Apparel Quality Management: Presentation On Walter A. Shewhart

National Institute of Fashion Technology, Gandhinagar
Apparel Quality
Management
Presentation on
Walter A. Shewhart
Copyright 2010: Esha Gupta || Nandini Gaur || Preksha Sharma || Saumya

1
Walter Andrew
Shewhart
Father of
Statistical
Quality Control
•Born: 18 March 1891 in New
Canton Illinois, USA
•Died: 11 March 1967 in Troy
Hills, New Jersey, USA
•
Walter A. Shewhart- The Father of Statistical Process Control 2

Brief
One of the most notable contributors to modern industry is Walter
Shewhart, a quality control pioneer. He started his rise to guru status
as a Bell Telephone employee in 1918. Born in New Canton, Illinois in
1891, Shewhart set precedents that would be referenced for years to
come in establishing the importance of information distribution among
quality managers and production personnel.


Co
nt.
In 1918 Shewhart joined the Western Electric Company to assist their
•
engineers in improving the quality of telephone hardware. Western Electric
produced hardware for the Bell Telephone Company, which became the
American Telephone and Telegraph Company (AT&T). The Western
Electric Company manufactured telephone equipment for them and since
1905 its major plant was the Hawthorne Plant in Cicero, a suburb of
Chicago. The company and its factory grew rapidly with the need for
telephones. By 1913 there were 14000 employees and by 1930 there were
43000. It was one of the largest manufacturing plants in the country.
Shewart worked at Hawthorne until 1925 when he moved to the Bell
Telephone Research Laboratories where he remained until his retirement in
1956.

Shewhart,
Juran &
Deming
While at Hawthorne, Shewhart met and influenced W Edwards
Deming who went on to champion Shewhart's methods. Joseph Juran
also worked at Hawthorne from 1924 to 1941 and was influenced by
Shewhart. Shewhart, Deming, and Juran are often considered to be
the three founders of the quality improvement movement.

Achievements
& Honors
In his obituary for the American Statistical Association, Deming wrote of Shewhart:
“As a man, he was gentle, genteel, never ruffled, never off his dignity. He knew
disappointment and frustration, through failure of many writers in mathematical
statistics to understand his point of view.”
He was founding editor of the Wiley Series in Mathematical Statistics, a role that he
maintained for twenty years, always championing freedom of speech and confident
to publish views at variance with his own.
•

Achievements His Honours included:
•Founding member, fellow and president of the Institute
& Honors
of Mathematical Statistics;
•Founding member, first honorary member and
first Shewhart Medalist of the American Society for
Quality;
•Fellow and President of the American Statistical
Association;
•Fellow of the International Statistical Institute;
•Honorary fellow of the Royal Statistical Society;
•Holley medal of the American Society of Mechanical
Engineers;
•Honorary Doctor of Science, Indian Statistical
Institute, Calcutta.

Works
He gave concepts for following:
1.PDCA Cycle
2.Statistical Process Control
3.Six Sigma
4.

PDCA Cycle
The concept of the PDCA Cycle was originally developed by Walter
Shewhart, the pioneering statistician who developed statistical process
control in the Bell Laboratories in the US during the 1930's. It is often
referred to as `the Shewhart Cycle'. It was taken up and promoted very
effectively from the 1950s on by the famous Quality Management
authority, W. Edwards Deming, and is consequently known by many as
`the Deming Wheel'.

PDCA Cycle-
Uses
PDCA Cycle is used to coordinate your continuous improvement efforts. It
both emphasizes and demonstrates that improvement programs must start
with careful planning, must result in effective action, and must move on
again to careful planning in a continuous cycle.
The PDCA Cycle diagram is also used in team meetings to take stock of
what stage improvement initiatives are at, and to choose the appropriate
tools to see each stage through to successful completion.

