Compact, Precision Six Degrees of Freedom Inertial Sensor: ADIS16445
Compact, Precision Six Degrees of Freedom Inertial Sensor: ADIS16445
POWER
SELF TEST I/O ALARMS MANAGEMENT GND
TRIAXIAL
GYRO OUTPUT CS
DATA
REGISTERS
TRIAXIAL CALIBRATION SCLK
ACCEL CONTROLLER AND SPI
FILTERS DIN
USER
CONTROL
TEMP REGISTERS DOUT
CLOCK
11051-001
VDD
ADIS16445
Figure 1.
This page is dynamically generated by Analog Devices, Inc., and inserted into this data sheet. A dynamic change to the content on this page will not
trigger a change to either the revision number or the content of the product data sheet. This dynamic page may be frequently modified.
ADIS16445 Data Sheet
TABLE OF CONTENTS
Features .............................................................................................. 1 Memory Management ............................................................... 15
Applications ....................................................................................... 1 Input/Output Configuration ......................................................... 16
General Description ......................................................................... 1 Data Ready Indicator ................................................................. 16
Functional Block Diagram .............................................................. 1 General-Purpose Input/Output................................................ 16
Revision History ............................................................................... 2 Digital Processing Configuration ................................................. 17
Specifications..................................................................................... 3 Gyroscopes/Accelerometers ..................................................... 17
Timing Specifications .................................................................. 5 Input Clock Configuration ....................................................... 17
Absolute Maximum Ratings ............................................................ 6 Calibration ....................................................................................... 18
ESD Caution .................................................................................. 6 Gyroscopes .................................................................................. 18
Pin Configuration and Function Descriptions ............................. 7 Accelerometers ........................................................................... 18
Typical Performance Characteristics ............................................. 8 Flash Updates .............................................................................. 19
User Registers .................................................................................... 9 Restoring Factory Calibration .................................................. 19
User Interface .................................................................................. 10 Alarms .............................................................................................. 20
Reading Sensor Data .................................................................. 10 Static Alarm Use ......................................................................... 20
Device Configuration ................................................................ 11 Dynamic Alarm Use .................................................................. 20
Output Data Registers .................................................................... 12 Alarm Reporting ........................................................................ 20
Gyroscopes .................................................................................. 12 Applications Information .............................................................. 21
Accelerometers............................................................................ 12 Mounting Tips ............................................................................ 21
Internal Temperature ................................................................. 13 Power Supply Considerations ................................................... 21
System Functions ............................................................................ 14 ADIS16445/PCBZ ...................................................................... 21
Global Commands ..................................................................... 14 PC-Based Evaluation Tools ....................................................... 21
Product Identification ................................................................ 14 Outline Dimensions ....................................................................... 22
Self-Test Function ....................................................................... 14 Ordering Guide .......................................................................... 22
Status/Error Flags ....................................................................... 15
REVISION HISTORY
12/15—Rev. E to Rev. F 5/14—Rev. B to Rev. C
Change to Features Section ............................................................. 1 Change to General Description Section .........................................1
Change to Status/Error Flags Section .......................................... 15
6/15—Rev. D to Rev. E Added Mounting Tips Section...................................................... 21
Changed ADIS16445AMLZ to ADIS16445BMLZ .........Throughout
Changes to Features Section and General Description Section........ 1 7/13—Rev. A to Rev. B
Changes to Table 1 .................................................................................. 3 Change to Linear Acceleration Effect on Bias Parameter, Table 1 ....3
Changes to Table 3 .................................................................................. 6 Changes to Burst Read Function Section .................................... 11
Changes to Figure 9 .............................................................................. 10
Changes to ADIS16445/PCBZ Section and Figure 22................... 21 3/13—Rev. 0 to Rev. A
Changes to Ordering Guide................................................................ 22 Changes to Table 1.............................................................................3
Deleted Mounting Approaches Section ....................................... 21
10/14—Rev. C to Rev. D Updated Outline Dimensions ....................................................... 22
Changes to Gyroscopes, Bias Temperature Coefficient
Parameter, and Accelerometers, Bias Temperature Coefficient 10/12—Revision 0: Initial Version
Parameter, Table 1............................................................................. 3
Changes to Table 41 ........................................................................ 20
Rev. F | Page 2 of 22
Data Sheet ADIS16445
SPECIFICATIONS
TA = 25°C, VDD = 3.3 V, angular rate = 0°/sec, dynamic range = ±250°/sec ± 1 g, unless otherwise noted.
