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Engineering Fracture Mechanics

The document summarizes an extended finite element method for modeling dynamic fracture in piezoelectric materials. The method is based on linear elastic fracture mechanics. It uses an implicit time integration scheme and novel enrichment functions that account for displacement and electric potential fields near cracks. Results are validated by comparing with the boundary element method and showing excellent agreement. The method allows for modeling arbitrary crack growth without remeshing.

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0% found this document useful (0 votes)
107 views13 pages

Engineering Fracture Mechanics

The document summarizes an extended finite element method for modeling dynamic fracture in piezoelectric materials. The method is based on linear elastic fracture mechanics. It uses an implicit time integration scheme and novel enrichment functions that account for displacement and electric potential fields near cracks. Results are validated by comparing with the boundary element method and showing excellent agreement. The method allows for modeling arbitrary crack growth without remeshing.

Uploaded by

Rasagya Mishra
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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Download as PDF, TXT or read online on Scribd
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Engineering Fracture Mechanics 92 (2012) 19–31

Contents lists available at SciVerse ScienceDirect

Engineering Fracture Mechanics


journal homepage: www.elsevier.com/locate/engfracmech

Extended finite element method for dynamic fracture


of piezo-electric materials
H. Nguyen-Vinh a,b,c, I. Bakar a,b,c, M.A. Msekh a,b,c, J.-H. Song a,b,c, J. Muthu a,b,c, G. Zi a,b,c, P. Le a,b,c,
S.P.A. Bordas a,b,c,d, R. Simpson a,b,c, S. Natarajan a,b,c, T. Lahmer a,b,c, T. Rabczuk a,b,c,⇑
a
Department of Civil Engineering, Bauhaus University Weimar, Marienstr. 15, 99423 Weimar, Germany
b
School of Mechanical, Industrial and Aeronautical Engineering, University of Witwatersrand, Johannesbuerg, South Africa
c
Faculty of Civil Engineering, Universiti Teknologi Mara, 40450 Shah Alam, Selangor, Malaysia
d
Institute of Mechanics & Advanced Materials (IMAM), School of Engineering, Cardiff University, Queen’s Buildings The Parade, CARDIFF CF243AA, Waless, UK

a r t i c l e i n f o a b s t r a c t

Article history: We present an extended finite element formulation for dynamic fracture of piezo-electric
Received 4 May 2011 materials. The method is developed in the context of linear elastic fracture mechanics. It is
Received in revised form 27 December 2011 applied to mode I and mixed mode-fracture for quasi-steady cracks. An implicit time inte-
Accepted 16 April 2012
gration scheme is exploited. The results are compared to results obtained with the bound-
ary element method and show excellent agreement.
Ó 2012 Elsevier Ltd. All rights reserved.
Keywords:
XFEM
Fracture
Piezo-electric
Cracks

1. Introduction

Piezo-electric materials are used as sensors, actuators or transducers in many engineering applications [7,8,18]. For an
example, piezo-electric materials are used as an accelerator, distance or knock-sensors in automotive industry and as sonar
transducers for navigation purposes. Piezo-electric transducers are applied extensively in medical engineering for destroying
kidney stones and for plaque removal. However the limited knowledge about the fracture of these smart materials is essen-
tial for their effective use, particularly for applications with high stress concentrations applications, ex: ultrasound cleaning
or valve control in common-rail diesel engines [26].
Studies on fracture of piezo-electric materials are limited to static applications using linear elastic fracture mechanics
(LEFMs) [29,38,41]. The influence of permeable and impermeable boundary conditions was studied by Fan and Gao [15]
and Shindo et al. [37]. Fracture criteria that take the influence of the electric field into account were done by Fulton and
Gao [14], Gao et al. [16] and Park and Sun [30]. The fracture criterion of Park and Sun [30] agreed well with experimental
results. Fulton and Gao [14] and Gao et al. [16] extended this criterion to non-linear effects and in [3] to fatigue cracks.
The extended finite element (XFEM) method was originally developed to model arbitrary crack growth without reme-
shing [5,25]. XFEM is based on a local partition of unity (PU) enrichment. The basic idea of XFEM is the enrichment of the
finite element (FE)-interpolation with information of the analytical solution. For example, cracks will create discontinuities
in the displacement field and therefore a discontinuous function such as the Heaviside-function or the step function is used
as an enrichment function. It is also known that in LEFM, there exists a stress singularity at the crack tip. Sometimes, the
near-crack tip solution is known and this information can be also included through the enrichment function in the

⇑ Corresponding author at: Department of Civil Engineering, Bauhaus University Weimar, Marienstr. 15, 99423 Weimar, Germany.
E-mail address: timon.rabczuk@uni-weimar.de (T. Rabczuk).

