428XL

V6.0
User’s Manual
Vol. 3

428XL User’s Manual Vol. 3 - 10028847 AC September 22, 2015

Ahead of the Curve SM

 428XL User’s Manual Vol. 3 - 10028847 AC

In no event shall SERCEL be liable for incidental or consequential damages or related expenses
resulting from the use of this product, or arising out of or related to this manual or the information
contained in it, even if SERCEL has been advised, or knew or should have known of the possibility of
such damages.
The information included in this documentation is believed to be accurate and reliable. However,
SERCEL reserves the right to make changes to its products or specifications at any time, without notice,
in order to improve design or performance and to supply the best possible product. This documentation
does not form in any way a contractual agreement of sales promise on the part of SERCEL.
Software mentioned in this documentation is sold under a precise licence agreement and as such the
documentation may cover technical areas for which the user may not have a final licence.
No part of this documentation, or any of the information included herein may be modified or copied in
any form or by any means without the prior written consent of SERCEL.

© 2005 Sercel. All Rights Reserved.

Printed in France.

Sercel, 428XL, 428XLS, AIB, DPG, DSD, DSU1, DSU3, DSU3-428, e-428, eSQC Pro, FDPA428, FDU,
FDU-428, HSU, LandPro Bin, LAUL, LAUL-428, LAULS, LAUX, LAUX-428, LAUXS, Link, LL428,
LLIU, LLX400, LRU, LSI, LSS, LT428, LX, MGA, MRU, MSI, QT428, SGA, TMS428, TMU428, VE432,
VE464, VQC88, WPSR are all trademarks of Sercel. All rights reserved.

DSUGPS: US Patent 7,117,094 B2.

UNIX is either a registered trademark or trademark of The Open Group in the United States and/or other
countries.Microsoft and Windows are either registered trademarks or trademarks of Microsoft
Corporation in the United States and/or other countries. Other product and company names mentioned
herein may be the trademarks of their respective owners.

Printed on 100% recycled paper

using vegetable-oil based ink

September 22, 2015 2

To contact Sercel
Europe Russia
Nantes, France Customer Support; Repair.
Sales; Customer Support; Moscow, Russia
Manufacturing & Repair. Tel: +7 495 644 08 05, Fax: +7 495 644 08 04
B.P. 30439, 16 rue de Bel Air E-mail: repair.cis@geo-mail.org
44474 Carquefou Cedex support.cis@geo-mail.org
Tel: +33 2 40 30 11 81, Fax: +33 2 40 30 19 48 Surgut, Russia
Hot-Line: Land: +33 2 40 30 58 88 Tel: +7 3462 28 92 50
Marine: +33 2 40 30 59 59
North America
Navigation: +33 2 40 30 69 87
E-mail: sales.nantes@sercel.com Houston, Texas, USA
Sales; Customer Support;
customersupport.land@sercel.com Manufacturing & Repair;
customersupport.marine@sercel.com Tel: +1 281 492 66 88, Fax: +1 281 579 75 05
customersupport.navigation@sercel.com Hot-Line: +1 281 492 66 88
repair.france@sercel.com E-mail:
streamer.repair@sercel.com sales.houston@sercel.com
www.sercel.com HOU_Customer.Support@sercel.com
St Gaudens, France HOU_Training@sercel.com
Vibrator & VSP Customer Support; HOU_Customer.Repair@sercel.com
Vibrator Manufacturing & Repair;
Streamer Manufacturing & Repair. Tulsa, Oklahoma, USA
Tel: +33 5 61 89 90 00, Fax: +33 5 61 89 90 33 Tel: +1 918 834 96 00, Fax: +1 918 838 88 46
Hot Line: (Vib) +33 5 61 89 90 91 E-mail:
(VSP) +33 5 61 89 91 00 support@sercel-grc.com
E-mail: customersupport.vib@sercel.com sales@sercel-grc.com
customersupport.vsp@sercel.com Calgary, Alberta, Canada
Sales; Customer Support; Manufacturing.
Les Ulis, France Tel: +1 403 275 3544, Fax: +1 403 295 1805
Sales; Customer Support E-mail:
Tel: +33 1 69 93 83 60, Fax: +33 1 69 81 78 09 Cal_Customer.Support@sercel.com
E-mail: vspsupport@sercel.com
Middle East
Hot Line: +33 6 15 54 13 96
Brest, France Dubai, U. A. E.
Sales; Customer Support Sales, Customer Support, Repair.
Tel: +971 4 8832142, Fax: +971 4 8832143
Tel: +33 2 98 05 29 05; Fax: +33 2 98 05 52 41
Hot Line: +971 50 6451752
E-mail: sales.nantes@sercel.com
E-mail: dubai@sercel.com
Toulon, France repair.dubai@sercel.com
Sales; Customer Support
Tel: +33 4 94 21 69 92; Fax: +33 4 94 21 73 44 Far East
E-mail: SalesMSBU@sercel.com Beijing, P. R. of China
SupportMSBU@sercel.com R & D.
Tel: +86 106 43 76 710, Fax: +86 106 43 76 367
Toulouse, France E-mail: support.china@geo-mail.com
Sales; Customer Support
Tel: +33 5 61 34 80 74; Fax:+33 5 61 34 80 66 repair.china@geo-mail.com
E-mail: support@metrolog.com Xian, P. R. of China
sales@metrolog.com, info@metrolog.com Manufacturing & Repair.
Tel / Fax: +86 29 8222 9504
Alfreton, U. K.
Streamer Manufacturing & Repair; Xushui, P. R. of China
Customer Support. Manufacturing & Repair.
Tel: +44 1 773 605 078, Fax: +44 1 773 541 778 Tel:+86 312 8648355, Fax:+86 312 8648441
E-mail: streamer.repair@sercel.com Singapore
Trondheim, Norway (Optoplan AS) Streamer Manufacturing & Repair;
Tel: +47 73820500, Fax: +47 73820599 Customer Support.
Tel:+65 64 17 70 00, Fax:+65 6 545 1418
Dortmund, Germany
Manufacturing.
DE REGT Tel: +49 2 31 65 55 64 11.
Warnings, Cautions, Important Notices,
and Notes
Warnings, Cautions, and Important notices throughout this manual guide you to avoid injury, prevent
equipment damage, and determine equipment use when varying components or configurations exist.
Notes provide tips or additional information.
SERCEL is not responsible for damages or injuries that result from failure to observe the information
provided.

Warnings and Cautions

When a Warning or Caution appears with a lightning-bolt icon, as

shown in this example, this is to indicate a potential hazard that may
lead to bodily injury or even death.

CAUTION
When a Warning or Caution appears with an exclamation-point icon, as
shown in this example, this is to indicate possible equipment damage or
potential risk of misuse and incorrect operation.

Important Notices
IMPORTANT
Important notices appear in the manual to highlight information that
does not affect the risk of bodily injury, death, or equipment damage,
but is nevertheless important. These notices appear with a stop-sign
icon, as shown in this example.

Notes
Note Notes provide tips or peripheral facts and may guide you to
other sources of information.

4 September 22, 2015

 428XL User’s Manual Vol. 3 - 10028847 AC

Revision history

Date of Manual Chapters or Description of revision or reason for

revision Version pages affected change
Mar. 2006 V 1.0 release
Dec. 2006 V 2.0 release
Jan. 2007 p. 21 Using Copy+ software tool to copy files
from NAS to tape.
Mar. 2007 Chap. 4 - Moved “Source controller interfacing”
from Volume 3 to Volume 2.
Chap. 10 - Added Acceptance tests.
Dec. 2007 V 3.0
p. 221 - Updated Tilt angle calculation.
p. 261 - Updated DSU trace correction formula.
Jan. 2008 p. 261 Updated DSU trace correction formula.
Apr. 2008 Chap. 10 - Reviewed acceptance test procedure.
App. B - Transverse cable length (125 m. max.)
July 2008 p. 299 Updated instrument noise test specifica-
tions.
Sep. 2008 p. 285, 301 - DSU1-428 specifications.
p. 298 - Acquisition cycle time.
Oct. 2008 p. 238 Channel offset removal in Gain&Phase
tests.
Dec. 2008 p. 225 Theory of DSU1 tests.
Feb. 2009 V4.0
Mar. 2009 p. 183 Crosstalk test.
July 2009 p. 238, 261 Note about trace processing for Tilt and
Gravity tests.
Oct. 2009 p. 286 DSU3BV-428 physical specifications
Jan. 2010 p. 285 DSUGPS specifications.
Sep. 2010 p. 42 Trace polarity.
Nov. 2010 Release 5.0.
Dec. 2010 p. 285 Updated DSUGPS specifications.
Jan. 2011 p. 22 Copy+ running on Windows 7 (32-bit).

September 22, 2015 5

428XL User’s Manual Vol. 3 - 10028847 AC

Date of Manual Chapters or Description of revision or reason for

revision Version pages affected change
Apr. 2011 p. 125 - DSU-428 Gain& Phase test record recov-
p. 191 ery.
- Gain (G1) in sensor Noise test.
Nov. 14, 2011 p. 291 NAS 4000 capacity.
May 16, 2012 p. 21 Copy+ software V3.0.
Sep.5, 2013 AA p. 236 “Correlation Before” process type irrele-
vant if Diversity Stack noise elimination.
June 24, 2014 AA p. 284 Specifications (new page layout).
Apr. 2015 AC V6.0 Release

6 428XL User’s Manual Vol. 3 - 10028847 AC

 Table of Contents

Warnings, Cautions, Important Notices, and Notes . . . . . . . . . . . . . .4

Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5
Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13

1 Utilities
Tape Copy (CopyMedia) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .16
General Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .16
Copy rules . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .17
Procedure for copying a file . . . . . . . . . . . . . . . . . . . . . . . . . . . .17
Examples . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .19
“Copy+” software tool . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .21
General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .21
Installation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .22
Accessing NAS disks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .26
Copy+ version 3.0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .30
Typical throughput . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .35
Earlier Copy+ versions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .38
Trace Polarity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .42

2 Playback Filters
Introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .44
Filter charts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .45

3 Channel Filter Response Charts

Linear Phase filter type. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56
Minimum Phase filter type . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .76

4 Source controller interfacing

428XL slave operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .98
Manual mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .98

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September 22, 2015
Table of Contents

Continuous mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .99

ADVANCE II source controller . . . . . . . . . . . . . . . . . . . . . . . . . . .100
Shot Pro Blaster (or equivalent) . . . . . . . . . . . . . . . . . . . . . . . . . . .101
Installation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .101
Protocol for data from 428XL to Shot Pro . . . . . . . . . . . . . . .102
Protocol for Data from Shot Pro to 428XL . . . . . . . . . . . . . . .102
Blaster Status Codes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .103
Terminology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .103
Examples . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .104
Results Processing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .104
Shallow Sequencer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .105
Protocol for Data from Shallow Sequencer to 428XL . . . . . . .105
Results Processing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .106
MACHA blaster . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .107
Protocol for data from MACHA blaster to 428XL . . . . . . . . .107
SGD-S blaster . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .108
SGD-S protocol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .108
Data fields updated by source controllers. . . . . . . . . . . . . . . . . . . .111

5 Instrument test record recovery

General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .114
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .114
Conventions used . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .114
Instrument Noise test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .115
Instrument Distortion test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .116
Instrument Gain and Phase tests . . . . . . . . . . . . . . . . . . . . . . . . . . .117
Instrument CMRR test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .123
Instrument Crosstalk test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .124
DSU-428 Gain and Phase test. . . . . . . . . . . . . . . . . . . . . . . . . . . . .125

8 428XL User’s Manual Vol. 3 - 10028847 AC

September 22, 2015
 Table of Contents

6 FDU Calibration
Overview. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .128
General principle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .128
Calibration timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .129
ADC low gain and internal reference . . . . . . . . . . . . . . . . . . . . . . .131
Purpose . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .131
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .131
Input resistors and DAC hardware . . . . . . . . . . . . . . . . . . . . . . . . .135
Purpose . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .135
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .135
DAC software . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .141
Purpose . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .141
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .141
Test network resistors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .144
Purpose . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .144
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .144
Common-mode resistors. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .150
Purpose . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .150
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .150
Earth ground resistor. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .156
Purpose . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .156
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .156
ADC high gain . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .160
Purpose . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .160
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .160

7 FDU test functions

General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .164
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .164

428XL User’s Manual Vol. 3 - 10028847 AC 9

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Table of Contents

Available tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .166

Instrument tests. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .168
Instrument Resistance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .168
Instrument Noise test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .170
Instrument Gain and Phase tests . . . . . . . . . . . . . . . . . . . . . . .173
Instrument Distortion test . . . . . . . . . . . . . . . . . . . . . . . . . . . .177
Instrument CMRR test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .180
Instrument Crosstalk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .183
Instrument Pulse . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .186
Reference voltage (Line power-on or TMS428 only) . . . . . . .188
Sensor tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .191
Sensor Noise test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .191
Sensor Resistance test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .194
Sensor Leakage test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .197
Sensor Tilt test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .200
Sensor CMRR test (LT428 and TMS428 only) . . . . . . . . . . . .202
Sensor Pulse . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .205
Sensor Distortion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .207

8 DSU test functions

Overview. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .212
Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .214
DSU3 tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .215
Noise test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .215
Gain and Phase test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .216
Distortion test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .217
Crosstalk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .218
Tilt test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .221
Gravity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .224
DSU1 tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .225
10 428XL User’s Manual Vol. 3 - 10028847 AC
September 22, 2015
 Table of Contents

Noise test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .225

Gain and Phase test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .226
Distortion test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .227
Crosstalk . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .228
Tilt test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .230

9 Reference information
Correlation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .232
Correlation in the Time Domain . . . . . . . . . . . . . . . . . . . . . . .232
Correlation In The Frequency Domain . . . . . . . . . . . . . . . . . .232
Correlation in the 428XL . . . . . . . . . . . . . . . . . . . . . . . . . . . . .234
Converting samples to Millivolts or m/s² . . . . . . . . . . . . . . . . . . . .235
Channel offset removal. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .238
Impulse, Crosstalk and Gain&Phase tests . . . . . . . . . . . . . . . .238
Geophone strings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .240
Number of geophones per trace . . . . . . . . . . . . . . . . . . . . . . . .240
Series / parallel arrangement . . . . . . . . . . . . . . . . . . . . . . . . . .241
String wiring . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .246
Conclusion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .248
Sample interpolation in case of statics . . . . . . . . . . . . . . . . . . . . . .249
Principle of 428XL acquisition . . . . . . . . . . . . . . . . . . . . . . . .249
Transmit error effects . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .252
CRC error handling algorithm . . . . . . . . . . . . . . . . . . . . . . . . .253
Experimentation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .254
DSU3 trace correction using tilt angles . . . . . . . . . . . . . . . . . . . . .261
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .261
DSU3 trace correction formula . . . . . . . . . . . . . . . . . . . . . . . .261

10 Acceptance tests
Before you begin. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .264
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How to do an Acceptance test . . . . . . . . . . . . . . . . . . . . . . . . . . . .265

Impulsive-type test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .271
Historic-type test, Correlation Before Stack. . . . . . . . . . . . . . . . . .273
Diversity-type test, Stacking. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .275

A Conventions for 3C polarity

Right-handed system . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .277
SEGD convention for 3C polarity . . . . . . . . . . . . . . . . . . . . . .279
DSU3 Tilt angles . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .280

B 428XL specifications
General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .284
Maximum real-time acquisition capacity . . . . . . . . . . . . . . . . . . . .290
Max Acquisition or Record length Vs number of traces . . . . . . . .292
Vibroseismic source . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .293
Impulsive source . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .294
Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .296
Acquisition cycle time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .298
Instrument test specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . .299
FDU-428 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .299
DSU3-428 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .301
DSU1-428 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .301

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Introduction
The documentation coming with the 428XL system consists of the
following manuals:
• Installation Manual: provides an introduction to the 428XL system,
installation information, a few instructions for the operator to get
started, and reference information that will help you select a 428XL
configuration tailored to your needs.
• User’s Manual Volume 1: describes the parameters displayed on the
system’s Graphic User Interface and how to use each window.
• User’s Manual Volume 2: contains information on logged data and on
interfaces (description of Input/Output formats, including the SEGD
format).
• User’s Manual Volume 3: this manual, containing reference
information (filter charts, theory of tests, technical data, release
notes, specifications).
• Technical Manual: contains maintenance and repair information,
including operating instructions for using the system’s testers.
With a PDF file reader (Adobe Acrobat Reader) on a computer you can
view this manual direct from the 428XL CDROM’s DOC directory.

September 22, 2015 13

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Chapter

1 Utilities

This chapter describes miscellaneous functions that are not

accessible from the windows of the 428XL graphic user
interface because they are only available for exceptional or
custom use. It includes the following sections:

• Tape Copy (CopyMedia) (page 16)

• “Copy+” software tool (page 21)
• Trace Polarity (page 42)

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1 Utilities
Tape Copy (CopyMedia) > General Description

Tape Copy (CopyMedia)

General Description
428XL software includes two utilities used to copy files between two
SCSI tape drives or between an SCSI tape drive and the server's hard
disk.
The CopyFile utility can copy
• one file from tape to tape;
• one file from tape to disk;
• one file from disk to tape.
The CopyMedia utility can copy
• all the files from a tape to another tape;
• all the files from a tape to a disk directory;
• all the files from a disk directory to a tape.

WARNING
Prior to using the CopyMedia command, make sure you have enough
disk space available, or else a "File System Full" error may appear.

WARNING
Be sure you are not writing to a tape that already contains files. The
system will not give any notice of already existing files!
Prior to reading from a tape, you must rewind it.

WARNING
The tape drives you want to use must be “released” in the Export
window).

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 Utilities
Tape Copy (CopyMedia) > Copy rules

Note On a Solaris host, prior to using the CopyMedia command to

copy records from an external disk (e. g. a NAS system) to a 1
tape, type the following command in the Terminal window:
ExpMount disk# (where # is the Device number). When you
want to unmount the disk, use the ExpUmount disk#
command.

Copy rules
a) When a file is copied from tape to tape, the blocks of the source
tape are copied to the destination tape and blocking is preserved
(Blocking is limited to 256 kbytes). EOF is not copied to the
destination tape.
b) When a file is copied from tape to disk, the blocks of the source
tape are packed in order to form one disk file. The EOF is not
copied.
With the CopyMedia utility, the destination disk file name is created
with the name xxxxx.tape (xxxx starts from 00001 and is incremented
for each file copied).

Procedure for copying a file

• Insert a cartridge into the drive. (The tape drive must have been
recognized by the 428XL beforehand).
• Go to Off Line in the Config client window.
• In the Export client window, choose Tape Functions from the Setup
menu, and then release the tape drive (choose Release from the
option button).
• Open the Terminal window on the server computer.

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Tape Copy (CopyMedia) > Procedure for copying a file

• Enter one of the following commands, where x and y are the SCSI
addresses of the drives (visible in the tape drive’s result log view in
the Export window):
1 - To copy a file from device #x to device #y:
> CopyFile x y (This copies the next file
read from the tape).

2 -To copy a file from device #x to the hard disk:

>CopyFile x /path/filename (This copies the next file
read from the tape).
3 - To copy a file from the hard disk to device #x
> CopyFile /path/filename x [blocking length]
4 - To copy all the files from device #x to device #y (see Note 2):
> CopyMedia x y
5 - To copy all the files from device #x to a directory on the hard disk
(see Note 2):
> CopyMedia x /path
6 - To copy all the files from a directory on the hard disk (/path) to a
device (#x), ending with two EOFs:
> CopyMedia /path x [blocking length] eom

Note (1) The copy ends when two tape marks or a blank medium is
encountered while reading the tape.
Note (2) When copying from the tape to the hard disk, make sure no
file with the same name already exists. If any file with the same
name already exists, it won’t be overwritten.

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 Utilities
Tape Copy (CopyMedia) > Examples

Examples
> CopyFile 2 3 copy one file from device 2
1
to device 3.
> CopyFile 5 /dir/filename copy one file from device 5
to /dir/filename.
> CopyFile /dir/filename 5 copy one file from /dir/
filename to device 5 using
default blocking length
(256 kB).
> CopyFile /dir/filename 5 0 copy one file from /dir/
filename to device 5 with no
trace blocking.
> CopyFile /dir/filename 5 100000 copy one file from /dir/
filename to device 5 using
100000 bytes as blocking
length.
> CopyMedia 4 1 copy all files from device 4
to 1.
> CopyMedia 2 /dir copy all files from device 2
to /dir.
> CopyMedia /dir 2 copy all files from /dir to
device 2 using default
blocking length (256 kB).
> CopyMedia /dir 2 0 copy all files from /dir to
device 2 without trace
blocking.
> CopyMedia /dir 2 100000 eom copy all files from /dir to
device 2, using 100000
bytes as blocking length,
and close the tape with two
EOFs.

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Tape Copy (CopyMedia) > Examples

Note If the requested blocking length exceeds 256 kbytes, the

blocking length actually used will be 256 kbytes.

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 Utilities
“Copy+” software tool > General

“Copy+” software tool 1

In order to copy SEGD files from a NAS system to a tape, you can use
the Copy+ software tool available from SERCEL.
In this section:
• General (page 21)
• Installation (page 22)
• Accessing NAS disks (page 26)
• Copy+ version 3.0 (page 30)
• Typical throughput (page 35)
• Earlier Copy+ versions (page 38)

General
• For a 3590 E1A tape drive to work properly with Copy+, you have to
change the tape drive’s configuration settings to be as shown below
(you will have to revert to the initial settings when the tape drive is
used with the recording system):
CE OFFLINE MODE
CONFIG_INSTALL
DRV_OPTIONS
DRV FEATURES: E1A 3494 RS422 ATT
SCSI CONFIG: AUTOSHARE ENABLED
(Restart the tape drive).
• For the list of compatible tape drives, see the manual provided with
the COPY+ tool.
• If the Copy+ window is already open when you power up a tape
drive, the drive may take some time to appear in the window. It may
take less time to refresh the window if you close it and open it again.

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“Copy+” software tool > Installation

Installation

Hardware
• Personal computer with the following minimum configuration:
- Pentium III;
- 256-Mbyte RAM;
- 1024 x 768 display;
- Ethernet interface (1Gb recommended);
- Adaptec SCSI host adapter AHA 29XX, or Qlogic Fibre
Channel 294X HBA, depending on which type of tape drive is
used;
- Microsoft Windows 2000 or XP, or Seven (32-bit).
• Tape drive (3592, 3590).

Installing Copy+
Windows host
1. Install Copy + software (this also installs Sentinel software);
2. Plug the dongle into a USB port;
3. Reboot the PC.

Linux host
1. Install Copy+ software on the computer.
2. Plug the dongle into a USB port.
3. Reboot the PC.

Connecting a tape drive (3592, 3590)

Each time you connect a new tape drive to the PC:
1. Power-on the tape drive first.
2. Boot up the PC.
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 Utilities
“Copy+” software tool > Installation

Setting the personal computer’s IP address

Windows XP
1
For the NAS disk to be visible to the personal computer, you have to
change the IP address of the PC to be something like 172.27.128._.
1. From the Start menu, choose Settings, then Network
Connections.

Figure 1-1

2. Right-click on the Local Area Connection and select Properties.

3. Click on Internet Protocol (TCPIP) in the list box and then click
on the Properties button.
4. Choose “Use the following IP address”.
5. In the IP address field, enter the IP address you want to assign to
the PC on the 172.27.128._ network (e. g. 172.27.128.99).
6. In the Subnet mask field, enter 255.255.255.0.

172.27.128.99
255.255.255.0

Figure 1-2

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“Copy+” software tool > Installation

Windows7
1. Select Control Panel > Network and Internet > Network and
Sharing Center > Change adapter settings.

Figure 1-3

2. Double-click on the Local Area Connection interface. In the

Local Area Connection Status window, click Properties.
3. In the Local Area Connection Properties box, select Internet
Protocol Version 4 (TCP/IPv4) and click Properties.

Figure 1-4

4. Choose “Use the following IP address”.

5. In the IP address field, enter the IP address you want to assign to
the PC on the 172.27.128._ network (e. g. 172.27.128.99).
6. In the Subnet mask field, enter 255.255.255.0. Click OK.

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 Utilities
“Copy+” software tool > Installation

Linux
To change the IP address, do the following: 1
1. From the System menu, select Administration and then
Network. Enter the password for the root user account if the
system asks you to do so.
2. In the Network Configuration window, choose the eth0 network
interface and click Configure (enter the password for the root
user account if the system asks you to do so).

Figure 1-5

3. In the Network Configuration window, double-click on the eth0

network interface.
4. Choose Statically set IP addresses.
5. In the IP address field,
enter the IP address you
want to assign to the
Client computer on the
172.27.128._ network
(e. g. 172.27.128.99)..
6. In the Subnet mask field,
172.27.128.2
enter 255.255.255.0.
Click OK.

Figure 1-6

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1 Utilities
“Copy+” software tool > Accessing NAS disks

Accessing NAS disks

Windows 7
1. In the Explorer window right-click on the Computer icon and
select Map Network Drive.

Figure 1-7

2. In the Folder field, type the path to the NAS folder containing the
SEGD files to copy (for example \\172.27.128.41\segd).

Figure 1-8

3. Click Finish.
4. In the log-in window that shows up:
- NAS4000: log in as qc with usernas as password.
- Intellique NAS type: log in as storiq with spider77 as password.

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“Copy+” software tool > Accessing NAS disks

Windows XP
1. Connect the user network port of the NAS disk to the PC. See the
1
428XL Installation Manual for details on the network interface
assignment, depending on which NAS model you have.
2. In the Explorer window’s address field, type in:
\\172.27.128.41 (or 42). Press Return.
3. In the log-in window that shows up:
- NAS4000: log in as qc with usernas as password.
- Intellique NAS type: log in as storiq with spider77 as password.
As a result, the /mnt/raid partition of the NAS disk, with an
“segd” directory, is visible to the PC.
4. Copy the pathname prompted in the address field
\\172.27.128.41\segd

Copy

Figure 1-9

5. Select “Map Network Drive” from the “Tools” menu in the

Explorer window.
6. Paste the pathname into the “Folder” field.

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1 Utilities
“Copy+” software tool > Accessing NAS disks

Paste

Figure 1-10

As a result, the NAS disk is attached to the computer’s file hierarchy.

Figure 1-11

Linux
NAS4000
1. Unless the “nas4000” directory already exists in the tmp
directory, create it as follows:
cd /tmp (Return)
mkdir nas4000 (Return)
chmod 777 nas4000 (Return)
(the content of the tmp directory is deleted each time you power
off the computer).

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 Utilities
“Copy+” software tool > Accessing NAS disks

2. Assuming the IP address of the NAS is 172.27.128.41, type the

following commands in a Terminal window: 1
su (Return)
administrator (Return)
/bin/mount -t nfs -o hard 172.27.128.41:/mnt/raid /tmp/nas4000

NAS Intellique
1. Unless the “intellique0” directory already exists in the tmp
directory, create it as follows:
cd /tmp (Return)
mkdir intellique0 (Return)
chmod 777 intellique0 (Return)
(the content of the tmp directory is deleted each time you power
off the computer).
2. Assuming the IP address of the NAS is 172.27.128.41, type the
following commands in a Terminal window:
su (Return)
administrator (Return)
/bin/mount -t nfs -o hard 172.27.128.41:/mnt/raid /tmp/intellique0

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1 Utilities
“Copy+” software tool > Copy+ version 3.0

Copy+ version 3.0

Main window Ap
pe
n

Inse
d

rt

Tape to which
to copy

List of files to copy

Figure 1-12

The top left panel allows you to browse through the attached disk. the
top right panel shows the available tape drives. The tabs below these
panels allow you to choose the type of job to do (Copy disk files to tape,
Copy tape files to disk, etc.).

Settings
The Settings tab allows you to Save and Load your preferred job
options and customize them as required.

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 Utilities
“Copy+” software tool > Copy+ version 3.0

In order to preclude any problem in reading tapes, be sure the “Blocking

record” option is disabled in Disk to Tape settings. 1
Note that the “Verify copy” option will compare the file copy with the
original file to check for any error.

Leave this option

unticked

Figure 1-13 Disk to Tape settings

Figure 1-14 Main settings

Note that the “Compressed” option is intended for compression by the

tape drive itself (Copy+ does not perform any compression).

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1 Utilities
“Copy+” software tool > Copy+ version 3.0

Copying files from a disk to a tape

Open the Copy+ main window (you have to open a new Copy+ main
window each time you want to generate a new tape).
WARNING
Load a blank tape or be sure not to inadvertently erase any file on it.
1. Click on the “Copy disk files to tape” tab.
2. Select the tape drive to which you want to copy files (double-click
on its icon in the top right panel, or drag and drop it to the Targets
panel).
3. In the top left panel, select the directory containing the files to
copy. You can drag and drop the directory to the list box under the
tabs, or open the directory and select one or more files to copy.
(Drag and drop to the bar above the list appends the directory or
file; drag and drop to the list box inserts the directory or file).
Note that right-clicking on an SEGD file in the list box opens a
“Properties” window displaying information extracted from the
file’s header.

Figure 1-15

4. Click START to launch copy process.

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“Copy+” software tool > Copy+ version 3.0

Copying from tape to disk or tape to tape

1

Figure 1-16

Figure 1-17

Comparing tapes

Figure 1-18

Right-clicking on a released tape drive opens a “Utilities” window that

allows you to dump files from the tape so that you can check for
integrity of records on that tape. Other helpful functions are also
available (to rewind, unload the tape, etc).

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“Copy+” software tool > Copy+ version 3.0

Figure 1-19

Log files

Used to browse through log files stored in

Program Files (x86)\CAPMEDIA\COPY+ V3.0\LOG

Figure 1-20

For details, see the manual provided with the Copy+ tool.

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 Utilities
“Copy+” software tool > Typical throughput

Typical throughput
Below is the typical throughput (average throughput, inclusive of tape
1
rewind time) achieved with the following configuration:
• Z400 HP computer, 6 GB RAM;
• OS: RedHat 5.4 Linux (recommended), or Windows 7 (64 bits);
• COPY+ V3.0.0;
• NAS4000;
• Tape Drive: 3592 E06.

Motherboard
Ethernet port

Gigabit Dual network Graphics QLE2462 card

interface card card (Two Fibre Channel ports)

Figure 1-21 HP Z400

Standard copy from a NAS4000 to a tape drive

NAS4000

Drive 10

172.27.128.41

Operating System Ethernet port Average throughput

RedHat 5.4 Motherboard 91 MB/s.

Figure 1-22 Copy from a NAS4000 to a tape drive

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1 Utilities
“Copy+” software tool > Typical throughput

Standard copy from a NAS4000 to two tape drives

Drive 10
NAS4000

Drive 20
(backup)
172.27.128.41

Operating System Ethernet port Average throughput

Windows 7 Add-on card 50 MB/s.

Figure 1-23 Two backup copies from one NAS4000

Copy from a “virtual NAS” to a tape drive

428XL V5.14 (or above) allows grouping two or more NAS4000 units
into a “Virtual NAS” for faster recording.
After loading the files from each NAS4000 making up the “Virtual
NAS”, you must rearrange the files in the list box, by sorting them by
creation date for example, so that the split virtual tape can be
concatenated on each tape drive.

Virtual NAS #1

File Num. NAS4000

1
3
5 Drive 10 File Num.
7 1
etc. 2
172.27.128.41 3
4
File Num.
etc.
2
4
6 Operating System Ethernet port Average throughput
8
etc. 172.27.128.42 RedHat 5.4 Motherboard 80 MB/s

Windows 7 Add-on card 48 MB/s.

Figure 1-24 Copy from a virtual NAS4000 to a tape drive

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 Utilities
“Copy+” software tool > Typical throughput

Copy from a “virtual NAS” to two tape drives

1
Virtual NAS #1
File Num.
File Num. NAS4000 1
1 Drive 10 2
3 3
5 4
7 etc.
etc.
172.27.128.41
File Num.
File Num. 1
2 2
4 3
6 Drive 20 4
8 (backup) etc.
etc. 172.27.128.42

Operating System Ethernet port Average throughput

RedHat 5.4 Motherboard 30 MB/s (see Note below)

Windows 7 Add-on Ethernet card 47 MB/s

Figure 1-25 Two backup copies from a Virtual NAS

Note Use an add-on Ethernet card to increase the bit rate.

Copy from one NAS4000 using two Copy+ windows

Drive 10

NAS4000

Drive 20

172.27.128.41

Operating System Ethernet port Average throughput

Drive 10: 42 MB/s.

Windows 7 Motherboard
Drive 20: 46 MB/s.

Figure 1-26 Using two Copy+ windows

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1 Utilities
“Copy+” software tool > Earlier Copy+ versions

Earlier Copy+ versions

Copy+ option settings

In order to preclude any problem in reading tapes, be sure the “Blocking
record” option in the Copy + “Setting” window is disabled.

Settings

Leave this option

unticked

Figure 1-27

Generating a tape using Copy+

Open the Copy+ main window (you have to open a new Copy+ main
window each time you want to generate a new tape).
WARNING
Load a blank tape or be sure not to inadvertently erase any file on it.
1. Click on the “Disk to Tape” icon.

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 Utilities
“Copy+” software tool > Earlier Copy+ versions

(1) Copy from disk to tape

1
(2) Choose tape drive

(3) Open directory

(4) Select files (5) Drag and drop

to copy

(6) Click to launch

Figure 1-28

2. Select the tape drive to which you want to copy files (double-click
on its icon).
3. Open the directory containing the files to copy. (Right-clicking on
an SEGD file in the list box opens a “Properties” window
displaying information extracted from the file’s header).
4. In the list box, select the files to copy.
5. Drag and drop the selected files to the destination tape drive icon.
6. Click GO to start copying.
A log view is available that provides information on each tape
generated.

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1 Utilities
“Copy+” software tool > Earlier Copy+ versions

Open log view

Figure 1-29

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 Utilities
“Copy+” software tool > Earlier Copy+ versions

Right-clicking on a released tape drive opens a “Utilities” window that

allows you to dump files from the tape so that you can check for 1
integrity of records on that tape. Other helpful functions are also
available (to rewind, unload the tape, etc).

Figure 1-30

For details, see the manual supplied together with the Copy+ software
tool.

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1 Utilities
Trace Polarity >

Trace Polarity
The procedure below allows you to invert the polarity of traces from
geophones (not for Auxiliary traces, nor for Instrument tests), or disable
the polarity inversion, as required.
To enable trace polarity inversion, do the following:
1. Go to the snSol/workSpace/xml/dic/ directory on the server.
2. Open the prm408Edit.user428.svr428.xml file. Find the
following command line
.set prmINVERSED_GEOPHONE_POLARITY=0
and change it to
.set prmINVERSED_GEOPHONE_POLARITY=1
3. Save the file.
4. Stop the server and restart it.
The following message appearing in the status mail pane of the
jOperation window means that trace polarity inversion is enabled.

Figure 1-31

If trace polarity inversion is enabled and you want to disable it, use the
same procedure to change the
prmINVERSED_GEOPHONE_POLARITY variable from 1 to 0.

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Chapter

2 Playback Filters

This chapter includes the following sections:

• Introduction (page 44)

• Filter charts (page 45)

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2 Playback Filters
Introduction >

Introduction
The attenuation rate of each playback filter is independent of the cutoff
frequency in the dB/Hz diagram. Therefore, the charts shown in this
chapter, for a cutoff frequency of 50 Hz, allow filters to be extrapolated
to any cutoff frequency by simply shifting each curve along the Hz
scale.
Combinations of the three filters (Low-cut, Notch, High-cut) are
permitted.

F F

Low cut HIgh cut

Band pass

Low cut High cut

Figure 2-1

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 Playback Filters
Filter charts >

Filter charts
Unite
CMXL playback
y filter
Filter frequency 50 Hz, Sample Rate 1 ms
Amplitude Spectrum 2
0

−10

−20

−30
Low−cut (dB)

−40

−50

−60

−70

−80
0 50 100 150 200 250 300 350 400 450 500
Frequencies (Hz)

Figure 2-2 Low-cut, 1 ms

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2 Playback Filters
Filter charts >

Unite
CMXL playback filter
Filter frequency 50 Hz, Sample Rate 1 ms
Amplitude Spectrum

−10

−20

−30
High−cut (dB)

−40

−50

−60

−70

−80
0 50 100 150 200 250 300 350 400 450 500
Frequencies (Hz)

Figure 2-3 High-cut, 1ms

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 Playback Filters
Filter charts >

Unite
CMXLplayback filter
Filter frequency 50 Hz, Sample Rate 1 ms
Amplitude Spectrum

−10
0
2
−20

−30

−40
Notch (dB)

−50

−60

−70

−80

−90

−100
0 50 100 150 200 250 300 350 400 450 500
Frequencies (Hz)

Figure 2-4 Notch, 1 ms

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2 Playback Filters
Filter charts >

Unite
CMXL playback
y filter
Filter frequency 50 Hz, Sample Rate 2 ms
Amplitude Spectrum

−10

−20

−30
Low−cut (dB)

−40

−50

−60

−70

−80
0 50 100 150 200 250
Frequencies (Hz)

Figure 2-5 Low-cut, 2 ms

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 Playback Filters
Filter charts >

Unite
CMXL playback filter
Filter frequency 50 Hz, Sample Rate 2 ms
Amplitude Spectrum

0
2
−10

−20

−30
High−cut (dB)

−40

−50

−60

−70

−80
0 50 100 150 200 250
Frequencies (Hz)

Figure 2-6 High-cut, 2 ms

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2 Playback Filters
Filter charts >

Unite
CMXLplayback filter
Filter frequency 50 Hz, Sample Rate 2 ms
Amplitude Spectrum

−10

−20

−30

−40
Notch (dB)

−50

−60

−70

−80

−90

−100
0 50 100 150 200 250
Frequencies (Hz)

Figure 2-7 Notch, 2 ms

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 Playback Filters
Filter charts >

Unite
CMXLplayback filter
Filter frequency 50 Hz, Sample Rate 4 ms
Amplitude Spectrum

−10
2
−20

−30
Low−cut (dB)

−40

−50

−60

−70

−80

−90
0 20 40 60 80 100 120
Frequencies (Hz)

Figure 2-8 Low-cut, 4 ms

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2 Playback Filters
Filter charts >

Unite
CMXLplayback filter
Filter frequency 50 Hz, Sample Rate 4 ms
Amplitude Spectrum

−10

−20

−30
High−cut (dB)

−40

−50

−60

−70

−80

−90
0 20 40 60 80 100 120
Frequencies (Hz)

Figure 2-9 High-cut, 4 ms

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 Playback Filters
Filter charts >

Unite playback filter

CMXL
Filter frequency 50 Hz, Sample Rate 4 ms
Amplitude Spectrum

−10
0
2
−20

−30

−40
Notch (dB)

−50

−60

−70

−80

−90

−100
0 20 40 60 80 100 120
Frequencies (Hz)

Figure 2-10 Notch, 4 ms

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2 Playback Filters
Filter charts >

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Chapter

3 Channel Filter Response

Charts

This chapter includes the following sections:

• Linear Phase filter type (page 56)

• Minimum Phase filter type (page 76)

NOTE: See also the files in the “impResp” folder on the

server computer, containing typical impulse response
samples for each sample rate and filter type.