Table 1.
Parameter Test Conditions/Comments Min Typ Max Unit
GYROSCOPES
Dynamic Range ±250 °/sec
Initial Sensitivity ±250°/sec, see Table 12 0.01 °/sec/LSB
±125°/sec 0.005 °/sec/LSB
±62°/sec 0.0025 °/sec/LSB
Repeatability1 −40°C ≤ TA ≤ +85°C 1 %
Sensitivity Temperature Coefficient −40°C ≤ TA ≤ +85°C ±40 ppm/°C
Misalignment Axis to axis ±0.05 Degrees
Axis to frame (package) ±0.5 Degrees
Nonlinearity Best fit straight line ±0.1 % of FS
Bias Repeatability1, 2 −40°C ≤ TA ≤ +85°C, 1 σ 0.5 °/sec
In-Run Bias Stability 1 σ, SMPL_PRD = 0x0001 12 °/hr
Angular Random Walk 1 σ, SMPL_PRD = 0x0001 0.56 °/√hr
Bias Temperature Coefficient −40°C ≤ TA ≤ +85°C ±0.005 °/sec/°C
Linear Acceleration Effect on Bias Any axis, 1 σ ±0.015 °/sec/g
Bias Supply Sensitivity +3.15 V ≤ VDD ≤ +3.45 V ±0.2 °/sec/V
Output Noise ±250°/sec range, no filtering 0.22 °/sec rms
Rate Noise Density f = 25 Hz, ±250°/sec range, no filtering 0.011 °/sec/√Hz rms
−3 dB Bandwidth 330 Hz
Sensor Resonant Frequency 17.5 kHz
ACCELEROMETERS Each axis
Dynamic Range ±5 g
Initial Sensitivity See Table 16 for data format 0.2475 0.25 0.2525 mg/LSB
Repeatability1 −40°C ≤ TA ≤ +85°C 1 %
Sensitivity Temperature Coefficient −40°C ≤ TA ≤ +85°C ±40 ppm/°C
Misalignment Axis to axis ±0.2 Degrees
Axis to frame (package) ±0.5 Degrees
Nonlinearity Best fit straight line ±0.2 % of FS
Bias Repeatability1, 2 −40°C ≤ TA ≤ +85°C, 1 σ ±8 mg
In-Run Bias Stability 1 σ, SMPL_PRD = 0x0001 0.075 mg
Velocity Random Walk 1 σ, SMPL_PRD = 0x0001 0.073 m/sec/√hr
Bias Temperature Coefficient −40°C ≤ TA ≤ +85°C ±0.04 mg/°C
Bias Supply Sensitivity +3.15 V ≤ VDD ≤ +3.45 V 1.5 mg/V
Output Noise No filtering 2.25 mg rms
Noise Density No filtering 0.105 mg/√Hz rms
−3 dB Bandwidth 330 Hz
Sensor Resonant Frequency 5.5 kHz
TEMPERATURE
Sensitivity See Table 17 0.07386 °C/LSB
LOGIC INPUTS3
Input High Voltage, VIH 2.0 V
Input Low Voltage, VIL 0.8 V
Logic 1 Input Current, IIH VIH = 3.3 V ±0.2 ±10 µA
Logic 0 Input Current, IIL VIL = 0 V
All Pins Except RST 40 60 µA
RST Pin 1 mA
Input Capacitance, CIN 10 pF
Rev. F | Page 3 of 22
ADIS16445 Data Sheet
Parameter Test Conditions/Comments Min Typ Max Unit
DIGITAL OUTPUTS3
Output High Voltage, VOH ISOURCE = 1.6 mA 2.4 V
Output Low Voltage, VOL ISINK = 1.6 mA 0.4 V
FLASH MEMORY Endurance4 10,000 Cycles
Data Retention5 TJ = 85°C 20 Years
FUNCTIONAL TIMES6 Time until new data is available
Power-On Start-Up Time 175 ms
Reset Recovery Time7 55 ms
Flash Memory Back-Up Time 55 ms
Flash Memory Test Time 20 ms
Automatic Self-Test Time SMPL_PRD = 0x0001 16 ms
CONVERSION RATE
xGYRO_OUT, xACCL_OUT SMPL_PRD = 0x0001 819.2 SPS
Clock Accuracy ±3 %
Sync Input Clock8 0.8 1.1 kHz
POWER SUPPLY Operating voltage range, VDD 3.15 3.3 3.45 V
Power Supply Current VDD = 3.15 V 74 mA
1
The repeatability specifications represent analytical projections, which are based off of the following drift contributions and conditions: temperature hysteresis (−40°C
to +85°C), electronics drift (high-temperature operating life test: 85°C, 500 hours), drift from temperature cycling (JESD22, Method A104-C, Method N, 500 cycles,
−40°C to +85°C), rate random walk (10 year projection), and broadband noise.