0013-7944/$ - see front matter Ó 2012 Elsevier Ltd. All rights reserved.
http://dx.doi.org/10.1016/j.engfracmech.2012.04.025
20 H. Nguyen-Vinh et al. / Engineering Fracture Mechanics 92 (2012) 19–31

approximation. In the general case, these functions are not known a priori, and XFEM can be use equally well with numer-
ically determined enrichment functions, as, for example in [44,45,46,47,48,49]. XFEM can be considered as an extension of
the Partition of Unity Finite Element Method (PUFEM) [24] to discontinuous problems. Meanwhile, XFEM has been extended
and applied to a variety of problems such as two-phase-flow [10,11], fluid–structure interaction [1,21,22,50,51] and thermo-
mechanical problems [2] as well as moving boundary problems such as biofilm growth [52].
An XFEM-formulation for modeling the fracture of piezo-electric materials under static conditions using LEFM was pre-
sented by Béchet et al. [4]. They derived novel enrichment functions around the crack tip for the displacement and for the
electric potential field. They also presented an efficient way to compute the generalized stress intensity factors. Verhoosel
et al. [42] proposed a multiscale approach for modeling the fracture of piezo-electric materials based on cohesive cracks.
An excellent overview article on modeling fracture of piezo-electric materials is given by Kuna [20]. Alternative methods
to model intact piezo-electric materials including the Smoothed Finite Element Method (SFEM) [6,27,28] and meshfree
methods [31] were presented by various authors. Note the recent work on enriched residual free bubble for coupled advec-
tion diffusion problems arising in nanoelectronics simulations [53]. Open source extended finite element codes in C++ [54]
and enriched meshless method codes in MATLAB [55] are available for download.1
To our best knowledge, there are no studies concerning the dynamic behavior of piezoelectric materials using XFEM
which are essential for utilizing smart materials for different engineering applications. In this paper, we present an extension
of the work of Béchet et al. [4] to dynamic fracture of piezoelectric materials. We have developed the method using linear
elastic fracture mechanics and it is validated by comparing numerical results with boundary element method (BEM) results.

1.1. Governing equations and weak form

The governing equations for the coupled electro-mechanical problem are given in weak form: Find u 2 U 8 du 2 U 0 und
U2V 8
Z dU 2 V 0 suchZ that Z Z
rij dij dX  bi dui dX  ti dui dC  .u€i dui dC ¼ 0 8 x 2 X ð1Þ
X X Ct X
Z Z
Di dEi dX   dC ¼ 0 8 x 2 X
dUq ð2Þ
X Cq

where rij is the Cauchy-stress tensor, ui the displacement field, bi the body forces, ti the traction and U the electric potential;
d denotes the ‘variation’ and an overline superimposed quantities, e.g t i is the von Neumann traction. The domain is denoted
by X with boundary C, where the indices u, t, q (U), and c denote ‘displacement’, ‘traction’, ‘electric’ and ‘crack’ boundaries,
respectively, see Fig. 1. The approximation of the test and trial functions is given by

U ¼ fuju 2 H1 ;  on Cu ;
u¼u u discontinuous on Cc g
1
U 0 ¼ fdujdu 2 H ; du ¼ 0 on Cu ; du discontinuous on Cc g
V ¼ fUjU 2 H1 ; U ¼ U on Cq ; U discontinuous on Cc g
V ¼ fdUjdU 2 H1 ; dU ¼ 0 on Cq ; dU discontinuous on Cc g ð3Þ
1
where H denotes the first Hilbert space. The compatibility conditions and the constitutive model are imposed in strong
form by
ij ¼ 1=2ðui;j þ uj;i Þ
Ei ¼ U;i
rij ¼ C Eijkl kl  ekij Ek
Di ¼ eikl kl þ jik Ek ð4Þ
where ij is the strain tensor derived from the displacement field ui, Ei is the electric field depending on the electric potential
U; C Eijkl is the first-order elasticity tensor, jik is the dielectric Tensor and ekij is the piezo-electric tensor.