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3 Channel Filter Response Charts
Linear Phase filter type >

Linear Phase filter type

Figure 3-1 (LIN) Impulse response @ 0.25 ms

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 Channel Filter Response Charts
Linear Phase filter type >

Figure 3-2 (LIN) FT phase, linear frequency scale @ 0.25 ms

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3 Channel Filter Response Charts
Linear Phase filter type >

Figure 3-3 (LIN) FT modulus, linear frequency scale @ 0.25 ms

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 Channel Filter Response Charts
Linear Phase filter type >

Figure 3-4 (LIN) FT modulus, log frequency scale @ 0.25 ms

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3 Channel Filter Response Charts
Linear Phase filter type >

Figure 3-5 (LIN) Impulse response @ 0.5 ms

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 Channel Filter Response Charts
Linear Phase filter type >

Figure 3-6 (LIN) FT phase, linear frequency scale @ 0.5 ms

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3 Channel Filter Response Charts
Linear Phase filter type >

Figure 3-7 (LIN) FT modulus, linear frequency scale @ 0.5 ms

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 Channel Filter Response Charts
Linear Phase filter type >

Figure 3-8 (LIN) FT modulus, log frequency scale @ 0.5 ms

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3 Channel Filter Response Charts
Linear Phase filter type >

Figure 3-9 (LIN) Impulse response @ 1 ms

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 Channel Filter Response Charts
Linear Phase filter type >

Figure 3-10 (LIN) FT phase, linear frequency scale @ 1 ms

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3 Channel Filter Response Charts
Linear Phase filter type >

Figure 3-11 (LIN) FT modulus, linear frequency scale @ 1 ms

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 Channel Filter Response Charts
Linear Phase filter type >

Figure 3-12 (LIN) FT modulus, log frequency scale @ 1 ms

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3 Channel Filter Response Charts
Linear Phase filter type >

Figure 3-13 (LIN) Impulse response @ 2 ms

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 Channel Filter Response Charts
Linear Phase filter type >

Figure 3-14 (LIN) FT phase, linear frequency scale @ 2 ms

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3 Channel Filter Response Charts
Linear Phase filter type >

Figure 3-15 (LIN) FT modulus, linear frequency scale @ 2 ms

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 Channel Filter Response Charts
Linear Phase filter type >

Figure 3-16 (LIN) FT modulus, log frequency scale @ 2 ms

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3 Channel Filter Response Charts
Linear Phase filter type >

Figure 3-17 (LIN) Impulse response @ 4 ms

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 Channel Filter Response Charts
Linear Phase filter type >

Figure 3-18 (LIN) FT phase, linear frequency scale @ 4 ms

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3 Channel Filter Response Charts
Linear Phase filter type >

Figure 3-19 (LIN) FT modulus, linear frequency scale @ 4 ms

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 Channel Filter Response Charts
Linear Phase filter type >

Figure 3-20 (LIN) FT modulus, log frequency scale @ 4 ms

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3 Channel Filter Response Charts
Minimum Phase filter type >

Minimum Phase filter type

Figure 3-21 (MIN) Impulse response @ 0.25 ms

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 Channel Filter Response Charts
Minimum Phase filter type >

Figure 3-22 (MIN) FT phase, linear frequency scale @ 0.25 ms

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3 Channel Filter Response Charts
Minimum Phase filter type >

Figure 3-23 (MIN) FT modulus, linear frequency scale @ 0.25 ms

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 Channel Filter Response Charts
Minimum Phase filter type >

Figure 3-24 (MIN) FT modulus, log frequency scale @ 0.25 ms

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3 Channel Filter Response Charts
Minimum Phase filter type >

Figure 3-25 (MIN) Impulse response @ 0.5 ms

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 Channel Filter Response Charts
Minimum Phase filter type >

Figure 3-26 (MIN) FT phase, linear frequency scale @ 0.5 ms

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3 Channel Filter Response Charts
Minimum Phase filter type >

Figure 3-27 (MIN) FT modulus, linear frequency scale @ 0.5 ms

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 Channel Filter Response Charts
Minimum Phase filter type >

Figure 3-28 (MIN) FT modulus, log frequency scale @ 0.5 ms

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3 Channel Filter Response Charts
Minimum Phase filter type >

Figure 3-29 (MIN) Impulse response @ 1 ms

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 Channel Filter Response Charts
Minimum Phase filter type >

Figure 3-30 (MIN) FT phase, linear frequency scale @ 1 ms

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3 Channel Filter Response Charts
Minimum Phase filter type >

Figure 3-31 (MIN) FT modulus, linear frequency scale @ 1 ms

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 Channel Filter Response Charts
Minimum Phase filter type >

Figure 3-32 (MIN) FT modulus, log frequency scale @ 1 ms

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3 Channel Filter Response Charts
Minimum Phase filter type >

Figure 3-33 (MIN) Impulse response @ 2 ms

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 Channel Filter Response Charts
Minimum Phase filter type >

Figure 3-34 (MIN) FT phase, linear frequency scale @ 2 ms

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3 Channel Filter Response Charts
Minimum Phase filter type >

Figure 3-35 (MIN) FT modulus, linear frequency scale @ 2 ms

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 Channel Filter Response Charts
Minimum Phase filter type >

Figure 3-36 (MIN) FT modulus, log frequency scale @ 2 ms

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3 Channel Filter Response Charts
Minimum Phase filter type >

Figure 3-37 (MIN) Impulse response @ 4 ms

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 Channel Filter Response Charts
Minimum Phase filter type >

Figure 3-38 (MIN) FT phase, linear frequency scale @ 4 ms

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3 Channel Filter Response Charts
Minimum Phase filter type >

Figure 3-39 (MIN) FT modulus, linear frequency scale @ 4 ms

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 Channel Filter Response Charts
Minimum Phase filter type >

Figure 3-40 (MIN) FT modulus, log frequency scale @ 4 ms

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3 Channel Filter Response Charts
Minimum Phase filter type >

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Chapter

4 Source controller interfacing

This chapter describes the communication protocols of

source controllers used with the 428XL. It includes the
following sections:

• 428XL slave operations (page 98)

• ADVANCE II source controller (page 100)
• Shot Pro Blaster (or equivalent) (page 101)
• Shallow Sequencer (page 105)
• MACHA blaster (page 107)
• SGD-S blaster (page 108)
• Data fields updated by source controllers (page 111)

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4 Source controller interfacing
428XL slave operations > Manual mode

428XL slave operations

Manual mode
The purpose of this paragraph is to describe operations with a 428XL
control module (LCI-428) connected to a source controller system
acting as a master controller.
The source controller system is connected to one of the BLASTER
connectors of the 428XL control module and uses the following signals:
EXTERNAL GO, FO and TB.

External Go

LCI-428 FO Source
controller
TB

BLASTER
connector

Figure 4-1

In the Operation main window:

1. Choose “Manual” in the operating setup (select Options from
the Setup menu and then click on the Operating tab).
2. Select a row in the operation table to form the selected spread and
to go to the field update mode.
Each time the EXTERNAL GO signal is raised, the 428XL exits the
field update mode, sends the FO and waits for the TB.
The 428XL receiving the TB causes the acquisition to start. After the
acquisition is complete, the spread corresponding to the next row in the
operation table is formed and the system goes to the field update mode,
thus allowing a new shot to be taken.
Note The FO can be used by the source controller to see if the 428XL
is ready when the TB is generated.

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 Source controller interfacing
428XL slave operations > Continuous mode

Continuous mode
To decrease the time needed by the 428XL between the moment it
receives the EXTERNAL GO and the moment it is ready to accept the
TB:
1. Select “Continuous” in the operating setup (select Options from
the Setup menu and then click on the Operating tab). If
Impulsive mode is needed, then select an “Impulsive Stack”
process type with a single acquisition. 4
2. Set the delay between VPs to the maximum value.
The 428XL control module operates in continuous mode but the delay
between two consecutive acquisitions is infinite: the EXTERNAL GO
aborts the delay and prepares for acquisition.

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4 Source controller interfacing
ADVANCE II source controller >

ADVANCE II source controller

Only the FO and TB signals are used. See 428XL Installation Manual
(Connectors).

FO Advance II
LCI-428 ESG
TB

BLASTER
connector

Figure 4-2

You can also use the XDEV2 port of an LAUX-428.

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 Source controller interfacing
Shot Pro Blaster (or equivalent) > Installation

Shot Pro Blaster (or equivalent)

Below is the protocol between the Shot Pro blaster (or equivalent such
as SGS or BoomBox) and SERCEL's 428XL. When the 428XL is in
Shot Pro mode, the messages to/from the source controller are
transported through the serial port available on the BLASTER
connector of the 428XL control module (LCI-428).

Installation 4
RS232

FO
LCI-428 Shot Pro
TB

BLASTER
connector

Figure 4-3

The RS232 line connected from the Shot Pro controller should be
connected to the serial port available on the BLASTER connector of the
LCI-428.
Time Break from the Shot Pro controller should be connected to Time
Break in the Recording System.
You can also use the XDEV2 port of an LAUX-428.
See 428XL Installation Manual (Connectors).

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4 Source controller interfacing
Shot Pro Blaster (or equivalent) > Protocol for data from 428XL to Shot Pro

Protocol for data from 428XL to Shot Pro

*SP#.../SL#.../SN#.../SI#.../SEQ#...<CR><LF>

Where Min. Max.

Shot Number SP#sssss 1 99999
Source Point Line SL#lllll.l 0.0 99999.9
Source Point number SN#lllll.l 0.0 99999.9
Source Point Index SI#1 1 9
Blaster number SEQ#ss 01 16

Protocol for Data from Shot Pro to 428XL

*SHOTPRO SP#.../SL#.../SN#.../SI#.../SEQ#.../STA:../CTB:00.000/
UH:000.0
where
SHOTPRO String to identify your shooting system
Min. Max.
Shot Number SP#sssss 1 99999
Source Point Line SL#lllll.l 0.0 99999.9
Source Point Number SN#lllll.l 0.0 99999.9
Source Point Index SI#1 1 9
Blaster Number SEQ#ss 01 16
Blaster Status STA:s 0 7
Confirmed Time Break CTB:cc.ccc 00.000 33.000
Uphole Time (FirstPick) UH:uuu.u 000.0 999.5 (.5 ms step)

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 Source controller interfacing
Shot Pro Blaster (or equivalent) > Blaster Status Codes

This message will immediately be followed by the GPS $GPGGA

message if GPS is used with the Shot Pro. If GPS is not used, the above
message will be followed by a <CR><LF>. If GPS is used, the
$GPGGA message will be followed by <CR><LF>.

Note "After the Shot" the acquisition is 3 seconds after the time
break. It takes 3 seconds after the shot to get all of the data sent
back and decoded from the radio. 4
Note The Shot Pro Encoder to 428XL ASCII message will not be
sent until the radio data has been decoded.

Blaster Status Codes

0 = No Fire (Radio Status Received but box did not fire).
1 = Shot Fired and Status received. All OK.
2 = No Status received (Radio Problem).
3 = Status Received but no Uphole analog data (Radio problem).
4 = Decoder Low Battery warning.
5 = Up Hole Geophone resistance not measured or out of tolerance.
6 = Cap resistance not measured or out of tolerance.
7 = Automatic Uphole Time Pick not successful.

Terminology
CONFIRMED TIME BREAK is the amount of time the current flow
to the blasting cap was greater than 4 amps. The start of current flow is
set up to start at Time Break in the Shot Pro Encoder.
UPHOLE TIME (FIRST PICK) is determined by analysis of the
Uphole Geophone signal. Selected algorithms are used to pick the time
the pulse from the blast is detected Uphole.

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4 Source controller interfacing
Shot Pro Blaster (or equivalent) > Examples

Examples
Below are examples of messages from a Shot Pro encoder to the
428XL:

*SHOTPRO SP# 283/SL# 41.2/SN# 13.5/SI#1/SEQ#7/STA:1/

CTB:01.868/UH:041.0
$GPGGA,161050,3645.1926,N,09705.0707,W,2,06,1,+0321.0,M,,M,,

With no GPS data

*SHOTPRO SP# 283/SL# 41.2/SN# 13.5/SI#1/SEQ# 7/STA:6/
CTB:01.851/UH:041.0 <CR><LF>
The above message has a status of 6 (Cap resistance not measured or out
of tolerance).

Message indicating a radio problem

*SHOTPRO SP# 283/SL# 41.2/SN# 13.5/SI#1/SEQ# 7/STA:2/
CTB:00.000/UH:000.0

Results Processing
The data from the Shot Pro blaster are used to update the shooter
window in the 428XL OPERATION main window:
• Shot Pro Blaster status
• Uphole Time
• Confirmed TB.
The Shot Pro data are recorded in the User Header, Manufacturer
Header and in SPS files.
If Shot Point position data are available, the Shot point is
geographically displayed in real time in the 428XL POSITIONING
main window.

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 Source controller interfacing
Shallow Sequencer > Protocol for Data from Shallow Sequencer to 428XL

Shallow Sequencer
Below is the protocol between the Shallow Sequencer and SERCEL's
428XL. The serial data from the Shallow Sequencer to the 428XL is
transported through the serial port available on the BLASTER
connector of the 428XL control module (LCI-428). You can also use the
XDEV2 port of an LAUX-428.

RS232 4
FO Shallow
LCI-428 Sequencer
TB

BLASTER
connector

Figure 4-4

Protocol for Data from Shallow Sequencer to 428XL

SPS <80 characters ><LF>
This record type contains details at the position of the shotpoint at the
time of recording.
Item Definition of field Cols. Format Min to Max Default Units
1 Record identification 1-1 A1 "S" None
2 Line name (left adj) 2-17 4A4 Free None
3 Point number (r adj) 18-25 2A4 Free None
4 Point index 26-26 I1 1-9
5 Point code (*) 27-28 A2 see below None
6 Static correction 29-32 I4 -999 - 999 Blank ms
7 Point Depth 33-36 F4.1 0 -99.9 None Metre
8 Seismic datum 37-40 I4 -999 - 999 None Metre
9 Uphole time 41-42 I2 0 99 Blank ms
10 Water depth (#) 43-46 F4.# 0 to 99.9/9999 Blank Metre
11 Map grid easting 47-55 F9.1 None
12 Map grid northing 56-65 F10.1 None
13 Surface Elevation 66-71 F6.1 -999.9 -9999.9 None Metre
14 Day of year 72-74 I3 1 - 999 None
15 Time hhmmss 75-80 3l2 000000-235959 None

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4 Source controller interfacing
Shallow Sequencer > Results Processing

(#) Water depth should be read in as F5.1 to allow for 4 character

decimal and integer values.
(*) Example Point codes:"PM" - permanent marker, "KL" - kill or
omit point.
"V1".."V9" "E1".."E9" "A1".."A9"..""W1".."W9",
"S1''..''S9". - source codes

Results Processing
The data from the Shallow Sequencer are recorded to the User Header,
Manufacturer Header and in the SPS Source file.

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 Source controller interfacing
MACHA blaster > Protocol for data from MACHA blaster to 428XL

MACHA blaster
Below is the protocol between a MACHA blaster box and SERCEL's
428XL. The serial data from the MACHA blaster box to the 428XL is
transported through the serial port available on the BLASTER
connector of the 428XL control module (LCI-428).

LCI-428
RS232

FO MACHA
4
TB

BLASTER
connector

Figure 4-5

You can also use the XDEV2 port of an LAUX-428.

Protocol for data from MACHA blaster to 428XL

The MACHA box sends an ASCII message with the following format:
uuuuiissm...m
uuuu Uphole time (hundreds of microseconds)
ii Blaster identification (blaster box number)
ss Blaster status 04 = Shot OK.
05 = Shot OK, battery LOW.
@0 = No Fire.
@1 = No Fire, battery LOW.
00 = No Fire (MACHA did not receive
any Firing Order).
m..m ASCII message from GPS, if any.
To set the MACHA box to ASCII mode, see MACHA documentation.

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4 Source controller interfacing
SGD-S blaster > SGD-S protocol

SGD-S blaster
The messages to/from the SGDS controller are transported through the
serial port available on the BLASTER connector of the 428XL control
module (LCI-428).

RS232

LCI-428 FO SGDS
Controller
TB

BLASTER
connector

Figure 4-6

You can also use the XDEV2 port of an LAUX-428.

SGD-S protocol

Ready status (SGD-S Controller to 428XL)

After a shooter is ready (i. e. after capturing the GPS position, backing
away from the shot hole location, pressing the START button, and after
the firing circuit capacitor is charged) the blaster transmits its status to
the SGD-S Controller which in turn transmits the following ASCII
string to the recording system:
• If no GPS location is available:
*SGD-S SEQ#<n><CR><LF>
Example: [*SGD-S SEQ#2<CR><LF>]
• If the GPS location is available:
*SGD-S SEQ#<n>$POS,<2>,<3>,<4>,<5><CR><LF>
Example:
[*SGD-S SEQ#2$POS,5450.898,N,08303.375,E<CR><LF>]

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 Source controller interfacing
SGD-S blaster > SGD-S protocol

Firing order (428XL to SGD-S Controller)

After the Observer clicks on Go in the Operation main window the HCI
transmits the following message to the Controller:
*SP#.../SL#.../SN#.../SI#.../SEQ#<n><CR><LF>
Example: [*SP#1289/SL#41.2/SN#13.5/SI#2/SEQ#1<CR><LF>]

Shot status
After shooting, the Controller transmits the following string to the
4
recording system:
• If no GPS location is available:
*SGD-S SP#.../SL#.../SN#.../SI#.../SEQ#<n>/STA:<s>/CTB:<c>/
UH:<u><CR><LF>
Example: [*SGD-S SP#1289/SL#41.2/SN#13.5/SI#2/SEQ#2/
STA:1/CTB:01.500/UH:015.3<CR><LF>]
• If the GPS location is available:
*SGD-S SP#.../SL#.../SN#.../SI#.../SEQ#<n>/STA:<s>/CTB:<c>/
UH:<u>$GPGGA,<1>,<2>,<3>,<4>,<5>,<6>,<7>,<8>,<9>,<10>,
<11>,<12>,<13>,<14><CR><LF>
Example: [*SGD-S SP#1289/SL#41.2/SN#13.5/SI#2/SEQ#2/
STA:1/CTB:01.500/
UH:015.3$GPGGA,051412.0,5450.898,N,08303.375,E,1,6,1.43,00
137,M,-036,M,,<CR><LF>]
Legend:
<n> Blaster Number, 1 to 4;
<s> Blaster Status,
0 = No Fire (Radio Status Received but box did not fire)
1 = Shot Fired and Status received. All OK
2 = No Status received (Radio Problem)
3 = Status Received but no Uphole analog data (Radio problem)

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SGD-S blaster > SGD-S protocol

7 = Automatic Uphole Time Pick not successful;

<c> Confirmed Time Break, 00.000 to 25.400 (0.1-ms step);
<u> Uphole Time, 000.0 to 199.9 (0.1-ms step), 200.0 in case
"Automatic Uphole Time Pick not successful"
<1> UTC of Position, hhmmss.s;
<2> Lattitude, llll.llll;
<3> N (North) or S (South);
<4> Longitude, yyyyy.yyyy;
<5> E (East) or W (West);
<6> GPS Quality Indicator: 0=No GPS, 1=GPS, 2=DGPS;
<7> Number of Satellites in Use, xx;
<8> HDOP, x.x;
<9> Antenna Altitude in Meters, x.x;
<10> M = Metres;
<11> Geoidal Separation in Meters, x.x;
<12> M = Metres;
<13> Age of Differential GPS Data, x.x;
<14> Differential Reference Station ID, 0000 to 1023.
SP Shot Number
SL Source Point Line
SN Source Point Number
SI Source Point Index
SEQ Blaster Number
STA Blaster Status
CTB Confirmed Time Break
UH Uphole Time

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 Source controller interfacing
Data fields updated by source controllers >

Data fields updated by source controllers

For each source controller supported, the table below gives the shot
information fields that are updated after intrepreting the messages
supplied by the source controller, in 428XL SEGD records.
• ♦ means that the field is updated after interpreting the message from
the source controller.
• “Default” means that the field is updated with the Setup parameters 4
from the GUI.
SEGD fields

Blaster Source Coords.

Blaster type Uphole Time Exten’d in Posi-
time Break XYZ Header tioning
Id Status Line # Point #
(3)

ShotPro (4)
or equivalent
♦ ♦ ♦ ♦ Default Default Default ♦ ♦ (2)

Shallow
♦ ♦ ♦ ♦ ♦ ♦
Sequencer

Macha ♦ ♦ ♦ Default Default Default ♦ ♦(2)

Other Default Default Default ♦ ♦ (2)
See Note (1)

Note (1): These fields are displayed in the Operation main window’s
results pane. The Blaster Status is displayed as an indicator light with
the following colour code:
- Blue No message or erroneous message received.
- Green Blaster OK.
- Orange Blaster OK, with a Warning.
- Red Blaster error.
Note (2): If the position of the shot point is received (in a $GPGGA
message) from these shooting systems, it is displayed in the Positioning
main window.

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4 Source controller interfacing
Data fields updated by source controllers >

Note (3):
Source XYZ SEGD fields SPS output

SEGD fields are updated because the Generate using SEGD

SPS position uses the appropriate projection. fields.

SEGD fields are NOT updated because the Generate by decoding the
position does not use the necessary
External Header and using
$GPGGA projection. The position is only copied into the the appropriate projection
External Header

Note (4): With a Shot Pro Encoder used via an LSS (Line Shooting
System), no field is updated because in that case the Encoder does not
return any serial message to the 428XL.

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Chapter

5 Instrument test record

recovery

This chapter provides the necessary formulas to recover test

results from test SEGD records. It includes the following
sections:

• General (page 114)

• Instrument Noise test (page 115)
• Instrument Distortion test (page 116)
• Instrument Gain and Phase tests (page 117)
• Instrument CMRR test (page 123)
• Instrument Crosstalk test (page 124)
• DSU-428 Gain and Phase test (page 125)

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5 Instrument test record recovery
General > Overview

General
Overview
Some of the instrument tests performed by the 428XL (Noise, Gain &
Phase, Distortion, CMRR and Crosstalk) can be recorded to tape as test
SEGD files. The formulas provided in this chapter allow you to
recompute the test results displayed on the HCI workstation with the
data from test SEGD records.
The number of samples used for the test computation depends on the
sampling rate
Sample Rate (ms) Number of samples
0.25 2048
0.5 2048
1 2048
2 1024
4 512

The first sample used for the computation starts at time 0 (the transient
resulting from the stimulus signal is not recorded).

Conventions used
In the formulas used to recompute test results with the data from a test
SEGD record, the following notations are used:
x RMS value in mV of the signal computed in the time domain.
x̂ i Complex value of a frequency line of the signal computed by
Fourier Transform.
x̂ i Modulus of complex value (RMS value of the line in mV).
Φ ( x̂ i ) Argument of complex value (phase in radian).
The RMS value ( x ) and complex value of a frequency line ( x̂ i ) of the
test signal are computed in mV from the SEGD trace samples using the
descaling multiplier of the corresponding Channel Set Descriptor.

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 Instrument test record recovery
Instrument Noise test >

Instrument Noise test

The noise is the energy of the signal above 3Hz.

To recover test results from a Noise test SEGD record, use the following
formula:
n 2
Noise( μV ) = 1000 × − x i
2
x 0

x RMS value of the signal. 5

x̂ i RMS value of frequency lines below 3Hz.
n Number of harmonic lines below 3 Hz.

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5 Instrument test record recovery
Instrument Distortion test >

Instrument Distortion test

The Distortion test signal is a 31.25 Hz sine wave with an amplitude of
97% of the FDU’s full scale.
Gain RMS test signal Peak test signal
400 388 mV. 548.7 mV.
1600 1552 mV. 2194.9 mV.

The distortion test result is the ratio in dB of the energy of harmonic

lines within the passband to the energy of the fundamental line.
To recover test results from a Distortion test SEGD record, use the
following formula:

 n 
 xˆ
2
 
Distortion(dB) = 20×log  
i
i =2
10 

|xˆ | 1 
 
x̂ 1 RMS value of the 31.25 Hz line.
x̂ i RMS value of harmonic lines at multiples of 31.25
Hz. (Max. 9 harmonic lines).

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 Instrument test record recovery
Instrument Gain and Phase tests >

Instrument Gain and Phase tests

A pulse is used as test signal. Three test sequences are used (T1, T2, T3):
50%
(% of generator
full scale)
0%

Tb T1 T2 T3 Te

Sample Rate
(ms)
T1 (ms) T2 (ms) T3 (ms) T1+T2+T3 (ms)
5
0.25 8 39 465 512
0.5 16 39 969 1024
1 32 38 1978 2048
2 64 36 1948 2048
4 128 40 1880 2048

Test pulse level (50% of generator full

Gain
scale)
400 353.5 mV.
1600 1214 mV.

The gain or phase error is obtained by comparing the channel response

and the theoretical response. The number of test frequencies used for
the computations (for the model and for the measured signal) depends
on the Sample Rate:
Sample
7.8125 Hz 15.625Hz 31.25 Hz 62.5 Hz 125 Hz 250 Hz 500 Hz
Rate (ms)
0.25 x x x x x x x
0.5 x x x x x x x
1 x x x x x x
2 x x x x x
4 x x x x

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5 Instrument test record recovery
Instrument Gain and Phase tests >

The error is computed for all the test frequencies, and the maximum
encountered is retained as final result.
The same acquisition is used to compute both the gain error and the
phase error.
To recover test results from a Gain & Phase test SEGD record, use the
following formulas:

Gain error:

 L × x i 
GainError (%) = 100 ×  − 1
 Tmod 

L Total length in seconds (T1+T2+T3).

Tmod Theoretical modulus of the frequency line.
x̂ i RMS value of the frequency line.

Phase error:

PhaseShift ( μs) =
(  i) − Targ
10 6 × Θ( x )
2 × π × Fi
Targ Theoretical argument at the Fi frequency.
Φ ( x̂ i ) Phase of frequency line at the Fi frequency.
Note For the theoretical modulus and argument of the test signal
recorded to tape (not including correction factors) see the tables
below.

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Instrument Gain and Phase tests >

Theoretical modulus for 1600 mV input scale gain (recorded test signal)
Sample Rate Frequency (Hz) 0.8 Lin 0.8 Min
0.25 7.8125 66.6215 66.6213
0.25 15.625 383.59 38.3586
0.25 31.25 12.9198 12.9192
0.25 62.5 9.97797 9.97608
0.25 125 1.93948 1.93819
0.25 250 1.76605 1.76307
0.25
0.5
500
7.8125
1.18135
66.6215
1.17648
66.6207
5
0.5 15.625 38.359 38.357
0.5 31.25 12.9198 12.9172
0.5 62.5 9.97792 9.97088
0.5 125 1.93944 1.93593
0.5 250 1.76585 1.75844
0.5 500 1.17994 1.14992
1 7.8125 65.45 65.4466
1 15.625 38.9862 38.9785
1 31.25 11.3145 11.3065
1 62.5 9.39886 9.38182
1 125 3.58325 3.56822
1 250 2.49432 2.43087
2 7.8125 62.9893 62.9768
2 15.625 39.9576 39.9293
2 31.25 7.79342 7.77929
2 62.5 7.1928 7.16263
2 125 5.06145 4.93268
4 7.8125 67.7527 677.048
4 15.625 37.6387 37.5705
4 31.25 14.3988 14.3384
4 62.5 10.1601 9.90157

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5 Instrument test record recovery
Instrument Gain and Phase tests >

Theoretical modulus for 400 mV input scale gain (recorded test signal)
Sample Rate Frequency (Hz) 0.8 Lin 0.8 Min
0.25 7.8125 16.6554 16.6553
0.25 15.625 9.58975 9.58965
0.25 31.25 3.22994 3.2298
0.25 62.5 2.49448 2.49401
0.25 125 0.484861 0.48454
0.25 250 0.441481 0.440737
0.25 500 0.295255 0.294039
0.5 7.8125 16.6554 16.6552
0.5 15.625 9.58975 9.58924
0.5 31.25 3.22994 3.2293
0.5 62.5 2.49447 2.49271
0.5 125 0.484852 0.483973
0.5 250 0.441432 0.439581
0.5 500 0.294903 0.287401
1 7.8125 16.3625 16.3617
1 15.625 9.74656 9.74462
1 31.25 2.82861 2.82661
1 62.5 2.34971 2.34544
1 125 0.895797 0.892039
1 250 0.623538 0.607675
2 7.8125 15.7473 15.7442
2 15.625 9.98939 9.98233
2 31.25 1.94835 1.94482
2 62.5 1.79819 1.79065
2 125 1.26534 1.23315
4 7.8125 16.9382 16.9262
4 15.625 9.40967 9.39261
4 31.25 3.5997 3.5846
4 62.5 2.54001 2.47538

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Instrument Gain and Phase tests >

Theoretical Phase for 1600 mV input scale gain (recorded test signal)
Sample Rate Frequency (Hz) 0.8 Lin 0.8 Min
0.25 7.8125 -1.35849 -1.40038
0.25 15.625 -2.71699 -2.80077
0.25 31.25 -2.29238 -2.45995
0.25 62.5 1.69846 1.36324
0.25 125 -2.88609 2.72611
0.25 250 -2.62908 2.30677
0.25
0.5
500
7.8125
-2.10526
-1.75119
1.42993
-1.83496
5
0.5 15.625 2.7808 2.61325
0.5 31.25 2.42001 2.08484
0.5 62.5 -1.44314 -2.11406
0.5 125 -2.88609 2.04982
0.5 250 -2.62908 0.906014
0.5 500 -2.10526 -1.83205
1 7.8125 -2.51205 -2.6796
1 15.625 1.25909 0.923918
1 31.25 -0.623406 -1.29433
1 62.5 -1.24679 -2.59407
1 125 -2.49339 1.04171
1 250 -1.84368 -1.57048
2 7.8125 2.24943 1.91426
2 15.625 -1.78433 -2.45525
2 31.25 -0.427058 -1.77433
2 62.5 -0.854091 2.681
2 125 -1.70799 -1.43478
4 7.8125 -0.990338 -1.66126
4 15.625 -1.98068 2.95523
4 31.25 -0.819755 2.71534
4 62.5 -1.63949 -1.36628

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5 Instrument test record recovery
Instrument Gain and Phase tests >

Theoretical phase for 400 mV input scale gain (recorded test signal)
Sample Rate Frequency (Hz) 0.8 Lin 0.8 Min
0.25 7.8125 -1.35886 -1.40075
0.25 15.625 -2.71772 -2.8015
0.25 31.25 -2.29385 -2.46142
0.25 62.5 1.69551 1.3603
0.25 125 -2.89197 2.72022
0.25 250 -2.64086 2.29499
0.25 500 -2.12881 1.40637
0.5 7.8125 -1.75156 -1.83533
0.5 15.625 2.78007 2.61251
0.5 31.25 2.41854 2.08337
0.5 62.5 -1.44608 -2.11701
0.5 125 -2.89198 2.04393
0.5 250 -2.64086 0.894234
0.5 500 -2.12882 -1.85561
1 7.8125 -2.51241 -2.67997
1 15.625 1.25835 0.923182
1 31.25 -0.624879 -1.29581
1 62.5 -1.24973 -2.59701
1 125 -2.49928 1.03582
1 250 -1.85546 -1.58225
2 7.8125 2.24906 1.91389
2 15.625 -1.78506 -2.45599
2 31.25 -0.42853 -1.77581
2 62.5 -0.857036 2.67806
2 125 -1.71388 -1.44067
4 7.8125 -0.990706 -1.66163
4 15.625 -1.98141 2.9545
4 31.25 -0.821228 2.71387
4 62.5 -1.64243 -1.36922

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 Instrument test record recovery
Instrument CMRR test >

Instrument CMRR test

The CMRR test signal is a 31.25 Hz, 8303.2 mV(RMS) sine wave.
The CMRR test result is the ratio of the RMS value of the test signal to
the RMS value of the output signal computed for the test frequency. The
CMRR is with respect to the earth, not to the analog ground.
To recover test results from a CMRR test SEGD record, use the
following formula:

Cmrr(dB)=20×log  8303.2 
10 |xˆi| 
5
x̂ i RMS value of the 31.25 Hz line.
8303.2 RMS Common Mode voltage (mV) at the FDU’s
input.
The FDU’s input circuitry is such that the common mode voltage is
divided by a large factor (21.4) prior to being applied to the pre-
amplifier input.
The test generator is applied beyond this divider. The peak amplitude of
the sine wave is 77.6% of its full capacity, i.e. 500√2 mV x 0.776
(approx. 548.6 mV). This voltage corresponds to an FDU input
common mode voltage of 500√2 mV x 0.776 mV x 21.4 = 11742.5 mV
(peak), i. e. 8303.2 mV RMS.

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5 Instrument test record recovery
Instrument Crosstalk test >

Instrument Crosstalk test

The Crosstalk test signal is a 31.25 Hz sine wave with an amplitude of
97% of the FDU’s full scale.
Gain RMS test signal Peak test signal
400 388 mV. 548.7 mV.
1600 1552 mV. 2194.9 mV.

The test includes two sequences: during the first sequence, the test
signal is applied to each even FDU and the resulting voltage is
measured in each odd FDU.
Conversely, during the second test sequence, the test sine wave is fed to
each odd FDU and the resulting voltage is measured in each even FDU.
The Crosstalk test result is the ratio of the theoretical RMS value of the
test signal to the measured RMS voltage at the test frequency.
Note Swapping between odd and even is not based on the channel
numbering within the spread but on numbering within each
segment delimited by LAUs: the closest channel to the
Transverse is always driven on the first test sequence. This may
give rise to an irregular pattern of driven channels when
crossing a Transverse or if the number of channels between two
consecutive LAUs is odd.
To recover test results from a Crosstalk test SEGD record, use the
following formula:

 
Crosstalk(dB)=20×log  xe 
xˆi 
10 | |

xe RMS value of applied signal (1552 mV for 1600 mV

scale, 388 mV for 400mV scale).
x̂ i RMS value of the 31.25 Hz line.

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 Instrument test record recovery
DSU-428 Gain and Phase test >

DSU-428 Gain and Phase test

The system first computes the direct Fourier transform of the acquired
test data: DFT.
The Phase and Gain are then computed with the following formulas.

Phase error (µs)

Phase_error = 106 × [ Arg(DFT) – ArgModel ] / (2 × π × 31.25Hz)

where ArgModel depends on the sample rate (ms) and type of filter: 5
Filter type
Sample Rate (ms)
Min Lin
0.25 1.402500 –1.571623
0.5 –1.906807 –1.571626
1 –2.242549 –1.571640
2 –2.918904 –1.571629
4 1.963457 –1.571631

Gain error (%)

Gain_error =
100 × (sqrt [ real (RMS)² + imag (RMS)² ] / 0.940654049472 – 1 )

where RMS is the RMS value computed from DFT.

0.940654049472 is a manufacturing value subject to change in future.

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DSU-428 Gain and Phase test >

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Chapter

6 FDU Calibration

This chapter describes the calibration technique used in a

Field Digitizer Unit. It includes the following sections:

• Overview (page 128)

• ADC low gain and internal reference (page 131)
• Input resistors and DAC hardware (page 135)
• DAC software (page 141)
• Test network resistors (page 144)
• Common-mode resistors (page 150)
• Earth ground resistor (page 156)
• ADC high gain (page 160)

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6 FDU Calibration
Overview > General principle

Overview
General principle
The FDU is a high-accuracy instrument measuring the voltage from a
geophone or geophone array connected across its sensor input.
The purpose of the Calibration process in the FDU is to compensate for
any discrepancy in its analogue circuitry. Calibration is first performed
at the end stage of manufacturing and it can be performed subsequently,
using the TMS428 system, if any drift is suspected or whenever
scheduled for periodical checks.
The results from the calibration process, interpreted by the TMS428,
consist of 17 correction factors that are saved to a non-volatile
memory in the FDU. Those factors are used by the LAU during the
measurement of the signal from the sensor. Only the gain correction
factors are used in normal operations. The other correction factors are
used in test functions (Leakage, CMRR, Resistance, etc.).
During the calibration process, some reference elements are
automatically connected to the sensor input of the FDU: short circuit,
reference voltage and resistors. The reference elements, built in the
TMU428, are accurately determined through the "TMU Calibration"
menu on the TMS428 (see 428XL Technical Manual).
The test signal at the input of the FDU during the successive calibration
steps can be:
• The FDU’s built-in reference voltage;
• The reference voltage from the TMU428 (2.048 V);
• A signal from the FDU’s built-in test generator (DAC).
• The signal from the FDU’s test generator, associated with the
TMU428’s 1.05-kΩ and 5.0-kΩ reference resistors.
The test signals from the FDU’s DAC (DC voltage or 7.8125 Hz sine
wave) are generated from basic digital signals stored in the TMU428’s
built-in LAUX.

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 FDU Calibration
Overview > Calibration timing

Except for the high gain (12 dB, 400 mV) correction factor calculus, all
calibrations steps are performed with the 0 dB (1600) gain option.

Calibration timing
The FDU calibration process is composed of five main sequences.
Calibration Number Reference connected
Correction factor
sequence of steps to FDU input
ADC circuitry, low LowGainFactor 3 External Ref.
gain. (2.048 V ±0.03%)
FDU’s internal RefVoltFactor Internal Ref.
reference voltage. (1.2 V, typical).
DAC internal
capacitor network.
RoughCurrentFactor 5.000 Kohm, ±0.01%.
1.0526 Kohm, ±0.01%.
6
P and N path output FineCurrentPfactor 6 5.000 Kohm, ±0.01%.
current of DAC FineCurrentNFactor
Seismic channel PosGndResFactor 5.000 Kohm, ±0.01%.
10 kΩ input resistors NegGndResFactor 1.0526 Kohm, ±0.01%.
Internal test network LowGainResPFactor
resistors, 1 KΩ and LowGainResNFactor
500 Ω HighGainResPFactor None
HighGainResNFactor 8
ComModeRes1Factor
ComModeRes2Factor
Common mode ComModeResPDacFactor
resistors in P and N ComModeResNDacFactor
paths of DAC.
FDU's 100 KΩ ground EarthResFactor 1 Short to earth ground.
resistor
ADC circuitry, high HighGainFactor 1 1.0526 Kohm, ±0.01%.
gain

Each main sequence consists of one or more measurement steps during

which one or more of the TMU428 references may be involved. To
determine the 17 correction factors, 19 measurement steps are
required.
After the calibration process is complete, the following checks are
performed:
- Compliance with allowable range for each correction factor.
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6 FDU Calibration
Overview > Calibration timing

- Voltage Reference Instrument test to within 0.1% (0 dB gain).

- Resistance Instrument test to within 0.1% (0 dB and 12 dB gain).

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 FDU Calibration
ADC low gain and internal reference > Purpose

ADC low gain and internal reference

Purpose
The first three calibration steps allow two calibration factors to be
determined:
• LowGainFactor: A correction factor used to compensate for any
discrepancies in the characteristics of analogue devices in the
acquisition channel with the 0 dB (1600) gain option enabled. It is
systematically applied to all samples at the output from the DSP when
the low gain option is enabled, whether in normal operations or in test
mode.
• RefVoltFactor: A correction factor for the FDU’s built-in reference
voltage. Its stands for the deviation of the actual (measured) reference
6
value from the nominal value (1.2 V).
After the two correction factors are determined, they are saved to the
non-volatile memory in the FDU. They are used where required in
subsequent calibration steps.