2
Bias repeatability describes a long-term behavior, over a variety of conditions. Short-term repeatability is related to the in-run bias stability and noise density specifications.
3
The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant.
4
Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C.
5
The data retention lifetime equivalent is at a junction temperature (TJ) of 85°C as per JEDEC Standard 22, Method A117. Data retention lifetime decreases with junction
temperature.
6
These times do not include thermal settling and internal filter response times (330 Hz bandwidth), which may affect overall accuracy.
7
The RST line must be held low for at least 10 μs to assure a proper reset and recovery sequence.
8
The sync input clock functions below the specified minimum value but at reduced performance levels.
Rev. F | Page 4 of 22
Data Sheet ADIS16445
TIMING SPECIFICATIONS
TA = 25°C, VDD = +3.3 V, unless otherwise noted.
Table 2.
Normal Mode Burst Read
Parameter Description Min1 Typ Max Min1 Typ Max Unit
fSCLK Serial clock 0.01 2.0 0.01 1.0 MHz
tSTALL Stall period between data 9 N/A2 µs
tREADRATE Read rate 40 µs
t CS Chip select to SCLK edge 48.8 48.8 ns
tDAV DOUT valid after SCLK edge 100 100 ns
tDSU DIN setup time before SCLK rising edge 24.4 24.4 ns
tDHD DIN hold time after SCLK rising edge 48.8 48.8 ns
tSCLKR, tSCLKF SCLK rise/fall times, not shown in timing diagrams 5 12.5 5 12.5 ns
tDR, tDF DOUT rise/fall times, not shown in timing diagrams 5 12.5 5 12.5 ns
tSFS CS high after SCLK edge 5 5 ns
t1 Input sync positive pulse width 25 25 µs
tSTDR Input sync to data ready valid transition 670 670 µs
tNV Data invalid time 210 210 µs
t3 Input sync period 910 910 µs
1
Guaranteed by design and characterization, but not tested in production.
2
When using the burst read mode, the stall period is not applicable.
Timing Diagrams
CS
tCS tSFS
1 2 3 4 5 6 15 16
SCLK
tDAV
DOUT MSB DB14 DB13 DB12 DB11 DB10 DB2 DB1 LSB
tDSU tDHD
11051-002
DIN R/W A6 A5 A4 A3 A2 D2 D1 LSB
tREADRATE
tSTALL
CS
11051-003
SCLK
t3
tSTDR t1
CLOCK
DATA
READY
11051-004
tNV
Rev. F | Page 5 of 22
ADIS16445 Data Sheet
Rev. F | Page 6 of 22
Data Sheet ADIS16445
SCLK
DIO2
DIO1
DIO3
GND
GND
DNC
DNC
VDD
DIN
19 17 15 13 11 9 7 5 3 1
20 18 16 14 12 10 8 6 4 2
DIO4/CLKIN
GND
CS
VDD
VDD
RST
DOUT
DNC
DNC
DNC
PIN 1
PIN 20
NOTES
1. THIS REPRESENTATION DISPLAYS THE TOP VIEW WHEN THE
CONNECTOR IS VISIBLE AND FACING UP.