2. XFEM for piezo-electric materials

The approximation of the displacement field in the XFEM [5,25,39,40] is given by


X X
nc X
ðNÞ ðNÞ
X
mt X X
NK
ðMÞ ðMÞ
uh ðxÞ ¼ NI ðxÞuI þ NI ðxÞwI aI þ NI ðxÞ /KI bKI ð5Þ
I2S N¼1 I2S c M¼1 I2S t K¼1

and in matrix form:


eD
uh ðXÞ ¼ ND þ N e þN
bDb ð6Þ

1
http://cmechanicsos.users.sourceforge.net/.
H. Nguyen-Vinh et al. / Engineering Fracture Mechanics 92 (2012) 19–31 21

Fig. 1. Definitions.

Fig. 2. Enriched nodes and definitions.

where S is the set of all nodes, S t is the set of nodes around the crack tip and S c is the set of nodes for elements that are
ðNÞ
completely cut by the crack (Fig. 2); nc denotes the number of cracks, wI is the associated enrichment function for discon-
tinuity N, mt is the number of crack tips and NK is the number of enrichment functions in /KI; the unknowns uI, aI and bKI are
stored in the vectors D; De and D.
b
We choose the step function as enrichment function in S c that ensures the jump in the displacement field
ðNÞ
wI;Riss ¼ sign½f ðNÞ ðXÞ  sign½f ðNÞ ðXI Þ ð7Þ

with

f ðNÞ ðXÞ ¼ sign½n  ðX  XðNÞ ÞminðX  XðNÞ Þ ð8Þ


|fflfflfflfflfflfflfflfflfflfflffl{zfflfflfflfflfflfflfflfflfflfflffl}
N ðNÞ
X 2Cc

where n is the normal of the crack. The second term on the RHS of Eq. (7) is called shifting and ensures that the enriched
ðNÞ
shape function N I ðxÞwI vanishes in the blending element. The shifting also guarantees the Kronecker-delta property of
the XFEM-interpolation. In other words: the nodal parameters uI remain the physical displacements.
For electro-mechanical problems, Bechet et al. [4] have developed a crack tip enrichment function in 2D for LEFM prob-
lems. In this manuscript, we employ the standard mechanical enrichment function (Fig. 3)
22 H. Nguyen-Vinh et al. / Engineering Fracture Mechanics 92 (2012) 19–31

Fig. 3. Definitions for the crack tip enrichment.

 
pffiffiffi h pffiffiffi h pffiffiffi h pffiffiffi h
/mech
KI ¼ r sin ; r cos ; r sin sinh; r cos sinh ð9Þ
2 2 2 2
and the electro-mechanical enrichment that has the form
pffiffiffi pffiffiffi pffiffiffi pffiffiffi pffiffiffi pffiffiffi 
/piezo
KI ¼ r f1 ðhÞ; rf2 ðhÞ; r f3 ðhÞ; r f4 ðhÞ; rf5 ðhÞ; r f6 ðhÞ ð10Þ

as proposed by Béchet et al. [4]; more details on the complex enrichment functions fi (i = 1, . . . , 6) are given in [4]. The struc-
ture of the test-functions is similar:
e D
duh ðXÞ ¼ NdD þ Nd e þ Nd
b Db ð11Þ
The approximation of the electric potential is similar to the approximation of the displacement field:
X X
nc X
ðNÞ ðNÞ
X
mt X X
NK
ðMÞ ðMÞ
Uh ðxÞ ¼ NI ðxÞUI þ NI ðxÞwI aI þ NI ðxÞ /KI bKI ð12Þ
I2S N¼1 I2S c M¼1 I2S t K¼1

or in matrix form
eU
Uh ðXÞ ¼ NU þ N bU
e þN b ð13Þ
where the unknown UI ; a
ðNÞ
and
ðMÞ
bKI e and U.
are stored in the vectors U; U b The approximation of the test function reads:
I