Plan-Do-
Check-Act
Four stages of the Cycle:
1.Plan to improve your operations first by
finding out what things are going
wrong (that is identify the problems
faced), and come up with ideas for
solving these problems.
2.Do changes designed to solve the
problems on a small or experimental
scale first. This minimises disruption
to routine activity while testing
whether the changes will work or not.

Plan-Do-
Check-Act
3. Check whether the small scale or experimental changes are achieving the
desired result or not. Also, continuously Check nominated key activities
(regardless of any experimentation going on) to ensure that you know what the
quality of the output is at all times to identify any new problems when they crop
up.
4. Act to implement changes on a larger scale if the experiment is successful.
This means making the changes a routine part of your activity. Also Act to involve
other persons (other departments, suppliers, or customers) affected by the
changes and whose cooperation you need to implement them on a larger scale,
or those who may simply benefit from what you have learned (you may, of course,
already have involved these people in the Do or trial stage).

Tools and techniques which can be used to
PDCA Cycle complete each stage of the PDCA Cycle.

Statistical
Process
Control (SPC)
Walter A. Shewhart defined control as follows:

"A phenomenon will be said to be controlled when, through the use
of past experience, we can predict, at least within limits, how the
phenomenon may be expected to vary in the future. Here it is understood
that prediction within limits means that we can state, at least
approximately, the probability that the observed phenomenon will fall
within the given limits."

This definition means that control is not equivalent to a complete absence
of variation but rather that the system is in a state where variation
is predictable within some fixed limit.
Statistical
Process
Control (SPC)
Shewhart also realized that frequent process-adjustment in reaction to
non-conformance actually increased variation and degraded quality.
That's why he expressed the fundamental rule of statistical process
control in this way:

"Variation from common-cause systems should be left to chance,
but special causes of variation should be identified and eliminated."

Basics of
SPC
•Statistical Process Control (SPC) UCL
–monitoring production process to
detect and prevent poor quality
•Sample
–subset of items produced to use for
inspection LCL
•Control Charts
–process is within statistical control
limits

Variability

Actions to
Example
Chart rules
follow industry follow if Rules
standards or are breached
adapt to suit
Xbar/R Chart for Data Control Chart Rules
1
1
2
10 3.0SL=9.844
5 3
Sample Mean
9
4
8
X=7.613 5
7
6
6
-3.0SL=5.383
7
5
8
Subgroup 0 5 10 15
Control Chart Actions
9 1
3.0SL=8.176
8 2
Sample Range
7
6 3
5
4 R=3.867 4
3
2 5
1 6
0 -3.0SL=0.00E+00
7
8
Subgroup
Control Chart Factors
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 n A2 D3 D4
Measure1 6 4 9 6 6 9 10 6 8 10 9 9 5 8 8 2 1.88 0.00 3.27
Measure2 6 8 10 5 7 10 6 5 7 10 10 10 8 5 11
3 1.02 0.00 2.57
Measure3 5 3 5 5 10 9 10 7 6 9 8 5 5 9 6
Measure4 7 7 7 8 5 10 5 10 7 9 10 6 8 5 12 4 0.73 0.00 2.28
Measure5 6 9 7 5 8 12 8 5 8 10 10 5 9 9 11 5 0.58 0.00 2.11
Sum 30 31 38 29 36 50 39 33 36 48 47 35 35 36 48 6 0.48 0.00 2.00
xbar 6 6.2 7.6 5.8 7.2 10 7.8 6.6 7.2 9.6 9.4 7 7 7.2 9.6
7 0.42 0.08 1.92
R 2 6 5 3 5 3 5 5 2 1 2 5 4 4 6
LCLx= 5.37 UCLx= 9.86 Xdbar= 7.61 8 0.37 0.14 1.86
LCL R = 0 UCL R = 8.16 Rbar= 3.87 9 0.34 0.18 1.82
Standard Shewhart Control
Factors, used to manually
Table for data collection Walter A. Shewhart- Thecalculate centre lines
Father of Statistical Process Control 18
and limits.
SPC in TQM
•Tool for identifying problems and make
improvements
•Contributes to the TQM goal of continuous
improvements