Description

LowGainFactor
The LowGainFactor correction factor is determined as follows:

Step 1 (LOW_GAIN_INTERN_REF_1)
During the first step, an external, accurately determined reference
voltage is applied to the seismic channel input. The resulting mean
output voltage (Mean1) is computed, relative to the input of the
ADC.

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6 FDU Calibration
ADC low gain and internal reference > Description

Pre-amp.

ΣΔ DSP
ADC
Ext. 24 bits
Ref.

Channel input
REFin

Built-in
reference
Test
generator Test network
(DAC)

Figure 6-1

Step 2 (LOW_GAIN_INTERN_REF_2)

Pre-amp.

ΣΔ DSP
ADC
24 bits

Channel input
REFin

Built-in
reference
Test
generator Test network
(DAC)

Figure 6-2

During the second step, the input is shorted. The resulting mean output
voltage (Mean2) is computed, relative to the input of the ADC. The
offset on the channel is determined (Offset = Mean2).

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 FDU Calibration
ADC low gain and internal reference > Description

From the above two measurements, the external reference value

measured by the acquisition channel with the 0 dB (1600) gain option
is determined:

Mean1 − Offset
LowGainFactor= − 1.0
VrefTheoret

where VrefTheoret is the theoretical value of the external reference

voltage fed to the input (2.048 VDC, ±0.03%).
The LowGainFactor correction factor stands or the relative error
between the value measured by the acquisition channel with the 0 dB
(1600) gain option and the theoretical value of the reference voltage.
6
RefVoltFactor
The RefVoltFactor correction factor is determined as follows:
• Step 3 (LOW_GAIN_INTERN_REF_3)

Pre-amp.

ΣΔ DSP
ADC
24 bits

Channel input
REFin

Built-in
reference
Test
generator Test network
(DAC)

Figure 6-3

During the third step, the input to the ADC converter is replaced by the
built-in reference voltage. The resulting mean output voltage (Mean3)
is computed, relative to the input of the ADC.

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6 FDU Calibration
ADC low gain and internal reference > Description

As the actual, corrected offset of the ADC converter is known

(determined during the LOW_GAIN_INTERN_REF_2 step and
corrected with the gain correction factor for the 0 dB gain option), the
calibration calculus determines the actual value of the FDU’s built-in
reference voltage.

Mean3 − Offset
RefVoltFactor = − 1.0
NomRefVoltage

where NomRefVoltage = 1.2V.

The RefVoltFactor correction factor stands for the relative error
between the measured value and the theoretical value of the built-in
reference voltage.

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 FDU Calibration
Input resistors and DAC hardware > Purpose

Input resistors and DAC hardware

Purpose
The calibration steps described in this paragraph allow three correction
factors to be determined:
• RoughCurrentFactor: A hardware calibration coefficient for the
internal capacitor network of the test generator (DAC).
• PosGndResFactor: A correction factor for the 10-kΩ resistor
(PosGndRes) located between the positive path of the seismic
channel input and the analogue ground.
• NegGndResFactor: A correction factor for the 10-kΩ resistor
(NegGndRes) located between the negative path of the seismic 6
channel input and the analogue ground.
After the three correction factors are determined, they are saved to the
non-volatile memory in the FDU. They are used where required in
subsequent calibration steps.

Description
To determine the three correction factors mentioned above, the test
system first has to determine the actual values of the 10-kΩ resistors
(PosGndRes and NegGndRes) in the input paths of the seismic
channel, and also the output current values (IDacP and IDacN) of the
test generator. Because those measurements cannot be taken directly,
the four unknowns are determined by solving four independent
equations.
The following four calibration steps are used, in order to take four
independent measurements:
• ROUGH_CURRENT_FACTOR_1
• ROUGH_CURRENT_FACTOR_2
• ROUGH_CURRENT_FACTOR_3
• ROUGH_CURRENT_FACTOR_4

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6 FDU Calibration
Input resistors and DAC hardware > Description

Step 1 (ROUGH_CURRENT_FACTOR_1)

10 k Pre-amp.

ΣΔ DSP
5k

ADC
24 bits
10 k

Channel input

Test
generator
(DAC)
Test network
Test data from LAUL

Figure 6-4

With the input configured as shown on the above diagram, the RMS
value (RMS1) of the resulting output signal is computed, relative to the
input of the ADC.

Step 2 (ROUGH_CURRENT_FACTOR_2)

Pre-amp.
10 k

ΣΔ DSP
5k

ADC 24 bits
10 k

Channel input

Test
generator
(DAC)
Test network

Test data from LAUL

Figure 6-5

With the input configured as shown on the above diagram, the RMS
value (RMS2) of the resulting output signal is computed, relative to the
input of the ADC.

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Input resistors and DAC hardware > Description

Step 3 (ROUGH_CURRENT_FACTOR_3)

Pre-amp.
10 k
ΣΔ
1.05 k

DSP
ADC
24 bits
10 k

Channel input

Test
generator
(DAC)

Test network
Test data from LAUL

Figure 6-6
6
With the input configured as shown on the above diagram, the RMS
value (RMS3) of the resulting output signal is computed, relative to the
input of the ADC.

Step 4 (ROUGH_CURRENT_FACTOR_4)

Pre-amp.
10 k

ΣΔ
1.05 k

DSP
ADC
24 bits
10 k

Channel input

Test
generator
(DAC)

Test network
Test data from LAUL

Figure 6-7

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6 FDU Calibration
Input resistors and DAC hardware > Description

With the input configured as shown on the above diagram, the RMS
value (RMS4) of the resulting output signal is computed, relative to the
input of the ADC.

Determining the input resistance correction factors

The input resistances in the positive and negative paths are computed
using the following expressions:
LoRes × HiRes × ( Rms4 − Rms2)
PosGndRes =
LoRes × Rms1 − HiRes × Rms3

LoRes × HiRes × ((Rms3 − Rms1) − (Rms4 − Rms2))

NegGndRes =
LoRes × Rms1 − HiRes × Rms3

where:
• Hires is the value of the higher test resistor, used in steps 1 and 2
(5 kΩ ±0.03%).
• LoRes is the value of the lower test resistor, used in steps 3 and 4
(1.0526 kΩ ±0.03%)
The equivalent resistance Zin is computed using the expression:
LoRes × HiRes × ( Rms3 − Rms1)
Zin =
LoRes × Rms1 − HiRes × Rms3

The system checks for Zin = 20 kΩ ±1% and

Zin = PosGndRes + NegGndRes ±0.01%
The correction factor for the resistance between the positive or negative
input path and the analogue ground of the seismic channel is determined
by computing the relative error between the measured value and its
theoretical value:

PosGndRes
PosGndResFactor = − 1.0
NomGndRes

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Input resistors and DAC hardware > Description

NegGndRes
NegGndResFactor = − 1.0
NomGndRes

where NomGndRes = 10 kΩ.

Determining the DAC current rough correction factor

The actual values of the current through the positive and negative output
paths of the test generator DAC before the calibration calculus can be
achieved are computed, using the following expressions:
Rms1 × Rms4 × LoRes − Rms2 × Rms3 × HiRes
IDacP =
HiRes × LoRes × (Rms4 − Rms2)

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Input resistors and DAC hardware > Description

((Rms3 − Rms4) × Rms1 × LoRes) + ((Rms2 − Rms1) × Rms3 × HiRes)

IDacN =
HiRes × LoRes × ((Rms3 − Rms1) − (Rms4 − Rms2))
where:
• Hires is the value of the higher test resistor, used in steps 1 and 2
(5 kΩ ±0.03%).
• LoRes is the value of the lower test resistor, used in steps 3 and 4
(1.0526 kΩ ±0.03%)
The mean output current of the DAC is computed as:
(IDacP + IDacN)
IDac =
2.0

The deviation from the nominal value of the DAC current is computed:
IDac
Cerror = − 1.0
TheoritIdac

The correction factor for the DAC output current is determined by

computing the weighted relative error between the measured mean
value and its theoretical value:

  Cerror 
RoughCurrentFactor = Bin 32 ×  1.0 − 
  CorrectRange  

where:
• TheorIdac: Theoretical RMS value of DAC output current (388 µA),
• CorrectRange: DAC output current adjustment range (0.24).

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DAC software > Purpose

DAC software
Purpose
The calibration steps described in this paragraph allow two correction
factors to be determined:
• FineCurrentPFactor: A correction factor for the current (IDacP) in
the positive output path of the test generator DAC.
• FineCurrentNFactor: A correction factor for the current (IDacN) in
the negative output path of the test generator DAC.
After the three correction factors are determined, they are saved to the
non-volatile memory in the FDU. They are used where required in
subsequent calibration steps. 6

Description
To determine the two correction factors mentioned above, the test
system first has to determine the actual values (IDacP and IDacN) of
the current in the output paths of the test generator. Because those
measurements cannot be taken directly, the two unknowns are
determined by solving two independent equations.
The following two calibration steps are used, in order to take two
independent measurements:
• FINE_CURRENT_FACTOR_1
• FINE_CURRENT_FACTOR_2

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6 FDU Calibration
DAC software > Description

Step 1 (FINE_CURRENT_FACTOR_1)
Pre-amp.

10 k ΣΔ DSP
5k

ADC
24 bits
10 k

Channel input

Test
generator
(DAC)
Test network
Test data from LAUL

Figure 6-8

With the input configured as shown on the above diagram, the RMS
value (RMS1) of the resulting output signal is computed, relative to the
input of the ADC.

Step 2 (FINE_CURRENT_FACTOR_2)
Pre-amp.
10 k

ΣΔ DSP
5k

ADC
24 bits
10 k

Channel input

Test
generator
(DAC)
Test network

Test data from LAUL

Figure 6-9

With the input configured as shown on the above diagram, the RMS
value (RMS2) of the resulting output signal is computed, relative to the
input of the ADC.

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DAC software > Description

Determining the DAC current fine correction factors

After the correction factors for the resistances in the seismic channel
input paths are available (see page 138), the actual values of the current
through the positive and negative output paths of the test generator
DAC (IDacP and IDacN) can be computed using the following
expressions:
Rms1 × PosGndRes + Rms2 × HiRes
IDacP =
HiRes × PosGndRes

(Rms1 × (PosGndRes × HiRes + (HiRes + Zin) × NegGndRes)) − (Zin × HiRes × Rms2)

IDacN =
HiRes × NegGndRes × Zin

where: 6
• Hires is the value of the test resistor, used in steps 1 and 2
(5 kΩ ±0.03%).
• PosGndRes: value of the 10-kΩ resistor in the positive input path of
the seismic channel.
• NegGndRes: value of the 10-kΩ resistor in the negative input path of
the seismic channel.
• Zin = PosGndRes + NegGndRes.

The fine correction factors for the positive and negative paths of the
DAC output current are determined by computing the relative error
between the value actually measured and the theoretical value of the
current:
IDacP
FineCurrentPFactor = − 1.0
TheorIDac

IDacN
FineCurrentNFactor = − 1.0
TheorIDac

where: TheorIdac is the theoretical RMS value of DAC output current

(388 µA).

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6 FDU Calibration
Test network resistors > Purpose

Test network resistors

Purpose
The calibration steps described in this paragraph allow four correction
factors to be determined:
• LowGainResPFactor: A correction factor for the 1.5-kΩ resistor
(LowGainResP), located in the positive path of the internal test
network.
• LowGainResNFactor: A correction factor for the 1.5-kΩ resistor
(LowGainResN), located in the negative path of the internal test
network.
• HighGainResPFactor: A correction factor for the 500-Ω resistor
(HighGainResP), located in the positive path of the internal test
network.
• HighGainResNFactor: A correction factor for the 500-Ω resistor
(HighGainResN), located in the negative path of the internal test
network
After the four correction factors are determined, they are saved to the
non-volatile memory in the FDU. They are used where required in
subsequent calibration steps.

Description
To determine the four correction factors mentioned above, the test
system first has to determine the actual values of the two 1.5-kΩ
(LowGainResP and LowGainResN) and two 500-Ω (HighGainResP
and HighGainResN) resistors in the test network. Because those
measurements cannot be taken directly, the four unknowns are
determined by solving four independent equations.
The following four calibration steps are used, in order to take four
independent measurements:

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Test network resistors > Description

• RC_NETWORK_RES_1
• RC_NETWORK_RES_2
• RC_NETWORK_RES_3
• RC_NETWORK_RES_4

Step 1 (RC_NETWORK_RES_1)

Channel Pre-amp.
input
ΣΔ DSP
ADC

6
24 bits
1.5 k
500
500

1.5 k
Test network

Test
generator
(DAC)

Test data from LAUL

Figure 6-10

With the channel input and test network configured as shown on the
above diagram, the RMS value (RMS1) of the resulting output signal is
computed, relative to the input of the ADC.

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Test network resistors > Description

Step 2 (RC_NETWORK_RES_2)
Channel Pre-amp.
input
ΣΔ DSP
ADC
24 bits
1.5 k

500
500

1.5 k

Test network
Test
generator
(DAC)
Test data from LAUL

Figure 6-11

With the channel input and test network configured as shown on the
above diagram, the RMS value (RMS2) of the resulting output signal is
computed, relative to the input of the ADC.

Step 3 (RC_NETWORK_RES_3)
Channel Pre-amp.
input
ΣΔ DSP
ADC
24 bits
1.5 k
500
500

1.5 k

Test network
Test
generator
(DAC)

Test data from LAUL

Figure 6-12

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Test network resistors > Description

With the channel input and test network configured as shown on the
above diagram, the RMS value (RMS3) of the resulting output signal is
computed, relative to the input of the ADC.

Step 4 (RC_NETWORK_RES_4)
Channel Pre-amp.
input
ΣΔ DSP
ADC
24 bits
1.5 k
500
500

1.5 k

Test network
6
Test
generator
(DAC)
Test data from LAUL

Figure 6-13

With the channel input and test network configured as shown on the
above diagram, the RMS value (RMS4) of the resulting output signal is
computed, relative to the input of the ADC.

Determining the four test network resistances

The actual values of the four resistors are determined using the
following expressions:
(Rm s2 − Rm s1)
Low G ainR esP =
ID acP

(Rms3 − Rms1)
LowGainResN =
IDacN

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6 FDU Calibration
Test network resistors > Description

R m s4
H ig h G ain R esP =
ID acP

(Rm s1 − Rm s4)
H ighG ainResN =
ID acN

where the DAC current is expressed by:

IDacP = NomIDac *SineModRate *(1.0 + FineCurrentPFactor)
and
IDacN = NomIDac *SineModRate *(1.0 + FineCurrentNFactor)

• NomIDac = 500.0 µA.

• SineModRate = 0.776.
• FineCurrentPFactor and FineCurrentNFactor are the fine
correction factors for the DAC output current, determined earlier (see
page 143).

Determining the test network resistor correction factors

The correction factors for the two 1.5-kΩ and two 500-resistors located
in the internal test network are determined by computing the relative
error between the value actually measured and the theoretical value of
each resistor.

LowGainResP
LowGainResPFactor = − 1.0
NomLowGainRes

LowGainResN
LowGainResNFactor = − 1.0
NomLowGainRes

where NomLowGainRes = 1500 Ω.

HighGainResP
HighGainResPFactor = − 1.0
NomHighGainRes

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Test network resistors > Description

HighGainResN
HighGainResNFactor = − 1.0
NomHighGainRes

where NomHighGainRes = 500 Ω.

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6 FDU Calibration
Common-mode resistors > Purpose

Common-mode resistors
Purpose
The calibration steps described in this paragraph allow four correction
factors to be determined:
• ComModeResPDacFactor: A correction factor for resistance
(ComModeResPDac) in the positive common-mode path of the test
generator DAC.
• ComModeResNDacFactor: A correction factor for resistance
(ComModeResNDac) in the negative common-mode path of the test
generator DAC.
• ComModeRes1Factor: A correction factor for the first 1-kΩ
resistance (ComModeRes1) in the common-mode path of the internal
test network.
• ComModeRes2Factor: A correction factor for the second 1-kΩ
resistance (ComModeRes2) in the common-mode path of the internal
test network.
After the four correction factors are determined, they are saved to the
non-volatile memory in the FDU. They are used where required in
subsequent calibration steps.

Description
To determine the four correction factors mentioned above, the test
system first has to determine the actual values of the two 1-kΩ
common-mode resistors of the test network (ComModeRes1 and
ComModeRes2) and two common-mode path resistances of the test
generator DAC (ComModeResPDac and ComModeResNDac).
Because those measurements cannot be taken directly, the four
unknowns are determined by solving four independent equations.
The following four calibration steps are used, in order to take four
independent measurements:

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Common-mode resistors > Description

• RC_NETWORK_RES_1
• RC_NETWORK_RES_2
• RC_NETWORK_RES_3
• RC_NETWORK_RES_4

Step 1 (RC_NETWORK_RES_1)

Channel Pre-amp.
input
ΣΔ DSP
ADC
24 bits
6
1k
1k

Test network

Test
generator
(DAC)

Test data from LAUL

Figure 6-14

With the channel input and test network configured as shown on the
above diagram, the RMS value (RMS1) of the resulting output signal is
computed, relative to the input of the ADC.

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Common-mode resistors > Description

Step 2 (RC_NETWORK_RES_2)
Channel Pre-amp.
input ΣΔ DSP
ADC
24 bits

1k

1k
Test network
Test
generator
(DAC)
Test data from LAUL

Figure 6-15

With the channel input and test network configured as shown on the
above diagram, the RMS value (RMS2) of the resulting output signal is
computed, relative to the input of the ADC.

Step 3 (RC_NETWORK_RES_3)
Channel Pre-amp.
input ΣΔ DSP
ADC
24 bits

1k
1k

Test network
Test
generator
(DAC)
Test data from LAUL

Figure 6-16

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Common-mode resistors > Description

With the channel input and test network configured as shown on the
above diagram, the RMS value (RMS3) of the resulting output signal is
computed, relative to the input of the ADC.

Step 4 (RC_NETWORK_RES_4)
Channel Pre-amp.
input
ΣΔ DSP
ADC
24 bits

1k
1k

6
Test network

Test
generator
(DAC)

Test data from LAUL

Figure 6-17

With the channel input and test network configured as shown on the
above diagram, the RMS value (RMS4) of the resulting output signal is
computed, relative to the input of the ADC.

Determining the four common-mode resistances

The actual values of the four resistances are determined using the
following expressions:
Rms1
ComModeResNDac =
IDacN

(Rms4 − Rms2)
ComModeResPDac =
IDacP

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Common-mode resistors > Description

(Rms4 − Rms3)
ComModeRes1 =
IDacP

(Rms3 − Rms2)
ComModeRes2 = − HighGainResP
IDacP

where the DAC current is expressed by:

IDacP = NomIDac *SineModRate *(1.0 + FineCurrentPFactor)

IDacN = NomIDac *SineModRate *(1.0 + FineCurrentNFactor)

and the HighGainResP resistance is expressed by:
HighGainResP = NomHighGainRes*(1.0 + HighGainResPFactor)

• NomIDac = 500.0 µA.

• SineModRate = 0.56.
• FineCurrentPFactor and FineCurrentNFactor are the fine
correction factors for the DAC output current, determined earlier (see
page 143).
• NomHighGainRes = 500 Ω.
• HighGainResPFactor: correction factor for the 500-Ω resistor
(HighGainResP), located in the positive path of the internal test
network (see page 148).

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Common-mode resistors > Description

Determining the common-mode correction factors

The correction factors for the two common-mode path resistances of the
test generator DAC (ComModeResPDac and ComModeResNDac)
are determined by computing the relative error between the value
actually measured and the theoretical value of each resistor.

ComModeResNDac
ComModeResNDacFactor = − 1.0
NomComModeResDac

ComModeResPDac
ComModeResPDacFactor = − 1.0
NomComModeResDac
6
where NomComModeResDac = 100 Ω.

The correction factors for the two 1-kΩ common-mode resistors of the
test network (ComModeRes1 and ComModeRes2) are determined by
computing the relative error between the value actually measured and
the theoretical value of each resistor.

ComModeRes1
ComModeRes1Factor = − 1.0
NomComModeRes1

ComModeRes2
ComModeRes2Factor = − 1.0
NomComModeRes2

where
NomComModeRes1 = 1000 Ω.
NomComModeRes2 = 1000 Ω.

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6 FDU Calibration
Earth ground resistor > Purpose

Earth ground resistor

Purpose
The calibration step described in this paragraph is used to determine a
correction factor (EarthResFactor) for the 100-kΩ resistor in the earth
ground path of the seismic channel (EarthRes).
After the correction factor is determined, it is saved to the non-volatile
memory in the FDU.

Description
During this calibration step, the voltage across resistor located in the
earth ground path of the seismic channel is measured. As the value of
the leak current through the resistor is known, the actual value of the
resistor can be determined.
The configuration of the channel input and test network for this
calibration step is as shown on the diagram below. The RMS value

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 FDU Calibration
Earth ground resistor > Description

(Rms) of the resulting output signal is computed, relative to the input of

the ADC.

Pre-amp.

Channel input ΣΔ DSP

ADC 24 bits

Test
network

6
Test 100 k
generator Earth ground
(DAC)

Test data from LAUL

Figure 6-18

Determining the earth ground resistor

The actual value of the earth ground resistor (EarthRes) is determined
using the following expression:
(ZCM + ComModeRes1 + ComModeRes2) × Rms
EarthRes =
(ComModeRes1 + ComModeRes2) × IDacP − Rms
where
PosGndRes × NegGndRes
ZCM =
PosGndRes + NegGndRes

The input resistances (PosGndRes and NegGndRes) are expressed by:

PosGndRes = NomGndRes*(1.0 + PosGndResFactor)

NegGndRes = NomGndRes*(1.0 + NegGndResFactor)

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6 FDU Calibration
Earth ground resistor > Description

where
- NomGndRes = 10000 Ω.
- PosGndResFactor: correction factor for the 10-kΩ resistor
(PosGndRes) located between the positive path of the seismic
channel input and the analogue ground (see page 138).
- NegGndResFactor: correction factor for the 10-kΩ resistor
(NegGndRes) located between the negative path of the seismic
channel input and the analogue ground (see page 138).
The common-mode resistors (ComModeRes1 and ComModeRes2) are
expressed by:
ComModeRes1 = NomComModeRes1*(1.0 + ComModeRes1Factor)

ComModeRes2 = NomComModeRes2 *(1.0 + ComModeRes2Factor)

where
• NomComModeRes1 = 1000 Ω.
• NomComModeRes2 = 1000 Ω.
• ComModeRes1Factor: correction factor for the first 1-kΩ
resistance (ComModeRes1) in the common-mode path of the internal
test network (see page 155).
• ComModeRes2Factor: correction factor for the second 1-kΩ
resistance (ComModeRes2) in the common-mode path of the internal
test network (see page 155).
The DAC output current (IDacP) is expressed by:
IDacP = NomIDac *SineModRate *(1.0 + FineCurrentPFactor)

where
• NomIDac = 500.0 µA.
• SineModRate = 0.56.
• FineCurrentPFactor: fine correction factor for the DAC output
current, determined earlier (see page 143).

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Earth ground resistor > Description

Determining the earth ground resistor correction factor

The correction factor (EarthResFactor) for the earth ground resistor is
determined by computing the relative error between the value actually
measured (EarthRes) and the theoretical value of the resistor.

EarthRes
EarthResFactor = − 1.0
NomEarthRes

where NomEarthRes = 100 kΩ.

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6 FDU Calibration
ADC high gain > Purpose

ADC high gain

Purpose
This calibration step is used to determine a correction factor
(HighGainFactor) for the seismic channel with the 12 dB (400) gain
option enabled.
This correction factor is used to compensate for any discrepancies in the
characteristics of analogue devices in the acquisition channel. It is
systematically applied to all samples at the output from the DSP when
the high gain option is enabled, whether in normal operations or in test
mode.

Description
During this calibration step, a known voltage is fed to the input of the
seismic channel, with the 12 dB gain option enabled. The
HighGainFactor correction factor stands for the relative error between
the voltage read by the channel and the theoretical input voltage.
The configuration of the channel input for this calibration step is as
shown on the diagram below.

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ADC high gain > Description

The RMS value (Rms) of the resulting output signal is computed,

relative to the input of the ADC.

Pre-amp.

ΣΔ
1.05 k

DSP
ADC
24 bits

Channel input

Test
generator
(DAC)

Test data from LAUL

Test network
6
Figure 6-19

Determining the input voltage

The theoretical input voltage (TheoritVin) is determined using the
following expression:
LoRes*(PosGndRes*IDacP + NegGndRes*IDacN)
TheoritVin =
LoRes + PosGndRes + NegGndRes

where:
LoRes: value of the test resistor (1.0526 kΩ ±0.03%).
The values of the input resistors (PosGndRes and NegGndRes) are
expressed by:
PosGndRes = NomGndRes*(1.0 + PosGndResFactor)

NegGndRes = NomGndRes*(1.0 + NegGndResFactor)

where
• NomGndRes = 10000 Ω.

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ADC high gain > Description

• PosGndResFactor: correction factor for the 10-kΩ resistor

(PosGndRes) located between the positive path of the seismic
channel input and the analogue ground (see page 138).
• NegGndResFactor: correction factor for the 10-kΩ resistor
(NegGndRes) located between the negative path of the seismic
channel input and the analogue ground (see page 138).
The DAC current is expressed by:
IDacP = NomIDac *SineModRate *(1.0 + FineCurrentPFactor)

IDacN = NomIDac *SineModRate *(1.0 + FineCurrentNFactor)

where
• NomIDac = 500.0 µA.
• SineModRate = 0.776.
• FineCurrentPFactor and FineCurrentNFactor are the fine
correction factors for the DAC output current, determined earlier (see
page 143).

Determining the high gain correction factor

The correction factor (HighGainFactor) for the 12 dB gain option of the
acquisition channel is determined by computing the relative error
between the value actually measured and the theoretical value of the
input voltage.

Rms
HighGainFactor = − 1.0
TheoritVin

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Chapter

7 FDU test functions

This chapter describes the principles of Instrument and

Field tests in a Field Digitizer Unit. For tests performed
with a TMS428, see also 428XL Technical Manual. This
chapter includes the following sections:

• General (page 164)

• Instrument tests (page 168)
• Sensor tests (page 191)

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7 FDU test functions
General > Overview

General
Overview
Below is a simplified block diagram of the circuitry involved in each
FDU addressed when you launch Instrument or Sensor tests on the
428XL GUI or on a TMS428 test system, or on an LT428.
With a TMS428, however, connections may be slightly different. Also,
for Gain, Filter type and Sample Rate options available on a TMS428,
see 428XL Technical Manual. The parameters given in this chapter are
only for tests launched on a 428XL GUI or LT428.

Sensors Pre-amp.
Input ΣΔ DSP
protection ADC
24 bits

Test network

Test
generator
(DAC)

Test data from LAUL

Figure 7-1

The test circuitry in each FDU mainly consists of a current generator

(Digital-to-Analog Converter), and a test network. The input to the
acquisition channel is selected depending on the test function to carry
out:
• signal from the sensor (e. g. Noise test),
• signal from both the sensor and the DAC (e. g. Tilt test),
• signal from both the DAC and the test network (e. g. Gain test).
The necessary test signals (DC voltage, sine wave or pulse) are
generated by the FDU’s DAC from basic digital signals stored in LAUs.

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 FDU test functions
General > Overview

Its maximum output voltage is 2828 mV for the G1600 (G1) gain and
707 mV for the G400 (G2) gain (maximum DAC current × RNetwork;
RNetwork = 4 kΩ or 1 kΩ respectively).
The following test frequencies are available from the DAC: 7.8125 Hz,
15.625 Hz, 31.25 Hz, 62.5 Hz, 125 Hz, 250 Hz, 500 Hz and 1000 Hz.
The input signal to the Analog-to-Digital Converter is scaled by the
appropriate factor, depending on the selected pre-amplifier gain: 1.6√2
for 0 dB (G1), 0.4√2 for 12 dB (G2).
The output signal from the acquisition channel is corrected for the error
amounts recorded during the Calibration procedure (gain, current gain
for the DAC, input network resistance calibration). No offset removal
is performed in the FDU.
Note For instrument tests in Dual telemetry, the FDU has no Low Cut
filter.
7
The test sequence is composed of different steps:
• Transient steps for analogue circuits: Beginning time (Tb) and End
time (Te).
Filter type Sample Rate Tb (ms) Te (ms)

(ms) Instrument Sensor (Instrument&Sensor)

0.25 136 520 16
0.5 144 528 24
0.8 LIN 1 160 544 40
2 192 576 72
4 256 640 136
0.25 144 528 8
0.5 160 544 8
0.8 MIN 1 192 576 8
2 256 640 8
4 384 768 8
No filter 0.25 512 8

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General > Available tests

• Measurement steps (Tm) the length of which depends on the type of

test, type of filter and on the sample rate.
The number of steps depends on the type of test.
The limits for instrument test results are contained in files (one for each
allowable sample rate) the format of which is described in 428XL
User’s Manual Vol. 2.
For the factory-settings of instrument test limits, see Acceptance Tests
in this manual.
The limits for Sensor tests are user-selected in the Survey Setup in the
LINE main window.

Available tests

Instrument tests
Test 428XL GUI TMS428 LT428
Internal Reference   
Internal Resistance   
Noise   
Offset 
Gain   
Phase error   
Distortion   
CMRR   
Crosstalk   
Pulse 

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General > Available tests

Sensor tests
Test 428XL GUI TMS428 LT428
Resistance   
Noise   
Offset 
Leakage   
Tilt   
Pulse 
CMRR  
Distortion (FDU2S only)

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7 FDU test functions
Instrument tests > Instrument Resistance

Instrument tests
Instrument Resistance
This test is used to check for any malfunction in the acquisition channel
electronics (test generator DAC, and ADC converter). The data is not
recorded.
It cannot be launched with the Test menu on the 428XL GUI, but it is
automatically performed every time the Line is powered up. Only the
result appears on the GUI (OK or ERROR).
In addition, it can be launched using a TMS428. On the TMS428, with
the 12 dB gain option selected, the Instrument Resistance test also
allows you to check for any drift of the high gain correction factor.

Configuration

Sensors Pre-amp.
Input
ΣΔ DSP
protection ADC
24 bits

Test network

Test
generator
(DAC)

Test data from LAUL

Figure 7-2

• ADC input: connected to the internal test network.

• Pre-amplifier gain: 1600 mV (0 dB). On the TMS428 only, the
400 mV (12 dB) gain option is also available.
• DAC: connected to internal test network.
• Filter type 0.8LIN; Sample Rate: 1 ms.

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 FDU test functions
Instrument tests > Instrument Resistance

Test Sequence:

Tb 128 ms Te

For Beginning and End times (Tb and Te), see page 165.

Test principle
• The DAC supplies a sine wave to the internal test network
(F = 7.8125 Hz and Amplitude = 0.776 × generator FullScale). The
ADC input is connected to the internal test network too.
• The RMS value (Vrms), relative to the ADC input level, of the output
signal during the test sequence is determined through the DFT of the
DSP’s output signal (for the input signal frequency).
• As both the RMS value of the output voltage and the output current
from the test generator DAC are known, the equivalent resistance
seen by the ADC converter is computed (InstRes) using the
7
following expression:
Vrms
InstRes = ---------------------------------------------------------------------
NomIDAC × SineModRate

where NomIDac = 500.0 µA.

SineModRate = 0.776.
InstRes is expressed in Ω.
• The theoretical value (TheoretRes) of the resistance is computed
using the correction factors determined through the Calibration
process (stored in the FDU’s non-volatile memory).
• The relative error (%) compared to the expected value is computed
using the following expression:
InstRes
RelInstResError = 100 × ------------------------------ – 1
TheoretRes

The test returns an Error status if the relative error is out of the allowable
range.

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Instrument tests > Instrument Noise test

Instrument Noise test

This test is used to measure the noise of the ADC converter in the FDU.
The noise is the energy of the signal above 3 Hz up to the Nyquist
Frequency.
The converter’s input is connected to the internal test network. A DFT
is performed and the noise spectral power below 3 Hz is computed. As
the total energy of the output signal is known, the total noise within the
bandwidth can be deduced.

Configuration

Sensors Pre-amp.
Input ΣΔ
protection DSP
ADC
24 bits

Test network

Test
generator
(DAC)

Test data from LAUL

Figure 7-3

• ADC input: connected to the internal test network.

• Pre-amplifier gain: 1600 mV (0 dB) or 400 mV (12 dB), user-
selected.
• DAC: OFF.
• Filter type and Sample Rate: user-selected.

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Instrument tests > Instrument Noise test

Test Sequence:

Tb Tm Te

Filter type Sample Rate (ms) Tm (ms) Number of samples

0.25 512 2048
0.5 1024 2048
0.8 LIN 1 2048 2048
2 2048 1024
4 2048 512
0.25 512 2048
0.5 1024 2048
0.8 MIN 1 2048 2048
2
4
2048
2048
1024
512
7
For Beginning and End times (Tb and Te), see page 165.

Test principle
From the DFT of the DSP’s output signal, the power of the Noise signal
below 3 Hz is computed.
As the total energy of the output signal is known, the system computes
the RMS level of instrument noise in the bandwidth.

Total Power on the N output signal samples:

1 N −1
TotalPower =  X i2
N 0
where N depends on Acquisition Length and S. R.
X scaled sample amplitude, 24 bit coded.

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Instrument tests > Instrument Noise test

Power below 3 Hz:

M 2

PowerLT3Hz =  Xˆ j
0

where M Number of harmonic lines below 3 Hz,

(depends on Δf = 1/N.SR).
^
Xj DFT of the DSP’s output signal X(t).

Instrument noise RMS value:

InstNoise = TotalPower – PowerLT3Hz

Instrument offset (TMS428 only)

On a TMS428, the mean value after scaling of the DSP’s output signal
acquired during the test length is also computed, relative to the ADC
input, and displayed as Instrument Offset.

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Instrument tests > Instrument Gain and Phase tests

Instrument Gain and Phase tests

This test is used to check for any drift of the gain and phase of the FDU’s
built-in ADC converter within the band from DC to the filter’s cutoff
frequency.
A pulse is used as test signal.

Configuration
Sensors Pre-amp.
Input ΣΔ DSP
protection ADC
24 bits

Test network

Test
generator
7
(DAC)

Test data from LAUL

Figure 7-4

• ADC input: connected to the internal test network.

• Pre-amplifier gain: 1600 mV (0 dB) or 400 mV (12 dB), user-
selected.
• DAC: connected to internal test network.
• Filter type and Sample Rate: user-selected.

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Instrument tests > Instrument Gain and Phase tests

Three test sequences are used (T1, T2, T3):

Input level 50%

(% of generator
full scale)
0%

Tb T1 T2 T3 Te

Sample T1+T2+T3 Number of

Filter type T1 (ms) T2 (ms) T3 (ms)
Rate (ms) (ms) samples
0.25 8 39 465 512 2048
0.5 16 39 969 1024 2048
0.8 LIN 1 32 38 1978 2048 2048
2 64 36 1948 2048 1024
4 128 40 1880 2048 512
0.25 8 39 465 512 2048
0.5 16 39 969 1024 2048
0.8 MIN 1 32 38 1978 2048 2048
2 64 36 1948 2048 1024
4 128 40 1880 2048 512

For Beginning and End times (Tb and Te), see page 165.

General test principle

The DAC supplies a pulse (with known amplitude and width) to the
internal test network.
Gain Test pulse level (50% of generator full scale)
400 353.5 mV.
1600 1214 mV.

The ADC input is connected to the internal test network. The voltage
across the internal test network is measured.

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Instrument tests > Instrument Gain and Phase tests

A DFT is computed on the DSP’s output signal (for different test

frequencies) and compared to a model computed with the same
frequencies.
The error is computed in terms of difference in amplitude and phase
with respect to the model.
The test returns the maximum error computed in amplitude and phase.

DFT computation
The number of test frequencies used for the DFT computations (for the
model and for the measured signal) depends on the Sample Rate
selected because of the following relation:
fnyquist = 1/2 SRand fcutoff = 0.8 fnyquist

Sample
Rate (ms)
7.8125 Hz 15.625Hz 31.25 Hz 62.5 Hz 125 Hz 250 Hz 500 Hz 7
0.25 x x x x x x x
0.5 x x x x x x x
1 x x x x x x
2 x x x x x
4 x x x x

Theoretical DFT of the input signal

The theoretical DFT of the input signal, TheoretDft, is computed from
the FDU's calibration values, from the DAC’s output currents, and from
the configuration of the internal resistance network.

Gain shift computation

RMS value of the theoretical input signal:
TheoretRms = | TheoretDft | * DevFreqRms
DevFreqRms represents the product of all gain correction
factors induced by the acquisition channel circuitry, like gain
corrections from the FDU's and LAU's digital filters and from
the ADC and DAC. DevFreqRms is not involved in the

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Instrument tests > Instrument Gain and Phase tests

computation of TheoretDft. The different DevFreqRms values

depend on the type of filter used, on the Sample Rate and on the
frequency.

RMS value of the measured signal:

(After applying the DFT on the DSP’s output signal)
Vrms = | Dft |

Gain relative error:

Vrms
GainDeviation = 100 × -------------------------------- – 1
TheoretRms

The gain error is computed for all the test frequencies, and the
maximum encountered is retained as final result.

Phase shift computation

Phase value of the theoretical input signal:
TheoretArg = Argument (TheoretDft) + DevFreqArg
DevFreqArg represents the product of all phase correction
factors induced by the acquisition channel circuitry, like phase
corrections from the FDU's and LAU's digital filters and from
the ADC and DAC. DevFreqArg is not involved in the
computation of TheoretDft. The different DevFreqArg values
depend on the type of filter used, on the Sample rate and on the
frequency.

Phase value of the measured signal:

(After applying DFT on the DSP’s output signal)
Arg = Argument (Dft)

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Instrument tests > Instrument Distortion test

Phase error:

6 Arg – TheoretArg
PhaseDeviation = 10 × ----------------------------------------------
2π × TestFreq

The phase error is computed for all the test frequencies, and the
maximum encountered is retained as final result.

Instrument Distortion test

This test is used to check the FDU’s built-in ADC converter for linear
response. A sine wave with kown amplitude and frequency is applied to
its input via the internal test network. The test returns the ratio of the
spectral power of all harmonics within the bandwidth determined by the
selected filter to the spectral power of the output signal.

Configuration 7
Sensors Pre-amp.
Input ΣΔ DSP
protection ADC
24 bits

Test network

Test
generator
(DAC)

Test data from LAUL

Figure 7-5

• ADC input: connected to the internal test network.

• Pre-amplifier gain: 1600 mV (0 dB) or 400 mV (12 dB), user-
selected.
• DAC: connected to internal test network.
• Filter type and Sample Rate: user-selected.
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Instrument tests > Instrument Distortion test

Test Sequence:

Tb Tm Te

Filter type Sample Rate (ms) Tm (ms) Number of samples

0.25 512 2048
0.5 1024 2048
0.8 LIN 1 2048 2048
2 2048 1024
4 2048 512
0.25 512 2048
0.5 1024 2048
0.8 MIN 1 2048 2048
2 2048 1024
4 2048 512

For Beginning and End times (Tb and Te), see page 165.

Test principle
The DAC supplies a 31.25 Hz sine wave to the internal test network
with a amplitude of 97% of the FDU’s full scale.
Gain RMS test signal Peak test signal
400 388 mV. 548.7 mV.
1600 1552 mV. 2194.9 mV.