h e U
dU ðXÞ ¼ NdU þ Nd b U
e þ Nd b ð14Þ
The spatial derivatives of the trial functions are obtained by formal differentiation
X nc X
X mt X
X XN K XN K
ðMÞ
ruh ðxÞ ¼ rNI ðxÞuI þ rNI ðxÞwðNÞ ðNÞ
I þ N I ðxÞrwI
ðNÞ
aI þ rNI ðxÞ /
ðMÞ
KI þ N I ðxÞ r /
ðMÞ
KI bKI
I2S
|fflfflfflffl{zfflfflfflffl} N¼1 I2S c |fflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflffl{zfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflffl}
K¼1 K¼1
M¼1 I2S t |fflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflffl{zfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflffl}
B
eB bB
X X nc X  mt X
X X XN K
N
E ¼ rUh ðxÞ ¼ rNI ðxÞwðNÞ ðNÞ
aðNÞ rNI ðxÞ K¼1 /ðMÞ ðMÞ ðMÞ
K
rNI ðxÞUI þ I þ N I ðxÞrwI I þ KI þ N I ðxÞ r / KI bKI ð15Þ
I2S
|fflfflfflffl{zfflfflfflffl} N¼1 I2S c |fflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflffl{zfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflffl}
K¼1
M¼1 I2S t |fflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflffl{zfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflfflffl}
B
eB bB

that can be given in matrix form by


eD
ruh ðXÞ ¼ B D þ B eþB
bDb
eU
E ¼ BU þ B bU
e þB b ð16Þ

Similarly, we obtain the derivatives of the test functions:


e D
rduh ðXÞ ¼ BdD þ Bd e þ Bd
b Db
e U
dE ¼ BdU þ Bd b U
e þ Bd b ð17Þ

3. Discrete equations

The discrete equations are obtained by substituting the approximations of the test and trial-functions, Eqs. (6), (11), (13)
and (14), and their derivatives, Eqs. (16) and (17), into the weak form, Eqs. (1) and (2). With the compatibility condition and
the constitutive model, Eq. (4), we obtain
H. Nguyen-Vinh et al. / Engineering Fracture Mechanics 92 (2012) 19–31 23

X Z
numele
e D
ð½BdD þ Bd e þ Bd
b D
b sym ÞT ½CE ðB D þ B
eDe þB
b DÞ
b sym  eðBU þ B
eU b UÞd
e þB b X
e¼1 XðeÞ

X Z
numele X t
numrand Z
 e D
½NdD þ Nd e þ Nd
b D
b T bdX  e D
½NdD þ Nd e þ Nd
b D
b TtdC
e¼1 XðeÞ e¼1 CðeÞ
t

X Z
numele
e b
 e D
.½NdD þ Nd e þ Nd
b D
b T ½ND eD
€þN b Dd
€ þN € X¼0
e¼1 XðeÞ

X
numele
e U
½BdU þ Bd b U
e þ Bd eD
b T ½eðB D þ B eþB
b DÞ
b sym þ jðBU þ B
eU b UÞd
e þB b X
e¼1

numrand
X q Z
 e U
½NdU þ Nd b U
e þ Nd b T q dC ¼ 0 ð18Þ
e¼1 CðeÞ
q

where numele is the number of elements in the domain X and numrandt and numrandq are the number of boundary elements
in Ct, Cq, respectively; sym denotes the symmetric part of a tensor. Defining

e D;
D ¼ ½D; D; b U; U;
e U
b T
e d D;
dD ¼ ½dD; d D; b dU; d U;
e d U
b T ð19Þ

and factoring out the nodal parameters of the test functions gives after some algebra the final (semi-) discrete system of
equations:

€ þ CD_ þ KD  FÞ ¼ 0
dDðMD ð20Þ

with
     
Mmm 0 Cmm Cme Kmm Kme
M¼ ; C¼ ; K¼ ð21Þ
0 0 Cem Cee Kem Kee

and the following sub-matrices for the mass


2 3
Muu
mm Mua
mm Mub
mm
6 au 7
Mmm ¼ 6
4 Mmm Maa
mm Mab 7
mm 5
ð22Þ
Mbu
mm Mba
mm Mbb
mm

the stiffness
2 3
Kuu
ij Kua
ij Kub
ij
6 au 7
Kij ¼ 6
4 Kij Kaa
ij Kab 7
ij 5; i; j ¼ m; e ð23Þ
Kbu
ij Kba
ij Kbb
ij

and
Z
Muu
mm ¼ .NI NJ dX
X
Z
Mua
mm ¼ .NI wJðNÞ NJ dX ¼ Mau
X
Z
Mub
mm ¼ .NI UðMÞ bu
K NJ dX ¼ Mmm
X
Z
Maa
mm ¼ .NI wIðNÞ NJ wJðNÞ dX
X
Z
Mab
mm ¼ .NI UðMÞ ðNÞ ba
K NJ wJ dX ¼ Mmm
X
Z
Mbb
mm ¼ .NI UðMÞ ðMÞ
K NJ UK dX ð24Þ
X
24 H. Nguyen-Vinh et al. / Engineering Fracture Mechanics 92 (2012) 19–31

Z
Kuu
mm ¼ BI CBJ dX
ZX
ðNÞ
Kua
mm ¼ BI CBJ wJ dX ¼ Kau
mm
X
Z
ðMÞ
Kub
mm ¼ BI CBJ UK dX ¼ Kbu
mm
X
Z
ðNÞ ðNÞ
Kaa
mm ¼ wI BI CBJ wJ dX
X
Z
ðNÞ ðMÞ
Kab
mm ¼ wI BI CBJ UK dX ¼ Kba
mm
X
Z
Kbb
mm ¼ UðMÞ ðMÞ
K BI CBJ UK dX ð25Þ
X

Z
Kuu
me ¼ BI eBJ dX
ZX
ðNÞ
Kua
me ¼ BI eBJ wJ dX ¼ Kau
mm
X
Z
ðMÞ
Kub
me ¼ BI eBJ UK dX ¼ Kbu
mm
X
Z
ðNÞ ðNÞ
Kaa
me ¼ wI BI eBJ wJ dX
X
Z
ðNÞ ðMÞ
Kab
me ¼ wI BI eBJ UK dX ¼ Kba
mm
X
Z
Kbb
me ¼ UKðMÞ BI eBJ UðMÞ
K dX ð26Þ
X

Z
Kuu
em ¼ BI eBJ dX
ZX
ðNÞ
Kua
em ¼ BI eBJ wJ dX ¼ Kau
mm
X
Z
ðMÞ
Kub
em ¼ BI eBJ UK dX ¼ Kbu
mm
X
Z
ðNÞ ðNÞ
Kaa
em ¼ wI BI eBJ wJ dX
ZX
ðNÞ ðMÞ
Kab
em ¼ wI BI eBJ UK dX ¼ Kba
mm
X
Z
Kbb
em ¼ UKðMÞ BI eBJ UðMÞ
K dX ð27Þ
X

Z
Kuu
ee ¼ BI jBJ dX
ZX
ðNÞ
Kua
ee ¼ BI jBJ wJ dX ¼ Kau
mm
X
Z
ðMÞ
Kub
ee ¼ BI jBJ UK dX ¼ Kbu
mm
ZX
ðNÞ ðNÞ
Kaa
ee ¼ wI BI jBJ wJ dX
X
Z
ðNÞ ðMÞ
Kab
ee ¼ wI BI jBJ UK dX ¼ Kba
mm
ZX
Kbb
ee ¼ UKðMÞ BI jBJ UðMÞ
K dX ð28Þ
X

where the superimposed indices e and m indicate electrical and mechanical quantities, superscript u, a and b refer to ‘usual’,
‘step-enriched’ and ‘tip-enriched’ nodes and capital indices refer to node numbers. For many applications, it is sufficient to
neglect the coupled damping terms and the electrical damping Cme, Cem and Cee, but instead use only the mechanical Ray-
leigh-damping [23]:
Cmm ¼ cKmm þ hMmm ð29Þ
H. Nguyen-Vinh et al. / Engineering Fracture Mechanics 92 (2012) 19–31 25

The semi-discrete equations are integrated in time using the implicit b-Newmark scheme. More details regarding time inte-
gration in XFEM are given by Cavin et al. [9], Combescure et al. [12], Réthoré et al. [35,36].