Quality
Measures

Control
Charts
•A graph that establishes control
limits of a process
•Control limits
–upper and lower bands
of a control chart

Where to use
Control
Charts
•Process has a tendency to go out of control
•Process is particularly harmful and costly if it goes out of control
•Examples
–at the beginning of a process because it is a waste of time and
money to begin production process with bad supplies
–before a costly or irreversible point, after which product is difficult to
rework or correct
–before and after assembly or painting operations that might cover
defects
–before the outgoing final product or service is delivered

Developing
Control
Charts

Next Steps

Process
Control
Charts
Out of control
Upper
control
limit
Process
average
Lower
control
limit
1 2 3 4 5 6 7 8 9 10
Sample number
Normal
Distribution
95%
99.74%
-3σ -2σ -1σ µ =0 1σ 2σ 3σ

A process is
in control if..
1.No sample points outside limits
2.Most points near process average
3.About equal number of points above and
below centerline
4.Points appear randomly distributed

Control
Charts for
Attributes
•Attribute refers to those quality characteristics that confirm to
specification or do not confirm to specification
•When an attribute does not confirm to specification, diff. descriptive
terms are used.
•A nonconformity is a departure of a quality characteristic from its
product or service not to meet the specification requirement.

Control
Charts for
Attributes

P- Charts
•P chart mainly used for the data that consist of the proportion of the number of
occurrence of an event to the total no. of occurance(events).
•To control the fraction nonconformity in product, quality characteristic or group
of quality characteristic.
•As a fraction non conformity is the proportion of the number nonconforming the
sample or subgroup to the total no. of sample in subgroup
•P= np/n.

P- Charts
UCL = p + zp
LCL = p - zp
z = number of standard deviations from
process average
p= sample proportion defective; an estimate
of process average
p = standard deviation of sample proportion
p(1 - p)
p = n
P- Charts
Example
NUMBER OF PROPORTION
SAMPLE DEFECTIVES DEFECTIVE
1 6 .06
2 0 .00
3 4 .04
: : :
: : :
20 18 .18
200
20 samples of 100 pairs of jeans
P- Chart
Example
Cont.
total defectives
p = = 200 / 20(100) = 0.10
total sample observations
p(1 - p) 0.10(1 - 0.10)
UCL = p + z = 0.10 + 3
n 100
UCL = 0.190
p(1 - p) 0.10(1 - 0.10)
LCL = p - z = 0.10 - 3
n 100
LCL = 0.010

P- Chart 0.20
Example 0.18 UCL = 0.190

Cont. 0.16
0.14
Proportion defective
0.12
p = 0.10
0.10
0.08
0.06
0.04
0.02 LCL = 0.010
2 4 6 8 10 12 14 16 18 20
Sample number

W a lte r A . S h e w h a rt- T h e Fa th e r o f
S ta tistica l Pro ce ss C o n tro l
c- Charts
The c-Chart monitors the number of times a condition occurs, relative to a
constant sample size. In this case, a given sample can have more than one
instance of the condition, in which case we count all the times it occurs in the
sample. For our example, we would sample a set number of transactions each
month from all the transactions that occurred, and from this sample count the
total number of errors in all the transactions. We would then track on the control
chart the number of errors in all the sampled transactions per month.
35
c- Charts
UCL = c + zc
c= c
LCL = c - zc
where
c = number of defects per sample

c- Charts
cont.
Number of defects in 15 sample rooms
NUMBER
SAMPL OF
E DEFECTS
190
c= = 12.67
1 12 15
2 8
3 16 UCL = c + zc
: : = 12.67 + 3 12.67
= 23.35
: :
15 15 LCL = c + zc
190 = 12.67 - 3 12.67
= 1.99
c- Charts
cont.
24
UCL = 23.35
21
18
Number of defects
c = 12.67
15
12
3 LCL = 1.99
2 4 6 8 10 12 14 16
Sample number
Control Charts
for Variables
§Mean chart ( x -Chart )
§uses average of a sample
§Range chart ( R-Chart )
§uses amount of dispersion in
a sample