11051-005
11051-006
2. MATING CONNECTOR: SAMTEC CLM-110-02 OR EQUIVALENT.
3. DNC = DO NOT CONNECT.
Rev. F | Page 7 of 22
ADIS16445 Data Sheet
+σ
AVERAGE +σ
AVERAGE
10 0.1
–σ
–σ
1 0.01
11051-007
11051-008
0.01 0.1 1 10 100 1k 10k 0.01 0.1 1 10 100 1k 10k
Tau (Seconds) Tau (Seconds)
Figure 7. Gyroscope Root Allan Variance Figure 8. Accelerometer Root Allan Variance
Rev. F | Page 8 of 22
Data Sheet ADIS16445
USER REGISTERS
Table 6. User Register Memory Map
Name R/W Flash Backup Address1 Default Function Bit Assignments
FLASH_CNT R Yes 0x00 N/A Flash memory write count See Table 26
Reserved N/A N/A 0x02 N/A N/A N/A
XGYRO_OUT R No 0x04 N/A X-axis gyroscope output See Table 9
YGYRO_OUT R No 0x06 N/A Y-axis gyroscope output See Table 10
ZGYRO_OUT R No 0x08 N/A Z-axis gyroscope output See Table 11
XACCL_OUT R No 0x0A N/A X-axis accelerometer output See Table 13
YACCL_OUT R No 0x0C N/A Y-axis accelerometer output See Table 14
ZACCL_OUT R No 0x0E N/A Z-axis accelerometer output See Table 15
Reserved N/A N/A 0x10 to 0x16 N/A Reserved N/A
TEMP_OUT R No 0x18 N/A Temperature output See Table 17
XGYRO_OFF R/W Yes 0x1A 0x0000 X-axis gyroscope bias offset factor See Table 30
YGYRO_OFF R/W Yes 0x1C 0x0000 Y-axis gyroscope bias offset factor See Table 31
ZGYRO_OFF R/W Yes 0x1E 0x0000 Z-axis gyroscope bias offset factor See Table 32
XACCL_OFF R/W Yes 0x20 0x0000 X-axis acceleration bias offset factor See Table 33
YACCL_OFF R/W Yes 0x22 0x0000 Y-axis acceleration bias offset factor See Table 34
ZACCL_OFF R/W Yes 0x24 0x0000 Z-axis acceleration bias offset factor See Table 35
Reserved N/A N/A 0x26 to 0x30 N/A Reserved N/A
GPIO_CTRL R/W No 0x32 0x0000 Auxiliary digital input/output control See Table 27
MSC_CTRL R/W Yes 0x34 0x0006 Miscellaneous control See Table 24
SMPL_PRD R/W Yes 0x36 0x0001 Internal sample period (rate) control See Table 28
SENS_AVG R/W Yes 0x38 0x0402 Dynamic range and digital filter control See Table 29
Reserved N/A N/A 0x3A N/A Reserved N/A
DIAG_STAT R No 0x3C 0x0000 System status See Table 25
Reserved N/A N/A 0x3A N/A Reserved N/A
GLOB_CMD W N/A 0x3E 0x0000 System command See Table 19
ALM_MAG1 R/W Yes 0x40 0x0000 Alarm 1 amplitude threshold See Table 36
ALM_MAG2 R/W Yes 0x42 0x0000 Alarm 2 amplitude threshold See Table 37
ALM_SMPL1 R/W Yes 0x44 0x0000 Alarm 1 sample size See Table 38
ALM_SMPL2 R/W Yes 0x46 0x0000 Alarm 2 sample size See Table 39
ALM_CTRL R/W Yes 0x48 0x0000 Alarm control See Table 40
Reserved N/A N/A 0x4A to 0x51 N/A Reserved N/A
LOT_ID1 R Yes 0x52 N/A Lot identification number See Table 20
LOT_ID2 R Yes 0x54 N/A Lot identification number See Table 21
PROD_ID R Yes 0x56 0x403D Product identifier See Table 22
SERIAL_NUM R Yes 0x58 N/A Lot-specific serial number See Table 23
1
Each register contains two bytes. The address of the lower byte is displayed. The address of the upper byte is equal to the address of the lower byte plus 1.
Rev. F | Page 9 of 22
ADIS16445 Data Sheet
USER INTERFACE
The ADIS16445 is an autonomous system that requires no user Table 8. Generic Master Processor SPI Settings
initialization. When it has a valid power supply, it initializes itself Processor Setting Description
and starts sampling, processing, and loading sensor data into
Master The ADIS16445 operates as a slave
the output registers at a sample rate of 819.2 SPS. DIO1 pulses
SCLK Rate ≤ 2 MHz1 Maximum serial clock rate
high after each sample cycle concludes. The SPI interface enables
SPI Mode 3 CPOL = 1 (polarity), CPHA = 1 (phase)
simple integration with many embedded processor platforms,
MSB-First Mode Bit sequence
as shown in Figure 9 (electrical connection) and Table 7 (pin
16-Bit Mode Shift register/data length
functions).