The ADC input is connected to the internal test network and the voltage
at the internal test network outputs is measured.
The DFT of the DSP’s output signal is computed (for the input signal
frequency).
The corresponding fundamental spectral power is computed
(TestFreqPower). The harmonic spectral power of the same signal is
computed too (HarmonicPower) and divided by the fundamental

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Instrument tests > Instrument Distortion test

spectral power (the harmonic lines are within the passband delimited by
the cut-off frequency of the filter selected).
The test result is expressed in dB.

Fundamental spectral power computation:

2
TestFreqPower = Xˆ 1
^
where X1 DFT of the fundamental harmonic line

Harmonics spectral power computation:

N 2

HarmonicPower =  Xˆ i
2 7
where N ≤ 9.

Instrument distortion computation:

HarmonicPower
InstDistortion = 10 × log 10 --------------------------------------------
TestFreqPower

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Instrument tests > Instrument CMRR test

Instrument CMRR test

This test is used to measure the Common Mode Rejection Ratio of the
FDU’s built-in ADC converter. A sine wave with known amplitude and
frequency is applied to both of its inputs via the internal test network.
The test returns the ratio of the RMS value of the output voltage,
relative to the input, to the common mode voltage.

Configuration

Sensors Pre-amp.
Input ΣΔ DSP
protection ADC
24 bits

Test network

Test
generator
(DAC)

Test data from LAUL

Figure 7-6

• ADC input: connected to the internal test network.

• Pre-amplifier gain: 1600 mV (0 dB) or 400 mV (12 dB), user-
selected.
• Filter type and Sample Rate: user-selected.
• DAC: connected to internal test network.

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Instrument tests > Instrument CMRR test

Test Sequence:

Tb Tm Te

Filter type Sample Rate (ms) Tm (ms) Number of samples

0.25 512 2048
0.5 1024 2048
0.8 LIN 1 2048 2048
2 2048 1024
4 2048 512
0.25 512 2048
0.5 1024 2048
0.8 MIN 1 2048 2048
2
4
2048
2048
1024
512
7
For Beginning and End times (Tb and Te), see page 165.

Test principle
The DAC supplies a sine wave to the internal test network
(F = 31.25 Hz and Amplitude = 77.6% of DAC full scale).
The ADC input is connected to the internal test network so that the ADC
receives the same signal on both inputs.
• The theoretical input RMS value of the Common Mode voltage,
CMSignalRms, is computed from the FDU's calibration values
(theoretical resistance correction factor, DAC’s current correction
factor).
• The measured output voltage, Vrms, is the RMS value after scaling
(x1.6√2 or 0.4√2) of the DSP’s output.

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Instrument tests > Instrument CMRR test

• CMRR computation:

CMSignalRms
InstCMRR = 20 × log 10 -------------------------------------- + 20 × log 10 ( CMfactor )
Vrms

where CMfactor represents the Common Mode resistance correction

factor derived from the FDU's calibration results. The resulting
CMRR is with respect to the earth, not to the analog ground.
The test result is expressed in dB.

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Instrument tests > Instrument Crosstalk

Instrument Crosstalk
This test is used to measure crosstalk between FDU channels in
Instrument Test configuration.
The test includes two sequences: during the first sequence, the test
generator applies a sine wave to the test network in each even FDU
(F = 31.25 Hz). The ADC converter in each odd FDU measures the
resulting voltage across its own test network. (The test generator in odd
FDUs is disabled).
Conversely, during the second test sequence, the test sine wave is fed to
each odd FDU and the resulting voltage is measured across the test
network in each even FDU.
The ratio of the theoretical value of the test signal to the measured
voltage is computed and displayed as Instrument Crosstalk
(intentionally limited to 140 dB), for each active FDU.
7
Note Swapping between odd and even is not based on the channel
numbering within the spread but on numbering within each
segment delimited by LAUs: the closest channel to the
Transverse is always driven on the first test sequence. This may
give rise to an irregular pattern of driven channels when
crossing a Transverse or if the number of channels between two
consecutive LAUs is odd.
As a result, on the plotter, the test sine wave appearing on adjacent
traces (on either side of an LAU) is not necessarily indicative of a
crosstalk error.
Even

Even

Even
Even

Even
Even

Even
Even
Odd

Odd

Odd
Odd

Odd

LAUX LAUL

Figure 7-7

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Instrument tests > Instrument Crosstalk

Configuration
• ADC input: connected to the internal test network.
• Pre-amplifier gain: 1600 mV (0dB) or 400 mV (12 dB).
• DAC: connected to test network:
- in even FDUs during 1st sequence,
- in odd FDUs during 2nd sequence.
• Filter type: user-selected; Sample Rate: user-selected.

Sensors Pre-amp.
Input ΣΔ DSP
protection ADC
24 bits

Test network

Test
generator
(DAC)
Even FDUs during 1st sequence.
Odd FDUs during 2nd sequence.
Test data from LAUL

Figure 7-8

Sensors Pre-amp.
Input ΣΔ DSP
protection ADC
24 bits

Test network

Test
generator
(DAC)
Odd FDUs during 1st sequence.
Even FDUs during 2nd sequence.
Test data from LAUL

Figure 7-9

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Instrument tests > Instrument Crosstalk

Two test sequences are used (T1, T2):

Tb T1 Te Tb T2 Te

Filter type Sample Rate (ms) T1 (ms) T2 (ms) Number of samples

0.25 512 512 2048
0.5 1024 1024 2048
0.8 LIN 1 2048 2048 2048
2 2048 2048 1024
4 2048 2048 512
0.25 512 512 2048
0.5 1024 1024 2048
0.8 MIN 1 2048 2048 2048
2 2048 2048 1024
4 2048 2048 512 7
For Beginning and End times (Tb and Te), see page 165.

Test principle
The DAC supplies a 31.25 Hz sine wave to the internal test network of
the driven channels, with an amplitude of 97% of the FDU’s full scale.
Gain RMS test signal Peak test signal
400 388 mV. 548.7 mV.
1600 1552 mV. 2194.9 mV.

The DSP’s output signal in each odd FDU during the 1st sequence and
each even FDU during the 2nd sequence is acquired and its RMS value
(Vrms) relative to the input of the ADC is computed.
From the theoretical values of the devices in the test network in each
FDU, the theoretical RMS value (TheoretRMS) of the test signal is
computed.
Instrument Crosstalk is computed using the following expression:

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Instrument tests > Instrument Pulse

TheoretRms
InstXtalk = 20 log 10 × -----------------------------
Vrms

It is intentionally limited to 140 dB.

Note: a minimum test length is required (5 seconds @ 2 ms SR).

Instrument Pulse
This test is used to record the response of the instrument channel to a
pulse (one sample long).

Configuration

Sensors Pre-amp.
Input ΣΔ DSP
protection ADC
24 bits

Test network

Test
generator
(DAC)

Test data from LAUL

Figure 7-10

• ADC input: connected to the internal test RC network.

• Pre-amplifier gain: 1600 mV (0 dB) or 400 mV (12 dB), user-
selected.
• DAC: connected to the internal test RC network.
• Filter type and Sample Rate: user-selected.

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Instrument tests > Instrument Pulse

Three test sequences are used (T1, T2, T3):

Input level 75%

(% of generator
full scale)
0%

Tb T1 T2 T3 Te

Filter type Sample Rate (ms) T1 (ms T2 (ms T3 (ms)

0.25 512 0.25 511.75
0.5 512 0.5 511.5
0.8 LIN 1 512 1 511
2 512 2 510
4
0.25
512
512
4
0.25
508
511.75
7
0.5 512 0.5 511.5
0.8 MIN 1 512 1 511
2 512 2 510
4 512 4 508

For Beginning and End times (Tb and Te), see page 165.

Test principle
The DAC supplies the pulse described above to the internal test RC
network, and the resulting signal at the ADC output is recorded to tape.

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7 FDU test functions
Instrument tests > Reference voltage (Line power-on or TMS428 only)

Reference voltage (Line power-on or TMS428 only)

This test is used to check for any drift of the FDU’s built-in reference
voltage for the ADC converter. It cannot be launched with the Test
menu on the 428XL GUI, but it is automatically performed every time
the Line is powered up. In addition, it can be launched using a TMS428.

Configuration
• Pre-amplifier gain: 1600 mV (0dB).
• DAC: OFF.
• Filter type: 0.8LIN; Sample Rate: 1 ms.
Two 128-ms test sequences are used:

Input level

Tb 128 ms Te Tb 128 ms Te

For Beginning and End times (Tb and Te), see page 165.

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Instrument tests > Reference voltage (Line power-on or TMS428 only)

Configuration for the first sequence:

Pre-amp.

ΣΔ DSP
ADC
24 bits

Channel input
REFin

Built-in
reference Test
generator Test network
(DAC)

Figure 7-11 First sequence

ADC input: connected to the FDU’s built-in reference voltage. 7

Configuration for the second sequence:
Channel Pre-amp.
input
ΣΔ DSP
ADC

24 bits

Test network

Test
generator
(DAC)
Test data from LAUL

Figure 7-12 Second sequence

ADC input: connected to the FDU’s internal test network.

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Instrument tests > Reference voltage (Line power-on or TMS428 only)

Test principle
During the first sequence, the built-in reference voltage is fed to the
ADC converter. The mean value (Mean1) of the resulting output signal
is computed, relative to the input of the ADC.
During the second sequence, the input of the ADC is terminated on the
internal test network. The mean value (Mean2) of the resulting output
signal is computed, relative to the input of the ADC. This amounts to
measuring the offset.
From the two measurements, the actual value of the reference voltage is
computed using the following expression:
VrefMes = Mean2 – Mean1

The theoretical value of the reference voltage is expressed by:

TheoretVref = NomVref × ( 1,0 + RefVoltageFactor )

where
• NomVref = 1.2 V.
• RefVoltageFactor: correction factor saved in the FDU’s non-
volatile memory during calibration (see the chapter on Calibration).
The relative error between the value actually measured and the
theoretical value of the reference voltage is computed using the
following expression:

RelRefError = 100 ×  -------------------------------- – 1,0

VrefMes
 TheoretVref 

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Sensor tests > Sensor Noise test

Sensor tests
Sensor Noise test
This test is used to measure the noise at the channel input. The ADC
converter’s input is connected to the channel input. A DFT is performed
and the noise spectral power below 3 Hz is computed. As the total
energy of the output signal is known, the total noise within the
bandwidth can be deduced.

Configuration

Sensors Pre-amp.
Input
protection
ΣΔ
ADC
DSP
24 bits
7
Test network

Test
generator
(DAC)

Test data from LAUL

Figure 7-13

• ADC input: connected to the input circuitry from the sensor.

• Pre-amplifier gain: 1600 mV (0 dB).
• DAC: OFF.
• Filter type: 0.8LIN; Sample Rate: user-selected.

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Sensor tests > Sensor Noise test

Test Sequence:

Tb Tm Te

Filter type Sample Rate (ms) Tm (ms)

0.25 512
0.5 1024
0.8 LIN 1 2048
2 2048
4 2048
0.25 512
0.5 1024
0.8 MIN 1 2048
2 2048
4 2048

For Beginning and End times (Tb and Te), see page 165.

Test principle
From the DFT of the DSP’s output signal, the power of the Noise signal
below 3 Hz is computed.
As the total energy of the output signal is known, the system computes
the RMS level of Sensor noise in the bandwidth.

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Sensor tests > Sensor Noise test

Total Power on the N output signal samples:

1 N −1 2
TotalPower =  X i
N 0
where N depends on Acquisition Length and S. R.
X scaled sample amplitude, 24 bit coded.

Power below 3 Hz:

M 2

PowerLT3Hz =  Xˆ j
0

where M Number of harmonic lines below 3 Hz,

(depends on Δf = 1/N.SR).
^
Xj DFT of the DSP’s output signal X(t).
7
Sensor noise RMS value:

FieldNoise = TotalPower – PowerLT3Hz

Sensor offset (TMS428 only)

On a TMS428, the mean value after scaling of the DSP’s output signal
acquired during the test length is also computed, relative to the ADC
input, and displayed as Field Offset.

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Sensor tests > Sensor Resistance test

Sensor Resistance test

This test is used to measure the resistance of the seismic sensor
connected on the channel input.

Configuration

Sensors Pre-amp.
Input ΣΔ DSP
protection ADC
24 bits

Test network

Test
generator
(DAC)

Test data from LAUL

Figure 7-14

• ADC input: connected to the input circuitry from the sensor.

• Pre-amplifier gain: 1600 mV (0dB).
• DAC: connected to the sensor.
• Filter type: 0.8LIN; Sample Rate: user-selected (defaults to 2 ms if
automation).

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Sensor tests > Sensor Resistance test

Two test sequences are used (T1, T2):

Input level 12.5 %

(% of generator
full scale)
0%

Tb T1 Te Tb T2 Te

Filter type Sample Rate (ms) T1 (ms T2 (ms)

0.25 128 128
0.5 128 128
0.8 LIN 1 128 128
2
4
128
128
128
128
7
0.25 128 128
0.5 128 128
0.8 MIN 1 128 128
2 128 128
4 128 128

For Beginning and End times (Tb and Te), see page 165.

Test principle
The DAC supplies two different current levels (with known amplitude)
to the sensor channel.
The ADC input is connected to the sensor channel and the voltage at the
outputs is measured.
The measured output voltage, mean1 and mean2 is the value after
scaling (x1.6√2) the DSP’s output.
Knowing the output voltage and the current level, the system computes
the sensor’s resistance value.
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Sensor tests > Sensor Resistance test

• Measuring the total sensor input channel resistance:

InputRes = | (mean2 - mean1) / (IDac2 - IDac1) |
where IDac2 & IDac1 the two different current levels used for
the test.
• Sensor resistance:
InputRes = SensorRes // InputNetworkRes

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Sensor tests > Sensor Leakage test

Sensor Leakage test

This test is used to measure the global leakage resistance between the
seismic channel and the earth ground.

Configuration

Pre-amp.

Channel input ΣΔ DSP

ADC
24 bits

Test
network 7
Signal ground
Test
generator Earth ground
(DAC)

Test data from LAUL

Figure 7-15

• ADC input: connected to both the input circuitry from the sensor and
to the internal test network.
• Pre-amplifier gain: 1600 mV (0dB) or 400 mV (12 dB), user-
selected.
• DAC: connected to the internal test network.
• Filter type: user-selected; Sample Rate: user-selected (defaults to
2 ms if automation).
Note The Sensor Leakage test is irrelevant if the Input of the FDU is
left unconnected (or if the resistance connected exceeds
9999 Ω).

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Sensor tests > Sensor Leakage test

Two test sequences are used (T1, T2):

Input level 50 %
(% of generator
full scale)
0%

Tb T1 Te Tb T2 Te

Filter type Sample Rate (ms) T1 (ms T2 (ms)

0.25 128 128
0.5 128 128
0.8 LIN 1 128 128
2 128 128
4 128 128
0.25 128 128
0.5 128 128
0.8 MIN 1 128 128
2 128 128
4 128 128

For Beginning and End times (Tb and Te), see page 165.

Test principle
The principle behind this test consists of applying a voltage across the
FDU's ground and the earth reference.
• The DAC supplies two different current levels (with known
amplitude) to the internal network.
• The ADC input is connected to the sensor channel and the voltage at
the outputs is measured.
• The measured output voltage, mean1 and mean2 is the value after
scaling the DSP’s output (x1.6√2 or x0.4√2).

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Sensor tests > Sensor Leakage test

• Knowing the output voltage and the current level, the system
computes the leak resistance value of the input sensor channel,
expressed in Ohms.
The test returns the leak resistance seen by the FDU, that is the global
leakage resistance between the input conductors of the receiver link and
the earth. Naturally this is an equivalent resistance, which may result
from a complicated network of leakage resistances.
Note The lower the resistance of the geophone, the more accurate the
the leakage measurement.
With no leakage between the conductors of geophone arrays, the
impedances, with respect to the ground (earth), of the two conductors
connecting a geophone array to an FDU are equal. The unwanted
signals picked up (atmospheric interferences, earth potential, etc.) are
then sensed in common mode and thus rejected by the FDU.
If any leakage takes place (due to water penetration in cables, or
7
connectors or geophones, etc.) then the links exhibit unbalanced
impedances. As a result, the common-mode signals are somewhat
converted into differential signals and therefore added to the seismic
signal.
Leakage may give rise to other faults:
• Leakage between two conductors in the same geophone array will
result in a difference in the response to a pulse (gain and damping).
The discrepancy will be detected by the check for similarity in a Tilt
test.
• Leakage between a conductor in a geophone array and one in another
array will give rise to crosstalk.
• Leakage between a power supply conductor and a receiver link
conductor will give rise to noise which will be detected by a Sensor
Noise test.

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Sensor tests > Sensor Tilt test

Sensor Tilt test

This test is used to check the seismic channel for compliance with a
reference response.

Configuration

Sensors Pre-amp.
Input ΣΔ DSP
protection ADC
24 bits

Test network

Test
generator
(DAC)

Test data from LAUL

Figure 7-16

• ADC input: connected to the input circuitry from the sensor.

• Pre-amplifier gain: 1600 mV (0dB).
• DAC: connected to the sensor.
• Filter type: no filter; Sample Rate: 0.25 ms.
Three test sequences are used:

Input level 12.5%

(% of generator
full scale)
0%

Tb 16 ms 240 ms 256 ms Te

For Beginning and End (Tb and Te) times see page 165.

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Sensor tests > Sensor Tilt test

Test principle
The DAC supplies a pulse (with known amplitude and width) to the
sensor input channel.
The ADC input is connected to the sensor channel and the voltage at the
sensor channel outputs is measured.
The DSP’s output signal (pulse response) is scaled by x1.6√2 factor and
compared to a model recorded during the Save Receiver test.
The error is computed in terms of difference from the model expressed
in %.
• Computation of the signal offset (tilt offset) represented by the mean
value of the DSP’s output signal scaled by the 1.6√2 factor, acquired
during the test.
• Computation of the correlation coefficient between the Tilt response
and the model response is the "mean" of all Tilt responses of all active 7
FDUs.

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Sensor tests > Sensor CMRR test (LT428 and TMS428 only)

Sensor CMRR test (LT428 and TMS428 only)

This test is used to measure the Common Mode Rejection Ratio of the
seismic channel. A sine wave with known amplitude and frequency is
applied to the seismic channel. The test returns the ratio of the RMS
value of the output voltage, relative to the ADC input, to the common
mode voltage applied to the channel input.

Configuration

Sensors Pre-amp.
Input ΣΔ DSP
protection ADC
24 bits

Test network

Test
generator
(DAC)

Test data from LAUL

Figure 7-17

• ADC input: connected to the input circuitry from the sensor.

• NOTE: With a TMS428, the built-in 1.05 kΩ reference resistor of the
TMU428 is connected across the channel input in place of any sensor.
• Pre-amplifier gain: 1600 mV (0 dB) or 400 mV (12 dB), user-
selected.
• Filter type and Sample Rate: user-selected.
• DAC: connected to the sensor.

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Sensor tests > Sensor CMRR test (LT428 and TMS428 only)

Test Sequence:

Tb Tm Te

Filter type Sample Rate (ms) Tm (ms)

0.25 512
0.5 1024
0.8 LIN 1 2048
2 2048
4 2048
0.25 512
0.5 1024
0.8 MIN 1 2048
2
4
2048
2048
7
For Beginning and End times (Tb and Te), see page 165.

Test principle
The DAC supplies a sine-wave common-mode voltage to the sensor
channel (F = 31.25 Hz and Amplitude = 0.776 * FullScale).
The ADC input is connected to the input channel from the sensor.
• The theoretical input RMS value of the Common Mode voltage
applied to the sensor input channel, CMSignalRms, is computed
from the FDU's calibration values (theoretical resistance correction
factor, DAC current correction factor).
• The measured output voltage, Vrms, is the RMS value after scaling
(x1.6√2 or 0.4√2) the DSP’s output.

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Sensor tests > Sensor CMRR test (LT428 and TMS428 only)

• CMRR computation:

CMSignalRms
FieldCMRR = 20 Log --------------------------------------
Vrms

The test result is expressed in dB.

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Sensor tests > Sensor Pulse

Sensor Pulse
This test is used to record the response of the seismic channel to a pulse
(one sample long).

Configuration

Sensors Pre-amp.
Input ΣΔ DSP
protection ADC
24 bits

Test network

Test
generator
(DAC) 7
Test data from LAUL

Figure 7-18

• ADC input: connected to the input circuitry from the sensor.

• Pre-amplifier gain: 1600 mV (0 dB) or 400 mV (12 dB), user-
selected.
• DAC: connected to the channel input.
• Filter type and Sample Rate: user-selected.

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Sensor tests > Sensor Pulse

Three test sequences are used (T1, T2, T3):

Input level 75%

(% of generator
full scale)
0%

Tb T1 T2 T3 Te

Filter type Sample Rate (ms) T1 (ms T2 (ms T3 (ms)

0.25 512 0.25 511.75
0.5 512 0.5 511.5
0.8 LIN 1 512 1 511
2 512 2 510
4 512 4 508
0.25 512 0.25 511.75
0.5 512 0.5 511.5
0.8 MIN 1 512 1 511
2 512 2 510
4 512 4 508

For Beginning and End times (Tb and Te), see page 165.

Test principle
The DAC supplies the pulse described above to the seismic channel
input, and the resulting signal at the ADC output is recorded to tape.

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Sensor tests > Sensor Distortion

Sensor Distortion
This test is available on the TMS428. On the GUI it is only available for
FDU2S units. It is used to check the seismic channel of an FDU2S for
linear response (input filter and ADC converter).
A sine wave with kown amplitude and frequency is applied to the
channel input. The test returns the ratio of the spectral power of all
harmonics within the bandwidth determined by the selected filter to the
spectral power of the output signal.

Configuration

Sensors Pre-amp.
ΣΔ
Input
protection ADC
DSP
24 bits
7
Test network

Test
generator
(DAC)

Test data from LAUL

Figure 7-19

• ADC input: connected to the input circuitry from the sensor.

• Pre-amplifier gain: 1600 mV (0 dB) or 400 mV (12 dB), user-
selected.
• DAC: connected to the channel input.
• Filter type and Sample Rate: user-selected.

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Sensor tests > Sensor Distortion

Test Sequence:

Tb Tm Te

Filter type Sample Rate (ms) Tm (ms)

0.25 512
0.5 1024
0.8 LIN 1 2048
2 2048
4 2048
0.25 512
0.5 1024
0.8 MIN 1 2048
2 2048
4 2048

For Beginning and End times (Tb and Te), see page 165.

Test principle
The DAC supplies a sine wave to the seismic channel input
(F = 31.25 Hz and Amplitude = 0.776 × generator FullScale).
The ADC input is connected to the input circuitry.
The DFT of the DSP’s output signal, relative to the input of the ADC,
is computed (for the input signal frequency).
The corresponding fundamental spectral power is computed
(TestFreqPower). The harmonic spectral power of the same signal is
computed too (HarmonicPower) and divided by the fundamental
spectral power (the harmonic lines are within the passband delimited by
the cut-off frequency of the filter selected).
The test result is expressed in dB.

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Fundamental spectral power computation:

2
TestFreqPower = Xˆ 1
^
where X1 DFT of the fundamental harmonic line.

Harmonics spectral power computation:

N 2

HarmonicPower =  Xˆ i
2

where N ≤ 9.

Sensor distortion computation: 7

HarmonicPower
FieldDistortion = 10 Log --------------------------------------------
TestFreqPower

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Chapter

8 DSU test functions

This chapter describes the tests used to check the

performance of a DSU3 or DSU1. It includes the following
sections:

• Overview (page 212)

• Calibration (page 214)
• DSU3 tests (page 215)
• DSU1 tests (page 225)

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8 DSU test functions
Overview >

Overview
On the 428XL GUI, tests fall into two categories, Instrument tests and
Sensor tests, because traditionally the instrument (channel electronics)
and the sensor (geophone arrays) are separate devices. In the case of a
DSU3 or DSU1, although some tests are regarded as Instrument tests
and the others as Sensor tests, the channel electronics and the
accelerometers are tested as a whole assembly, never as separate
functions.
Test type on 428XL GUI
Test DSU3 DSU1
Instrument Sensor
Noise   
Gain & Phase   
Tilt   
Distortion   
Crosstalk   
Gravity  

The limits for instrument test results are contained in files (one for each
allowable sample rate) the format of which is described in 428XL
User’s Manual Vol. 2.
The limits for Sensor tests are user-selected in the Survey Setup in the
LINE main window.

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Overview >

The test sequence is composed of different steps:

• Transient steps: Beginning time (Tb) and End time (Te).
Filter type Sample Rate Tb (ms) Te (ms)

(ms) Instrument Sensor (Instrument&Sensor)

0.25 136 520 16
0.5 144 528 24
0.8 LIN 1 160 544 40
2 192 576 72
4 256 640 136
0.25 144 528 8
0.5 160 544 8
0.8 MIN 1 192 576 8
2 256 640 8
4 384 768 8
No filter 0.25 512 8

• Measurement steps (Tm) the length of which depends on the type of

test, type of filter and on the sample rate.
8
The number of steps depends on the type of test.

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8 DSU test functions
Calibration >

Calibration
DSU3 or DSU1 channels are calibrated prior to shipment from
SERCEL. The calibration process determines parameters that are saved
to the non-volatile memory in the DSU, allowing the LAU controlling
the line segment to correct all inherent errors attributable to the
construction (gain errors, offset errors, geometry errors). The following
tolerances are allowed during calibration:
• Gain: 0.5%, which amounts to a relative tolerance of 0.03°
(5.23 × 10-4 rad) for angles.
• Crosstalk (for DSU3 only): 0.25%, that is an orthogonality and
horizontality error of 0.15° (2.62 × 10-3 rad).
• Position on test fixture: 1° along each axis for a DSU3, 1° along the
vertical axis for a DSU1.

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DSU3 tests > Noise test

DSU3 tests
Noise test
The test returns the RMS value of the signal acquired on each channel
(µm/s²). The offset is not displayed on the GUI. No test signal is used.

MEMS ASIC 24 bits

Figure 8-1

• Filter type: 0.8LIN; Sample Rate: user-selected.

• Limits are user-selected in the Sensor setup on the GUI.
Test Sequence:
Tb Tm Te
8
Filter type Sample Rate (ms) Tm (ms)
0.25 512
0.5 1024
0.8 LIN 1 2048
2 2048
4 2048
0.25 512
0.5 1024
0.8 MIN 1 2048
2 2048
4 2048

For Beginning and End times (Tb and Te), see page 213.

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DSU3 tests > Gain and Phase test

Gain and Phase test

A 31.25 Hz sine wave is
applied to the sensor on
each channel. The MEMS ASIC 24 bits
response of the channel is
compared to a template. 31.25 Hz sine-wave

The test returns the relative Figure 8-2

error (%) compared to the
expected RMS value (Gain error). The test also returns the Phase error,
that is the difference (in µs) of the measured phase in relation to the
expected phase (@31.25Hz).
• Filter type and Sample Rate: user-selected.
• Limits are preset by SERCEL (Gain Error < +-3%,
Phase Error < 20 µs).
Test Sequence: Tb Tm Te

Filter type Sample Rate (ms) Tm (ms) Number of samples

0.25 512 2048

0.5 1024 2048
0.8 LIN 1 2048 2048
2 2048 1024
4 2048 512
0.25 512 2048
0.5 1024 2048
0.8 MIN 1 2048 2048
2 2048 1024
4 2048 512

For Beginning and End times (Tb and Te), see page 213.

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DSU3 tests > Distortion test

Distortion test
This test is used to check the DSU3 for linear response. A 31.25 Hz
sine-wave is applied to the sensor on each channel. The test returns the
ratio of the spectral power of all harmonics within the bandwidth
determined by the selected filter to the power of the fundamental
frequency (dB).

MEMS ASIC 24 bits

31.25 Hz sine-wave

Figure 8-3

• Filter type and Sample Rate: user-selected.

• Limits are preset by SERCEL.
Test Sequence: 8
Tb Tm Te

Filter type Sample Rate (ms) Tm (ms) Number of samples

0.25 512 2048
0.5 1024 2048
0.8 LIN 1 2048 2048
2 2048 1024
4 2048 512
0.25 512 2048
0.5 1024 2048
0.8 MIN 1 2048 2048
2 2048 1024
4 2048 512

For Beginning and End times (Tb and Te), see page 213.
Note: Distortion is noise-dependent.

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DSU3 tests > Crosstalk

Crosstalk
This test is used to measure crosstalk between DSU3 channels in
Instrument Test configuration.
The test includes two sequences: during the first sequence, the test
generator applies a sine wave to the sensor in each even channel
(F = 62.5 Hz for the 4-ms sample rate, 125 Hz otherwise). The resulting
voltage is measured on each odd channel. (The test generator in odd
channels is disabled).
Conversely, during the second test sequence, the test sine wave is fed to
each odd channel and the resulting voltage is measured on each even
channel.
The ratio of voltages during “active” and “silent” sequences is
computed and displayed as Instrument Crosstalk (intentionally limited
to 140 dB), for each active DSU3.
Note Swapping between odd and even is not based on the channel
numbering within the spread but on numbering within each
segment delimited by LAUs: the closest channel to the
Transverse is always driven on the first test sequence. This may
give rise to an irregular pattern of driven channels when
crossing a Transverse or if the number of channels between two
consecutive LAUs is odd.
As a result, on the plotter, the test sine wave appearing on adjacent
traces (on either side of an LAU) is not necessarily indicative of a
crosstalk error.

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DSU3 tests > Crosstalk

Even

Even

Even
Even

Even
Even

Even
Even
Odd

Odd

Odd
Odd

Odd
LAUX LAUL
Even

Even

Even

Even

Even

Even
Even

Even

Even

Even
Odd

Odd

Odd

Odd

Odd

Odd

Odd

Odd
LAUX
DSU3 DSU3 DSU3 DSU3 DSU3 DSU3

Figure 8-4

Configuration
• Filter type: user-selected; Sample Rate: user-selected (1, 2 or 4 ms).
• Test record length: see Specifications in 428XL User’s Manual Vol.
3.
Two test sequences are used (T1, T2): 8
Tb T1 Te Tb T2 Te

Number of samples
Filter type Sample Rate (ms) T1 (ms T2 (ms)
(for T1 or T2)
0.8 LIN 1 2048 2048 2048
2 2048 2048 1024
4 2048 2048 512
0.8 MIN 1 2048 2048 2048
2 2048 2048 1024
4 2048 2048 512

For Beginning and End times (Tb and Te), see page 213.

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DSU3 tests > Crosstalk

Test principle
A sine wave is fed to the driven channels (even during the 1st sequence,
odd during the 2nd sequence). Output signals from each channel during
“active” and “silent” sequences are acquired and their RMS value
(Vrms) is computed.
Instrument Crosstalk is computed using the following expression:

Vactive RMS
InstXtalk = 20 log 10 × ------------------------------
Vsilent RMS

(should not be less than 80 dB).

Note: Crosstalk is noise-dependent.

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DSU3 tests > Tilt test

Tilt test
The tilt test consists of
measuring the DC offset, caused
by the gravitational force, on ASIC 24 bits
each channel. (The DSU3 has
no low-cut frequency). No test MEMS
signal is used. Figure 8-5

The test returns the tilt angle,

expressed in degrees, of the I- and C-channels, that is the angle between
the direction axis of the channel and the horizontal plane (see
Conventions for 3C polarity on page 277). In the event of a Tilt error, the
LED on the DSU3 is flashing.
• Filter type: 0.8LIN; Sample Rate: user-selected.
• Full scale: user-selected.
• Limits are user-selected in the “Sensor setup” on the GUI.
Test Sequence: Tb Tm Te
8
Filter type Sample Rate (ms) Tm (ms)
0.25 512
0.5 1024
0.8 LIN 1 2048
2 2048
4 2048
0.25 512
0.5 1024
0.8 MIN 1 2048
2 2048
4 2048

For Beginning and End times (Tb and Te), see page 213.
The tilt angle is calculated in several steps. First, the system determines
which axis is the more vertical, that is the channel on which the absolute
value of acceleration is maximum. The tilt angle on that channel is
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DSU3 tests > Tilt test

calculated from the measurements on the other two channels. The

calculation depends on which channel is the closest to the vertical
direction and also on the sign of acceleration on the other channels.
The expressions used for calculating the tilt angle along each direction
are given in the table below.

The more vertical axis V-channel Tilt angle

 AccI 2 + AccC 2
AccV < 0 TiltV = ArcSin  ------------------------------------------
|AccV| > |AccI|
 G 
|AccV| > |AccC|
 AccI 2 + AccC 2
AccV > 0 TiltV = 180° – ArcSin  ------------------------------------------
 G 

TiltV = ArcCos  ----------------

|AccI| > |AccV| – AccV
|AccI| > |AccC|  G 

TiltV = ArcCos  ----------------

|AccC| > |AccV| – AccV
|AccC| > |AccI|  G 

The more vertical axis I-channel Tilt angle

TiltI = ArcSin  ------------

AccV < 0
AccI
 G 
|AccV| > |AccI|
|AccV| > |AccC|
TiltI = ArcSin  ------------
AccV > 0
AccI
 G 

|AccI| > |AccV|  AccV 2 + AccC 2

|AccI| > |AccC| TiltI = sign ( AccI ) × A rcCos  --------------------------------------------
 G 

TiltI = ArcSin  ------------

|AccC| > |AccV| AccI
|AccC| > |AccI|  G 

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DSU3 tests > Tilt test

The more vertical axis C-channel Tilt angle

– ArcSin  --------------
AccC
AccV < 0 TiltC =
 G 
|AccV| > |AccI|
|AccV| > |AccC|
TiltC = ArcSin  -------------- – sign ( AccC ) × 180
AccV > 0
AccC
 G 

– ArcSin  --------------
AccV < 0 AccC
TiltC =
 G 
|AccI| > |AccV|
|AccI| > |AccC|
TiltC = ArcSin  -------------- – sign ( AccC ) × 180
AccV > 0
AccC
 G 

TiltC = – sign ( AccC ) ×

|AccC| > |AccV|
|AccC| > |AccI|  AccV + AccI 
2 2
ArcCos  – sign ( AccV ) × ------------------------------------------
 G 
8
Note that for a Tilt test, the tilt correction processing is not done and the
offset is not removed.

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DSU3 tests > Gravity

Gravity
This test measures the gravity acceleration (“g”). This makes it possible
to qualify the complete performance of the DSU3.
The gravity is calculated from a Noise&Offset acquisition on the three
channels of the DSU3 simultaneously, using the following expression:

2 2 2
g = offsetV + offsetI + offsetC

The LAUL compares the measurement against G = 9.81 and returns the
departure in %.
The gain, sample rate and filter are user-selected. The necessary
acquisition is done over:
• 2048 ms @ S. R. 4 ms, 2 ms and 1ms.
• 1024 ms @ S. R.0.5 ms.
• 512 ms @ S. R. 0.25 ms.
Note that for a Gravity test, the tilt correction processing is not done and
the offset is not removed.

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DSU1 tests > Noise test

DSU1 tests
Noise test
The test returns the RMS value of the signal acquired on each channel
(µm/s²). The offset is not displayed on the GUI. No test signal is used.

MEMS ASIC 24 bits

Figure 8-6

• Filter type: 0.8LIN; Sample Rate: user-selected.

• Limits are user-selected in the Sensor setup on the GUI.
Test Sequence:
Tb Tm Te
8
Filter type Sample Rate (ms) Tm (ms)
0.25 512
0.5 1024
0.8 LIN 1 2048
2 2048
4 2048
0.25 512
0.5 1024
0.8 MIN 1 2048
2 2048
4 2048

For Beginning and End times (Tb and Te), see page 213.

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8 DSU test functions
DSU1 tests > Gain and Phase test

Gain and Phase test

A 31.25 Hz sine wave is
applied to the sensor on
each channel. The MEMS ASIC 24 bits
response of the channel is
compared to a template. 31.25 Hz sine-wave

The test returns the relative Figure 8-7

error (%) compared to the
expected RMS value (Gain error). The test also returns the Phase error,
that is the difference (in µs) of the measured phase in relation to the
expected phase (@31.25Hz).
• Filter type and Sample Rate: user-selected.
• Limits are preset by SERCEL (Gain Error < +-3%,
Phase Error < 20 µs).
Test Sequence: Tb Tm Te

Filter type Sample Rate (ms) Tm (ms) Number of samples

0.25 512 2048

0.5 1024 2048
0.8 LIN 1 2048 2048
2 2048 1024
4 2048 512
0.25 512 2048
0.5 1024 2048
0.8 MIN 1 2048 2048
2 2048 1024
4 2048 512

For Beginning and End times (Tb and Te), see page 213.

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DSU1 tests > Distortion test

Distortion test
This test is used to check the DSU3 for linear response. A 31.25 Hz
sine-wave is applied to the sensor on each channel. The test returns the
ratio of the spectral power of all harmonics within the bandwidth
determined by the selected filter to the power of the fundamental
frequency (dB).

MEMS ASIC 24 bits

31.25 Hz sine-wave

Figure 8-8

• Filter type and Sample Rate: user-selected.

• Limits are preset by SERCEL.
Test Sequence: 8
Tb Tm Te

Filter type Sample Rate (ms) Tm (ms) Number of samples

0.25 512 2048
0.5 1024 2048
0.8 LIN 1 2048 2048
2 2048 1024
4 2048 512
0.25 512 2048
0.5 1024 2048
0.8 MIN 1 2048 2048
2 2048 1024
4 2048 512

For Beginning and End times (Tb and Te), see page 213.
Note: Distortion is noise-dependent.

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DSU1 tests > Crosstalk

Crosstalk
This test is used to measure crosstalk between DSU1 units in Instrument
Test configuration.
The test includes two sequences: during the first sequence, the test
generator applies a sine wave to the sensor in each even DSU1
(F = 62.5 Hz for the 4-ms sample rate, 125 Hz otherwise). The resulting
voltage is measured on each odd DSU1. (The test generator in odd
DSU1s is disabled).
Conversely, during the second test sequence, the test sine wave is fed to
each odd DSU1 and the resulting voltage is measured on each even
DSU1.
The ratio of voltages during “active” and “silent” sequences is
computed and displayed as Instrument Crosstalk (intentionally limited
to 140 dB), for each active DSU1.
Note Swapping between odd and even is not based on the channel
numbering within the spread but on numbering within each
segment delimited by LAUs: the closest channel to the
Transverse is always driven on the first test sequence. This may
give rise to an irregular pattern of driven channels when
crossing a Transverse or if the number of channels between two
consecutive LAUs is odd.
As a result, on the plotter, the test sine wave appearing on adjacent
traces (on either side of an LAU) is not necessarily indicative of a
crosstalk error.
Even

Even

Even
Even

Even
Even

Even
Even
Odd

Odd

Odd
Odd

Odd

LAUX LAUL

Figure 8-9

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DSU1 tests > Crosstalk

Configuration
• Filter type: user-selected; Sample Rate: user-selected (1, 2 or 4 ms).
• Test record length: see Specifications in 428XL User’s Manual Vol.
3.
Two test sequences are used (T1, T2):

Tb T1 Te Tb T2 Te

Number of samples
Filter type Sample Rate (ms) T1 (ms T2 (ms)
(for T1 or T2)
0.8 LIN 1 2048 2048 2048
2 2048 2048 1024
4 2048 2048 512
0.8 MIN 1 2048 2048 2048
2 2048 2048 1024
4 2048 2048 512
8
For Beginning and End times (Tb and Te), see page 213.

