SQC
SQC
SQC
Control
(SQC)
SQC may be defined as the industrial management technique by
means of which product of uniform acceptable quality are
manufactured. It is concerned mainly with setting things right rather
than discovering and rejecting those made wrong.
SQC techniques are being used extensively in almost all industries
such as automobiles, aircrafts, textile, rubber etc.
of process output using a device called the control chart. Other than
control charts, SPC also monitors process capability, an indicator for
adequacy of process.SPC aims at maintaining a stable, capable and
predictable process.
Several benefits of using the SPC approach are as follows:
a) This type of the process being controlled has no restrictions but the
process tackled will be improved.
b) Decisions guided by SPC are based on facts not opinions.
c) Quality awareness of the workforce increases because they become
directly involved in the improvement process.
d) Knowledge and experience of those who operate the process are
released in a systematic way through the investigative approach.
Process Capability
It is the range over which the natural variation of a process occurs
as determined by the system of common or random causes.
The capability of a process is the fraction of output that can be
Variability:
In every manufacturing process, there is some variability. This variability
may be large or small, but it is always present.
It can be divided into two types:
a) Common or Random causes- variability is said to be inherent in the
process and it can be expected to occur naturally within a process.
Factors like equipment vibration, passing traffic, atmospheric pressure or
temperature changes etc which are beyond control of human hand are
called common causes.
b) Assignable or Special causes- Variability due to
assignable causes refers to the variation that can be linked to specific or
special causes that disturb a process like tool failure, power supply
interruption, process controller malfunction, adding wrong ingredients or
wrong quantities, switching a vendor etc.
1)
Flowchart:
The flowchart lists the order of
activities in a project or process and
their interdependency. It expresses
detailed process knowledge.
2) Histogram:
The histogram is a bar chart showing
a distribution of variable quantities or
characteristics.
3) Pareto chart:
The Pareto chart, as shown below,
indicates the distribution of effects
attributable to various causes or
factors arranged from the most
frequent to the least frequent.
5) Scatter Diagram:
The scatter diagram shows any
existing pattern in the relationship
between two variables that are
thought to be related. For eg: As
temperatures drop, do cases of the
common cold rise in number?
6) Run Chart:
The run chart shows the history and
pattern of variation. It is plot of data
points in time sequence, connected
by a line. Its primary use is in
determining trends over time.
7) Control charts
The control chart in particular is a powerful process quality monitoring device and
it constitutes the core of statistical process control (SPC). It is a line chart marked
with control limits at 3 standard deviations (s) above and below the average
quality level.
A typical control chart consists of 3 horizontal lines:
1) Central line(CL)- desired level of the process.
2) Upper control limit(UCL)-upper limit of tolerance.
3) Lower control limit(LCL)- lower limit of tolerance.
*UCL and LCL are represented by dotted lines. The quality scale is given by
vertical scale and sample subgroup by horizontal line.
Cycles
Cycles are short, repeated patterns in the chart, alternating high peaks and
low valleys. These patterns are the result of causes that come and go on a
regular basis.
Trends
A trend is the result of some cause that gradually affects the quality
characteristics of the product and causes the points on a control chart to gradually
move up or down from the center line. In the xbar chart, trends may be the result
of improving operator skills or aging of equipment.
Instability
Instability is characterized by unnatural and erratic fluctuations on both sides of
the chart over a period of time. Points will often lie outside both the upper and
lower control limits without a consistent pattern.
10
Mean:
43
49
37
44
45
37
51
46
43
47
Range:
Calculate the values for the central line and the control limits for the mean chart
and range chart. Comment on the state of control.
Given: A2=0.577,D3=0,D4=2.115
Solution:
Here, n=5,k=10 , Using the formulae, we get:
x_doublebar: 44.2
r_doublebar: 5.8 , then 3 sigma control limits are given by:
For x_doublebar:
CL: 44.2
UCL: x_doublebar+(A2*Rbar)=44.2+(0.577*5.8)=44.2+3.346=47.546
LCL: x_doublebar+(A2*Rbar)=44.2-(0.577*5.8)=44.2-3.346=40.854
For x_doublebar: CL=5.8
UCL= D4*Rbar=2.115*5.8=12.67
LCL= D3*Rbar=0*5.8=0
Comments:
x_doublebar= Since sample numbers 2,3,6 and 7 are outside the control
limits, therefore the process average is out of control.
Rbar= since none of the sample ranges lie beyond the control limits of the
R chart ,process variability is under control.
However as one is out of control , so it cant be regarded in a state of
statistical control.
55
M
ea
n:
50
cl
45
LC
L
U
CL
40
35
1
10
s / C2
C3
s B4
C2
C
LCLS E ( s ) 3S .E ( s ) s 3 3 s B3
C2
UCLS E ( s ) 3S .E (s ) s 3
P-chart
When dealing with attributes, if all samples or subgroups are ascertained to
have sample population to have same population proportion P.
Let d be the number of defectives in sample of size n.
sample proportion defective is p=d/n.
Hence, d is a binomial variate with parameters n and P.
E(d)=nP, var(d)=nPQ, Q=1-P.
Thus,E(p)=E(d/n)=(1/n)E(d)=P
Var(p)=PQ/n
so 3 sigma control limits are given by:
E ( p) 3S .E ( p) P 3 PQ
P A PQ
or
P A P (1 P )
Question: The figures of the following defects of 22lots each containing 2000 belts
each are given:
425
430
216
341
225
322
280
306
337
305
356
402
216
264
126
409
193
326
280
389
451
420
Draw control chart for defective and comment on the state of control of the process.
Solution: n=2000 for each lot, let di and pi be no.of defectives and fraction of
defective for ith lot. Then,
di
pi
p
2000
0.2
0.15
fraction defective
0.1
UCL
LCL
0.05
CL
0
1
10 11 12 13 14 15 16 17 18 19 20 21 22
d-chart
If instead of p, the sample proportion defective, we use d, the number of
defectives in the sample, then the 3 sigma control limits are:
E(d)+-3 S.E(d) = nP+-3*sqrt(nP(1-P))
implies,
UCL= nP+3*sqrt(nP(1-P))
LCL= nP-3*sqrt(nP(1-P))
p
nk
Sample
no.
10
No. of
0
defectives
Sample
no.
12
13
14
15
16
17
18
19
20
11
No. of
1
defectives
d or np-chart
10
9
8
7
6
No.of defectives
5
4
3
2
1
0
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20
no.of defectives
UCL
CL
LCL
c-chart
It applies to no. of defects per unit. Control limits for c-chart:
here the sample size n is large and so the probability p of the occurrence of a
defect in any one spot is very small such that np is finite. So pattern of
variation in data can be represented by poisson distribution.
If we assume that c is poisson variate with parameter lambda.
E(c)=lambda, Var(c)=lambda
then 3 sigma control limits for c-chart are given by:
UCL= lambda+3*sqrt(lambda)
LCL = lambda-3*sqrt(lambda)
CL= lambda
OR
It can easily be seen that as cbar is an unbiased estimate of lambda.
So limits become
cbar +-3*sqrt(cbar)
10
no. of
defects
Item
no.
11
12
13
14
15
16
17
18
19
20
no. of
defects