X- bar chart
x1 + x2 + ... xk
x= = k
UCL = x= + A2R LCL = x= - A2R
where
=
x = average of sample means

X- bar chart
example
OBSERVATIONS (SLIP- RING DIAMETER, CM)
SAMPLE k 1 2 3 4 5 x R
1 5.02 5.01 4.94 4.99 4.96 4.98 0.08
2 5.01 5.03 5.07 4.95 4.96 5.00 0.12
3 4.99 5.00 4.93 4.92 4.99 4.97 0.08
4 5.03 4.91 5.01 4.98 4.89 4.96 0.14
5 4.95 4.92 5.03 5.05 5.01 4.99 0.13
6 4.97 5.06 5.06 4.96 5.03 5.01 0.10
7 5.05 5.01 5.10 4.96 4.99 5.02 0.14
8 5.09 5.10 5.00 4.99 5.08 5.05 0.11
9 5.14 5.10 4.99 5.08 5.09 5.08 0.15
10 5.01 4.98 5.08 5.07 4.99 5.03 0.10
50.09 1.15

X- bar chart
example
cont.
= ∑x 50.09
x = = = 5.01 cm
k 10
UCL = x + A
= 2R = 5.01 + (0.58)(0.115) = 5.08
=
LCL = x - A 2R = 5.01 - (0.58)(0.115) = 4.94

X- bar chart
example
cont.
= ∑x 50.09
x = = = = 5.01 cm
k 10
UCL = x + A2R = 5.01 + (0.58)(0.115) = 5.08
=
LCL = x - A2R = 5.01 - (0.58)(0.115) = 4.94
=

X- bar chart
example
cont.
5.10 –
5.08 –
UCL = 5.08
5.06 –
5.04 –
x= = 5.01
Mean
5.02 –
5.00 –
4.98 –
4.96 – LCL = 4.94

4.94 –
4.92 – | | | | | | | | | |
1 2 3 4 5 6 7 8 9 10
Sample number
R- chart
OBSERVATIONS (SLIP-RING DIAMETER, CM)
1 5.02 5.01 4.94 4.99 4.96 4.98 0.08
2 5.01 5.03 5.07 4.95 4.96 5.00 0.12
3 4.99 5.00 4.93 4.92 4.99 4.97 0.08
4 5.03 4.91 5.01 4.98 4.89 4.96 0.14
5 4.95 4.92 5.03 5.05 5.01 4.99 0.13
6 4.97 5.06 5.06 4.96 5.03 5.01 0.10
7 5.05 5.01 5.10 4.96 4.99 5.02 0.14
8 5.09 5.10 5.00 4.99 5.08 5.05 0.11
9 5.14 5.10 4.99 5.08 5.09 5.08 0.15
10 5.01 4.98 5.08 5.07 4.99 5.03 0.10
50.09 1.15

R- chart
UCL = D4R LCL = D3R
∑R
R= k
where
R = range of each sample

k = number of samples

R- chart
example
OBSERVATIONS (SLIP-RING DIAMETER, CM)
1 5.02 5.01 4.94 4.99 4.96 4.98 0.08
2 5.01 5.03 5.07 4.95 4.96 5.00 0.12
3 4.99 5.00 4.93 4.92 4.99 4.97 0.08
4 5.03 4.91 5.01 4.98 4.89 4.96 0.14
5 4.95 4.92 5.03 5.05 5.01 4.99 0.13
6 4.97 5.06 5.06 4.96 5.03 5.01 0.10
7 5.05 5.01 5.10 4.96 4.99 5.02 0.14
8 5.09 5.10 5.00 4.99 5.08 5.05 0.11
9 5.14 5.10 4.99 5.08 5.09 5.08 0.15
10 5.01 4.98 5.08 5.07 4.99 5.03 0.10
50.09 1.15