Test principle
A sine wave is fed to the driven channels (even during the 1st sequence,
odd during the 2nd sequence). Output signals from each channel during
“active” and “silent” sequences are acquired and their RMS value
(Vrms) is computed.
Instrument Crosstalk is computed using the following expression:

Vactive RMS
InstXtalk = 20 log 10 × ------------------------------
Vsilent RMS

(should not be less than 80 dB).

Note: Crosstalk is noise-dependent.

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DSU1 tests > Tilt test

Tilt test
The tilt test consists of
measuring the DC offset, caused
by the gravitational force. (The ASIC 24 bits
DSU1 has no low-cut
frequency). No test signal is MEMS
used. Figure 8-10

The test returns the tilt angle,

expressed in degrees, of the sensor with respect to the vertical direction
axis. In the event of a Tilt error (i.e. Tilt > 20°), the LED on the DSU1
is flashing.
• Filter type: 0.8LIN; Sample Rate: user-selected.
• Full scale: user-selected.
• Limits are user-selected in the “Sensor setup” on the GUI.
Test Sequence: Tb Tm Te

Filter type Sample Rate (ms) Tm (ms)

0.25 512
0.5 1024
0.8 LIN 1 2048
2 2048
4 2048
0.25 512
0.5 1024
0.8 MIN 1 2048
2 2048
4 2048

For Beginning and End times (Tb and Te), see page 213.
Below is the expression used for calculating the tilt angle:

 G + AccV 
TiltV = ArcCos1 − 
 G 

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Chapter

9 Reference information

This chapter contains advanced reference information on

miscellaneous technical aspects. It includes the following
sections:

• Correlation (page 232)

• Converting samples to Millivolts or m/s² (page 235)
• Channel offset removal (page 238)
• Geophone strings (page 240)
• Sample interpolation in case of statics (page 249)
• DSU3 trace correction using tilt angles (page 261)

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9 Reference information
Correlation > Correlation in the Time Domain

Correlation
This section describes the correlation technique used in the 428XL.

Correlation in the Time Domain

cn =  pi si + n
i = 0, N – 1

where p Pilot channel

s Seismic channel
N Number of Pilot or Seismic samples in the
acquisition if the pilot ends with zeroes.

Correlation In The Frequency Domain

Principle: The complex product of the Fourier Transform of two signals
to be correlated is equal to the Fourier Transform of the correlation.
Fourier Transform of the correlation:
1.
– j  ------ nk
2π
 N
Ck =  cn e
n = 0, N – 1

2.
– j  ------ nk
2π
 N
CK =   pi si + n e
n = 0, N – 1 i = 0, N – 1

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 Reference information
Correlation > Correlation In The Frequency Domain

3.
– j  ------ ( n + i – i )k
2π
 N
CK =   pi si + n e
n = 0, N – 1 i = 0, N – 1

4.
+j  ------- ik – j  ------ ( n + i – i )k
2Π 2π
 N  N
CK =  pi e  si e
i = 0, N – 1 n = 0, N – 1

5.
C k = P k∗ × S k

(Which was to be proved)

Pk* is the conjugate of the Fourier Transform of the pilot.
The correlation is obtained from the inverse Fourier Transform.
6.
j  ------ kn
2π
 N
9
cn = ( 1 § N )  Ck e
k = 0, N – 1

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9 Reference information
Correlation > Correlation in the 428XL

Correlation in the 428XL

The correlation is achieved through a single FFT the length of which
exceeds the acquisition length. Complete inverse Fourier Transform is
performed. Therefore, the result does not need any correction.
Effect of the MP coefficient (Descale Multiplier):
- Let MPs be the coefficient on seismic channels and MPp the
coefficient on the pilot:
Si = Smv/2MPs
Pi = Pmv/2MPp

- For crosscorrelation of the seismic channels with the pilot:

cmv2 = cn 2MPs 2MPp

- For autocorrelation of the pilot:

amv2 = an 2MPp 2MPp

To normalize the result whatever the level and gain of the pilot channel
and to take account of the gain of the seismic channel, we need to divide
the result by the square root of the autocorrelation peak and multiply by
MPs:

MPs
cn 2
c mv 2 normalized = ------------------
-
an

Note Smv and Pmv in millivolts.

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 Reference information
Converting samples to Millivolts or m/s² >

Converting samples to Millivolts or m/s²

A field (bytes 9 to 12) in Trace Header Extension Block #7 allows trace
samples to be converted into millivolts, whatever:
- the type of receiver (FDU, DSU),
- the seismic channel gain,
- the type of process (Stack, Correl Before or After),
- the stacking fold,
- the noise elimination type,
- the level of the pilot and the gain of the corresponding Aux
channel.
See Trace Header Extension block # 7 (page 39) in User’s Manual Vol. 2.
The value in mV is obtained by directly multiplying the sample read
from the tape by the value recorded in the trace header.
For instance let 8388607 (0x7FFFFF) be the value of the sample and
2.697 × 10-4 be the value of the factor, the value of the sample in mV is:
8388607 × 2.697 × 10-4 = 2262 mV (which corresponds to the max value 9
of the receiver’s ADC converter with 0 dB gain).

The sample-to-mV conversion factor (K) recorded in bytes 9-12 is

computed as:
K = K1 × K2
K1 depends on the type of receiver and on the gain:
Table 9-1

FDU DSU3-428

0 dB (1600 mV) 12 dB (400 mV)

K1 = 2.697 × 10-4
K1 = 2.697 × 10-4 K1 = 6.742 × 10-5

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Converting samples to Millivolts or m/s² >

K2 depends on the type of process, on the stacking fold, on the noise

elimination type and on the max of pilot autocorrelation (see the table
below).
Table 9-2

With no noise elimination or with

K2 = With Diversity Stack
Historic elimination

Explo 1 1

Stack 1-
------ 1
SF

Correl.Before 2
---------------------------------
- Irrelevant
An × NS × SF

Correl After 2
-----------------------------------
- 2 -
-------------------
An × NS × SF
2 An × NS

where An = max of pilot autocorrelation

SF = stacking fold
NS = Pilot length / sampling rate

DSU-428 samples
The numbers on tape from DSU-428 channels convert to real units of
acceleration as follows:
1. Multiply the samples by the number in bytes 9-12 of Trace Header
Extension block #7;
2. Divide by 452 (sensor sensitivity recorded in byte 21-24 of Trace
Header Extension block #6).
For full scale, the maximum value of a sample in volts is 1.6√2
(= 2.262 V = 2262 mV), so 2262/452 = 5.004 m/s² is the maximum
measurable acceleration.

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Converting samples to Millivolts or m/s² >

DSU-408 samples
The numbers on tape from DSU-408 channels convert to real units of
acceleration as follows:
• If the samples are recorded with “Low Full Scale” gain, you have to
multiply the samples by the number in bytes 9-12 of Trace Header
Extension block #7, and then divide by 204. For full scale, the
maximum value of a sample in volts is 0.4√2 (= 0.5655 V
= 565.5 mV), so 565.5/204= 2.772 m/s² is the maximum measurable
acceleration.
• If the samples are recorded with “High Full Scale” gain, you have to
multiply the samples by the number in bytes 9-12 of Trace Header
Extension block #7, and then divide by 408. For full scale, the
maximum value of a sample in volts is 1.6√2 (= 2.262 V
= 2262 mV), so 2262/408 = 5.544 m/s² is the maximum measurable
acceleration.

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9 Reference information
Channel offset removal > Impulse, Crosstalk and Gain&Phase tests

Channel offset removal

Prior to processing a trace, whatever the type of signal (seismic or
auxiliary or test) and type of sensor, the PRM removes the offset from
each sample in that trace. With DSU3 sensors, the optional correction
of tilt is performed prior to calculating and removing the offset.
The offset is removed by calculating the average value of samples in the
whole trace, then subtracting that value from each sample.
If the “Micro-seismic” operating mode is selected (in the Operation
window’s Seismic setup), the offset is not removed.
Note that for a Tilt test (DSU1-428 or DSU3-428) or a Gravity test
(DSU3-428), the offset is not removed.

Impulse, Crosstalk and Gain&Phase tests

In Impulse, Crosstalk and Gain&Phase tests, each sample is corrected
using the following expression:
n
 A (k , i)
k=m
A (k , i) = A(k , i) −
n − m +1

1st sample in trace 1st sample in average value Last sample in trace
(mth sample in trace)
kth sample in trace
last sample in average value
(nth sample in trace)
ith trace

512 ms + 64 samples ( n – m + 1 ) × Sample Rate

---------------------------------------------------------------- = integer
32
Figure 9-1 Average value calculation in Impulse and Crosstalk tests

In Impulse, Crosstalk and Gain&Phase tests, the first 512 ms + 64

samples are not included in the calculation. As a result, the average
value is not biased by any transients in the early portion of the trace or

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Channel offset removal > Impulse, Crosstalk and Gain&Phase tests

by any overscaling caused by the source (most likely to appear in the

early portion of the trace). The length of the portion used to calculate
the average value is chosen to be a multiple of 32 ms. This prevents the
average value from being biased in Crosstalk tests (since the length is a
multiple of the period of the 31.25-Hz sine wave used in that type of
test).
In a Gain&Phase test with 0.25-ms sample rate, the trace length that is
not included in the calculation is shorter because the test only lasts
512 ms (see Instrument Gain and Phase tests on page 173).

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9 Reference information
Geophone strings > Number of geophones per trace

Geophone strings

Number of geophones per trace

The goal of seismic acquisition is to capture a signal. Unfortunately, the
signal is always affected by undesirable signals known under the
generic name of noise. So, the quality of an acquisition mostly depends
on the signal-to-noise ratio (S/N), also known as dynamic range (DR),
often expressed in dB: DR = 20 x log (S/N).
In seismic, the useful signal can be increased at the expense of a
stronger source, up to a certain level where it becomes corrupted by the
sensors (distortion occurs when the coil of the geophones starts going
outside of the linear zone of the magnetic field).
The dynamic range of a string, in field conditions, is limited at its low
side by the ground noise of the area (other noises like thermal or
Brownian noise are generally negligible).
The number of geophones per string (N) increases the dynamic range in
dB by 10 x log(N), whatever the arrangement (N = Np x Ns: Np sub-
string in parallel of Ns geophones in series) because in-phase signals
add linearly while uncorrelated signals add quadratically. For instance,
with 16 geophones per string, a gain of 12 dB can be expected.
With the 428XL, in most areas, the FDU noise figure is so low that the
arrangement (series/parallel) does not influence the result in terms of
signal to noise ratio: for the serial arrangement, the signal voltages
captured by the geophones are multiplied by N and the noise voltages
(RMS value) are multiplied by √Ν, while for the parallel arrangement
the signal voltages are not amplified (x1) but the noise voltages are
divided by √Ν. Therefore, the S/N ratio benefit is the same in both
cases.

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Geophone strings > Series / parallel arrangement

Series / parallel arrangement

The arrangement does not impact the S/N ratio but it impacts:
1- the gain;
2- the impedance of the string (hence, the Common Mode Rejection
Ratio, see Common Mode Rejection Ratio on page 242).
The geophones in a string can be connected as follows:
- arrangement 1: all in parallel (Ns = 1, Np = N)
- arrangement 2: all in series (Ns = N, Np = 1)
- arrangement 3: Np sub-strings in parallel of Ns geophones in series
(N = Np x Ns).
Note Arrangements 1 and 2 are special cases of arrangement 3.

String gain
The sensitivity of a geophone is the output voltage to ground velocity
ratio (Gg in V/m/s) also called transconduction constant.
The gain of a string, Gs, is the string output voltage to geophone output
voltage ratio. Gs depends on the geophone arrangement. 9
The gain of a string is equal to Ns, Ns being the number of geophones
in series in the string or sub-string:
- arrangement 1 (all in parallel): Gs = 1
- arrangement 2 (all in series): Gs = N
- arrangement 3 (Np x Ns): Gs = Ns

String impedance
Depending on the series/parallel arrangement the string differential
impedance can be lower or higher than the impedance of a single
geophone.

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Geophone strings > Series / parallel arrangement

The string impedance to geophone impedance ratio (Ir) is given by:

Ir = Ns / Np
- arrangement 1 (all in parallel): Ir = 1/N
- arrangement 2 (all in series): Ir = N
- arrangement 3 (Np x Ns): Ir = Ns / Np
For a given number of geophones per string, the impedance ratio
between arrangement 2 (all in series) and arrangement 1 (all in parallel)
is N2 (e.g. 256 for 16 geophones).
This is important for the Common Mode Rejection Ratio (CMRR) of
the string.

Common Mode Rejection Ratio

A geophone string acts as a receiver (antenna) for electro-magnetic
fields produced by atmospheric or industrial activities. When the two
conductors of the string exhibit equal impedance with respect to ground
(balanced string), the electro-magnetic field is turned into the same
voltage (with respect to ground) across the two string terminals (same
amplitude, same phase). The differential input nature of the recording
instrument rejects this common mode voltage.
If, for leakage reasons or by construction (see String wiring on page 246),
the impedance-to-ground of one conductor is different from the
impedance-to-ground of the other conductor, a current flows through
the differential string impedance causing a differential voltage to appear
across the string terminals (spikes, Hi-line pick-up, etc.). This is known
as the common-mode to differential-mode voltage conversion. The
amplitude of the picked-up signals is nearly proportional to the
differential impedance of the string i.e. proportional to Ir (Ns/Np).
With N geophones, in an Np x Ns string configuration, the signal
increases proportionally to Ns, the parasitic signals proportionally to
Ns/Np. Therefore, the signal to picked-up signal ratio increases by Np.

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Geophone strings > Series / parallel arrangement

The more branches in parallel, the better. A series-type geophone string

is much more likely to capture parasitic signals than aparallel-type (in a
given imbalance configuration).
Also, low-impedance geophones should be preferred. Especially, the
coil resistance should be low, as it is the dominant factor at high
frequencies.

Best string arrangement

We have seen that the string arrangement does not affect the dynamic
range if we consider the ‘normal’ noise generated in differential mode
(ground noise, thermal noise of the geophones). Only the number of
geophones matters.
A parallel-type arrangement gives more pick-up noise immunity and
therefore seems optimum.
However, when the string is connected to a recording system, one must
think in terms of system (sensors + recording instrument) dynamic
range, as two new factors intervene: the recording instrument noise and
the recording instrument maximum input voltage (themselves a
function of the preamplifier gain). 9
The sensitivity of the receiver configuration (which is the geophone
sensitivity times the string sensitivity: Gg x Gs) must be selected in such
a way that the string dynamic range best fits the instrument dynamic
range. A too high sensitivity will make the system clip large signals
(overscaling). A too low sensitivity will make the instrument noise limit
the signal-to-noise ratio. Both cases degrade the system dynamic range.
First, what is the best preamplifier gain?
The 428XL offers two selectable preamplifier gains (G1600 and G400)
which scale the instrument dynamic range as follows:

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Geophone strings > Series / parallel arrangement

Table 9-3

Max. signal Dynamic range

Gain Noise (typical 2 ms, nVrms)
(mVrms) (dB, typ.)
G1600 450 1600 131
G400 145 400 129

The 428XL has an unprecedented dynamic range at both gains with a

little advantage for G1600. However, G400 will be the reference for
configuring the geophone arrangement since it requires a lower receiver
sensitivity (remember: higher sensitivity means serial-type string
arrangement, hence more pick-up). This G400 gain should be used in
the lowest field noise conditions. G1600 should be selected in noisy
field conditions without loss in dynamic range provided that the source
energy is increased accordingly.
Let us go back to the best geophone arrangement in a string or more
generally in a receiver group.
The optimum receiver group sensitivity is the one that is “just high
enough” to make the lowest ground noise of the area higher than the
instrument noise for the selected preamplifier gain.
The input noise density of the 428XL is about 10 nV/ √Hz in G400 gain.
The earth back-ground noise is about 0.1 nm/s/√Hz at 20 Hz (New Low
Noise Model, Peterson 1993). Then, the receiver group sensitivity
should be in the order of at least 100 V/m/s. With a common geophone
sensitivity (Gg) of 30 V/m/s, a string gain (Gs) of 4 seems adequate.
However, this must be corrected by the fact that ideal back-ground noise
conditions are very seldom met in the field.
A realistic suggestion would be a string gain of 2 or 3 (Np sub-strings
in parallel of 2 or 3 geophone in series), which leads to strings built
according to the following table:

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Geophone strings > Series / parallel arrangement

Table 9-4 Suggested string configurations

N Np Ns Gs Irs DRBs (dB)

6 3 2 2 0.66 7.8
6 2 3 3 1.5 7.8
9 3 3 3 1 9.5
8 4 2 2 0.5 9

N: number of geophones in the string

Np: number of branches in parallel
Ns: number of geophones in series in each branch
Gs: gain of the arrangement
Irs: impedance ratio (string to geophone impedance ratio)
DRBs: dynamic range benefit.
Note High sensitivity geophones are favorable as they minimize the
required number of geophones in series for a given receiver
group sensitivity.

Group of strings
Of course, for better resolution, further dynamic range improvement
9
can be obtained through combining several strings of Table 9-4 in series/
parallel configuration (group of strings). Once again, parallel-type
string combinations should be preferred as long as the instrument noise
is not the limiting factor.
The following (non exhaustive) table gives the corrections to be made
to the figures of Table 9-4 when several strings are used:
Table 9-5 Corrections for group of strings

NS NSp NSs Gg Irg DRBg (dB)

2 2 1 1 0.5 3
2 1 2 2 2 3
3 3 1 1 0.66 4.8
3 1 3 3 3 4.8
4 2 2 2 1 6

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Geophone strings > String wiring

NS: number of strings per group

NSp: number of strings in parallel
NSs: number of strings in series
Gg: gain of the group of strings
Irg: impedance ratio of the group (group-to-string impedance
ratio)
DRBg: dynamic range benefit of the group of strings

To obtain the global figures of the receiver group, apply the following
formulas:
Total number of geophones of the group: N x NS
Group gain: Gs x Gg
Group to geophone impedance ratio: Irs x Irg
Group to geophone dynamic range benefit(dB): DRBs + DRBg

String wiring
We have seen (Common Mode Rejection Ratio on page 242) that a
parallel-type string arrangement minimizes common mode to
differential mode conversion for a given imbalance configuration i.e.
reduces parasitic signals (atmospheric and industrial noise) in the
records.
Another factor of major importance to minimize the common mode to
differential mode conversion is the impedance-to-ground matching of
the two terminals of the string (or the group of strings).
A string is balanced when the impedance seen between one terminal and
the local ground equals the impedance seen from the other terminal.
The impedance-to-ground is made of resistance and capacitance.

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Geophone strings > String wiring

The resistive part of this impedance is due to leakage arising mostly

from water intrusion in the connectors, the geophones or wounded
string cables. This must be carefully checked and fixed.
Besides resistive leakage, this impedance-to-ground is mainly made of
the capacitance-to-ground of each piece of wire in the string, connected
to each other through geophone impedance.
The capacitance of each piece of wire is proportional to its length.
Therefore, the wiring of the string must be symmetrical, i.e. the length
of the pieces of wire seen from one terminal, including those seen
through the geophones, must be identical to the length of the wires seen
from the other terminal.
If we consider that all the strings are built with several serial-type sub-
strings in parallel, all of these sub-strings, including the last one (at the
end of the string) must comply with the rule of symmetry. If this
condition is met at the sub-string level, the strings and the groups of
strings will be balanced.

Must be
Symmetrical substring connected
T1 9
T2

Substring 1 Last substring

Figure 9-2 Example of symmetrical string wiring

L1

L5
L3

L4
L6

L2

(L1 = L2, L3 = L4, L5 = L6)

Figure 9-3 Symmetrical sub-string

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Geophone strings > Conclusion

Note that with geophone cables having only 2 wires, often used in all-
in-series strings, it is difficult to respect the balance condition. The
imbalance can be minimized through dispatching the geophones in the
2 wires in turn:

Figure 9-4 Minimizing imbalance effect of 2-wire cables

Conclusion
For better seismic acquisition quality, the following tips should be borne
in mind:
1. A high number of geophones per trace improves the signal-to-
noise ratio (spatial filtering is not taken into account in this paper).
2. The G400 preamplifier gain is optimum with a 428XL recording
system, in low-noise areas (G1600 in noisy environments).
3. Parallel-type arrangement of geophones or strings should be
preferred to serial-type arrangement as long as the instrument
noise is not the limiting factor for the dynamic range (lower
impedance, less pick-up). Run field noise test and instrument
noise tests at both gains in order to select the gain that brings the
average field noise just above the instrument noise.
4. Strings made up of geophones with low coil resistance and high
sensitivity are less sensitive to pick-up noise. The right quality
factor for a geophone is the normalized transconduction constant
expressed in V/m/s/√Rc (or V/in/s/√Rc, Rc: coil resistance).
5. A symmetrical string wiring is a condition for a good common-
mode rejection ratio (atmospheric or industrial disturbances).
Two-wire string cables should be avoided (except for all-in-
parallel arrangements).

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Sample interpolation in case of statics > Principle of 428XL acquisition

Sample interpolation in case of statics

Principle of 428XL acquisition

Synchronous transmission
The 428XL system uses a synchronous transmission at 8.192 MHz or
16.384 MHz on Lines and 100 Mbps Ethernet on Transverses.
The transmission bits are organised in frames occurring every 1 ms. The
frames are generated by the 428XL (LCI-428) central unit on its Left
and Right Transverses, and replicated by each LAUX-428 on its Low
and High ports.
A frame is composed of 64 cells: the first cell is the frame header, the
next 63 ones are dedicated to LAU/LAU or FDU/LAU
communications. A cell is 16 bytes long on Lines and 32 bytes long on
Transverses.

Frame
header
Cell 1 Cell 64
9
1ms frame = 1024 bytes (Line) or 2048 bytes (Transverse)

Figure 9-5

Each cell is composed of three parts:

• cell header containing control bits (one byte),
• cell data (14 bytes on Line, 30 bytes on Transverse),
• cell CRC (one byte).

Cell header Cell data Cell CRC

1 byte 14 bytes (Line) or 1 byte

30 bytes (Transverse)

Figure 9-6

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Sample interpolation in case of statics > Principle of 428XL acquisition

The frames are used to implement the two communication schemes

described below.

FDU/LAU communications (low level protocol)

During acquisition, once per ms (i. e. once per frame), each FDU writes
4 samples in a cell data field. The addressing mode uses a token
mechanism: each FDU writes its data in the first free cell following a
frame header and sets a busy bit (in the cell header).The addressing
mode is then sequential: the Nth FDU writes its data in the Nth data cell.
The communication is synchronous with FDU acquisition and provides
an error detection mechanism using the CRC field.

Header Token Sample 1 Sample 2 Sample 3 Sample 4 CRC

Byte 1 Bytes Bytes Bytes Bytes Byte 16

4, 5, 6 7, 8, 9 10, 11, 12 13, 14, 15

Figure 9-7 Line FDU cell

LAU/LAU communication (high level protocol)

FDU samples received by an LAU are processed and compressed to
form packets that are sent back to the 428XL central unit. There is no
time relation with FDU acquisition: a high level protocol with error
detection and recovery is implemented.

Time synchronisation
The FDU samples the analog input using a 256 Kbits/s sigma-delta
converter. The sampling clock is derived from the 8.192 MHz line
frequency. The FDU performs a first decimation process to produce
24-bit samples at 0.25 ms sampling rate. Four 0.25 ms samples are
written into a cell every 1 ms.
The time difference between the generation of the 428XL frame and
sampling by each FDU is measured at line power-on with a precision of
122 ns. This value (let's call it T1) is measured and stored in each LAU
for each FDU it controls.

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Sample interpolation in case of statics > Principle of 428XL acquisition

The frame header sent by the 428XL central unit contains the T0
information. The information is received by all LAUs and FDUs.
To prevent wrong or no decoding of T0 in case of transmit errors:
• an LAU or FDU decodes T0 only if the CRC of the frame header is
correct,
• the T0 information is repeated three times.
The TB from the shooting system is not synchronous with the
generation of the 428XL frame. When TB occurs, the 428XL measures
the time from TB to the start of the next frame with a precision of 488 ns
and writes the T0 information and the measured time (let's call it T2) in
the next frame header.
The LAU uses T1+T2 times to have the data received from FDUs
synchronised with T0.

LAU acquisition
The LAU houses two processors: a DSP processor and an IBM403
processor.
The DSP of the LAU runs two independent processes: 9
• Process 1 receives incoming frames, decodes cells, checks cell
consistency and CRC, extracts samples and stores them into a 512 ms
circular buffer.
• Process 2 reads samples from the circular buffer, performs
convolution and decimation to generate acquisition samples at the
user sample rate, compresses them into packets of 16 scans and sends
the compressed packets to the IBM processor.
The IBM processor stores compressed packets into an acquisition
buffer. The acquisition buffer is sent to 428XL central unit upon request
using the LAU/LAU protocol. This phase (called retrieval) can be done
at a later date compared to acquisition.

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Sample interpolation in case of statics > Transmit error effects

LAU convolution
The DSP performs a convolution of 0.25 ms FDU samples with an FIR
filter to produce samples synchronous with T0 at the user sample rate.
The FIR filter length depends on the sample rate:
Table 9-6

Filter length
Sample rate
(number of points)
0.25 64
0.5 128
1 256
2 512
4 1024

There are 10 basic FIR filters: one for each sample rate, one for each
high-cut filter (0.8Lin and 0.8Min).
From each basic filter, a set of 64 filters are computed by shifting the
basic filter in 3.9-microsecond steps (0.25 ms / 64). The 640 filters are
pre-computed and stored in the memory of the LAU.
When receiving the T0, for each FDU, the LAU DSP divides the
propagation time by 0.25ms: the quotient is used to select the 0.25 ms
sample in the circular buffer to start the convolution with, the remainder
is used to select the correct FIR filter to obtain the precision of
3.9 microseconds.

Transmit error effects

The transmit error affects line transmission differently depending on the
protocol used:
• FDU to LAU communications: when receiving a frame from the line,
the LAU checks for cell consistency. When a cell CRC error is
detected, the corresponding path is displayed in orange. If frame
headers are unaltered, the acquisition continues. If frame headers are
altered, then the acquisition stops with an error message such as
frame error or token error.

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Sample interpolation in case of statics > CRC error handling algorithm

• LAU to LAU communications: the transfer of compressed sample

packets from LAU to the 428XL central unit uses the high level
protocol. If a transmit error occurs, a packet CRC error is detected,
the wrong packet is discarded and repeated. Transmit errors have no
effect on this type of communication.

CRC error

Figure 9-8

CRC error handling algorithm

An algorithm is implemented that minimises the effect of random
transmit error upon acquisition and allows the acquisition to continue,
9
in the event of CRC errors, rather than stopping with an error message.
In any frame where a CRC error occurs, the four 0.25 ms samples of
each FDU are replaced by the four corresponding samples of the
previous frame.
As the 0.25 ms FDU samples are then filtered, the result is an
interpolation (at the 2 ms sampling rate, the 4 duplicated samples are
convoluted with 508 samples around).
The corresponding path is displayed in orange.
The traces affected by CRC errors during the acquisition are marked as
“edited” in the SEGD record. (The Trace Edit field in demultiplexed
trace header is set to 03).

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Sample interpolation in case of statics > Experimentation

Experimentation

Effect of single CRC error

To illustrate how the CRC error handling algorithm works, results from
an experimentation are presented below, in which a CRC error is
generated during the acquisition of an FDU test sine wave (31.25 Hz
frequency) for all sampling rates.
The trace altered by the CRC (seis 5441) is captured by the SGA along
with a reference trace (seis 5436).
The sampling rate corresponding to the capture is displayed at the foot.

Figure 9-9 0.25 ms Sampling Rate

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Sample interpolation in case of statics > Experimentation

Figure 9-10 0.5 ms Sampling Rate

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Sample interpolation in case of statics > Experimentation

Figure 9-11 1 ms Sampling Rate

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Sample interpolation in case of statics > Experimentation

9
Figure 9-12 2 ms Sampling Rate

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Sample interpolation in case of statics > Experimentation

Figure 9-13 4 ms Sampling Rate

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Sample interpolation in case of statics > Experimentation

Effect of consecutive CRC errors

The experimentation consists in creating CRC errors on all acquisition
frames during 20 ms every 100 ms at 1 ms and 2 ms sampling rate.
The acquisition signal is a 31.25 Hz sine wave.
The trace altered by CRC errors is displayed in red and can be compared
with a normal trace displayed in brown.

Altered by CRC errors Normal trace

Figure 9-14 1 ms Sampling rate

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Sample interpolation in case of statics > Experimentation

Altered by CRC errors Normal trace

Figure 9-15 2 ms Sampling rate

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DSU3 trace correction using tilt angles > Overview

DSU3 trace correction using tilt angles

Overview
The Vertical, Inline and Crossline traces of a DSU3-428 (or DSU3-408)
can be corrected according to the tilt angle measured during tests, using
the formula below.
To enable the correction option see page 67 in User’s Manual Vol. 1.
The status of the option, indicating whether or not the correction is
done, is recorded in the File Header block of the SEGD file (bytes 777
to 780). See page 27 in User’s Manual Vol. 2.
The Tilt angle is recorded in bytes 17 to 20 of Trace Header Extension
block #3. See page 35 in User’s Manual Vol. 2.
If tilt correction is enabled and a DSU3 does not have any tilt test result
available, then the correction is not done on its channels and a warning
message is displayed.
Likewise, if any square root cannot be calculated because the value
involved is negative, the correction is not done and a warning message
is displayed. 9
Note that in Gravity and Tilt tests, no correction for tilt is done.

DSU3 trace correction formula

V′ = a 1 V + b 1 I + c 1 C

I′ = a 2 V + b 2 I + c 2 C
C′ = a 3 V + b 3 I + c 3 C
Where:
V, I, C are the 3 components of the DSU3 acquired at the same
time.
V', I', C' are the 3 components of the DSU3 after correction.
b1 = – sin(TiltI)

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DSU3 trace correction using tilt angles > DSU3 trace correction formula

2 2
a 1 = sC × sI × cos ( TiltC ) – sin ( TiltI )

c1 = sin(TiltC)

2 2
a 2 = sC × tan ( TiltI ) × cos ( TiltC ) – sin ( TiltI )

b2 = cos(TiltI)
c2 = sin(TiltC) × tan(TiltI)

sin ( TiltC )
a 3 = – --------------------------
cos ( TiltI )

b3 = 0

2 2
cos ( TiltC ) – sin ( TiltI )
c 3 = sC × ---------------------------------------------------------------------
cos ( TiltI )

TiltI is the tilt angle of the I component.

TiltC is the tilt angle of the C component.

sC = sign(cos(TiltC))
sI = sign(cos(TiltI))
sC and sI allow the use of DSU3 units with the V component
pointing upward.

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Chapter

10 Acceptance tests

This chapter includes the following sections:

• Before you begin (page 264)

• How to do an Acceptance test (page 265)
• Impulsive-type test (page 271)
• Historic-type test, Correlation Before Stack (page 273)
• Diversity-type test, Stacking (page 275)

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10 Acceptance tests
Before you begin >

Before you begin

WARNING
Prior to running any Acceptance test, open the Log main window and
save all your operating parameters (see below).
In the Log window:
• Open the Parameters folder;
• Select Save from the File menu (or from the toolbar). In the dialog
box that shows up, enter a name for the file to save (in the “File
Name” field), choose a directory where to save it (from the “Save In”
option button);
• Click Save.
WARNING
You can choose to do Acceptance tests for 1000 or 4000 or 10000
traces. Be sure the “Maximum number of traces” setting in the Install
window is consistent with the test you want to do.

Figure 10-1 Scaling parameters

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How to do an Acceptance test >

How to do an Acceptance test

1. In the Line main window, click Field Off.
2. In the Log main window, choose Load from the File menu.

acceptanceCfg

Figure 10-2

- In the box that shows up, select this directory (Linux):

export/home/user428/Sercel/e-428v-.-/eHci/jlog/workspace/acceptanceCfg

or on a Windows client computer:

10
ProgramFiles\Sercel\e-428v-.-\eHci>jlog\workspace\acceptanceCfg

- In the list box showing the content of that directory, choose one
of these configuration files, depending on which type of test you
want to do and how many traces you want simulate (xxxx = 1000
or 4000 or 10000):
- “accept_xxxx_impulsive.cfg” (xxxx traces, no processing, no
noise elimination);
- “accept_xxxx_historic.cfg” (xxxx traces, correlation before
stacking, Historic-type noise elimination);

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How to do an Acceptance test >

- “accept_xxxx_diversity.cfg” (xxxx traces, stacking,

Diversity-type noise elimination).
- Click Open.
- Click this button: to load the test parameters.

Figure 10-3 Test parameters viewed in Log window

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 Acceptance tests
How to do an Acceptance test >

3. In the Config main window:

- Open the Swath Setup window and click Apply.
- Open the Crew Setup window and click Apply.
- Click On Line.

Figure 10-4

4. In the Line main window:

- From the Setup menu, choose Synthetic Setup. 10
- From the Menu, choose Open. This opens a box prompting the
virtual spread files available for the system to simulate different
trace counts. Select the file matching the selection you made in
the Log main window.

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How to do an Acceptance test >

Tick this
option

Figure 10-5 Synthetic Setup window

- For example, choose the “accept_4000.ssprd” file if you want to

simulate 4000 traces. Click Open.
- Tick the Acceptance Test Mode option.
- Click the Browse button.

Figure 10-6

- Select the /users/e-428/snSol/snFile/synthetic/ directory. In the

list box showing the content of that directory, select the file
matching the selections you made above:
IMPORTANT
Be sure the files you select in the Line window match the file selected
in the Log window.

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How to do an Acceptance test >

For example, with “accept_4000_historic.cfg” selected in the

Log window, you must choose “accept_4000.ssprd” and
“accept_historic.rtv” in the Line window.
- Click Select.
- Click the Start Synthetic Mode button.
- In the main window, click Field On.

5. In the vibrator interface (VE432) main window, open the Basic

Type setup window and click Apply.

10
Figure 10-7

6. In the Plotter window, click Apply. Choose “On Line” from the
menu that pops up when you right-click on the plotter’s folder in
the left-hand pane.
7. In the Operation window:
- If you are doing a Historic-type test, open the Noise Editing
setup window. Go to Manual and then click on the Init button.
Go back to Auto.

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How to do an Acceptance test >

Figure 10-8

- Click in the operation table to choose a shot, and then click Go.
This launches the test and returns a message in the Status Mail
panel saying whether the test was successful or failed. A result
file (containing this message, and errors if any) is automatically
saved to this directory:
/export/home/e-428/snSol/workSpace/result/acceptance
You can use the file browser to go to that directory and open the
file in a text editor.

Figure 10-9

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 Acceptance tests
Impulsive-type test >

Impulsive-type test
In this test, a synthetic source signal is generated with a frequency
varying from 5 to 40 Hz and a 2-ms sample rate. The data is recorded to
a file, then a bit-to-bit comparison of that file with a reference file is
performed.
Below is an example of plot resulting from an Impulsive-type
Acceptance test.

Figure 10-10 Impulsive-type Acceptance test banner

10

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Impulsive-type test >

Figure 10-11 Impulsive-type Acceptance test traces

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 Acceptance tests
Historic-type test, Correlation Before Stack >

Historic-type test, Correlation Before Stack

In this test, a synthetic source signal is generated with a frequency
varying from 5 to 40 Hz and a 2-ms sample rate. The following
operations are performed successively: noise elimination, correlation,
recording to a file, bit-to-bit comparison of the file with a reference file.
Below is an example of plot resulting from a Historic-type Acceptance
test.

Figure 10-12 Historic-type Acceptance test banner

10

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Historic-type test, Correlation Before Stack >

Figure 10-13 Historic-type Acceptance test traces

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 Acceptance tests
Diversity-type test, Stacking >

Diversity-type test, Stacking

In this test, the system performs a two-fold stacking of a sweep with a
Diversity-type noise elimination processing, which can be visually
checked on a plotter, and a bit-to-bit comparison of the data with a
reference file.
The first sweep is a full-scale 40-Hz sine wave (2-ms sample rate), and
the second sweep a half-scale 60-Hz sine wave (2-ms sample rate).
Below is an example of plot resulting from a Diversity-type Acceptance
test.

Figure 10-14 Diversity-type Acceptance test banner

10

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Diversity-type test, Stacking >

Figure 10-15 Diversity-type Acceptance test traces

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Chapter

A Conventions for 3C
polarity

In this Appendix:

• Right-handed system (page 277)

• SEGD convention for 3C polarity (page 279)
• DSU3 Tilt angles (page 280)

Right-handed system

X Z

Figure A-1

Figure A-2

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A Conventions for 3C polarity
> Right-handed system

The three sensors in a DSU3-428 (or DSU3-408) are referenced to a

direct orthonormal (also called right-handed) 3-axis coordinate system.

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 Conventions for 3C polarity
> SEGD convention for 3C polarity

SEGD convention for 3C polarity

428XL data records conform to SEGD conventions for 3C polarity,
A
meaning that:

C
I

In
lin
e
C
ne I
ssli V
o
Cr
Vertical

+
V
Figure A-3

Figure A-4

- The three components are referenced to a “right-handed” 3-axis

coordinate system with the vertical axis pointing downwards.
- POSITIVE acceleration along each axis is toward the positive
direction of the axis.
The following polarity convention is used for tilt angles:
• A rotation from V to I around C is positive.
• A rotation from I to C around V is positive.
• A rotation from C to V around I is positive.

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A Conventions for 3C polarity
> DSU3 Tilt angles

C C C
I I I
+
+
V + V V

+
+ +
Figure A-5

DSU3 Tilt angles

The Tilt test returns the tilt angle of the I- and C-channels, that is the
angle between the direction axis of the channel and the horizontal plane,
expressed in degrees.
For example, the Tilt test will return the “I-tilt” angle and “C-tilt” angle
shown in the figure below, where:
• I’ is the projection of I onto the horizontal plane.
• C’ is the projection of C onto the horizontal plane.

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 Conventions for 3C polarity
> DSU3 Tilt angles

e
gl
an
ilt
I-t
I g)
ar in
e
(B
I0 (North)
I’
C le
t ang
C-til

C’
C0 (East)

- Reference directions: V0, I0, C0.

- Directions of DSU3 channels: V, I, C.

In this example:
- the “I-tilt” angle is positive,
- the “C-tilt” angle is negative.
V

V0 (Down)

Figure A-6

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> DSU3 Tilt angles

(Page intentionally blank)

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Appendix

B 428XL specifications

This appendix includes the following sections:

• General (page 284)

• Maximum real-time acquisition capacity (page 290)
• Max Acquisition or Record length Vs number of traces
(page 292)
• Acquisition cycle time (page 298)
• Instrument test specifications (page 299)

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B 428XL specifications
General >

General
Note All specifications below are typical at 25°C.