+3.3V
1
For burst read, SCLK rate ≤ 1 MHz.
I/O LINES ARE COMPATIBLE WITH
VDD 3.3V LOGIC LEVELS READING SENSOR DATA
10 11 12 The ADIS16445 provides two different options for acquiring
SYSTEM
PROCESSOR SS 6 CS ADIS16445 sensor data: a single register and a burst register. A single regis-
SPI MASTER
SCLK 3 SCLK
ter read requires two 16-bit SPI cycles. The first cycle requests
MOSI 5 DIN
the contents of a register using the bit assignments in Figure 12.
MISO 4 DOUT
Bit DC7 to Bit DC0 are don’t cares for a read, and then the output
IRQ 7 DIO1
register contents follow on DOUT during the second sequence.
Figure 10 includes three single register reads in succession.
13 14 15
11051-010
MISO Master input, slave output
DOUT XGYRO_OUT YGYRO_OUT ZGYRO_OUT
IRQ Interrupt request
Figure 10. SPI Read Example
The ADIS16445 SPI interface supports full duplex serial commu-
nication (simultaneous transmit and receive) and uses the bit CS
sequence shown in Figure 12. Table 8 provides a list of the most SCLK
common settings that require attention to initialize the serial
port of a processor for the ADIS16445 SPI interface. DIN DIN = 0000 0100 0000 0000 = 0x0400
DOUT
11051-011
DOUT = 1111 10011101 1010 = 0xF9DA = –15.74°/sec LSBs ≥ –62.96°/sec
CS
SCLK
DIN R/W A6 A5 A4 A3 A2 A1 A0 DC7 DC6 DC5 DC4 DC3 DC2 DC1 DC0 R/W A6 A5
DOUT D15 D14 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 D15 D14 D13
NOTES
1. THE DOUT BIT PATTERN REFLECTS THE ENTIRE CONTENTS OF THE REGISTER IDENTIFIED BY [A6:A0]
11051-012
Rev. F | Page 10 of 22
Data Sheet ADIS16445
Burst Read Function DEVICE CONFIGURATION
The burst read function provides a way to read all of the data in The control registers in Table 6 provide users with a variety of
one continuous stream of bits, with no stall time. As shown in configuration options. The SPI provides access to these registers,
Figure 13, start this mode by setting DIN = 0x3E00 while keeping one byte at a time, using the bit assignments in Figure 12. Each
CS low for eight additional 16-bit read cycles. These eight cycles register has 16 bits, where Bits[7:0] represent the lower address,
produce the following sequence of output registers on DOUT: and Bits[15:8] represent the upper address. Figure 15 provides
DIAG_STAT, XGYRO_OUT, YGYRO_OUT, ZGYRO_OUT, an example of writing 0x04 to Address 0x37 (SMPL_PRD[15:8],
XACCL_OUT, YACCL_OUT, ZACCL_OUT, and TEMP_OUT. using DIN = 0xB704). This example reduces the sample rate by
CS 1 2 3 9 a factor of eight (see Table 28).
CS
SCLK
11051-013
DOUT DIAG_STAT XGYRO_OUT TEMP_OUT DIN
11051-015
Figure 13. Burst Read Sequence DIN = 1011 0111 0000 0100 = 0xB704, WRITES 0x04 TO ADDRESS 0x37.
DOUT = 0100 0000 0011 1101 = 0x403D = 16,445 critical user settings.
Figure 14. SPI Test Read Pattern DIN = 0x5600, DOUT = 0x403D
MANUAL
FLASH
BACKUP
NONVOLATILE VOLATILE
FLASH MEMORY SRAM
START-UP
11051-016
RESET
Rev. F | Page 11 of 22
ADIS16445 Data Sheet
aZ
gZ
X-AXIS
Y-AXIS
aX
aY gX
gY
11051-017
Rev. F | Page 12 of 22
Data Sheet ADIS16445
INTERNAL TEMPERATURE
Table 18. Temperature, Twos Complement Format
The internal temperature measurement data loads into the Temperature (°C) Decimal Hex Binary
TEMP_OUT (see Table 17) register. Table 18 illustrates the
+105 +1002 0x3EA 0011 1110 1010
temperature data format. Note that this temperature represents
+85 +731 0x2DB 0010 1101 1011
an internal temperature reading, which does not precisely rep-
+31.14771 +2 0x002 0000 0000 0010
resent external conditions. The intended use of TEMP_OUT is
+31.07386 +1 0x001 0000 0000 0001
to monitor relative changes in temperature.
