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2000 – 2009
- 2007
[i1]Georges G. E. Gielen, Wim Dehaene, Phillip Christie, Dieter Draxelmayr, Edmond Janssens, Karen Maex, Ted Vucurevich:
Analog and Digital Circuit Design in 65 nm CMOS: End of the Road? CoRR abs/0710.4709 (2007)- 2006
- [j8]Evelyn Grossar, Michele Stucchi, Karen Maex, Wim Dehaene:
Read Stability and Write-Ability Analysis of SRAM Cells for Nanometer Technologies. IEEE J. Solid State Circuits 41(11): 2577-2588 (2006) - [c9]Evelyn Grossar, Michele Stucchi, Karen Maex, Wim Dehaene:
Statistically Aware SRAM Memory Array Design. ISQED 2006: 25-30 - [c8]Mandeep Bamal, Youssef Travaly, Wenqi Zhang, Michele Stucchi, Karen Maex:
Impact of interconnect resistance increase on system performance of low power and high performance designs. SLIP 2006: 85-90 - 2005
- [j7]Kris Vanstreels, Marc D'Olieslaeger
, Ward De Ceuninck, Jan D'Haen, Karen Maex:
A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structure. Microelectron. Reliab. 45(3-4): 753-759 (2005) - [j6]Yunlong Li, Zsolt Tökei, Philippe Roussel, Guido Groeseneken, Karen Maex:
Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability. Microelectron. Reliab. 45(9-11): 1299-1304 (2005) - [c7]Georges G. E. Gielen, Wim Dehaene, Phillip Christie, Dieter Draxelmayr, Edmond Janssens, Karen Maex, Ted Vucurevich:
Analog and Digital Circuit Design in 65 nm CMOS: End of the Road? DATE 2005: 36-42 - [c6]Hua Wang, Miguel Miranda, Wim Dehaene, Francky Catthoor, Karen Maex:
Systematic Analysis of Energy and Delay Impact of Very Deep Submicron Process Variability Effects in Embedded SRAM Modules. DATE 2005: 914-919 - 2004
- [c5]Francky Catthoor, Andrea Cuomo, Grant Martin, Patrick Groeneveld, Rudy Lauwereins, Karen Maex, Patrick van de Steeg, Ron Wilson:
How Can System-Level Design Solve the Interconnect Technology Scaling Problem? DATE 2004: 332-339 - [c4]Mandeep Bamal, Evelyn Grossar, Michele Stucchi, Karen Maex:
Interconnect width selection for deep submicron designs using the table lookup method. SLIP 2004: 41-44 - 2003
- [c3]Antonis Papanikolaou, Miguel Miranda, Francky Catthoor, Henk Corporaal, Hugo De Man, David De Roest, Michele Stucchi, Karen Maex:
Global interconnect trade-off for technology over memory modules to application level: case study. SLIP 2003: 125-132 - 2002
- [j5]Hasan Ymeri, Bart Nauwelaers, Karen Maex, Servaas Vandenberghe, David De Roest:
A CAD-oriented analytical model for frequency-dependent series resistance and inductance of microstrip on-chip interconnect on silicon substrate. Microprocess. Microsystems 26(1): 45-48 (2002) - [j4]Michele Stucchi, Karen Maex:
Frequency dependence in interline capacitance measurements. IEEE Trans. Instrum. Meas. 51(3): 537-543 (2002) - [c2]Hasan Ymeri, Bart Nauwelaers, Karen Maex, David De Roest, Michele Stucchi, Servaas Vandenberghe:
Simple and Efficient Approach for Shunt Admittance Parameters Calculations of VLSI On-Chip Interconnects on Semiconducting Substrate. DATE 2002: 1113 - [c1]Antonis Papanikolaou, Miguel Miranda, Francky Catthoor, Henk Corporaal, Hugo De Man, David De Roest, Michele Stucchi, Karen Maex:
Interconnect exploration for future wire dominated technologies. SLIP 2002: 105-106 - 2001
- [j3]Hasan Ymeri, Bart Nauwelaers, Karen Maex:
On the two-dimensional capacitance calculation of multiconductor multilayered interconnects. Ann. des Télécommunications 56(9-10): 550-559 (2001) - [j2]Hasan Ymeri, Bart Nauwelaers, Karen Maex:
Frequency-dependent mutual resistance and inductance formulas for coupled IC interconnects on an Si-SiO2 substrate. Integr. 30(2): 133-141 (2001) - 2000
- [j1]Hasan Ymeri, Bart Nauwelaers, Karen Maex:
Computation of capacitance matrix for integrated circuit interconnects using semi-analytic Green's function method. Integr. 30(1): 55-63 (2000)
Coauthor Index
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