R- chart
example
cont.
∑R 1.15 UCL = D4R = 2.11(0.115) = 0.243

R= = = 0.115
k 10 LCL = D3R = 0(0.115) = 0

R- chart
example
cont.
0.28 –
0.24 –
0.20 – UCL = 0.243
0.16 –
Range
0.12 – R = 0.115
0.08 –
0.04 –
0– LCL = 0
| | | | | | | | | |
1 2 3 4 5 6 7 8 9 10
Sample number
Performing a
Pattern Test
SAMPLE x ABOVE/BELOW UP/DOWN

ZONE
1 4.98 B — B
2 5.00 B U C
3 4.95 B D A
4 4.96 B D A
5 4.99 B U C
6 5.01 — U C
7 5.02 A U C
8 5.05 A U B
9 5.08 A U A
10 5.03 A D B
Sample Test
•Attribute charts require larger sample sizes
- 50 to 100 parts in a sample
•Variable charts require smaller samples
- 2 to 10 parts in a sample

Appendix
SAMPLE SIZE FACTOR FOR x-CHART FACTORS FOR R-CHART

n A2 D3 D4
2 1.88 0.00 3.27

3 1.02 0.00 2.57
4 0.73 0.00 2.28
5 0.58 0.00 2.11
6 0.48 0.00 2.00
7 0.42 0.08 1.92
8 0.37 0.14 1.86
9 0.44 0.18 1.82
10 0.11 0.22 1.78
11 0.99 0.26 1.74
12 0.77 0.28 1.72
13 0.55 0.31 1.69
14 0.44 0.33 1.67
15 0.22 0.35 1.65
16 0.11 0.36 1.64
17 0.00 0.38 1.62
18 0.99 0.39 1.61
19 0.99 0.40 1.61
20 0.88 0.41 1.59

Shewhart & Six
Sigma
Selected aspects of the work of Shewhart and
Deming can be compared with
a common element of various six-sigma
programs.

Shewhart & Six
Sigma
• Shewhart explains in the opening paragraph of Statistical Method:
• “Corresponding to these three steps there are three senses in
which statistical control [i.e. process behavior charts] may play an
important part in attaining uniformity in the quality of manufactured
product:
• (a) as a concept of a statistical state constituting a limit to which
one may hope to go in improving the uniformity of quality;
• (b) as an operation or technique of attaining uniformity; and
• (c) as a judgment.”

Shewhart & Six
Sigma
• The three-sigma limits of a process behavior chart
characterize the potential of your process. They define
what a predictable process will do, and they
approximate what an unpredictable process can be
made to do.

Shewhart & Six
Sigma

Timeline
Shewhart's studies into variation at Bell Telephone Labs

Shewhart publishes book , " Economic Control of Quality of
Manufactured Product
Widespread adoption of Shewhart's principles for War - time
Production
Ishikawain develops
the US Ishikawa diagram and pioneers use of 7 -
tools
Widespread abandonment of Shewhart's principles in Post - War
US .Deming teaches Shewhart principles to
Japanese
Deming develops management philosophy based on Shewhart
concepts own extend
Japanese ideas Deming's teachings , develop the " Total Quality ”
concept
USA starts to copy Japan , called TQC ( Total Quality
Control ) eventually the term TQM ( Total Quality
Management ) is used as the label .
Renewed focus on Process
Management
1920' 1931 1940' 1943 1950 1960 1970 1980 1990 1994 1996 2000 2002
s s
US discovers Deming 6 - sigma goes
Rapid spread TQM principles to US mainstream
Widespread
service industries
Pacific basin countries , excluding Australia emergence of
commence adopting TQM Balanced Scorecard
Organisational learning
Western Europe discovers TQM
Australian services sector copies US with emerging as a key
adoption Australian
of TQM competitive
Team based approaches issue
to work
manufacturing commences with TQM
gaining broad acceptance in
Developing countries rapidly adopting
TQM Businessindustry
Process Reengineering