4. Computation of the stress intensity factors

The stress intensity factors (SIFs) can be evaluated through the displacement field and the electrical field or the crack
opening displacement, for a discussion see De Luycker et al. [13], Garcia-Sanchez et al. [17], Wünsche et al. [43]. Alterna-
tively, they can be obtained through the J-integral or the interaction integral. For a piezo-electric material, the domain form
of the dynamic J-integral can be written as
Z
Z

@ui @U @q @u @u
J¼ rij þ Dj  Hd1j dA þ qu€i i  qu_ i i q dA ð30Þ
AðC Þ @x1 @x1 @xj AðCÞ @x1 @x1

where H is the electric enthalpy density for electromechanical loading, q is a smooth function chosen to be unity at the crack
tip and nj is the jth component of the outward unit vector normal to an arbitrary contour C enclosing the crack tip. For linear
piezoelectric solids under mixed-mode loading conditions, the relation of the stress intensity factors (SIFs) and the J-integral
can be written as [19]

1 T
J¼ K YK ð31Þ
2

where K = (KII KI KIII KIV) is the vector of the four field intensity factors, and Y is the Irwin matrix for piezo-electric materials:
2 3
Y 11 Y 12 Y 13 Y 14
6Y Y 22 Y 23 0 7
6 21 7
Y¼6 7 ð32Þ
4 Y 31 Y 32 Y 33 0 5
Y 41 0 0 Y 44

The Irwin matrix is basically derived from the constitute relationship with the boundary conditions ti ¼ 0 and niDi = 0 on Cc.
The left upper 3  3 matrix refers to the mechanical behavior of the piezo-electric material, Y44 is related to the permittivity
and Y14 = Y41 to the piezo-electricity. More details can be found in the excellent paper by Suo et al. [41].
The stress intensity factors KI, KII and KIII refer to the crack opening mode, crack sliding mode and tearing mode, respec-
tively. The SIF KIV, also called the electric displacement intensity factor, characterizes the concentration of the electrical dis-
placement fields. Note that in a two-dimensional setting, the SIF KIII vanishes.
The drawback of the J-integral is that it can only be converted into single mode stress intensity factors. However, the crack
is generally subjected to a mixed mode loading conditions with an additional electrical mode IV. A possibility in overcoming
the limitation is given by the interaction integral method which is based on two load cases: (1) defines the actual loading of
the structure and is assumed to be an auxiliary fields on the entire domain and (2) represents the electromechanical loading
along a vanishingly small contour around the crack tip. The interaction integral for a homogeneous piezoelectric material is
defined as [34]
Z ð2Þ ð1Þ
!
ð2Þ ð1Þ
@ui ð1Þ @ U ð2Þ @ui ð2Þ @ U @q
Ið1;2Þ ¼ rð1Þ
ij þ Dj þ rij þ Dj  Hð1;2Þ d1j dA
AðCÞ @x1 @x1 @x1 @x1 @xj
Z ð2Þ ð2Þ ð1Þ ð1Þ
!
ð1Þ @ui ð1Þ @ui ð2Þ @ui ð2Þ @ui
þ .ui
€  .ui_ þ .ui €  .ui_ q dA ð33Þ
AðCÞ @x1 @x1 @x1 @x1

with

rð1Þ ð2Þ ð2Þ ð1Þ ð1Þ ð2Þ ð2Þ ð1Þ


ij ij þ rij ij  Dj Ej  Dj Ej
Hð1;2Þ ¼ ð34Þ
2

The stress intensity factor can be defined as


 
ð1Þ ð2Þ ð1Þ ð2Þ ð1Þ ð2Þ ð1Þ ð2Þ ð1Þ ð2Þ ð1Þ ð2Þ ð1Þ ð2Þ
Ið1;2Þ ¼ K II K II Y 11 þ K I K I Y 22 þ K IV K IV Y 44 þ K I K II þ K II K I Y 12 þ K II K IV þ K IV K II Y 14

ð1Þ ð2Þ ð1Þ ð2Þ
þ K I K IV þ K IV K I Y 24 ð35Þ

The SIFs are then obtained by judiciously choosing the auxiliary state in a way that two SIFs vanish and one is set to 1. More
details are found in the excellent paper by Rao and Kuna [34].
26 H. Nguyen-Vinh et al. / Engineering Fracture Mechanics 92 (2012) 19–31

Fig. 4. Set up of the center crack problem.

