X-RAY
DIFFRACTOMETER
A JOURNEY TO LEARN THE
CRYSTALLOGRAPHIC VIEW OF MATERIALS
Presented by
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INTRODUCTION
Definition: X-Ray Diffractometer is a high-precision non-destructive analytical
instrument which is used to analyze physical properties such as phase composition,
crystal structure and orientation of powder, solid and liquid samples.
X-ray is a high energy electromagnetic radiation.
In 1895, Wilhelm Rontgen (accidentally) discover an image cast from his cathode ray
generator, projected far beyond the possible range of the cathode rays.
INTRODUCTION
In 1912, Max Von Laue, showed that if a beam of X-rays passed
through a crystal, diffraction would take place and a pattern would be
formed on a photographic plate placed at a right angle to the direction
of the rays.
X-ray diffractometer is used to determine the positions of atoms in a
crystal with an accuracy in the order of 10-4 nm. Again, quantitative
phase analysis is done by x-ray diffractometer.
Generally, the working principle of x-ray diffractiometer is based on
Bragg’s law.
WORKING PRINCIPLE
Working Principle
X-rays are a type of electromagnetic radiation, when a monochromatic x-
ray scatters from a substance with a structure on this scale, it causes
interferences. This interference creates a pattern of lower and higher
intensities due to constructive and destructive interference (Bragg’s law).
Working Principle
IF THERE IS A CRYSTALLINE
SUBSTANCE THEN A THREE-
DIMENSIONAL PATTERN IS
CREATED LIKE THE SPACINGS OF
PLANES IN THE CRYSTAL LATTICE,
THIS PROCESS IS CALLED
CONSTRUCTIVE INTERFERENCE.
BY COLLECTING ALL THE
DIFFRACTED X-RAYS ONE CAN
ANALYZE THE SAMPLES’
STRUCTURE. THE WAY THE X-RAY
REVEALS THE ATOMIC
STRUCTURE OF THE CRYSTALS IS
Working Principle
We have fixed wavelength
of incident X-RAY. Using
the Bragg’s law, by
changing the value of
incident angle
we can calculate the value
of inter-planar distance(d).
Hence we can also
determine the other
properties of the sample.
COMPONENTS
COMPONENTS
1.X-ray tube: It is the source from which the X-ray is
emitted and it consists of a cathode ray tube with a heating
tungsten filament. This produces the electrons which
accelerate on to the sample surface by applying a voltage.
The bombardment of the electrons on the samples is
controlled by the filaments which affect the X-ray output
intensity.
2.Sample holder: it is the basement on which the sample to
be characterized is placed and it can be rotated in the
direction of the X-ray tube and the detector. The adjustments
are made as per the reflection and emission of the X-rays
from the sample.
3.X-ray detector: The X-ray detector is used to record and
process the X-ray signal received from the sample. The
signals received are converted into count rate which is
obtained as the output on the monitor or printer.
ADVANTAGES
ADVANTAGES
Phase Identification : It can identify FCC,BCC, HCP and other
structures.
Rapid Analysis : It can analysis a huge amount of sample together.
Wide Applicability : Various types of materials can be analyzed.
Non Destructive Test : Can test a sample without destroying it.
ADVANTAGES
Automation : It is a semi automated machine, so most of the work is done by the
machine.
Versatility : Various type of sample can be tested by changing wavelength,
incident angle etc.
Economical Advantage : It can test a huge amount of sample with a very small
cost.
LIMITATIONS
Limitations
Applicability : It can not identify the amorphous materials.
Skilled operator : High skilled operator is needed to operate this
machine.
Health hazardous : Operators might face potential radiation exposure.
Large working area : It is a bulk technique process.
High cost : The initial set up cost is high.
APPLICATIONS
Applications
Crystalline structure determine
Phase Identification
Size of nanomaterials
Defects in materials
Semiconductors