Publications
•The Bell Telephone Laboratories were founded in 1925 and Shewhart
moved to them when the Laboratories opened and worked there until his
retirement in 1956.
•He expanded his interests to a broader use of statistics over this period.
During this period he published many articles papers in the Bell System
Technical Journal.
•In addition, he published Random sampling in the American Mathematical
Monthly in 1931. In 1939 he published the important book Statistical
Method from the Viewpoint of Quality Control.
Societies
Shewhart was a founder of the Institute of Mathematical Statistics, being elected
a fellow and serving a term as vice-president in 1936 and president from 1936 to
1944. He was also a founder of the American Society for Quality Control.
He was elected to a fellowship of the American Statistical Association, of the
International Statistical Institute, and of the Royal Statistical Society. He was also
elected to the American Association for the Advancement of Science (serving on
the council during 1942-49), the Econometric Society, and the New York
Academy of Science. He served a term as president of the American Statistical
Association in 1945, and was awarded the Holley medal of the American Society
of Mechanical Engineers in 1954. The Indian Statistical Institute in Calcutta
awarded him an honorary doctorate.

Shewhart
Medal
The Shewhart Medal is awarded for technical leadership: “The Shewhart
Medal committee may designate, not more often than once each year,
that nominee, not previously so designated, who is deemed by it to have
demonstrated the most outstanding technical leadership in the field of
modern quality control, especially through the development to its theory,
principles, and techniques...”(ASQ bylaws)
The Society made him their first honorary member in 1947 and also
made him the first to receive their Shewhart Medal.

Shewhart’s
visit to India
The ISI also played a pioneering role in starting the Statistical Quality
Control (SQC) movement in India by organising a visit of Professor W.A.
Shewhart, the father of SQC, to India in November 1947

References
•http://www-groups.dcs.st-and.ac.uk/~history/Biographies/Shewhart.html
•http://mospi.nic.in/arep0003_chapter7.pdfhttp://walter-a-shewart.blogspot.com/
•http://asq.org/about-asq/who-we-are/bio_shewhart.html
•http://www.jstor.org/pss/25047976
•http://www.eolss.net/ebooks/Sample%20Chapters/C02/E6-02-05-04.pdf
•http://www-groups.dcs.st-and.ac.uk/~history/Biographies/Shewhart.html

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National Institute of Fashion Technology, Gandhinagar

Copyright 2010: Esha Gupta || Nandini Gaur || Preksha Sharma || Saumya

Walter A. Shewhart- The Father of Statistical Process Control 2

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Example 0.18 UCL = 0.190

0.02 LCL = 0.010

Walter A. Shewhart- The Father of Statistical Process Control 34

Walter A. Shewhart- The Father of Statistical Process Control 36

Walter A. Shewhart- The Father of Statistical Process Control 39

UCL = x= + A2R LCL = x= - A2R

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4.96 – LCL = 4.94

Walter A. Shewhart- The Father of Statistical Process Control 45

R = range of each sample

Walter A. Shewhart- The Father of Statistical Process Control 46

Walter A. Shewhart- The Father of Statistical Process Control 47

∑R 1.15 UCL = D4R = 2.11(0.115) = 0.243

Walter A. Shewhart- The Father of Statistical Process Control 48

SAMPLE x ABOVE/BELOW UP/DOWN

Walter A. Shewhart- The Father of Statistical Process Control 51

SAMPLE SIZE FACTOR FOR x-CHART FACTORS FOR R-CHART

2 1.88 0.00 3.27

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Shewhart's studies into variation at Bell Telephone Labs

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