5. Examples

5.1. Center crack

Let us consider a plate with a center crack under impact loading as illustrated in Fig. 4 with h = 40 mm and a = 2.4 mm.
Plain strain conditions are assumed. The impact is caused either by a mechanical loading r  ðtÞ or by an electrical loading DðtÞ
or by a combination of both as shown in Fig. 4. This problem has been studied previously by Garcia-Sanchez et al. [17] in the
context of the BEM and is used here as a validation example. They assumed a homogeneous linear piezo-electric solid with
the following material parameters: C11 = 126 GPa; C12 = 84.1 GPa and C22 = 117 GPa and C66 = 23 GPa; e21 = 6.5 C/m2,
e22 = 23.3 C/m2 and e16 = 17 C/m2; j11 = 15.04 C/(GV m) and e22 = 13 C/(GV m); density . = 7500 kg/m3. In order to facilitate
a direct comparison, we adopt the presentation of the results in [17] who introduced normalized dynamic stress intensity
factors and a normalized dynamic electrical displacement intensity factor:
K I ðtÞ K IV ðtÞ
K I ¼ ; K IV ¼ K ð36Þ
K stI K stIV
with
e22 pffiffiffiffiffiffi
K¼ ; K stI ¼ r0 pa ð37Þ
j22

Fig. 5. Normalized dynamic KI factor for the mode I-fracture problem Section 5.1 compared to the results in [17], k = 1; XFEM-m refers to a mechanical tip
enriched XFEM formulation, Eq. (9); XFEM-p refers to a ‘piezo-electric’ tip enriched XFEM formulation as proposed by Bechet et al. [4].
H. Nguyen-Vinh et al. / Engineering Fracture Mechanics 92 (2012) 19–31 27

Fig. 6. Normalized dynamic KIV factor for the mode I-fracture problem Section 5.1 compared to the results in [17], k = 1; XFEM-m refers to a mechanical tip
enriched XFEM formulation, Eq. (9); XFEM-p refers to a ‘piezo-electric’ tip enriched XFEM formulation as proposed by Bechet et al. [4].

Moreover, the ratio between electric impact and mechanical impact is defined as
D22
k¼K ð38Þ
r22
The plate is discretized with different refinements on Cartesian grids using standard 4-node elements starting from approx-
imately 1500 elements up to almost 12,000 (155  76) elements. At least 77  38 elements were needed in order to obtain
convergent results. Afterwards, the results were very similar. As an analytical solution is not available and therefore a thor-
ough convergence study cannot be performed, we present only the results for 77  38 elements in this manuscript. We also
ensured that the time step has no critical influence on the numerical results. Though it would reduce computational costs, no
symmetry conditions have been used.
Figs. 5 and 6 compare the results obtained with XFEM to the results of the BEM obtained in [17]. Therefore, we have
adopted the illustration from Garcia-Sanchez et al. [17] and presented the results in normalized form where cL is the longi-
tudinal wave speed. The results agree reasonably well. The results of XFEM with pure ‘mechanical’ tip enrichment (XFEM-m),
Eq. (9), are also compared with the results of an XFEM-formulation using the enrichment proposed by Bechet et al. [4]
(XFEM-p). There are only minor differences in the results. We note that the key advantage of XFEM is its ability to model
crack growth without re-meshing. This capability can also be used in the context of inverse analysis where the detection
of cracks or inclusions in piezo-electric materials is of interest. However, in this manuscript, our main goal is to develop a
dynamics XFEM-formulation for stationary cracks.
Fig. 7 shows the influence of the electrical impact intensity on the results. For dynamic problems, the dynamic stress
intensity factor is larger than the static stress intensity factor. It can also be seen that an electric impact can cause negative
values of the dynamic stress intensity factor. The maximum values of the normalized dynamic stress intensity factor is re-
duced with increasing k-value, i.e. increasing influence of electrical impact. Fig. 8 shows the results for a pure electrical im-
pact when the direction of impact is reversed. The magnitudes of the normalized dynamic stress intensity factor remain the
same but the signs change, meaning that change in the direction of the impact does not cause the absolute value of the dy-
namic stress intensity factor to change.