Central Unit
LCI-428/LCI-G
LCI-428 : Field units management, up to 10,000 channels real time @ 2 ms.
Up to 10 LCI-428 can be linked together to handle up to 100,000 channels real time @ 2 ms.
LCI-G : Field units management, up to 100,000 channels real time @ 2 ms.
Operating voltage 110-220 VAC, 50/60 Hz
Power consumption 6.7 W
Operating temperature 0 to +45°C
Storage temperature -40° to +70°C
Dimensions (HxWxD) 2U 19” rackable, 86.1 x 483 x 420.7 mm (19 x 16.5 x 3.4 in.)
Weight 4.1 kg (9.0 lbs.)

Ground Equipment
FDU-428
Functions • Data transmission with CRC control
• 24 bits A/D conversion
• D/A conversion with programmable bit stream
Input impedance differential mode 20 kΩ // 77 nF
Input impedance common mode 105 kΩ
Full scale input levels @ G1600 1.6 V RMS
Full scale input levels @ G400 400 mV RMS
Offset 0 (digitally zeroed)
Crosstalk > 130 dB
Low-cut filter None
High-cut filter 0.8 FN (linear or minimum phase)
Stop band attenuation > 120 dB (above Nyquist)
Sample rates 4, 2, 1, 0.5, 0.25 ms
Time standard True synchronous system
Interval between FDUs @ 8 Mbps: up to 110 m with ST+ cable, 90 m with WPSR cable
@ 16 Mbps: up to 90 m with ST+ cable, 75 m with WPSR cable
Power consumption 120 mW @ 8 Mbps, 132 mW @ 16 Mbps
Noise (3-200Hz) @ G1600 450 nV RMS
Noise (3-200Hz) @ G400 145 nV RMS
Instant dynamic range 130 dB
System dynamic range 140 dB
Distortion -110 dB
Gain accuracy < 0.1%
Phase accuracy 20 μs
CMRR 110 dB
Dimensions (HxWxD) 82.5 x 71.4 x 194 mm (3.2 x 2.8 x 7.6 in.)
Weight 0.35 kg (0.77 lbs.) with ST+ cable
Operating & storage temperatures -40° to +70°C
Water depth 15 m (for WPSR) 1 m (for ST+)
Instrument tests noise, distortion, phase, gain, CMRR, crosstalk
Fields tests resistance, tilt, leakage, noise, CMRR

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 428XL specifications
General >

DSU3-428
Functions • Acceleration measurement and data transmission with CRC control
• 24 bits digital acquisition
Full scale
Tilt max value
Noise (10-200 Hz)
5 m/s2
± 180°
0.4 μm/s2/√Hz
B
System dynamic range 120 dB @ 4 ms
Sampling rate 4, 2, 1, 0.5, 0.25 ms
Bandwidth 0 - 800 Hz (up to 1,600 Hz with degraded specifications)
Distortion -90 dB
Amplitude calibration accuracy ± 0.25%
Orthogonality calibration accuracy ± 0.25°
Power consumption 285 mW @ 8 Mbps, 300 mW @ 16 Mbps
Static sensor tests Tilt, gravity, noise
Dynamic sensor tests Distortion, gain, phase
Dimensions (HxWxD) 159.2 x 70 x 194 mm (6.2 x 2.7 x 7.6 in.)
Weight 0.43 kg (0.9 lbs)
Operating Temperatures -40° to 70°C
Storage temperatures -40° to +70°C
Water depth 15 m (for WPSR)
1 m (for ST+)

DSU1-428
Functions • Acceleration measurement and data transmission with CRC control
• 24 bits digital acquisition
Full scale 5 m/s2
Noise (10-200 Hz) 0.4 μm/s2/√Hz
System dynamic range 120 dB @ 4 ms
Sampling rate 4, 2, 1, 0.5, 0.25 ms
Bandwidth 0 - 800 Hz (up to 1,600 Hz with degraded specifications)
Distortion -90 dB
Amplitude calibration accuracy ± 0.25%
Power consumption 160 mW @ 8 Mbps, 170 mW @ 16 Mbps
Static sensor tests Tilt, noise
Dynamic, sensor tests Distortion, gain, phase
Weight 0.375 kg (0.827 lbs)
Operating Temperatures -40° to 70°C

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B 428XL specifications
General >

Spec. @ 25°C DSUGPS DSU3BV-428

Acceleration measurement and data
Functions transmission with CRC control.
24 bits digital acquisition
0 - 800 Hz (up to 1,600 Hz with degraded
Bandwidth
specifications)
Sampling rate (ms) 4, 2, 1, 0.5, 0.25
Full scale 5 m/s²
System dynamic
120 dB @ 4 ms
range
Noise (10-200 Hz) 0.4 µm/s²/√Hz
Distortion -90 dB
Tilt max value +/- 180° +/- 180°
Amp. +/- 0.25%, Orth. +/- 0.25° Amplitude +/- 0.25%
Calibration accuracy
Azimuth ±3.°, Positioning ± 1 m. Orthogonality +/- 0.25°
Power consumption
510 @ 16Mbps (310 if GPS off) 285 @ 8 Mbps, 300 @ 16 Mbps
(mW)
Static sensor tests Tilt, gravity, noise Tilt, gravity, noise
Dynamic sensor
Distortion, gain, phase Distortion, gain, phase
tests
Weight 0.58 kg (1.28 lbs) 1.5 kg (3.3 lbs)*
Temperature:
- Operating -40° to +70°C -40° to +70°C
- Storage -40° to +70°C -40° to +70°C
Water depth 1 m (ST+ or HP) 15 m.
Length * N/A 243 mm.
Diameter * N/A 62 mm.
Spike ** N/A Long or Short spike.
Drop cable: 250daN.
Pulling strength 70 daN WPSR Line cable: 250 daN
Pulling cord: 500daN. Snaphook: 300 daN.
15 m max.
Drop cable length ** N/A
(TS + 2×DL < 70 m)

* Main body.
** Customizable.
DL= Drop Length; TS = Trace Spacing.

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General >

LAUL-428
Functions • FDUs, DSUs and line management, data transmission with error recovery and
temporary storage
• 50 V line power supply

Tests capabilities
• Tests
• Power supply
• Data transmission
B
• Leakage
Operating power voltage 10.5 to 15 VDC, 2 battery connectors, to allow uninterrupted operation during battery
replacement
Power consumption 2.8 W (idle: 320 mW)
Maximum number of FDUs/DSUs between LAUs (@ 2 ms) :
Cable length between FDUs/DSUs 8 Mbps 16 Mbps
5 m 60/20 102/40
10 m 60/20 90/40
15 m 60/20 81/40
20 m 60/20 74/40
25 m 60/20 68/40
30 m 60/20 64/40
35 m 60/20 60/40
40 m 59/20 57/40
45 m 56/20 55/39
50 m 54/20 52/37
55 m 52/20 50/36
60 m 50/20 48/34
70 m 47/20 45/32
80 m 44/20 43/30
90 m 42/20 40/29
100 m 38/20 NA/NA
110 m 37/20 NA/NA
Line data rate 1000 ch. @ 2 ms @ 8 Mbps / 2000 ch. @ 2 ms @ 16 Mbps
Memory 30 MB local buffer for non-real time mode transmission
Material Aluminium
Dimensions (HxWxD) 108 x 93 x 224 mm (4.2 x 3.6 x 8.8 in.)
Weight 2.4 kg (5.3 lbs.)
Operating temperatures -40° to +70°C
Storage temperatures -40° to +70°C
Water depth 15 m

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General >

LAUX-428/LAUX-G
Functions • Ethernet-TCP/IP data transmission and routing (transverse) with error recovery and
temporary storage
• 50 V line power supply
• Tests
Tests capabilities • Power supply
• Data transmission
• Field tests (resistance, tilt, leakage, noise, CMRR)
• Instrument tests (noise, distortion, phase, gain, CMRR, crosstalk)
Operating power voltage 10.5 to 15 VDC, 2 battery connectors to allow uninterrupted operation during battery
replacement
Power consumption
LAUX-428 6.7 W (idle 1 W)
LAUX-G 6.9 W
TREP-428 1.3 W
TFOI-428 2.2 W
TFOI-G 2.8 W
Interval between LAUX on transverse:
Copper wire up to 6 x 125 m with TREP-428 repeaters and SRHRF cable
Fiber optics up to 10 km (one piece fiber) with TFOI-428 and TFOI-G interfaces
Transverse data rate 10,000 ch. @ 2 ms with LAUX-428
100,000 ch. @ 2 ms with LAUX-G
Memory 3 MB local buffer for non-real time mode transmission
Material Aluminium
Dimensions (HxWxD) 137 x 312 x 242 mm (5.4 x 12.3 x 9.5 in.)
Weight 5.5 kg (12.1 lbs.)
Operating temperatures -40° to +70°C
Storage temperatures -40° to +70°C
Water depth 15 m (also for TREP-428, TFOI-428 and TFOI-G)

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General >

428XL CABLES
APPLICATION Link Transverse
TYPE Light Strengthened Copper fiber optics
Name
Field conditions
ST+
Dry
WPSR
Wet
SRHRF
Wet
FIBER 428
Wet
B
Conductors arrangement 1 quad 1 quad 1 quad 1 fiber

Conductor type stranded stranded stranded NA

Foil Alu/PE +
Screen no no no
Copper Braid CuEt

Water blocked no yes yes no

Max water depth 1m 15 m 15 m 15 m

Diameter 6.5 mm 9.5 mm 10 mm 7.2 mm

Tensile strength (nude cable) 100 daN 300 daN 300 daN 200 daN

Tensile strength (with

70 daN 250 daN 250 daN 170 daN
connectors)
Stress Member aramid in line aramid braid aramid braid aramid in line

Weight 47 kg/km 95 kg/km 100 kg/km 45 kg/km

Double jacket no yes yes yes

Operating temperature -45 +70°C -40 +70°C -40+70°C -40+70°C

Storage temperature -45 +70°C -55 +85°C -55 +85°C -40 +70°C

Max. length in Line (8/16 Mbps) 110 m / 90 m 90/75 m NA NA

Max. length in Transverse (100

NA NA 125 m 5 km in line
Mbps)
2SWLFDO¿EUH $UDPLG¿EUH
$UDPLG¿EUH 2XWHUMDFNHWLQ
PU

5 mm

3
4 1

Note: Sercel reserves the right to change its specifications without prior notice.

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Maximum real-time acquisition capacity >

Maximum real-time acquisition capacity

Line data rate: 1000 traces @ 2ms @ 8 Mbps.
2000 traces @ 2ms @ 16 Mbps.
Transverse data rate: 10000 traces @ 2ms.
Acquisition: 10000 traces @ 2ms per LCI-428.
Transfer to drive: 3490E Single Simult
Blocked traces @ 2 ms 1350 1350
Non-blocked traces @ 2 ms 1350 1350

FUJI 3590 Single Simult

Blocked traces @ 2 ms 4500 4500
Non-blocked traces @ 2 ms 3500 2200

IBM 3590B Single Simult

Blocked traces @ 2 ms 3200 3200
Non-blocked traces @ 2 ms 3200 3200

IBM 3590E Single Simult

Blocked traces @ 2 ms 5500 5500
Non-blocked traces @ 2 ms 5500 5500

LTO 2 Single Simult

Blocked traces @ 2 ms 4500 4500
Non-blocked traces @ 2 ms 4500 4500

3592 J1A Single Simult

Blocked traces @ 2 ms 13000 13000
Non-blocked traces @ 2 ms 13000 13000

3592 E05 Single Simult

Blocked traces @ 2 ms 30000 18000
Non-blocked traces @ 2 ms 30000 18000

Note: The above figures are derived from the system’s processing capability. To
determine the ultimate capacity, see also the allowable number of traces as a
function of the Acquisition Length and Record Length (page 290), and select
whichever figure is the lowest.

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Maximum real-time acquisition capacity >

NAS Model D Single Simult

Traces @ 2 ms 28000 15000

NAS 1TB Model XA

Traces @ 2 ms
Single
28000
Simult
15000
B
NAS 4000 Single
Traces @ 2 ms 50 000

Note: The above figures are derived from the system’s processing capability. To
determine the ultimate capacity, see also the allowable number of traces as a
function of the Acquisition Length and Record Length (page 290), and select
whichever figure is the lowest.

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Max Acquisition or Record length Vs number of traces >

Max Acquisition or Record length

Vs number of traces
Tables B-1 through B-11 give the maximum allowable acquisition or
record length for each type of source signal (Vibroseismic, Implusive,
Test).
The allowable acquisition or record length depends on the following
factors:
• the Line data rate (16 or 8 Mbps);
• the RAM size of the 428XL server machine;
• the Sample Rate;
• the number of traces per LCI-428;
• the maximum number of samples allowed in the processing software,
determined by the “Maximum Nb Of Samples” parameter setting
(12001 by default) in the Administration window.
The figures in Tables B-1 through B-11 assume the “Maximum Nb Of
Samples” parameter is set at 128001.
If that parameter is set at 12001, then a shorter maximum acquisition
length is achieved. For example in Table B-1, the maximum acquisition
length with 125 traces per LCI-428 drops to:
- 48 s (instead of 99) @ 4-ms Sample Rate;
- 12 s (instead of 99) @ 1-ms Sample Rate;
- 3 s (instead of 32) @ 0.25-ms Sample Rate;

Note: To calculate the number of samples per trace, see Trace Data block
(page 30) in 428XL User’s Manual Vol. 2.

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Max Acquisition or Record length Vs number of traces > Vibroseismic source

Vibroseismic source
Table B-1 LAUL-428 @ 16 or 8 Mbps, 8-GB server RAM

Num. of FDU
channels
Seconds of data Versus Number of traces per LCI-428

S. R.
Traces B
(ms) 125 250 500 1000 2000 4000 8000 10000
between LAUs
4 99 99 99 99 99 99 55 44
48 2 99 99 99 99 99 55 27 22
(or 120 DSU 1 99 99 99 99 55 27 13 11
channels) 0.5 64 64 64 55 27 13 6 5
0.25 32 32 32 27 13 6 3 2

Table B-2 LAUL408 @ 8 Mbps, 4-GB server RAM

Seconds of data Versus Number of traces per LCI-428
Num. of FDU Traces
S. R.
channels
(ms) 125 250 500 1000 2000 4000 8000 10000
between LAUs
4 99 99 99 99 95 47 23 19
48 2 63 63 63 63 47 23 11 9
1 31 31 31 31 23 11 5 4
0.5 15 15 15 15 11 5 2 2
32
0.25 11 11 11 11 5 2 1 1

Table B-3 LAUL408 @ 8 Mbps, 8-GB server RAM

Seconds of data Versus Number of traces per LCI-428
Num. of FDU Traces
S. R.
channels
(ms) 125 250 500 1000 2000 4000 8000 10000
between LAUs
4 99 99 99 99 95 47 23 19
48 2 63 63 63 63 47 23 11 9
1 31 31 31 31 23 11 5 4
0.5 15 15 15 15 11 5 2 2
32
0.25 11 11 11 11 5 2 1 1

Note: with 3490E tape drives, the record length is limited to 64 s @ 2ms.

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Max Acquisition or Record length Vs number of traces > Impulsive source

Impulsive source

Table B-4 LAUL-428 @ 16 or 8 Mbps, 8-GB server RAM, FDU

Seconds of data Versus Number of traces per LCI-428
Num. of FDU Traces
S. R.
channels
(ms) 125 250 500 1000 2000 4000 8000 10000
between LAUs
4 99 99 99 99 99 99 55 44
2 99 99 99 99 99 55 27 22
48 1 99 99 99 99 55 27 13 11
0.5 64 64 64 55 27 13 6 5
0.25 32 32 32 27 13 6 3 2

Table B-5 LAUL-428 @ 16 Mbps, 8-GB server RAM, DSU3-428

Seconds of data Versus Number of traces per LCI-428
Num. of DSU3 Traces
S. R.
channels
(ms) 125 250 500 1000 2000 4000 8000 10000
between LAUs
4 99 99 99 99 99 99 55 44
2 99 99 99 99 99 55 27 22
120
1 81 81 81 81 55 27 13 11
(i. e. 40 DSU3s)
0.5 40 40 40 40 27 13 6 5
0.25 20 20 20 20 13 6 3 2

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Max Acquisition or Record length Vs number of traces > Impulsive source

Table B-6 LAUL408 @ 8 Mbps, 8-GB server RAM

Seconds of data Versus Number of traces per LCI-428
Num. of FDU Traces
channels
between LAUs
S. R.
(ms) 125 250 500 1000 2000 4000 8000 10000 B
4 63 63 63 63 63 63 55 44
2 31 31 31 31 31 31 27 22
48
1 15 15 15 15 15 15 13 11
0.5 7 7 7 7 7 7 6 5
32 0.25 5 5 5 5 5 5 3 2

Table B-7 LAUL408 @ 8 Mbps, 4-GB server RAM

Seconds of data Versus Number of traces per LCI-428
Num. of FDU Traces
S. R.
channels
(ms) 125 250 500 1000 2000 4000 8000 10000
between LAUs
4 63 63 63 63 63 47 23 19
2 31 31 31 31 31 23 11 9
48
1 15 15 15 15 15 11 5 4
0.5 7 7 7 7 7 5 2 2
32 0.25 5 5 5 5 5 2 1 1

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Max Acquisition or Record length Vs number of traces > Tests

Tests

Table B-8 LAUL-428 @ 8 Mbps, 8-GB server RAM, FDU

Seconds of data Versus Number of traces per LCI-428
Num. of FDU Traces
S. R.
channels
(ms) 125 250 500 1000 2000 4000 8000 10000
between LAUs
4 99 99 99 99 99 99 55 44
60 2 99 99 99 99 99 55 27 22
1 99 99 99 99 55 27 13 11
0.5 64 64 64 55 27 13 6 5
48
0.25 32 32 32 27 13 6 3 2

Table B-9 LAUL-428 @ 16 Mbps, 8-GB server RAM, DSU3-428

Seconds of data Versus Number of traces per LCI-428
Num. of DSU3 Traces
S. R.
channels
(ms) 125 250 500 1000 2000 4000 8000 10000
between LAUs
4 99 99 99 99 99 99 55 44
2 99 99 99 99 99 55 27 22
120
1 73 73 73 73 55 27 13 11
(i. e. 40 DSU3s)
0.5 36 36 36 36 27 13 6 5
0.25 18 18 18 18 13 6 3 2

Note about DSU3 Crosstalk test:

· @ 1-ms Sample Rate: a 5.5-second minimum length is required;
· @ 2- or 4-ms Sample Rate: an 8-second minimum length is required;
· @ 0.5- or 0.25-Sample Rate: Crosstalk test not allowed.

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Max Acquisition or Record length Vs number of traces > Tests

Table B-10 LAUL408 @ 8 Mbps, 4-GB server RAM

Seconds of data Versus Number of traces per LCI-428
Num. of FDU Traces
channels
between LAUs
S. R.
(ms) 125 250 500 1000 2000 4000 8000 10000 B
4 45 45 45 45 45 45 23 19
60 2 22 22 22 22 22 22 11 9
1 11 11 11 11 11 11 5 4
48 0.5 7 7 7 7 7 5 2 2
32 0.25 5 5 5 5 5 2 1 1

Table B-11 LAUL408 @ 8 Mbps, 16-GB server RAM

Seconds of data Versus Number of traces per LCI-428
Num. of FDU Traces
S. R.
channels
(ms) 125 250 500 1000 2000 4000 8000 10000
between LAUs
4 45 45 45 45 45 45 23 19
60 2 22 22 22 22 22 22 11 9
1 11 11 11 11 11 11 5 4
48 0.5 7 7 7 7 7 5 2 2
32 0.25 5 5 5 5 5 2 1 1

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Acquisition cycle time >

Acquisition cycle time

You can calculate the minimum acquisition cycle time (T) achievable,
depending on your record length, using the expression below:
T = T1 + T2 + T3
where
T1 = time required to form a fixed or rolling spread. See
Table B-12 below.
T2 = source controller synchronization delay (see FO-to-TB
time in VE432 or VE464 user’s manual).
T3 = your Acquisition Length (Record Length).

Table B-12 Time (seconds) required to form the spread

Num. of LCI-428s
Num. of traces Fixed spread Rolling spread
(@ 2-ms Sample Rate)
2000 < 0.1 < 0.6
4000 < 0.2 < 0.8
1 6000 < 0.2 < 0.9
8000 < 0.2 <1.0
10000 < 0.3 < 1.1
2 10000 to 20000 < 0.4 < 1.2
3 20000 to 30000 < 0.6 < 1.5

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Instrument test specifications > FDU-428

Instrument test specifications

Below are the programmed limits for Instrument tests (not to be
mistaken for the typical specifications @ 2-ms sample rate and 25°C
given on page 285).
B
FDU-428

0.25 ms Sample Rate

• Max. Distortion: -103 dB.
• Min. Common-Mode Rejection: 100 dB.
• Max. Gain error: 3.0%.
• Max. Phase error: 30 µs.
• Max. Noise (0 dB gain, 1600 mV scale): 18.0 µV.
• Max. Noise (12 dB gain, 400 mV scale): 4.5 µV.
• Min Crosstalk rejection: 110 dB.

0.5 ms Sample Rate

• Max. Distortion: -103 dB.
• Min. Common-Mode Rejection: 100 dB.
• Max. Gain error: 1.5%.
• Max. Phase error: 25 µs.
• Max. Noise (0 dB gain, 1600 mV scale): 2.0 µV.
• Max. Noise (12 dB gain, 400 mV scale): 0.5 µV.
• Min Crosstalk rejection: 110 dB.

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Instrument test specifications > FDU-428

1 ms Sample Rate
• Max. Distortion: -103 dB.
• Min. Common-Mode Rejection: 100 dB.
• Max. Gain error: 1.0%.
• Max. Phase error: 20 µs.
• Max. Noise (0 dB gain, 1600 mV scale): 1.4 µV.
• Max. Noise (12 dB gain, 400 mV scale): 0.35 µV.
• Min Crosstalk rejection: 110 dB.

2 ms Sample Rate
• Max. Distortion: -103 dB.
• Min. Common-Mode Rejection: 100 dB.
• Max. Gain error: 1.0%.
• Max. Phase error: 20 µs.
• Max. Noise (0 dB gain, 1600 mV scale): 1.0 µV.
• Max. Noise (12 dB gain, 400 mV scale): 0.25 µV.
• Min Crosstalk rejection: 110 dB.

4 ms Sample Rate
• Max. Distortion: -103 dB.
• Min. Common-Mode Rejection: 100 dB.
• Max. Gain error: 1.0%.
• Max. Phase error: 20 µs.
• Max. Noise (0 dB gain, 1600 mV scale): 0.7 µV.
• Max. Noise (12 dB gain, 400 mV scale): 0.18 µV.
• Min Crosstalk rejection: 110 dB.

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Instrument test specifications > DSU3-428

DSU3-428
For all sample rates:
• Gravity: 3 % B
• Max. Distortion: -60.0 dB (noise-dependent).
• Max. Gain error: 3.0 %
• Max. Phase error: 20 µs
• Min. Crosstalk rejection: 80.00 dB (noise-dependent).

DSU1-428
For all sample rates:
• Max. Distortion: -60.0 dB (noise-dependent).
• Max. Gain error: 3.0 %
• Max. Phase error: 20 µs
• Min. Crosstalk rejection: 80.00 dB (noise-dependent).

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Instrument test specifications > DSU1-428

(Page intentionally blank)

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 >

Index 1

428XL manuals
IM = Installation Manual
U1 = User’s Manual Vol. 1
U2 = User’s Manual Vol. 2
U3 = User’s Manual Vol. 2
TM = Technical Manual

Numerics
3592 cartridge drive IM: 161
3C
· polarity, SEGD U3: 265
408ULS
· Handling IM: 299
428-Lite
· connectors IM: 485
· installing IM: 46

A
Abbreviations IM: 509
Abort
· button, Operation U1: 232
· Plot U1: 584
· TMS428 tests TM: 43
Absolute
· spread U1: 124
· Spread, tests U1: 197
Accelerated
· weight drop U1: 51
Acceleration
· baseplate, monitoring, VE432 U1: 630

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>

· mass, monitoring, VE432 U1: 630

Acceptance
· tests U3: 251
Account IM: 109
Acquisition
· Error description (SEGD) U2: 16
· graphic view, normal, OVC U1: 681
· graphic view, normal, VE432 U1: 661
· graphic view, normal, VE464 U1: 548
· index, process type U1: 239
· Length U3: 280
· Length (SEGD) U2: 13
· local, VE432 U1: 645
· local, VE464 U1: 541
· Nb, APS U2: 150
· normal, OVC U1: 681
· normal, VE432 U1: 660
· normal, VE464 U1: 547
· Number (SEGD) U2: 16
· numeric view, normal, OVC U1: 683
· numeric view, normal, VE432 U1: 664
· numeric view, normal, VE464 U1: 551
· test, TMS428 TM: 95
· type, OVC U1: 676
· type, Process type U1: 239
· type, VE432 U1: 625
· type, VE464 U1: 502
Acquisition type tables (SEGD) U2: 15
Action (see Shortcuts)
Active
· swath U1: 77
Activity
· window U1: 78
ADC
· test, TMS428) TM: 91
Add
· button U1: 11
· to query U1: 436
· to quick launch, TMS428 TM: 49
Additional
· blocks (SEGD general header) U2: 7
· effects U1: 431
Address
· 428XL local network IM: 26
· Client computer IM: 118

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 >

· FUJI 3x90, changing IM: 151

· FUJI 3x90, displaying IM: 152
· LCI-428, changing IM: 29
1
· LCI-428, selecting U1: 46
· LTO, changing IM: 157
· MAC U1: 51
· TMS428 TM: 32
Adjusting
· clock, LCI TM: 6
Administration
· server U1: 22
Advance II U3: 88
Advanced
· connection parameters U1: 18
· mode, LT428 IM: 324, IM: 335, IM: 337
· process type U1: 237
Again
· Plot U1: 584
AGC
· plotter U1: 594
Air
· gun (SPS) U2: 66, U2: 114
· pressure psi (SPS) U2: 80, U2: 130
Alarm
· Positioning U1: 426
Alert
· system U1: 426
Alias filter
· Frequency at - 3dB point (SEGD) U2: 12
· Slope (SEGD) U2: 12
Angle from skew (SPS) U2: 62, U2: 74, U2: 110, U2: 124
Annotation
· logging U1: 69
Antenna
· Height, format U2: 154
Append
· VE432 vib (Look) U1: 643
Apply
· All, Survey setup U1: 105
· button U1: 12
· Sensor, Survey setup U1: 105
APS
· File format U2: 147
· report U1: 577
Archiving

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· configuring U1: 52
· DSUT TM: 157
· system status U1: 38
Array
· Forming (SEGD) U2: 12
Arrays, sub, number of U2: 80, U2: 130
Assembly
· Location (SEGD) U2: 27
· Serial number (SEGD) U2: 27
· Type (SEGD) U2: 27
Authorization
· granting U1: 23
Auto
· Corr Peak Time U1: 242
· Export U1: 444
· Level, VE432 vib drive U1: 656
· Level, VE464 vib drive U1: 534
· Lift, VE432 U1: 627
· Lift, VE464 U1: 504
· Look U1: 129
· noise editing U1: 282
· saving TMS428 reports TM: 49
Auto/Manual
· noise editing threshold U1: 282
· VE432 U1: 640
· VE464 U1: 522
Autocorrelation peak time (SEGD) U2: 16
Automatic
· Saving, DSUT TM: 147
Automation
· Continuous, shooting U1: 263
· Discontinuous, shooting U1: 263
· Look U1: 267
· Manual, shooting U1: 264
· shooting U1: 262
Autonomous
· mode, enabling U1: 262
· mode, using U1: 354
Aux
· Channel contents (SPS) U2: 63, U2: 76, U2: 111, U2: 126
· Line U1: 117
· Process Descriptor U1: 243
· Traces, number of U2: 13
Auxiliary
· channel, description U1: 117

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· channels U1: 117

· channels, Comments U1: 119
· channels, deploying IM: 282
1
· channels, Gain U1: 118
· channels, Instrument tests U1: 198
· trace scaling U1: 596
· trace, description U1: 243
Average
· distortion, APS U2: 148
· force, APS U2: 148
· ground stiffness, APS U2: 148
· ground viscosity, APS U2: 148
· phase, APS U2: 148
AWD U1: 51

B
Backup
· GoBook Q200 IM: 249
· setup U1: 73
Backward
· playback U1: 456
Banner
· setup, plotter U1: 585
Base
· Tracs TDMA U1: 508
Base scan interval (SEGD) U2: 8
Baseplate
· acceleration, monitoring, VE432 U1: 630
· velocity, monitoring, VE432 U1: 630
Basic
· pilot signal, VE432 (Acquisition type) U1: 626
· sweep signal, VE432 (Acquisition type) U1: 626
· sweep signal, VE464 (Acquisition type) U1: 503
Basic Type
· LOG, dB/Hz, VE432 U1: 612
· LOG, dB/Hz, VE464 U1: 486
· LOG, dB/octave, VE432 U1: 615
· LOG, dB/octave, VE464 U1: 489
· Setup, VE432 U1: 609
· Setup, VE464 U1: 483
· Taper, VE432 U1: 609
· Taper, VE464 U1: 484
· Tn, VE432 U1: 616
· Tn, VE464 U1: 490
Batteries (Show/hide) U1: 93

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>

Battery
· GoBook Q200 IM: 245
· LED TM: 88
· Limit, LT428 IM: 326
· polarity test (TMS428) TM: 89
· test TM: 89
· voltage limit U1: 93
Baud
· rate, Raveon radio (VE464) U1: 511
· rate, Tracs TDMA U1: 508
Bearing
· source line, VE432 U1: 638
· source line, VE464 U1: 520
Beginner U1: 30
Blaster
· Advance II U3: 88
· connector, LCI-428 IM: 480, IM: 481
· controller, in line IM: 304
· controllers U1: 285
· id (SEGD) U2: 14
· MACHA U3: 95
· SGDS U3: 96
· Shallow Sequencer U3: 93
· Shot Pro U3: 89
· signals IM: 482
· status (SEGD) U2: 14
· type U1: 50
Blasters
· interfacing U3: 85
Blocking
· trace U1: 449
Blocks in General Trailer U2: 9
BoomBox U1: 50
· wiring IM: 498
Box
· type, detour U1: 121
Break
· Point U1: 256
Bridge
· radio, ethernet IM: 429
Browser
· settings U1: 20
Buffer U1: 46
Build
· feature query U1: 435

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Built-in
· LAUX, upgrading TM: 105
Button U1: 4
1
Bypass
· file exports U1: 445
Bytes per scan (SEGD) U2: 7

C
Cable
· BoomBox IM: 498
· calibration TM: 44
· length, Line IM: 278, IM: 279
· Line cable length IM: 278, IM: 279
· Macha IM: 497
· path U1: 99
· replacing, LAUL TM: 210
· SGD-S Blaster IM: 493
· ShotPro IM: 495, IM: 496
· tester TM: 181
Cables IM: 479
Calibration
· clock, LCI TM: 6
· DSUT TM: 116
· FDU U3: 115, TM: 81
· meter and test cables TM: 44
· multimeter, TMS428 TM: 20
· TMU428 TM: 108
Camp
· distance to, alarm U1: 429
Capacitance
· error (SEGD) U2: 26
· high limit (SEGD) U2: 26
· low limit (SEGD) U2: 26
· value (SEGD) U2: 26
Capacity
· Processing U3: 278
Cartridge
· insertion U1: 474
Cartridge drive
· Shock-mount parts IM: 149
Cartridge drive. See Tape drive
CDU
· configuration IM: 65
Centre

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· button (mouse) U1: 95

Change
· button U1: 11
Changing
· LCI-428 U1: 44
Channel
· auxiliary, description U1: 117
· data error overscaling (SEGD) U2: 29
· edited status (SEGD) U2: 30
· filter (SEGD) U2: 29
· filter response U3: 43
· gain control method (SEGD) U2: 11
· gain scale (SEGD) U2: 29
· increment (SPS) U2: 68, U2: 85, U2: 117, U2: 135
· number (SEGD) U2: 27
· process (SEGD) U2: 30
· Raveon radio U1: 511
· sample to mV conversion factor (SEGD) U2: 30
· Set End Time (SEGD) U2: 11
· Set Number (SEGD) U2: 21
· set number (SEGD) U2: 11
· Set Starting Time (SEGD) U2: 11
· set, number of channels in U2: 11
· sets per record U1: 71, U2: 8
· skipping U1: 133
· Tracs TDMA U1: 508
· type (SEGD) U2: 28
· type id (SEGD) U2: 30
· Type Identification (SEGD) U2: 11
· type, Log shooting setup U1: 566
Channels, number of (SPS) U2: 63, U2: 75, U2: 111, U2: 125
Charge
· Depth U2: 79, U2: 129
· Length U2: 79, U2: 129
Chat U1: 42
Check
· Line U1: 206
Checkerboard
· view U1: 98
Circular bearing of H256 (SPS) U2: 62, U2: 73, U2: 110, U2: 124
Cleaning
· boxes IM: 254
· plugs IM: 254, TM: 279
Click U1: 4
· right, Line window U1: 97

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Client
· installing IM: 99
· main window U1: 30
1
· SPS U2: 61, U2: 71, U2: 109, U2: 121
Clipping
· method (noise elimination) U1: 370
· noise editing type U1: 280
· plotter U1: 599
Clock
· internal U1: 68
· LCI TM: 6
· time w.r.t. GMT (SPS) U2: 61, U2: 71, U2: 109, U2: 122
Cluster U1: 274
CMRR
· geophone string U3: 230
· Instrument (TMS428) TM: 80
· Instrument test U1: 200
· test record result recovery U3: 111
· test, FDU U3: 168
· test, Field (TMS428) TM: 76
· test, Sensor U3: 190
CN3e IM: 228
· Getting started IM: 316
· installing LT428 software IM: 234
· network address IM: 222, IM: 466
· resetting IM: 230
Code
· Producer U1: 71
COG
· Easting, format U2: 154
· elevation, format U2: 154
· file, format U2: 154
· log file U1: 577
· Northing, format U2: 154
· radius threshold U1: 396
· source position (estimated) U1: 419
· status, format U2: 154
· to source deviation, format U2: 154
Comments
· Auxiliary channels U1: 119
· LT428 results IM: 345
· observer, setup U1: 284
· SEGD U2: 19
· setup, Operation window U1: 258
Common

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· Mode Rejection U1: 200

· mode, Field (TMS428) TM: 76
· mode, Instrument (TMS428) TM: 80
· mode, test network, FDU calibration U3: 138
Common mode
· rejection ratio, geophones U3: 230
Communications
· protocol, source controllers U3: 85
Compound
· basic sweep signal, VE432 U1: 622
· basic sweep signal, VE464 U1: 499
Computation Domain, APS U2: 151
Connecting
· FDU link, TMS428 TM: 57
· FDU2S, TMS428 TM: 58
· LAUL, TMS428 TM: 59
· LAULS, TMS428 TM: 60
· LAUX, TMS428 TM: 61
· LAUXS, TMS428 TM: 67
· LAUXS-428, TMS428 TM: 65
· LT428 IM: 314
· TMS428 device under test TM: 56
Connection
· crew Web site U1: 39
· opening a session U1: 18
Connector (see Replacing)
Connectors IM: 479
· 428-Lite Break-Out Box IM: 485
· Blaster1 IM: 480
· Blaster2 IM: 481
· FDU Input IM: 487
· FDU2S takeoutt IM: 491
· LAUL
XDEV IM: 485, IM: 488
· LAUL-428 IM: 488
· LAUX
LINE IM: 489
Power IM: 489
TRANSVERSE IM: 489
XDEV IM: 490
Consumption
· port, TMS428 TM: 92
Continuity
· test limit U1: 110
Continuous

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· shooting U1: 263

Control
· type (SPS) U2: 65, U2: 79, U2: 113, U2: 129
1
· unit serial number (SEGD) U2: 29
· unit type (SEGD) U2: 29
Controller
· source, time management U1: 69
Conversion
· sample to mV U2: 30
Converting
· coordinates U1: 437
· samples to mV U3: 223
Coord. status final/prov (SPS) U2: 66, U2: 80, U2: 114, U2: 130
Coordinate location (SPS) U2: 61, U2: 71, U2: 109, U2: 121
Coordinates
· converting U1: 437
Copy
· and Paste U1: 14
· function (Export window) U1: 457
· tape, file U3: 4
Copy+ software tool U3: 9
Copying
· files to tape U1: 468
CopyMedia U3: 4
Copyrights U1: 63
Correction
· factor, FDU calibration U3: 116, TM: 81
· rate, DGPS (Raveon) U1: 511
· rate, DGPS (Tracs TDMA) U1: 507
Correlation
· After Stack, process type U1: 250
· After stack, theory of U1: 372, U1: 374
· Before Stack, process type U1: 248
· data distribution U1: 380
· Frequency domain U3: 220
· more about U1: 378
· pilot, choosing U1: 240
· Time domain U3: 220
Correlator, noise supp (SPS) U2: 65, U2: 79, U2: 113, U2: 129
Corrosion IM: 300
CRC errors U3: 237
Create
· selection U1: 436
Crew
· name U1: 66

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· name, Comment (SPS) U2: 63, U2: 75, U2: 111, U2: 125
· number, VE432 U1: 606
· number, VE464 U1: 480
· setup U1: 66
· VE464 vibrators U1: 480
· vibrators, OVC U1: 675
· vibrators, VE432 U1: 606
Crossline
· spacing, AGC U1: 596
Crosstalk
· Instrument test U1: 199
· Instrument, FDU U3: 171
· test record result recovery U3: 112
Crosstalk test
· DSU3 U3: 206, U3: 216
CT400 TM: 181
Custom
· basic sweep signal, VE432 U1: 619
· basic sweep signal, VE464 U1: 493
· sweep file, VE432 (how to load) U1: 621
· sweep, loading to VE464 DPG U1: 536
Customer
· support U1: 63
Customizing
· TMS428 tests TM: 68
Cut off
· error (SEGD) U2: 26
· high limits (SEGD) U2: 26
· low limit (SEGD) U2: 26
· value (SEGD) U2: 26
Cygwin IM: 126

D
DAC
· Common-Mode resistance, FDU calibration U3: 138
· line current correction, FDU calibration U3: 129
· rough current correction, FDU calibration U3: 123
Damp coeff, natural freq. (SPS) U2: 64, U2: 112
Damping coeff, natural freq (SPS) U2: 77, U2: 127
Data
· archive, DSUT TM: 157
· Bypass U1: 445
· computation domain, VE432 vib QC U1: 633
· computation domain, VE464 vib QC U1: 516

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· record sorting order (SPS) U2: 58, U2: 106

Data rate
· Line U3: 278
1
· Transverse U3: 278
Date
· of survey (SPS) U2: 61, U2: 70, U2: 109, U2: 120
· SEGD U2: 16
Datum U1: 438
· type, setup U1: 390
Datum Type setup
· Datum U1: 438
· Ellipsoid U1: 438
· Geoid U1: 438
Day
· of year (SPS) U2: 67, U2: 83, U2: 115, U2: 133
· of Year, APS U2: 151
Dead seis traces, number of U2: 13
Deboost
· basic sweep signal, VE432 U1: 623
· basic sweep signal, VE464 U1: 500
Default
· Channel type, Log U1: 566
Delay
· at end of Acq. U1: 275
· at end of VP U1: 275
· basic sweep signal, VE432 U1: 623
· basic sweep signal, VE464 U1: 498
· lift up, VE432 U1: 657
· lift up, VE464 U1: 535
· no-move alarm U1: 429
· radio, measuring, VE432 U1: 652
· radio, VE432 U1: 650
· refraction, process type U1: 238
· setup, Operation window U1: 275
· speed alarm U1: 430
Delete
· button U1: 12
Deploying
· field equipment IM: 251
Depth
· charge U2: 79, U2: 129
· towing U2: 80, U2: 130
Descale Multiplier (SEGD) U2: 11
Description
· absolute spread U1: 124

