"Analysis of slow traps centres in submicron MOSFETs by random telegraph ..."

Nabil Sghaier et al. (2007)

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DOI: 10.1016/J.MEJO.2007.02.003

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type: Journal Article

metadata version: 2023-09-30

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Nabil Sghaier, Liviu Militaru, M'Hamed Trabelsi, Yacoubi Yacoubi, Souifi Souifi:
Analysis of slow traps centres in submicron MOSFETs by random telegraph signal technique. Microelectron. J. 38(4-5): 610-614 (2007)

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