Fig. 7. Normalized dynamic KI factor for the mode I-fracture problem Section 5.1 for different k-values.
28 H. Nguyen-Vinh et al. / Engineering Fracture Mechanics 92 (2012) 19–31

Fig. 8. Effect of the direction of electrical impact on the normalized dynamic KI-factor for the mode I-fracture problem Section 5.1.

Fig. 9. Set up of the slanter crack problem.

Fig. 10. Normalized dynamic KI factor for the slanted crack problem for different k-values.

5.2. Slanted crack

The last example was also extracted from Garcia-Sanchez et al. [17]. Therefore, consider a homogeneous and linear piezo-
electric specimen that contains a slanted crack as shown in Fig. 9 with h = 22 mm, w = 32 mm, c = 6 mm and a = 22.63 mm.
Plain strain conditions are assumed and the material parameters from the previous section are used. We tested again differ-
ent refinements as in the previous example and achieved convergence with 4000 elements, which agrees well with the
H. Nguyen-Vinh et al. / Engineering Fracture Mechanics 92 (2012) 19–31 29

Fig. 11. Normalized dynamic KI factor for the slanted crack problem for different k-values. Comparison between XFEM with pure ‘mechanical’ tip
enrichment, Eq. (9), XFEM-m versus XFEM with ‘piezo-electric’ tip enrichment [4], XFEM-p.

Fig. 12. Normalized dynamic KII factor for the slanted crack problem for different k-values.

Fig. 13. Normalized dynamic KII factor for the slanted crack problem for different k-values. Comparison between XFEM with pure ‘mechanical’ tip
enrichment, Eq. (9), XFEM-m versus XFEM with ‘piezo-electric’ tip enrichment [4], XFEM-p.

previous results. Therefore, we present only results of a discretization with 75  54(=4050) elements and compare those to
the BEM results presented in Garcia-Sanchez et al. [17].
Fig. 10 shows the normalized dynamic stress intensity factor KI for different values of k. The results agree well with those
obtained in Garcia-Sanchez et al. [17]. The same observations are made when comparisons are done with the normalized
dynamic stress intensity factor KII, Fig. 12. Comparisons between different tip-enrichments (XFEM-m versus XFEM-p) are
30 H. Nguyen-Vinh et al. / Engineering Fracture Mechanics 92 (2012) 19–31

illustrated in Figs. 11 and 13. The differences are minor. One can also observe that the electrical impact has in general a ‘po-
sitive’ effect on the normalized dynamic stress intensity factor. In other words, both, K I as well as K II decrease with increas-
ing k.

6. Conclusion

We have presented an extended finite element method for dynamic fracture of piezo-electric materials. The method ex-
ploits the partition of unity enrichment and therefore allows crack propagation without remeshing. It can be considered as
an extension of the method by Bechet et al. [4] to dynamics. The b-Newmark implicit time integration scheme is adopted.
We have tested different crack tip enrichment functions, i.e. the pure mechanical enrichment function and the more com-
plex enrichment function from Bechet et al. [4] for piezo-electric materials. We found that the results differ only slightly
when the more complex enrichment functions from Bechet et al. [4] are used. However it is not possible to make a general
statement regarding the accuracy as there are no analytical solutions for dynamic problems of piezo-electric materials.
The method was applied to two examples with mechanical and electrical boundary conditions, that concern with quasi-
steady cracks. Since no analytical results are available for dynamic fracture problems of piezo-electric materials, the XFEM
results were compared to results obtained by the BEM [17] and they show excellent agreement.
In the future, we will extend the method to non-linear materials involving cohesive cracks and inverse problems, i.e. to
detect inclusions and cracks in piezo-electric materials. XFEM seems to be ideally suited for inverse problems as shown by
[32,33].

Acknowledgement

The support of the German Research Foundation (DFG), Project No. RA 1946/10-1 is gratefully acknowledged.

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