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Journal Articles
- 2017
[j7]Slah Hlali
, Neila Hizem, Liviu Militaru, A. Kalboussi, Abdelkader Souifi:
Effect of interface traps for ultra-thin high-k gate dielectric based MIS devices on the capacitance-voltage characteristics. Microelectron. Reliab. 75: 154-161 (2017)- 2015
- [j6]Inga Zbierska, Liviu Militaru, Françis Calmon, Sylvain Feruglio, Guo-Neng Lu:
Electrical characterization and TCAD simulations of multi-gate bulk nMOSFET. Microelectron. J. 46(7): 588-592 (2015) - 2011
- [j5]W. Hourani, B. Gautier, Liviu Militaru, D. Albertini, A. Descamps-Mandine, R. Arinero:
Influence of the surrounding ambient on the reliability of the electrical characterization of thin oxide layers using an atomic force microscope. Microelectron. Reliab. 51(12): 2097-2101 (2011) - 2007
- [j4]Nabil Sghaier, Liviu Militaru, M'Hamed Trabelsi, Yacoubi Yacoubi, Souifi Souifi:
Analysis of slow traps centres in submicron MOSFETs by random telegraph signal technique. Microelectron. J. 38(4-5): 610-614 (2007) - [j3]T. Nguyen, C. Busseret, Liviu Militaru, A. Poncet, D. Aimé, Nicolas Baboux, Carole Plossu:
Parameters extraction of hafnium based gate oxide capacitors. Microelectron. Reliab. 47(4-5): 729-732 (2007) - 2006
- [j2]Nabil Sghaier, M'Hamed Trabelsi, Ne. Sghaier, Liviu Militaru, Abdelkader Souifi, Adel Kalboussi, Noureddine Yacoubi:
Static and low-frequency noise characterization in submicron MOSFETs for memories cells applications. Microelectron. J. 37(11): 1399-1403 (2006) - 2001
- [j1]Liviu Militaru, A. Souifi, M. Mouis, Alain Chantre, G. Brémond:
Investigation of deep traps in silicon-germanium epitaxial base bipolar transistors with a single polysilicon quasi self-aligned architecture. Microelectron. Reliab. 41(2): 253-263 (2001)
Conference and Workshop Papers
- 2022
- [c2]Camille Laguna, Mathieu Bernard, Julien Garrione, Niccolo Castellani, Valentina Meli, S. Martin, François Aussenac, D. Rouchon, N. Rochat, Emmanuel Nolot, Guillaume Bourgeois, Marie Claire Cyrille, Liviu Militaru, A. Souifi, François Andrieu, Gabriele Navarro:
Multilayer Structure in SeAsGeSi-based OTS for High Thermal Stability and Reliability Enhancement. ESSDERC 2022: 225-228 - 2021
- [c1]Camille Laguna, Mathieu Bernard, Nicolas Bernier, D. Rouchon, N. Rochat, Julien Garrione, A. Jannaud, Emmanuel Nolot, Valentina Meli, Niccolo Castellani, C. Sabbione, Guillaume Bourgeois, Marie Claire Cyrille, Liviu Militaru, A. Souifi, Gabriele Navarro, Etienne Nowak:
Multilayer OTS Selectors Engineering for High Temperature Stability, Scalability and High Endurance. IMW 2021: 1-4
Coauthor Index
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