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· Auxiliary channels U1: 117

· Channels (Aux), Instrument tests U1: 198
· Channels (tests) U1: 197
· Generic Line U1: 127
· Generic spread U1: 128
· of grid units (SPS) U2: 61, U2: 72, U2: 109, U2: 123
· of survey area (SPS) U2: 61, U2: 70, U2: 109, U2: 120
· Receiver section U1: 107
· Survey U1: 106
Desensitization IM: 365, U1: 185
Desktop U1: 21
Detect
· end of tape U1: 474
Detection
· fiber, TMS428 TM: 93
Detour U1: 119
· skipped receiver points U1: 137
Deviation, COG to source, format U2: 154
Dialog box U1: 4
Digital
· pilot, additional U1: 504
· pilot, choosing U1: 503
· pilot, correlation U1: 240
· Sensor Unit, deploying IM: 260
Directories
· DSUT TM: 129
Disable
· radio U1: 193
Disassembling
· DSU TM: 200
· FDU TM: 195
· FDU2S TM: 254
· LAUL TM: 211
· LAULS TM: 258
· LAUR TM: 235
· LAUX-428 TM: 217
· LAUX-G TM: 223
· LAUXS TM: 229, TM: 264
· LRU TM: 243
· TFOI TM: 350
· TFOI-G TM: 339
· TREP-428 TM: 250
Discharge
· ESD protection TM: 4
Discontinuous

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· shooting U1: 263

Disk
· buffer U1: 46
1
· record, setup U1: 73
· space, monitoring U1: 475
Disk space
· DSUT TM: 129
Display
· mode, LT428 IM: 343
· Traces per inch U1: 599
Distance
· no-move alarm U1: 429
· simultaneous sources U1: 265
Distortion
· Instrument test U1: 199
· Sensor test U3: 195
· test record result recovery U3: 104
· test, FDU U3: 165
· test, TMS428 TM: 80
Distortion test
· DSU U3: 205, U3: 215
Distortion, APS U2: 148
Diversity
· enhanced (theory of) U1: 374
· stack U1: 278
· stack (theory of) U1: 372
Dongle IM: 132, U1: 47
Double-click U1: 4
Download
· DSUGPS firmware U1: 149
· from crew Web site U1: 40
· setup (firmware) U1: 217
DPG
· number of U1: 50
· Slave, VE432 U1: 607
· Slave, VE464 U1: 481
· status code, VE464 U1: 553
DPG Hosd Id U1: 47
Drag U1: 4
Drag and drop
· base camp U1: 410
· recording unit U1: 410
· source (Positioning) U1: 412
Drilling
· tool, DSU-428 IM: 263

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Drive
· level, APS U2: 148
· level, high, VE432 U1: 656
· level, high, VE464 U1: 535
· level, low, VE432 U1: 656
· level, low, VE464 U1: 535
· tape, install U1: 52
· transfer to U3: 278
Drive. See Tape drive
Driver
· graphic, Linux IM: 138
DSD
· Get, VE432 U1: 647
· Get, VE464 U1: 529
· Network, Navigation U1: 289
· network, VE432 U1: 607
· network, VE464 U1: 482
· reference signal, VE432 U1: 630
· setting, OVC U1: 681
· setting, VE432 U1: 646
· setting, VE464 U1: 527
· status code, VE464 U1: 553
· VE432 status, get U1: 629
· VE464 status, get U1: 516
DSP
· DRAM & DPR test TM: 87
DSU
· Deploying IM: 260
· disassembly instructions TM: 200
· Re-assembly instructions TM: 203
· tests TM: 163
DSU1-428
· test specifications U3: 289
DSU3
· theory of tests U3: 199
· tilt correction U1: 157
· trace correction formula U3: 249
DSU3-428
· in Line window U1: 140
· test specifications U3: 289
· tester (DSUT428) TM: 113
DSU3BV-428
· deploying IM: 267
· specifications U3: 274
DSUGPS

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· acquisition U1: 142

· deploying IM: 266
· firmware upgrading U1: 149
1
· GPS Base Position station IM: 40
· in Line window U1: 140
· in Positioning window U1: 414
· Instrument view U1: 153
· instrument view U1: 153
· Setup menu U1: 147
· specifications U3: 274
· SPS positions U1: 574
DSUT
· Archiving TM: 157
· Getting started TM: 132
· Installation, hardware TM: 117
· installation, software TM: 122
· Log-in TM: 132
· password TM: 132
· Repair assistant TM: 150, TM: 152
· Repair log file TM: 152
· Running tests TM: 142
· Specifications TM: 114
· Statistics TM: 155
· Test report TM: 158
· Test sequence editor TM: 140
Dump
· Output button U1: 240
· to SQC U1: 262
Dump stacking fold (SEGD) U2: 16
Duplicating, tape, file U3: 4
Duplication, sample U3: 237
DXF format U1: 405
Dynamic
· grouping, fleets U1: 266

E
e428 software
· licence U1: 47
Earth
· ground resistor, FDU calibration U3: 144
Easting, COG, format U2: 154
Edit menu
· DSUT TM: 140
Editing
· Noise U1: 278

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· number of windows (noise) U1: 280

· Spike U1: 369
· system parameters (Log) U1: 564
· type (noise) U1: 280
· Zeroing Length (noise) U1: 280
· Zeroing Taper Length (noise) U1: 280
Effect
· speed alert U1: 431
Electrostatic
· discharge TM: 4
Elevation
· antenna height, format U2: 154
· COG, format U2: 154
· reference U1: 394
Ellipsoid U1: 438
Ellipsoidal
· model U1: 394
Emergency
· alarm U1: 426
Enable
· instruments U1: 46
· radio U1: 193
Enabled
· export U1: 436
End
· colour map scale U1: 433
· line plug IM: 277
· of media U1: 453
· of tape, detecting U1: 474
End-of-line plug IM: 277
EOF U1: 452
EOM U1: 453
Error
· leakage U1: 131
· only, TMS428 report TM: 50
· recovery, Micro-seismic U1: 353
Errors
· CRC U3: 237
· DSUT TM: 167
ESD TM: 4
eSQC Pro IM: 13
Esri format U1: 405
Estimated
· source COG U1: 419
Ethernet

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· port, identifying IM: 30

· port, testing (TMS428) TM: 97
· radio bridge IM: 429
1
Event
· log viewer U1: 579
Excitation Overload, APS U2: 151
Expanded file number (SEGD) U2: 9, U2: 10
Explosive
· source type setup U1: 270
Explosive (SPS) U2: 66, U2: 114
Exponent, subscans U2: 11
Exponential
· basic sweep signal, VE432 U1: 616
· basic sweep signal, VE464 U1: 490
· time, plotter U1: 595
Export
· Auto/Manual U1: 444
· client window U1: 439
· enabled U1: 436
· mode U1: 52
Exporting
· LT428 results IM: 346
· SPS files U1: 573
· to NAS U1: 463
Exports
· configuring U1: 52
Extended
· channel set number (SEGD) U2: 12, U2: 21
· Channel Sets/Scan Types (SEGD) U2: 9
· file number (SEGD) U2: 21
· header (SEGD) U2: 13
· header blocks (SEGD) U2: 9
· header flag (SEGD) U2: 12
· header length (SEGD) U2: 8
· QC, VE432 vib U1: 633
· QC, VE464 vib U1: 516
· receiver line number (SEGD) U2: 22
· receiver point number (SEGD) U2: 23
· Record Length (SEGD) U2: 9
Extender
· TFOI, connecting IM: 274
External
· header (SEGD) U2: 19
· header blocks (SEGD) U2: 9
· header length (SEGD) U2: 8

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· label U1: 448

· tape label U1: 72

F
Factor to metre (SPS) U2: 61, U2: 73, U2: 109, U2: 123
Farthest
· Rcv Nb, LT428 IM: 333
FDPA428
· connecting IM: 386
· operating guide IM: 388
FDU
· Calibration U3: 115
· connector, replacing TM: 270
· disassembly instructions TM: 195
· INPUT connector IM: 487
· Input polarity IM: 487
· Max number between LAUs IM: 279, IM: 280
· Number in link, LT428 IM: 352
· Number in link, TMS428 TM: 109
· Power supply IM: 278
· reassembly instructions TM: 196
· unit type (SEGD) U2: 27
FDU2S
· Disassembly instructions TM: 254
· Input polarity IM: 491
· Re-assembly instructions TM: 255
· Takeout connector IM: 491
FDU-428
· deploying IM: 255
· test specifications U3: 287
Feature
· property names U1: 433
Fiber
· detection, TMS428 TM: 93
Fibre Optics
· allowable loss TM: 328
· connector, replacing TM: 378
· repairs TM: 327
· splices, number of TM: 328
· TFOI, connecting IM: 274
Field
· computer system(s) (SPS) U2: 61, U2: 71, U2: 109, U2: 121
· electronics, upgrading U1: 217
· electronics, upgrading via XDEV IM: 92
· on/off U1: 87

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· record increment (SPS) U2: 68, U2: 85, U2: 117, U2: 135
· record number (SPS) U2: 68, U2: 85, U2: 117, U2: 135
· tape number (SPS) U2: 68, U2: 85, U2: 117, U2: 135
1
· test limits, LT428 IM: 327
· test, automation U1: 267
· test, LT428 IM: 337
· update U1: 129
· update mode U1: 83, U1: 201, U1: 202
Field Units (see Instruments)
File
· count (SEGD) U2: 16
· duplicating U3: 4
· Header block (SEGD) U2: 7
· Load/Save U1: 583
· menu (TMS428) TM: 42
· number (SEGD) U2: 7, U2: 21
· number, recording U1: 76
· packager U1: 38
Files
· per tape U1: 449
· per tape (SEGD) U2: 16
Filter
· alias Hz, dB pnt, slope (SPS) U2: 63, U2: 75, U2: 111, U2: 125
· low Hz, dB pnt, slope (SPS) U2: 63, U2: 76, U2: 111, U2: 126
· LT428 IM: 324
· notch Hz, -3 dB points (SPS) U2: 63, U2: 111
· notch Hz, -3dB points (SPS) U2: 76, U2: 126
· playback U3: 31
· response, channel U3: 43
· servo control, VE432 U1: 655
· servo control, VE464 U1: 533
· type U1: 67
· type (SEGD) U2: 16
Filters
· plotter U1: 597
Firing
· Order (FO), process type U1: 237
Firmware
· updating U1: 217
· updating, TMS428 TM: 43
· updating, via XDEV IM: 92
· upgrading (TMS428) TM: 99
· version, reading (TMS428) TM: 98
First
· Notch Frequency (SEGD) U2: 12
· Timing Word (SEGD) U2: 21

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· waypoint U1: 399

Fleet
· cluster U1: 308
· group, dynamic U1: 266
· Ready U1: 273
· VE464 vibrator, crew U1: 482
· vibrator, APS format U2: 148
· vibrator, VE432 crew U1: 607
Floppy disk
· specifications (SPS) U2: 58, U2: 59, U2: 106, U2: 107
FM4 plug assembly
· SRHRF cable TM: 295
· ST+ cable TM: 284
· WPSR cable TM: 308
FO Window
· VE432 U1: 635
Folders
· DSUT TM: 129
Force
· ground, monitoring, VE432 U1: 630
· Overload, APS U2: 151
Force, APS U2: 148
Form
· Line, LT428 IM: 332
· Transverse, LT428 IM: 340
Format
· APS U2: 147
· code (SEGD) U2: 7
· instrument test limit U2: 41
· SEGD U2: 3
· SEGD, Rev 2.1 U2: 33
· Source
controllers U3: 85
· SPS, initial U2: 53
· SPS, Rev. 2.1 U2: 99
· SPS-like U2: 147
· synthetic file U2: 45
· version num. (SPS) U2: 61, U2: 70, U2: 109, U2: 120
Forward
· playback U1: 456
Fourier
· Transform U3: 220
Frequency
· domain U3: 220
· LRU IM: 362, U1: 181

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· Nyquist U1: 67
From channel (SPS) U2: 68, U2: 85, U2: 117, U2: 135
From receiver (SPS) U2: 68, U2: 86, U2: 117, U2: 136
1
FTP
· exporting U1: 443
· server U1: 52
· server setup U1: 451
· server, installing on PC IM: 208
FUJI 3x90
· address, changing IM: 151
· address, displaying IM: 152
Functions
· Test U1: 195
· VE432 U1: 640
· VE464 U1: 522

G
Gain
· Auxiliary channels U1: 118
· code U1: 125
· code, absolute spread U1: 124
· error, Instrument test U1: 200
· geophone string U3: 229
· Instrument tests U1: 198
· LT428 IM: 324
· Preamplifier, 0 dB, FDU calibration U3: 119
· Preamplifier, 12 dB, FDU calibration U3: 148
· Seismonitor U1: 94
· shooting setup, Log U1: 566
· test record result recovery U3: 105
· test, FDU U3: 161
· test, TMS428 TM: 80
Gain test
· DSU U3: 204, U3: 214
Gap U1: 107
· between receiver sections U1: 114
General
· Header block 1 (SEGD) U2: 7
· Header block 2 (SEGD) U2: 9
· Header block 3 (SEGD) U2: 10
· Header Block Number (SEGD) U2: 9, U2: 10
· LT428 parameters IM: 320, IM: 324
· Trailer blocks, number of U2: 9
Generate
· report U1: 436

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Generic
· spread U1: 126
· spread, description U1: 128
Geodetic datum
· parameters (SPS) U2: 61, U2: 72, U2: 109, U2: 122
· spheroid (SPS) U2: 61, U2: 72, U2: 109, U2: 122
Geographic
· AGC U1: 595
Geographic (see Topographic)
Geoid U1: 438
Geoidal
· model U1: 394
Geophone
· arrangement U3: 231
· number per trace U3: 228
· parallel U3: 229
· series U3: 229
· strings U3: 228
Geophysical contractor (SPS) U2: 61, U2: 71, U2: 109, U2: 121
Geotiff format U1: 405
Geozone
· alarm U1: 427
Get
· Similarities, VE464 U1: 544
· VE432 DSD U1: 647
· VE432 DSD status U1: 629
· VE464 DSD U1: 529
· VE464 DSD status U1: 516
Getting started
· 428XL GUI U1: 17
· DSUT TM: 132
· FDPA428 IM: 388
· LT428 IM: 316
· TMS428 TM: 36
Giga Transverse IM: 17
· DSU IM: 262
GIS U1: 432
Global
· rendering, plotter U1: 599
Go
· starting a shot U1: 231
· to waypoint U1: 360
· Topographic view U1: 89, U1: 91
GoBook IM: 243
· connecting IM: 314

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· Getting started IM: 316

· Q200 IM: 313
GoBook Q200
1
· Backup IM: 249
· Battery IM: 245
· installing IM: 246
· quick guide IM: 243
· Reinstalling IM: 250
· resetting IM: 244
GPS
· differential corrections, Raveon radio U1: 510
· differential corrections, Tracs TDMA U1: 507
· time management U1: 69
Grabbing
· VP U1: 396
Graphic
· driver, Linux IM: 138
· view, normal acquisition, OVC U1: 681
· view, normal acquisition, VE432 U1: 661
· view, normal acquisition, VE464 U1: 548
· view, Positioning window U1: 400
Graphic view (see Topographic)
Graphics
· how to select U1: 14
Gravity
· test U1: 200
Gravity test, DSU U3: 212
Grid
· coord. at origin (SPS) U2: 62, U2: 73, U2: 110, U2: 123
· origin (SPS) U2: 62, U2: 73, U2: 110, U2: 123
Ground
· earth resistor, FDU calibration U3: 144
· force, monitoring, VE432 U1: 630
· stiffness, APS U2: 148
· TMS428 TM: 21
· viscosity, APS U2: 148
· wing nut, replacing TM: 270
Group
· geophone string U3: 233
Guest
· privileges U1: 24
Guidance
· overview U1: 359
· set, VE464 U1: 543
· vibrator, enabling U1: 266

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H
Hardware
· installing IM: 25
HDOP, APS U2: 151
Header
· external, size U1: 71
Header record
· description (SPS) U2: 70, U2: 120
· specification (SPS) U2: 60, U2: 108
Height
· antenna, format U2: 154
Help TM: 46
· language U1: 20
· send, emergeny alarm U1: 427
Hide
· layer (Positioning) U1: 404
High
· box, detour U1: 121
· channel, detour U1: 121
· Line, sync, VE432 U1: 627
· Line, sync, VE464 U1: 504
· SN, detour U1: 121
· VE432 drive level U1: 656
· VE464 drive level U1: 535
High-cut
· filter, plotter U1: 597
· playback filter U3: 32
Hilbert
· transform, VE432 U1: 621
Histogram
· view U1: 103
Historic
· editing type (SEGD) U2: 15
· range (SEGD) U2: 15
· taper length (SEGD) U2: 15
· threshold Init value (SEGD) U2: 15
· zeroing length (SEGD) U2: 15
Historical
· Noise Editing U1: 278
History
· Line window U1: 102
Hold/Var U1: 282
Hot
· Line U1: 63

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Hour of day (SEGD) U2: 7

I
1
Icon U1: 5
ID
· VE464 vibrator U1: 481
· vibrator, VE432 U1: 607
Identity
· card U1: 64
Identity Card U1: 39
Immersible
· electronics IM: 288
· electronics, strain-relief IM: 303
Impedance
· geophone string U3: 229
Importing
· SPS files U1: 571
Impulse
· Sensor test U3: 193
Impulsive
· process type U1: 246
· Stack process type U1: 247
Inactive
· units (detour) U1: 119
Increment
· LT428 Rcv num IM: 323
· Marker U1: 116
· Shot U1: 270
· VP to do U1: 272
Index
· box U1: 5
· Source Point U1: 226
Indicator
· replacing TM: 276
Init
· Thresh U1: 282
Initialization, DSUT hardware TM: 133
Inline
· spacing, AGC U1: 596
Input
· resistance, FDU calibration U3: 123
· servo control loop, VE432 U1: 655
· servo control loop, VE464 U1: 533
Inserting

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· cartridge U1: 474

Install
· window U1: 44
Installing
· 428-Lite IM: 46
· Client software IM: 99, IM: 114
· DSUT hardware TM: 117
· DSUT software TM: 122
· Ethernet plotter IM: 143
· FDPA428, GoBook IM: 246
· FTP server on PC IM: 208
· Handheld PC software IM: 217
· hardware IM: 25
· laser link IM: 415
· LT428 software, CN3e IM: 234
· LT428, GoBook IM: 246
· patch (client) IM: 122
· patch (server) IM: 88
· Redhat, server IM: 75, IM: 102
· TMS428 hardware TM: 21
· TMS428 software TM: 23
· TMS428 software new release TM: 26
· Vehicle tracking box IM: 215
Instrument
· Code (I) tables (SPS) U2: 63, U2: 111
· Code (SPS) U2: 68, U2: 85, U2: 117, U2: 135
· Crosstalk U1: 199
FDU U3: 171
· Distortion U1: 199
· Gain error U1: 200
· Noise U1: 199
· Phase error U1: 200
· Pulse test U1: 200
· test limits U2: 41
· test limits, LT428 IM: 328
· test record recovery U3: 101
· test specifications U3: 287
· tests U1: 198
· tests, CMRR (FDU) U3: 168
· tests, Distortion (FDU) U3: 165
· tests, FDU U3: 156
· tests, Gain&Phase U3: 161
· tests, LT428 IM: 336
· tests, Noise U3: 158
· tests, Offset U3: 160
· tests, Pulse (FDU) U3: 174

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· tests, Resistance U3: 156

Instrument tests
· Crosstalk
1
DSU3 U3: 206, U3: 216
Instruments
· Colour U1: 91
· Show/hide U1: 91
Interfacing
· source controller U3: 85
Internal
· ADC, testing (TMS428) TM: 91
· clock U1: 68
· time break (SEGD) U2: 15
Interpolation U1: 600
· sample U3: 237
IP address
· 428XL local network IM: 26
· Client computer IM: 118
· LCI-428, changing IM: 29
· TMS428 TM: 32
Irregular
· LT428 layout IM: 335, IM: 337

J
jConfig window U1: 61
jExport window U1: 439
jInstall window U1: 43
jLine window U1: 81
jLog window U1: 557
jOperation window U1: 223
jOVC U1: 673
jPlotter window U1: 581
jPositioning window U1: 385
Julian
· day, backup setup U1: 74
Julian day (SEGD) U2: 7
jVE432 window U1: 603
jVE464 window U1: 477
jVibOther window U1: 669

K
Kit
· tools TM: 192

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L
Lab
· distance to, alarm U1: 429
Label
· external U1: 448
· properties U1: 432
· tape, external U1: 72
Landscape
· plotter U1: 598
Language
· help U1: 20
Laser Link IM: 411
· Installing IM: 415
· Specifications IM: 427
Last
· record, playback U1: 455
Lat. Long
· initial line (SPS) U2: 62, U2: 73, U2: 110, U2: 124
· scale factor (SPS) U2: 62, U2: 73, U2: 110, U2: 123
Lat. of standard parallel(s) (SPS) U2: 61, U2: 73, U2: 109, U2: 123
Latitude
· reference, vibrator guidance U1: 266
LAU tests
· Transmission TM: 93
· XILINX loading TM: 88
LAUL-428
· cable replacement TM: 210
· connectors IM: 485, IM: 488
· deploying IM: 273
· disassembly instructions TM: 211
· Power supply IM: 278
· reassembly instructions TM: 212
· spacing IM: 278, IM: 279
LAULS
· Disassembly instructions TM: 258
· Re-assembly instructions TM: 260
Launch
· quick, TMS428 tests TM: 49
Launcher
· bar, customizing U1: 29
· icons U1: 28
LAUR U1: 178
· disassembly instructions TM: 235
· reassembly instructions TM: 236

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LAUR-428 IM: 356

LAUX
· in TMS428 test system IM: 15
1
LAUX-428
· connectors IM: 489, IM: 490
· deploying IM: 273
· disassembly instructions TM: 217
· Power supply IM: 278
· reassembly instructions TM: 218
LAUX-G IM: 17
· disassembly instructions TM: 223
· GPS receiver for DSUGPS IM: 262
· reassembly instructions TM: 224
· TFOI-G strain-relief TM: 386
LAUXS
· Disassembly instructions TM: 264
· Re-assembly instructions TM: 265
LAUXS100-408 IM: 294
LAUXS100-428
· description IM: 294
LAUXS-428
· disassembly instructions TM: 229
· reassembly instructions TM: 230
Layer
· rename (Positioning) U1: 404
· show/hide (Positioning) U1: 404
Layout
· LT428 IM: 324
· setup U1: 112
LCI
· oscillator, adjusting TM: 6
LCI-428
· address, selecting U1: 46
· installing IM: 33
· IP address, changing IM: 29
· repairing TM: 7
· replacing U1: 44
LCI-G IM: 17, IM: 262
· installing IM: 32
Leak
· testing TM: 278
Leakage
· error U1: 131
· error (SEGD) U2: 26
· limit (SEGD) U2: 26

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· Line port, TMS428 TM: 92

· Sensor test U1: 202
· test U3: 185
· Test circuitry (LAU) U1: 131
· Test limit U1: 110
· test, Field (TMS428) TM: 77
· value (SEGD) U2: 26
LED
· Run, testing (TMS428) TM: 90
LED test
· DSU TM: 163
Length
· pilot, other vibrator systems U1: 671
· pilot, OVC U1: 676
· record (SEGD) U2: 16
· record, process type U1: 237
· sweep, other vibrator systems U1: 670
· sweep, OVC U1: 676
· time, plotter U1: 600
· Zeroing (noise) U1: 280
· Zeroing Taper (noise) U1: 280
Level
· alert, used disk space U1: 476
· auto, VE432 vib drive U1: 656
· auto, VE464 vib drive U1: 534
Licence
· client IM: 132, U1: 47
· information about U1: 26
· LT428 IM: 316
· Plotter IM: 133, U1: 48
· VE464 Guidance IM: 134, U1: 49
Lift
· up delay, VE432 U1: 657
· up delay, VE464 U1: 535
Limit
· instrument test U2: 41
Limits (see Test limits)
Line
· check U1: 206
· data rate U3: 278
· end plug IM: 277
· Error Recovery U1: 353
· Generic U1: 127
· mapping to a logical line U1: 135
· name (SPS) U2: 67, U2: 68, U2: 81, U2: 85, U2: 86, U2: 115, U2: 117, U2: 131,
U2: 135, U2: 136
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· name, APS U2: 148, U2: 157

· name, COG, format U2: 154
· Nb Inc, LT428 IM: 323
1
· number U1: 106
· number format (SPS) U2: 62, U2: 74, U2: 110, U2: 124
· port, leakage test (TMS428) TM: 92
· port, transmission test (TMS428) TM: 94
· power polarity (TMS428) TM: 97
· radio bridge IM: 455
· sequence number, SPS U2: 109, U2: 121
· skipping U1: 128
· socket, replacing TM: 271
· splitting U1: 116
· Test, LT428 IM: 321
· troubleshooting U1: 207
LINE connector
· LAUX IM: 489
Line Tester
· operating guide IM: 311
Linear
· basic sweep signal, VE432 U1: 611
· basic sweep signal, VE464 U1: 485
· Phase U1: 68
· phase filter U3: 44
Link
· FDU-428, examples IM: 258
· Number of FDUs, update (LT428) IM: 352
· Number of FDUs, update (TMS428) TM: 109
Linux
· graphic driver IM: 138
List
· box U1: 5
Listening
· time U1: 238
Lite
· connectors IM: 485
· installing IM: 46
· Process Type settings U1: 237
Live seis traces, number of U2: 13
LLX400. See Laser Link
LLX400. See Laser link
Load
· Thresh U1: 282
Loading
· Custom sweep (VE464 DPG) U1: 536

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· DSUT software TM: 122

· system parameters U1: 565
· TMS428 software TM: 23
Local
· acquisition, VE432 U1: 645
· acquisition, VE464 U1: 541
· disk U1: 46
· ellipsoidal model U1: 394
· network IM: 19
· oscillator, testing (TMS428) TM: 93
· user U1: 19
LOG
· dB/Hz, VE432 U1: 612
· dB/Hz, VE464 U1: 486
· dB/octave, VE432 U1: 615
· dB/octave, VE464 U1: 489
Log
· file, DSU repair TM: 152
· files, compressing IM: 97
Log in
· connecting to server U1: 18
· DSUT TM: 132
· installing server software IM: 77, IM: 104
· name U1: 20
Logging
· post-annotation U1: 69
Logging in
· first time IM: 131
Logical
· line mapping U1: 135
Login IM: 109
Long. of central meridian (SPS) U2: 62, U2: 73, U2: 110, U2: 123
Look
· Automatic U1: 267
· automatic U1: 129
· manual U1: 129
· properties U1: 129
· sensors U1: 89, U1: 91
· test (TMS428) TM: 98
· VE432 DSD U1: 641
Look&Feel U1: 21
Loop
· LRU U1: 194
· servo control, VE432 U1: 655
· servo control, VE464 U1: 533

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Loss

Low
· Fibre Optics repairs TM: 328 1
· box, detour U1: 121
· channel, detour U1: 121
· SN, detour U1: 121
· stacks, number of U2: 30
· Trace U1: 281
· Trace Percentage (SEGD) U2: 15
· Trace Value U1: 281
· Trace Value (SEGD) U2: 15
· VE432 drive level U1: 656
· VE464 drive level U1: 535
Low-cut
· Filter frequency (SEGD) U2: 12
· Filter slope (SEGD) U2: 12
· filter, plotter U1: 597
· Playback filter U3: 32
LP traceability, DSU TM: 152
LRB
· deployment IM: 463
· in jLine U1: 158
· installing IM: 455
LRU IM: 356
· Desensitization IM: 365, U1: 185
· disassembly instructions TM: 243
· Frequency IM: 362, U1: 181
· Half-duplex IM: 361
· reassembly instructions TM: 244
· Sleep U1: 193
· Time Division Multiplex U1: 186
LSI IM: 9, IM: 304
· Instrument tests U1: 299
· Shooting U1: 292
· TB widow calibration U1: 293
LSS IM: 9
· channel Instrument tests U1: 299
· Instrument tests U1: 299
· Shooting U1: 292
· TB window calibration U1: 293
LT
· Line Nb IM: 322
· Position IM: 320, IM: 322
· Rcv Nb IM: 323
· Sensor Type Nb IM: 324

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LT428
· connecting IM: 314
· Exec Line Test IM: 321
· Exec Transverse Test IM: 321
· Field test IM: 337
· Getting started IM: 316
· Instrument test IM: 336
· main menu IM: 319
· operating guide IM: 311
· Power-on IM: 316
· results IM: 343
· running Line tests IM: 329
· running Transverse tests IM: 339
· Save Rcv Tilt model IM: 335
· Self-test IM: 318
· Set general parameters IM: 320, IM: 324
· Set LT position IM: 320, IM: 322
· Set Test Limits IM: 320, IM: 326
· Tap test IM: 321, IM: 349
LTO address, changing IM: 157
LXIU. See Laser link
LXIU-400. See Laser Link

M
MAC address U1: 51
MACHA U3: 95
Macha
· wiring IM: 497
Macha blaster U1: 51
Maintenance
· field electronics TM: 191
· Field equipment TM: 6
· TCXO on LCI board TM: 6
Management
· sessions U1: 25
· time U1: 68
Manual
· Export U1: 444
· Look U1: 129
· noise editing U1: 282
· scale, Line window U1: 103
· shooting U1: 264
Manual/Auto
· noise editing threshold U1: 282
· VE432 U1: 640

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· VE464 U1: 522

Manufacturer’s
· code (SEGD) U2: 7
1
· serial nb (SEGD) U2: 7
Map grid
· easting (SPS) U2: 67, U2: 82, U2: 115, U2: 132
· northing (SPS) U2: 67, U2: 82, U2: 115, U2: 132
Mapping
· line U1: 135
Marker
· FDU2S channels U1: 164
· increment U1: 116
· Line Layout setup U1: 113
Marking, stop U1: 122
Mass
· acceleration, monitoring, VE432 U1: 630
· overload, APS U2: 151
· velocity, monitoring, VE432 U1: 630
· warning, APS U2: 150
Master
· Ethernet radio bridge IM: 433
· oscillator, LCI TM: 6
Master/slave
· cabling IM: 44
· operation U1: 365
Max
· number of FDUs IM: 279, IM: 280
· number of traces U3: 280
· of max, Aux (SEGD) U2: 16
· of max, Seis (SEGD) U2: 16
· speed U1: 430
· speed, scale U1: 398
MDR IM: 212
Media
· copy U3: 4
Meter
· calibration TM: 44
· reset TM: 43
Micro-seismic
· enabling U1: 262
· usage U1: 352
Min
· High Drive, VE432 U1: 657
· High Drive, VE464 U1: 535
· Low Drive, VE432 U1: 656

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· Low Drive, VE464 U1: 535

Minicom IM: 97
Minimum
· Phase U1: 68
· phase filter U3: 64
Minute of day (SEGD) U2: 7
Mode
· display, plotter U1: 599
· LT428 display IM: 324
· operating U1: 261
Model
· ellipsoidal U1: 394
· geoidal U1: 394
Monitoring
· disk space U1: 475
Monoline U1: 135
Mounting
· parts IM: 50
Mouse
· Buttons U1: 5
· buttons U1: 5
· Centre button U1: 95
Move
· alarm U1: 429
MRU
· configuring U1: 54
Multi-component
· recording (SPS) U2: 63, U2: 76, U2: 111, U2: 126
Multi-DPG configuration IM: 36
Multi-gun U1: 362
Multimeter
· calibration, TMS428 TM: 20
Multimodule IM: 38
Multiple
· tests U1: 204
Multi-screen IM: 139
Mute
· channel U1: 122

N
Name
· crew U1: 66
· feature, colour map U1: 433
· Log in U1: 20

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· plotter U1: 51
· property, query builder U1: 435
· user U1: 39
1
NAS system IM: 13, IM: 167
· archiving system U1: 53
· connecting IM: 169
· exporting to U1: 463
· FTP connection IM: 176
· IP address on user network IM: 173
· reinstalling IM: 178
· Rescue mode IM: 181
· shock-mount parts IM: 168
· user network IM: 177
NAS4000
· cabling IM: 189
· shock-mount parts IM: 187
Navigation
· option U1: 290
· shooting mode U1: 289
Nb
· Sensor/Rcv Pt, LT428 IM: 324
Network
· DSD, Navigation U1: 289
· VE432 DSD U1: 607
· VE464 DSD U1: 482
Networking
· 428XL local network IM: 26
· Client computer IM: 118
· TMS428 TM: 32
Next
· Plot U1: 584
· record, playback U1: 456
NFS
· disk setup U1: 450
· server U1: 52
NFS disk
· exporting to U1: 443
No
· move U1: 429
· reply U1: 428
No. sub arrays, nom depth (SPS) U2: 80, U2: 130
Noise
· Editing U1: 278
· editing, setup U1: 277
· elimination type (SEGD) U2: 15

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· Instrument test U1: 199

· Sensor test U1: 202
· Test limit U1: 110
· test record result recovery U3: 103
· test, FDU (Instrument) U3: 158
· test, Field (TMS428) TM: 76
· test, Instrument (TMS428) TM: 79
· test, Sensor (FDU) U3: 179
Noise test
· DSU U3: 203, U3: 213, TM: 164
Noisy
· stacks, number of U2: 30
· Trace % U1: 281
· trace percentage (SEGD) U2: 15
Nominal towing depth U2: 80, U2: 130
Normal
· acquisition OVC U1: 681
· acquisition, VE432 U1: 660
· acquisition, VE464 U1: 547
· mode, LT428 display IM: 324
Normalization
· plotter U1: 595
Northing, COG, format U2: 154
Notch U1: 597
· frequency (SEGD) U2: 12
· playback filter U3: 32
Num
· Sensor Type, LT428 IM: 324
Number of
· Auxes (SEGD) U2: 13
· blocks of General Trailer (SEGD) U2: 9
· channel sets per record (SEGD) U2: 8
· channels (SPS) U2: 63, U2: 75, U2: 111, U2: 125
· channels in this channel set (SEGD) U2: 11
· dead Seis traces (SEGD) U2: 13
· DPG modules U1: 50
· FDUs between LAUs, max IM: 279, IM: 280
· FDUs in link, LT428 IM: 352
· FDUs in link, TMS428 TM: 109
· geophones per trace U3: 228
· live Seis traces (SEGD) U2: 13
· plotters U1: 51
· sample skew 32 byte extensions (SEGD) U2: 8
· samples in trace (SEGD) U2: 13
· samples per trace U2: 20
· samples per trace (SEGD) U2: 22

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· Seis traces (SEGD) U2: 13

· splices, Fibre Optics TM: 328
· stacks low (SEGD) U2: 30
1
· stacks noisy (SEGD) U2: 30
· subscans exponent (SEGD) U2: 11
· traces (SEGD) U2: 13
· traces, max U3: 280
· vibrators in pattern, VE432 U1: 636
· vibrators in pattern, VE464 U1: 518
· windows (SEGD) U2: 15
· windows, noise editing U1: 280
Numeric
· pilot, additional U1: 504
· pilot, choosing U1: 503
· pilot, correlation U1: 240
· view, Line window U1: 101
· view, normal acquisition, OVC U1: 683
· view, normal acquisition, VE432 U1: 664
· view, normal acquisition, VE464,VE464 U1: 551
Nunits, len, width (SPS) U2: 64, U2: 65, U2: 77, U2: 78, U2: 112, U2: 113, U2: 127,
U2: 128
Nut
· wing, replacing TM: 270
NVIDIA IM: 141
Nyquist U1: 67

O
Observer
· comments, setup U1: 284
· privileges U1: 24
· reports U1: 575
ODU IM: 430
Off
· Line U1: 78
Offset
· removing U3: 226
· test U3: 160
· test, Sensor U3: 181
· to coord. location (SPS) U2: 61, U2: 71, U2: 109, U2: 121
On
· Line U1: 78
Only
· errors, TMS428 report TM: 50
Open

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· session U1: 18
· Test plan TM: 42
· test report, TMS428 TM: 55
Operating
· mode U1: 261
Operation
· table U1: 226
Optical Fibre
· TFOI, connecting IM: 274
Option
· button U1: 5
Options
· Navigation U1: 290
· Slip-sweep U1: 264, U1: 315
Organization
· code U2: 159
Orientation
· LT428 IM: 331
· pattern, VE432 U1: 637
· pattern, VE464 U1: 519
· plotter page U1: 598
· test, LAUL (TMS428) TM: 96
Oscillator
· local, testing (TMS428) TM: 93
· Master (LCI) TM: 6
Output
· Dump U1: 240
· stack U1: 240
· Xdump U1: 240
OVC U1: 673
Overload, APS U2: 151

P
Page
· setup, plotter U1: 598
Parallel
· geophone U3: 229
Parameters
· loading (Log) U1: 564
· saving (Log) U1: 564
· saving/loading IM: 85
· system, editing U1: 564
Parts
· DSU-428, spare TM: 200

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· FDU, spare TM: 194

· LAUL-428, spare TM: 209
· LAUX-428, spare TM: 216
1
· LAUXS-428, spare TM: 229
Password
· DSUT TM: 132
· expiry date U1: 23
· opening a session U1: 20
Paste U1: 14
Patch
· client IM: 122
· server IM: 88
Path
· colour U1: 99
Pattern
· number, creating, VE432 U1: 636
· number, creating, VE464 U1: 518
· orientation, VE432 U1: 637
· orientation, VE464 U1: 519
· setup, VE432 U1: 636
· setup, VE464 U1: 518
· vibrator, choosing U1: 257
PC
· Handheld, installing IM: 217
PCMCIA
· tools, VE432 U1: 657
Peak
· distortion, APS U2: 148
· force, APS U2: 148
· phase, APS U2: 148
Peg (see Topographic stake)
Period
· monitoring, used disk space U1: 476
Periodical verification, DSUT TM: 116
Peripherals IM: 137
· Install setup U1: 50
Permission U1: 24
Phase
· angle (SEGD) U2: 10
· Control (SEGD) U2: 10
· error (Instrument test) U1: 200
· Linear U1: 68
· Minimum U1: 68
· test, FDU U3: 161
· test, TMS428 TM: 80

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Phase test
· DSU U3: 204, U3: 214
Phase, APS U2: 148
Pilot
· basic signal, VE432 U1: 626
· digital, additional U1: 504
· digital, choosing U1: 503
· digital, correlation U1: 240
· length, other vibrator systems U1: 671
· length, OVC U1: 676
Pilot length (SEGD) U2: 16
Ping IM: 30
Planting
· tool, DSU3BV-428 IM: 271
· tool, DSU-428 IM: 265
Plate Warning, APS U2: 150
Playback
· filters U3: 31
· record U1: 454
Plot U1: 598
· abort U1: 584
· Again U1: 584
· Next U1: 584
Plotter
· AGC U1: 594
· banner U1: 585
· ethernet, installing IM: 143
· general IM: 13
· licence IM: 133, U1: 48
· mode, display U1: 599
· name U1: 51
· number of U1: 51
· parameters U1: 594
· processing U1: 594
· scaling U1: 596
· type U1: 51
Plug
· cleaning IM: 254, TM: 279
· process type, FO U1: 237
Plug, FM4
· SRHRF cable TM: 295
· ST+ cable TM: 284
· WPSR cable TM: 308
Point
· Code, FDU2S channels U1: 163

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· Number (Marker) U1: 115

Point (to) U1: 6
Point Code
1
· DSU channels U1: 143
· FDU channels U1: 108
· SPS U2: 67, U2: 81, U2: 115, U2: 131
Point Depth (SPS) U2: 67, U2: 81, U2: 115, U2: 131
Point Index
· SPS U2: 67, U2: 68, U2: 81, U2: 85, U2: 115, U2: 117, U2: 131, U2: 135
Point Index, APS U2: 148, U2: 157
Point Index, format U2: 154
Point number
· COG, format U2: 154
· SPS U2: 67, U2: 68, U2: 81, U2: 85, U2: 115, U2: 117, U2: 131, U2: 135
Point number, APS U2: 148, U2: 157
Point record
· description (SPS) U2: 81, U2: 131
· specification (SPS) U2: 67, U2: 115
Polarity
· 3C U3: 265
· battery, test (TMS428) TM: 89
· FDU input IM: 487
· FDU2S takeout IM: 491
· SEGD U2: 8
· test, FDU (TMS428) TM: 78
· test, line power (TMS428) TM: 97
· trace U3: 30
Port
· consumption, TMS428 TM: 92
· switching test (TMS428) TM: 96
· voltage, testing (TMS428) TM: 90
Portrait
· plotter U1: 598
Pos. proc. contractor (SPS) U2: 61, U2: 71, U2: 109, U2: 121
POSC U2: 159
Positioning
· contractor (SPS) U2: 61, U2: 71, U2: 109, U2: 121
· layers U1: 387
Post-annotation
· logging U1: 69
Post-plot date of issue (SPS) U2: 61, U2: 70, U2: 109, U2: 120
Power
· connector, LAUL-428 IM: 488
· connector, LAUX IM: 489
· polarity, line (TMS428) TM: 97

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· requirements IM: 31
· socket, replacing TM: 273
· test, LAU TM: 88
Power supply
· field electronics IM: 278
Power-off
· Line, LT428 IM: 332
Power-on
· Line, LT428 IM: 332
· LT428 IM: 316
· test, LT428 IM: 332
· Transverse, LT428 IM: 340
Power-up
· TMS428 TM: 37
P-P bar/m,prim/bubble (SPS) U2: 80, U2: 130
Preamplifier
· 0 dB gain, FDU calibration U3: 119
· 12 dB gain, FDU calibration U3: 148
Pressure
· sensor, enabling, VE464 U1: 542
Pressure Overload, APS U2: 151
Prestack within field units (SEGD) U2: 15
Preview
· colour mapped attributes U1: 433
Printer IM: 13
Privileges U1: 24
Process
· Type setup, generating U1: 254
· type, Log shooting setup U1: 567
· type, overview U1: 236
· Type, SEGD U2: 15
· Type, setup U1: 257
Processing
· capacity U3: 278
· Crossline spacing, plotter U1: 596
· filter, plotter U1: 597
· Geographic AGC, plotter U1: 595
· Inline spacing, plotter U1: 596
· Normalization, plotter U1: 595
· plotter U1: 594
· Time, exponential U1: 595
· Window length (AGC) U1: 595
· Wz velocity, plotter U1: 595
Producer
· code U1: 71

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Project code and description (SPS) U2: 62, U2: 74, U2: 110, U2: 124
Projection U1: 438
· type (SPS) U2: 61, U2: 72, U2: 109, U2: 122
1
· type, setup U1: 393
· zone (SPS) U2: 61, U2: 72, U2: 109, U2: 123
Projection Type setup
· Projection U1: 438
Properties
· in graphic view, Line U1: 97
· Look, Line U1: 129
· object label U1: 432
· test plan, TMS428 TM: 48
Property
· name, query builder U1: 435
Protocol
· source controllers U3: 85
Pseudorandom
· basic sweep signal, VE432 U1: 618
· basic sweep signal, VE464 U1: 491
Pulse
· basic sweep signal, VE432 U1: 617
· basic sweep signal, VE464 U1: 496
· Instrument test U1: 200
· Sensor test U1: 203
· test, FDU U3: 174

Q
Q200 IM: 313
· Backup IM: 249
· Battery IM: 245
· connecting IM: 314
· Getting started IM: 316
· installing IM: 246
· quick guide IM: 243
· Reinstalling IM: 250
QC
· choice, VE432 vib U1: 633
· choice, VE464 vib U1: 515
· data (How to view) U1: 96
· extended, VE432 vib U1: 633
· extended, VE464 vib U1: 516
· limits, OVC U1: 678
· limits, VE432 vib U1: 632
· limits, VE464 vib U1: 513
QT-400 IM: 309

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Quadrant bearing of H256 (SPS) U2: 62, U2: 74, U2: 110, U2: 124
Quality
· COG radius threshold U1: 396
· Control IM: 13
· Vib position accuracy U1: 397
· warning setup U1: 395
Quality Control
· check records (SPS) U2: 66, U2: 114
Query
· add to U1: 436
· builder U1: 435
Quick
· Launch, TMS428 tests TM: 49
· tester, QT-400 IM: 309

R
R,S,X file quality control (SPS) U2: 66, U2: 114
Radio
· bridge, ethernet IM: 429
· delay, measuring, VE432 U1: 652
· Delay, VE432 U1: 650
· delay, VE432 U1: 654
· management, VE432 vib U1: 629
· management, VE464 vib U1: 506
· telemetry, deployment IM: 355
· telemetry, setting up U1: 178
Radius
· alarm, distance to camp U1: 429
· alarm, distance to recording unit U1: 429
· shooting setup, Log U1: 567
Random
· basic sweep signal, VE432 U1: 618
· basic sweep signal, VE464 U1: 491
· Lift up delay, VE464 U1: 536
Rate
· refresh U1: 34
· sample U1: 67
Raveon radio
· setup U1: 510
Raw
· Impulsive Stack process type U1: 247
· process type, Correlation U1: 249
· servo control, VE432 U1: 656
· servo control, VE464 U1: 534
· Vib Stack process type U1: 252

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Rcv
· Nb Increment, LT428 IM: 323
Read
1
· traceability, FDU (TMS428) TM: 83
· traceability, LAU (TMS428) TM: 102
· user info (TMS428) TM: 99
Ready
· fleet U1: 273
Re-assembling
· DSU TM: 203
· FDU2S TM: 255
· LAULS TM: 260
· LAUXS TM: 265
Reassembling
· FDU TM: 196
· LAUL TM: 212
· LAUR TM: 236
· LAUX-428 TM: 218
· LAUX-G TM: 224
· LAUXS TM: 230
· LRU TM: 244
· TFOI TM: 359
· TFOI-G TM: 343
· TREP-428 TM: 251
Reboot
· server U1: 27
Receiver
· code (Rx) tables (SPS) U2: 64, U2: 112
· index (SPS) U2: 68, U2: 86, U2: 117, U2: 136
· line number (SEGD) U2: 22
· point easting (SEGD) U2: 24
· point elevation (SEGD) U2: 24
· point index (SEGD) U2: 22
· point northing (SEGD) U2: 24
· point number (SEGD) U2: 22
· point, skipping U1: 127, U1: 137
· position history U1: 578
· section U1: 107
· section, marking U1: 114
· Tilt model, LT428 IM: 335
· Type Layout, LT428 IM: 324
Record
· disk, setup U1: 73
· identification (SPS) U2: 67, U2: 68, U2: 115, U2: 117
· identification, APS U2: 148, U2: 157
· identification, COG, format U2: 154

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· Instrument tests U1: 196

· last, playback U1: 455
· length (SEGD) U2: 16
· length, Intrument tests U1: 199
· length, process type U1: 237
· next, playback U1: 456
· test result recovery U3: 101
· type (SEGD) U2: 8
Record length U3: 280
· SEGD U2: 8
Recovering
· instrument test records U3: 101
Recovery
· line error, Micro-seismic U1: 353
Redhat
· installing, server IM: 75, IM: 102
Reference
· DSU3, DSUT TM: 117, TM: 144
· latitude, vibrator guidance U1: 266
· resistors, calibration U3: 117
· signal, VE432 DSD U1: 630
· voltage, calibration U3: 117
· voltage, FDU (TMS428) TM: 81
· voltage, FDU calibration U3: 119
Refraction
· delay, process type U1: 238
· delay, SEGD U2: 14
Refresh
· rate U1: 34
Registering
· user U1: 23
Reinstalling
· TMS428 software TM: 26
Relation record
· description (SPS) U2: 85, U2: 135
· specification (SPS) U2: 68, U2: 117
Release
· tape drive U1: 453
Remote
· connection to server, Linux IM: 125
· connection to server, Windows IM: 126
· network IM: 20, IM: 21, IM: 22
· user U1: 19
· user, installing IM: 114
Rename

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· layers (Positioning) U1: 404

Rendering
· global, plotter U1: 599
1
· setup, plotter U1: 598
Repair
· assistant, DSU TM: 150, TM: 152
· LCI-428 TM: 7
· log file, DSUT TM: 152
Repairing
· SRHRF cable TM: 289
· ST cable TM: 280
· ST+ cable TM: 280
· WPSR cable TM: 289
Repeater
· LAUX-428, Marker setup U1: 114
· Raveon radio U1: 511
· Tracs TDMA U1: 509
· Transverse IM: 277
Replacing
· cable, LAUL TM: 210
· cable, TFOI TM: 349
· cable, TFOI-G TM: 338
· connector, Fibre Optics TM: 378
· FDU connector TM: 270
· ground wing nut TM: 270
· indicators TM: 276
· LCI-428 U1: 44
· Line & Trans sockets TM: 271
· Power socket TM: 273
· TFOI board TM: 354
· XDEV sockets TM: 274
Reply
· alarm U1: 428
Report
· APS U1: 577
· COG U1: 577
· errors only (TMS428) TM: 50
· generate, query U1: 436
· Observer U1: 575
· publishing
Publish
reports U1: 561
· receiver position U1: 578
· test, TMS428 TM: 53
Repository U1: 46
Rescue
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· NAS system IM: 181

Reset
· button U1: 12
· Meter TM: 43
· queries and classification U1: 434
· Tester Unit TM: 43
Resetting
· CN3e IM: 230
· GoBook Q200 IM: 244
Reshoot U1: 268
Reshot U1: 268
Resistance
· error (SEGD) U2: 25
· high limit (SEGD) U2: 25
· input, FDU calibration U3: 123
· low limit (SEGD) U2: 25
· Sensor test U1: 201
· test network, FDU calibration U3: 132
· test, FDU U3: 156
· test, Field (TMS428) TM: 78
· test, Instrument (TMS428) TM: 79
· test, Sensor U3: 182
· value (SEGD) U2: 25
Response, Channel filter U3: 43
Restart
· server U1: 27
Retrieval
· Wireline telemetry U1: 79
Return
· Pilot, VE432 U1: 630
· signal, VE432 DSD U1: 629
· sweep, VE432 vib U1: 630
Reverse
· button U1: 12
Reversed
· Marking option U1: 116
Revision
· SEGD U1: 71
Revision Number (SEGD) U2: 9
Rewind
· tape U1: 453
Right
· click, Line window U1: 97
Role U1: 24
Run

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· LED, testing (TMS428) TM: 90

· TMS428 tests TM: 43
Running
1
· Line tests, LT428 IM: 329
· Tests
DSUT TM: 142
· tests, TMS428 TM: 51
· Transverse tests, LT428 IM: 339
RVT300 IM: 212

S
S N (serial number)
· detour U1: 121
Sample
· conversion to mV U3: 223
· int. Record Len. (SPS) U2: 63, U2: 111
· int., Record Length (SPS) U2: 75, U2: 125
· interpolation U3: 237
· Rate U1: 67
· Rate, LT428 IM: 324
· skew extensions, number of U2: 8
· skew, SEGD U2: 21
· to mV conversion factor U2: 30
Sample Rate
· SEGD U2: 13
Samples
· in trace, number of U2: 13
· per trace, number of U2: 20, U2: 22
Save
· Rcv Tilt Model, LT428 IM: 335
· Thresh U1: 283
Saving
· automatic, TMS428 reports TM: 49
· results, LT428 IM: 346
· system parameters U1: 565
Saving, automatic
· DSUT TM: 147
Scalability
· installation settings U1: 55
Scale
· button U1: 6
· factor (SPS) U2: 62, U2: 73, U2: 110, U2: 123
· histograms U1: 103
Scaling
· plotter U1: 596

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Scan Type
· Header (SEGD) U2: 11
· Number (SEGD) U2: 21
· per record (SEGD) U2: 8
Scrollbar U1: 6
Sealing TM: 278
Searching
· LT428 results IM: 345
Second
· Notch Frequency (SEGD) U2: 12
· of minute (SEGD) U2: 7
SEGD
· 3C polarity U3: 265
· Code U1: 111
· format U2: 3
· format, Rev 2.1 U2: 33
· revision, choosing U1: 71
· setup U1: 70
· Trace Blocking U1: 449
Seis traces, number of U2: 13
Seismic
· datum (SPS) U2: 67, U2: 82, U2: 115, U2: 132
· instrument header records (SPS) U2: 75, U2: 125
· receiver header records (SPS) U2: 77, U2: 127
· setup, Operation U1: 261
· source header records (SPS) U2: 78, U2: 128
· trace scaling U1: 596
Seismonitor U1: 94
· DSUT TM: 145
· gain U1: 94
· Sensor test U1: 205
Select U1: 6
· VE432 vib (Look) U1: 641
Selecting
· graphical objects U1: 14
· in graphic view U1: 95
· table cells U1: 13
· text U1: 13
· traces to plot U1: 591
Selection
· create U1: 436
Self-test
· LAU (TMS428) TM: 87
· LT428 IM: 318
Senior

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· Observer, privileges U1: 24

Sensor
· Coulour code U1: 89
1
· Leakage test U1: 202
· Noise test U1: 202
· num/Rcv pnt, LT428 IM: 324
· Pulse test U1: 203
· Resistance test U1: 201
· Seismonitor U1: 205
· sensitivity (SEGD) U2: 28
· show/hide U1: 89
· test limits U1: 109
· tests U1: 201
· tests, CMRR U3: 190
· tests, Distortion U3: 195
· tests, FDU U3: 179
· tests, Impulse U3: 193
· tests, Leakage U3: 185
· tests, Look U1: 130
· tests, Noise (FDU) U3: 179
· tests, Offset U3: 181
· tests, Resistance U3: 182
· tests, Tilt U3: 188
· Tilt model U1: 202
· Tilt test U1: 202
· Type, FDU2S channels U1: 163
· Type, LT428 IM: 324
Sensor Type
· DSU channels U1: 142
· FDU channels U1: 109
· Number (sensor tests) U2: 24
· SEGD code U2: 23
Sequence
· Line, SPS U2: 109, U2: 121
· test, DSUT TM: 140
Sequencer
· Shallow U3: 93
Sequential
· time, plotter U1: 599
· trace, plotter U1: 599
Serial
· number, detour U1: 121
· number, tape U1: 72
Series
· geophones U3: 229
Server

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· administration U1: 22
· connectors IM: 51
· FTP U1: 52
· log on to U1: 18
· NFS U1: 52
· software, installing IM: 73
· start/stop U1: 27
Server ID IM: 132, U1: 47
Servo
· input, VE432 U1: 655
· input, VE464 U1: 533
· setting, VE432 U1: 655
· setting, VE464 U1: 532
Session
· manager U1: 25
· opening U1: 18
Set
· channel, number per record U1: 71
· DSD, OVC U1: 681
· Guidance, VE464 U1: 543
· Servo, VE432 U1: 655
· Servo, VE464 U1: 532
· tape U1: 76
· tape, creating U1: 447
· VE432 DSD U1: 646
· VE464 DSD U1: 527
Sets, channel U2: 8
Settings
· browser U1: 20
· help U1: 20
Setup
· Crew, OVC U1: 675
· DSUT TM: 138
· Observer comments U1: 284
· VE432 Crew, vibrators U1: 606
· VE464 Crew, vibrators U1: 480
SFL
· Spread First Line U1: 257
SFN
· Spread First Number U1: 257
SGD-S
· Blaster cable IM: 493
SGDS U3: 96
SGS
· shooting system U1: 51

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SH geophone IM: 259

Shallow
· mode, enabling U1: 262
1
· Sequencer U3: 93
Shallow-water U1: 362
Shapefile U1: 405
Shock
· mount parts IM: 50
Shock-mount
· Cartridge drive IM: 149
· NAS system IM: 168
· NAS4000 IM: 187
Shooter U1: 285
Shooting U1: 285
· LSI IM: 304
· LSS IM: 9, U1: 292
· Navigation mode U1: 289
· setup, Log U1: 566
· system U1: 50
· system, connecting IM: 37
· systems, interfacing U3: 85
Shortcut
· Line window U1: 97
Shortcuts
· tests TM: 46
Shot
· automation U1: 262
· Depth, charge len. (SPS) U2: 66, U2: 114
· depth, charge len. (SPS) U2: 79, U2: 129
· Id U1: 255
· Id, Log shooting setup U1: 567
· increment U1: 270
· Nb, APS U2: 150
· number (SEGD) U2: 13
· starting U1: 231
ShotPro
· install U1: 50
· interfacing U3: 89
· wiring IM: 495, IM: 496
Show
· layer (Positioning) U1: 404
Shutdown
· server U1: 27
Signal
· return sweep, VE432 U1: 630

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Similarities
· VE464, radio U1: 544
Similarity
· test, radio, VE432 U1: 630
Simultaneous mode U3: 278
Single
· mode, recording specifications U3: 278
Size
· external header U1: 71
· vert. stk fold (SPS) U2: 65, U2: 113
Size, vert. stk fold (SPS) U2: 78, U2: 128
Skew, sample, number of extensions U2: 8
Skip
· channel U1: 133
Skipping
· lines (spread description) U1: 128
· receiver points U1: 127
· receiver points (detour) U1: 137
Slave
· 428XL U3: 86
· Ethernet radio bridge IM: 433
· VE432 DPG U1: 607
· VE464 DPG U1: 481
Slave. See Master/Slave.
Sleep
· LRU U1: 193
Slip
· time U1: 315
· time, selecting U1: 275
Slip-sweep IM: 36, U1: 315
· enable U1: 264
· mode used (SEGD) U2: 16
Snaking U1: 116
· DSU U1: 145
· FDU U1: 138
· FDU2S U1: 174
Software
· e428, licence U1: 47
· Handheld PC, installing IM: 217
· installing, GoBook IM: 246
· installing, TMS428 TM: 23
· New release TM: 32
· patch (client) IM: 122
· patch (server) IM: 88
· updating U1: 217

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· version (SEGD) U2: 16

Software, installing
· CN3e IM: 234
1
Soil, drill method (SPS) U2: 66, U2: 79, U2: 114, U2: 129
Source
· aux nb (SEGD) U2: 16
· code (Sx) tables (SPS) U2: 65, U2: 113
· COG file, format U2: 154
· control, LSS IM: 9, IM: 304
· controller, in line IM: 304
· controller, time management U1: 69
· easting (SEGD) U2: 16
· elevation (SEGD) U2: 16
· Explosive U1: 270
· Line U1: 256
· line bearing, VE432 U1: 638
· line bearing, VE464 U1: 520
· Line Number (SEGD) U2: 10
· northing (SEGD) U2: 16
· Point Index U1: 226
· Point Index (SEGD) U2: 10
· Point Number (SEGD) U2: 10
· point setup, generating U1: 260
· point, setup U1: 255
· Receiver U1: 256
· Set Number (SEGD) U2: 10
· type, setup U1: 269
Source controllers U3: 85
Space, disk
· DSUT TM: 129
Spacing
· crossline (AGC) U1: 596
· DSU3 IM: 280
· FDU IM: 279
· inline (AGC) U1: 596
· LAU IM: 279
Spare
· DSU-428 parts TM: 200
· FDU parts TM: 194
· LAUL-428 parts TM: 209
· LAUX-428 parts TM: 216
· LAUXS-428 parts TM: 229
Spatial
· filtering, Positioning window U1: 388
· query U1: 403
Specifications
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· 428XL U3: 271

· DSUT TM: 114
· Instrument tests U3: 287
· laser link IM: 427
· TMS428 TM: 17
Speed
· alarm U1: 431
· maximum U1: 430
· maximum, scale U1: 398
Spike
· editing U1: 369
Splicing
· SRHRF cable TM: 289
· ST+ cable TM: 280
· WPSR cable TM: 289
Split
· line U1: 116
Spread
· absolute U1: 124
· generic U1: 126
· layout conventions IM: 284
· number (SEGD) U2: 13
· setup U1: 123
· SFL U1: 257
· SFN U1: 257
· Superspread U1: 258
· Superspread, Line window U1: 125
· type U1: 256
· type (SEGD) U2: 14
SPS
· exporting U1: 573
· format, initial U2: 53
· importing U1: 571
· Rev. 2.1 U2: 99
· Sercel (over 10000 traces) U2: 96
SPS-like file format U2: 147
SQC
· dump to U1: 262
· dump, VE432 U1: 342
· dump, VE464 U1: 329
SQC Dump mode U1: 329
SRHRF cable
· splicing TM: 289
SSMon
· operating instructions IM: 468

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· software, installing IM: 225, IM: 240

ST cable
· splicing TM: 280
1
ST+ cable
· splicing TM: 280
Stack
· Correlation after, process type U1: 250
· Correlation before, process type U1: 248
· distance, VE432 U1: 637
· distance, VE464 U1: 519
· Impulsive, process type U1: 247
· Output button U1: 240
· Vibroseismic, process type U1: 252
Stacking Fold
· SEGD U2: 15
Stacking Fold, APS U2: 151
Stacks, number of
· Low U2: 30
· Noisy U2: 30
Stake (see Topographic stake)
Standard
· process type U1: 237
Start
· colour map scale U1: 433
· time, plotter U1: 600
Starting
· 428 server U1: 27
· DSUT428 TM: 132
· FDPA428 IM: 388
· LT428 IM: 316
· TMS428 TM: 36
Static correction (SPS) U2: 67, U2: 81, U2: 115, U2: 131
Statics U3: 237
Statistics
· DSUT TM: 155
· OVC U1: 685
· VE432 U1: 667
· VE464 U1: 555
Status
· codes, VE432 DPG and DSD U1: 666
· codes, VE464 DPG and DSD U1: 553
· VE432 DSD, get U1: 629
· VE464 DSD, get U1: 516
Step
· negative U1: 305

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· Vibroseismic source U1: 272

Stiffness (ground), APS U2: 148
Stop
· button, Operation U1: 231
· Marking U1: 122
· on error, TMS428 TM: 49
Stopping
· 428 server U1: 27
Strain-relief
· TFOI-428 IM: 275
· TFOI-G TM: 386
· ULS equipment IM: 303
Streamer cable number (SEGD) U2: 12
String
· gain, geophone U3: 229
· group, geophone U3: 233
· impedance, geophone U3: 229
· wiring, geophones U3: 234
Subarrays, number of U2: 80, U2: 130
Submersible
· electronics IM: 288
· electronics, strain-relief IM: 303
Subscan exponent U2: 11
Superspread U1: 258
· Line window U1: 125
Support
· customer U1: 63
Surface
· elevation, reference U1: 394
· elevation, SPS U2: 67, U2: 115
Surface elevation
· SPS U2: 82, U2: 132
Survey
· description U1: 106
· setup U1: 105
Swath
· backup setup U1: 74
· first line (SEGD) U2: 13
· first number (SEGD) U2: 13
· name U1: 76
· number U1: 75
· type U1: 568
Sweep
· basic signal, VE432 (Acquisition type) U1: 626
· basic signal, VE464 (Acquisition type) U1: 503

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· freq start, end (SPS) U2: 65, U2: 113

· frequency start,end (SPS) U2: 79, U2: 129
· length (SEGD) U2: 16
1
· length, other vibrator systems U1: 670
· length, OVC U1: 676
· return signal, VE432 U1: 630
· slip time U1: 315
· slip, enable U1: 264
· type, length (SPS) U2: 65, U2: 79, U2: 113, U2: 129
Switching
· port (TMS428) TM: 96
Sync
· high line, VE432 U1: 627
· high line, VE464 U1: 504
Syntax (see Description)
Synthetic
· file format U2: 45
· file syntax U1: 213
· Signal type U1: 213
System
· shooting U1: 50
· tools, troubleshooting IM: 97

T
T0
· mode, VE432 U1: 635
· Repeat Times, VE432 U1: 634
· setup, VE432 U1: 634
Table
· how to select U1: 13
· operation U1: 226
Tap
· test, LT428 IM: 321, IM: 349
Tape
· copy U3: 4
· drive IM: 13
· drive address
FUJI 3x90, displaying IM: 152
· drive, install U1: 52
· Label U1: 448
· label (SEGD) U2: 16
· label, external U1: 72
· Number U1: 448
· number of files U1: 449
· number, SEGD U2: 16

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· set U1: 76
· set, creating U1: 447
· setup, Export window U1: 447
· type, format, density (SPS) U2: 63, U2: 75, U2: 111, U2: 125
Tape drive
· address
3592 IM: 161
FUJI 3x90, changing IM: 151
LTO IM: 157
· exporting to U1: 442
· installing IM: 149
· interface card IM: 56
· supported IM: 150
Tape/disk identifier (SPS) U2: 61, U2: 70, U2: 109, U2: 120
Taper
· length start, end (SPS) U2: 65, U2: 79, U2: 113, U2: 129
· VE432 U1: 609
· VE464 U1: 484
TB
· window, process type U1: 238
· window, SEGD U2: 13
Tb to T0 time (SEGD) U2: 15
TB window
· LSS U1: 293
TCXO, LCI board TM: 6
TDMA U1: 506
· channel, Tracs TDMA U1: 508
Template
· TMS428 tester TM: 36
Terminal
· Linux IM: 97
Test
· acceptance U3: 251
· Automatic U1: 267
· cable calibration TM: 44
· customizing (TMS428) TM: 68
· functions U1: 195
· functions, FDU U3: 151
· generator, FDU calibration U3: 123
· Instrument, FDU U3: 156
· limit
battery U1: 93
Continuity U1: 110
Leakage U1: 110
Noise U1: 110

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Sensor U1: 109

Tilt U1: 110
· limit file format U2: 41
1
· limits, LT428 IM: 320, IM: 326
· multiple U1: 204
· network, Resistance, FDU calibration U3: 132
· record result recovery U3: 101
· Record, type (SEGD) U2: 13
· Running, DSUT TM: 142
· running, TMS428 TM: 51
· Sensor, FDU U3: 179
· sequence editor, DSUT TM: 140
· setup U1: 195
· shortcut (Topographic view) U1: 89, U1: 91
· Spread U1: 197
· System, TMS428 IM: 15
Test plan
· TMS428 TM: 47
Test report
· DSUT TM: 158
Test system
· TMS428 TM: 15
Tested
· Line Nb, LT428 IM: 323
Tester
· cable TM: 181
· reset TM: 43
Text
· box U1: 6
· how to select U1: 13
TFOI
· board, replacing TM: 354
· cable TM: 349
· connecting IM: 274
· disassembly instructions TM: 350
· reassembly instructions TM: 359
TFOI-G IM: 17
· cable TM: 338
· disassembly instructions TM: 339
· reassembly instructions TM: 343
· strain-relief TM: 386
Third Notch Frequency (SEGD) U2: 12
Threshold
· COG radius U1: 396
· Hold/Var (SEGD) U2: 15

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· Init U1: 282

· Init Value, noise editing U1: 281
· Load U1: 282
· Save U1: 283
· type tables (SEGD) U2: 15
· type, other vibrator systems U1: 671
· type, OVC U1: 676
· updating (noise elimination) U1: 370
Tilt
· correction, enable U1: 46, U1: 157
· error (SEGD) U2: 25
· limit (SEGD) U2: 25
· Model U1: 202
· test U1: 202, U3: 188
DSU TM: 164
· Test limit U1: 110
· test, Field (TMS428) TM: 77
· test, theory U3: 209, U3: 218
· value (SEGD) U2: 25
Tilt angle
· DSU3 trace correction formula U3: 249
Time
· delay, FTB-SOD (SPS) U2: 63, U2: 76, U2: 111, U2: 126
· Division Multiplex, LRU U1: 186
· domain, correlation U3: 220
· exponential, plotter U1: 595
· Interpolation U1: 600
· Length, plotter U1: 600
· listening U1: 238
· management U1: 68
· Sequential, plotter U1: 599
· SPS U2: 67, U2: 83, U2: 115, U2: 133
· Start, plotter U1: 600
Time break
· SEGD U2: 14
· window, SEGD U2: 21
Time, APS U2: 151
TMS428 IM: 15, TM: 15
· Connecting an FDU link TM: 57
· Connecting an FDU2S TM: 58
· Connecting an LAUL TM: 59
· Connecting an LAULS TM: 60
· Connecting an LAUX TM: 61
· Connecting an LAUXS TM: 67
· Connecting an LAUXS-428 TM: 65
· customizing tests TM: 68

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· FDU calibration U3: 116

· firmware update TM: 43
· Grounding TM: 21
1
· installation TM: 21
· main window TM: 41
· software, installing TM: 23
· specifications TM: 17
· Templates TM: 36
· Test plan TM: 47
· test reports TM: 53
TMS428 specifications
· Electrical TM: 19
· Environmental TM: 20
· Physical TM: 20
TMU428 TM: 16
· Calibration TM: 108
· FDU calibration U3: 116
Tn
· basic sweep signal, VE432 U1: 616
· basic sweep signal, VE464 U1: 490
Tn, VE432 U1: 616
Tn, VE464 U1: 490
To channel (SPS) U2: 68, U2: 85, U2: 117, U2: 135
To receiver (SPS) U2: 68, U2: 86, U2: 117, U2: 136
Toggle
· button U1: 7
Toolbar
· tests TM: 46
Tools
· maintenance, field electronics TM: 192
· Meter and test cables calibration TM: 44
· PCMCIA, VE432 U1: 657
· Reset Meter TM: 43
· Reset Tester Unit TM: 43
· SRHRF cable splicing TM: 289
· ST+ cable splicing TM: 280
· ST+ FM4 plug replacement TM: 284
· STSR FM4 plug replacement TM: 308
· TMS428 TM: 43
· USB key management IM: 97
· WPSR cable splicing TM: 289
· WPSR FM4 plug replacement TM: 308
Topographic
· stake U1: 89
· view U1: 85

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Total number of traces (SEGD) U2: 13

Towing depth U2: 80, U2: 130
Trace
· auxiliary, description U1: 243
· blocking U1: 449
· data block U2: 20
· edit (SEGD) U2: 21
· Low U1: 281
· Noisy percentage U1: 281
· Number (SEGD) U2: 21
· number of samples in U2: 13
· polarity U3: 30
· selecting, plot U1: 591
· Sequential, plotter U1: 599
Trace Header
· Extension (SEGD) U2: 21
· Extension Block 1 (SEGD) U2: 22
· Extension block 2 (SEGD) U2: 24
· Extension block 3 (SEGD) U2: 25
· Extension block 4 (SEGD) U2: 26
· Extension block 5 (SEGD) U2: 26
· Extension block 6 (SEGD) U2: 27
· Extension block 7 (SEGD) U2: 29
· Extensions (SEGD) U2: 12, U2: 22
· SEGD U2: 21
Traceability
· DSU LP board TM: 152
· FDU, read (TMS428) TM: 83
· FDU, write (TMS428) TM: 83
· field equipment U1: 100
· LAU, read (TMS428) TM: 102
· LAU, write (TMS428) TM: 102
Traces
· max number of U3: 280
· per inch U1: 599
· total number of U2: 13
Traces, number of
· Aux U2: 13
· Dead seis U2: 13
· Live seis U2: 13
· Seismic U2: 13
Tracking
· box, installing IM: 215
· Positioning window U1: 416
· VE464 U1: 508
· vehicle setup U1: 398

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Tracs TDMA
· Baud rate U1: 508
Trailer, general U2: 9
1
Trans
· socket, replacing TM: 271
Transfer
· to drive, spec U3: 278
Transform
· Hilbert, VE432 U1: 621
Transmission
· Line port (TMS428) TM: 94
· test IM: 341
· test, Line (LT428) IM: 333
· Transverse port (TMS428) TM: 94
· troubleshooting U1: 99
Transverse
· connector, LAUX IM: 489
· data rate U3: 278
· port, transmission test (TMS428) TM: 94
· test, LT428 IM: 321
Transverse (LT428) IM: 341
TREP-428
· connecting IM: 277
· disassembly instructions TM: 250
· reassembly instructions TM: 251
TREPS100-408
· specifications IM: 296
Troubleshooting
· DSU TM: 149
· Line U1: 207
· tools, system IM: 97
· Transmission U1: 99
Type
· blaster U1: 50
· box, detour U1: 121
· Model, Polarity (SPS) U2: 63, U2: 64, U2: 65, U2: 75, U2: 77, U2: 78, U2: 111,
U2: 112, U2: 113, U2: 125, U2: 127, U2: 128
· of process (SEGD) U2: 15
· of source (SEGD) U2: 13
· plotter U1: 51

U
ULS technology IM: 10
· deployment IM: 288, IM: 294

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· Handling IM: 299

· in Line window U1: 160
· strain-relief IM: 303
Uninstalling
· client software IM: 135
· patch (client) IM: 122
· patch (server) IM: 88
· server software IM: 86
Unit
· serial number (SEGD) U2: 27
· type (SEGD) U2: 27
Units
· how to select U1: 95
· spacing X, Y (SPS) U2: 64, U2: 65, U2: 77, U2: 78, U2: 112, U2: 113, U2: 127,
U2: 128
Unload
· tape U1: 453
Unmanned
· configuration IM: 58
· installation parameters U1: 59
· option, enabling U1: 45
Unselect
· in Line topographic view U1: 95
Update
· field U1: 83, U1: 129, U1: 201, U1: 202
· VE464 vib fleet U1: 525
Updating
· firmware U1: 217
· firmware (TMS428) TM: 99
· firmware, via XDEV IM: 92
· Number of FDUs in link, (LT428) IM: 352
· Number of FDUs in link, (TMS428) TM: 109
· TMS428 firmware TM: 43
Upgrade
· firmware (TMS428) TM: 99
Upgrading
· built-in LAUX TM: 105
· field electronics U1: 217
· TMS428 firmware TM: 43
· via XDEV, field electronics IM: 92
Uphole
· time (SEGD) U2: 14
· time (SPS) U2: 67, U2: 82, U2: 115, U2: 132
Upload U1: 40
UPS

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· configuration IM: 59
URL
· opening a session U1: 19
1
USB
· key IM: 97
User
· account IM: 109
· info U1: 70
· interface table, DSUT TM: 136
· local IM: 19
· name U1: 39
· registering U1: 23
· remote IM: 20, IM: 21, IM: 22
Utilities
· LAU (TMS4028) TM: 98

V
V12 IM: 145
VA (plotter) U1: 599
Values
· query builder U1: 436
Valve Overload, APS U2: 151
Var/Hold U1: 282
VE432
· connecting IM: 36
· DPG, connecting IM: 36
· functions U1: 640
· Version, APS U2: 151
VE464
· connecting IM: 35
· functions U1: 522
Vehicle
· Tracking box IM: 215
Velocity
· baseplate, monitoring, VE432 U1: 630
· mass, monitoring, VE432 U1: 630
· plotter U1: 595
Verbose
· APS report U1: 577
Veritas IM: 145
Version
· firmware, reading (TMS428) TM: 98
Vertical
· datum description (SPS) U2: 61, U2: 72, U2: 109, U2: 122

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· Stack (SEGD) U2: 12

Vib
· position accuracy U1: 397
· position Easting, APS U2: 148
· position elevation, APS U2: 148
· position Northing, APS U2: 148
· Status Code, APS U2: 150
Vibrator
· drive level (APS) U2: 148
· fleet (APS) U2: 148
· guidance U1: 359
· guidance, enabling U1: 266
· number (APS) U2: 148
· pattern setup, VE432 U1: 636
· pattern setup, VE464 U1: 518
· QC choice, VE432 U1: 633
· QC choice, VE464 U1: 515
· QC limits, OVC U1: 678
· QC limits, VE432 U1: 632
· QC limits, VE464 U1: 513
· Radio management, VE432 U1: 629
· Radio management, VE464 U1: 506
· signals, recording IM: 283
· T0, VE432 U1: 634
· type U1: 50
· type (SEGD) U2: 10
· VE464 Fleet function U1: 523
Vibroseis (SPS) U2: 65, U2: 113
View
· Graphic, OVC (normal acquisition) U1: 681
· Graphic, VE432 (normal acquisition) U1: 661
· Graphic, VE464 (normal acquisition) U1: 548
· Histogram U1: 103
· menu, TMS428 TM: 44
· numeric, Line window U1: 101
· Numeric, OVC (normal acquisition) U1: 683
· Numeric, VE432 (normal acquisition) U1: 664
· Numeric, VE464 (normal acquisition) U1: 551
· topographic, line U1: 85
Viscosity (ground), APS U2: 148
Voltage
· port (TMS428) TM: 90
· reference, FDU (TMS428) TM: 81
· reference, FDU calibration U3: 119
VP
· grabbing radius U1: 396

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· Id U1: 255

VSR
· to do, increment U1: 272 1
· deployment IM: 283
· enable U1: 262
· Hilbert transform, VE432 U1: 621
· VE432 U1: 342
· VE464 U1: 329

W
Warnings
· DSUT TM: 167
Water
· depth (SPS) U2: 67, U2: 82, U2: 115, U2: 132
· gun (SPS) U2: 66, U2: 114
Watertightness TM: 278
Waypoint
· first U1: 399
Weathering thickness (SPS) U2: 66, U2: 79, U2: 114, U2: 129
Wiggle U1: 599
Window
· Length, AGC U1: 595
· menu, TMS428 TM: 44
· Number of (noise) U1: 280
· TB U2: 13
· TB, process type U1: 238
Wing
· nut, replacing TM: 270
Wireless IM: 436
WPSR cable
· splicing TM: 289
Write
· traceability, FDU (TMS428) TM: 83
· traceability, LAU (TMS428) TM: 102
· user info (TMS428) TM: 99
Wz Velocity, AGC U1: 595

X
XDEV
· connector, LAUL IM: 485, IM: 488
· connector, LAUX IM: 490
· socket, replacing TM: 274
· upgrading field electronics IM: 92
Xdump
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· Output button U1: 240

Xmit
· test, Line ( LT428) IM: 333
· test, Transverse (LT428) IM: 341

Y
Year (SEGD) U2: 7

Z
Zeroed
· channel U1: 122
Zeroing
· Length (noise) U1: 280
· method (noise elimination) U1: 370
· noise editing type U1: 280
· Taper Length (noise) U1: 280
Zoom
· Line window U1: 96

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