+31 0 0x000 0000 0000 0000
Table 17. TEMP_OUT (Base Address = 0x18), Read Only +30.92614 −1 0xFFF 1111 1111 1111
Bits Description +30.85229 −2 0xFFE 1111 1111 1110
[15:12] Not used −40 −962 0xC3E 1100 0011 1110
[11:0] Twos complement, 0.07386°C/LSB, 31°C = 0x000
Rev. F | Page 13 of 22
ADIS16445 Data Sheet
SYSTEM FUNCTIONS
GLOBAL COMMANDS SELF-TEST FUNCTION
The GLOB_CMD register in Table 19 provides trigger bits The MSC_CTRL register in Table 24 provides a self-test function
for software reset, flash memory management, and calibration for the gyroscopes and accelerometers. This function allows the
control. Start each of these functions by writing a 1 to the assigned user to verify the mechanical integrity of each MEMS sensor.
bit in GLOB_CMD. After completing the task, the bit automati- When enabled, the self-test applies an electrostatic force to each
cally returns to 0. internal sensor element, which causes them to move. The move-
ment in each element simulates its response to actual rotation/
For example, set GLOB_CMD[7] = 1 (DIN = 0xBE80) to initiate
acceleration and generates a predictable electrical response in the
a software reset. Set GLOB_CMD[3] = 1 (DIN = 0xBE08) to back
sensor outputs. Set MSC_CTRL[10] = 1 (DIN = 0xB504) to activate
up the user register contents in nonvolatile flash. This sequence
the internal self-test routine, which compares the response to an
includes loading the control registers with the data in their re-
expected range of responses and reports a pass/fail response to
spective flash memory locations prior to producing new data.
DIAG_STAT[5]. If this bit is high, review DIAG_STAT[15:10]
Table 19. GLOB_CMD (Base Address = 0x3E), Write Only to identify the failing sensor.
Bits Description (Default = 0x0000)
Table 24. MSC_CTRL (Base Address = 0x34), Read/Write
[15:8] Not used
Bits Description (Default = 0x0006)
7 Software reset
[15:12] Not used
[6:4] Not used
11 Checksum memory test (cleared upon completion)1
3 Flash update
1 = enabled, 0 = disabled
2 Not used
10 Internal self-test (cleared upon completion)1
1 Factory calibration restore
1 = enabled, 0 = disabled
0 Gyroscope bias correction
[9:8] Do not use, always set to 00
PRODUCT IDENTIFICATION 7 Not used
6 Point of percussion, see Figure 21
The PROD_ID register in Table 22 contains the binary equivalent
1 = enabled, 0 = disabled
of 16,445. It provides a product-specific variable for systems that
[5:3] Not used
need to track this in their system software. The LOT_ID1 and
LOT_ID2 registers in Table 20 and Table 21, respectively, combine 2 Data ready enable
to provide a unique, 32-bit lot identification code. 1 = enabled, 0 = disabled
1 Data ready polarity
The SERIAL_NUM register in Table 23 contains a binary num- 1 = active high when data is valid
ber that represents the serial number on the device label. The
0 = active low when data is valid
assigned serial numbers in SERIAL_NUM are lot specific.
0 Data ready line select
Table 20. LOT_ID1 (Base Address = 0x52), Read Only 1 = DIO2, 0 = DIO1
Bits Description 1
The bit is automatically reset to 0 after finishing the test.
[15:0] Lot identification, binary code
Rev. F | Page 14 of 22
Data Sheet ADIS16445
STATUS/ERROR FLAGS MEMORY MANAGEMENT
The DIAG_STAT register in Table 25 provides error flags for The FLASH_CNT register in Table 26 provides a 16-bit counter
a number of functions. Each flag uses 1 to indicate an error con- that helps track the number of write cycles to the nonvolatile flash
dition and 0 to indicate a normal condition. Reading this register memory. The flash updates every time a manual flash update
provides access to the status of each flag and resets all of the bits occurs. A manual flash update is initiated by the GLOB_CMD[3]
to 0 for monitoring future operation. If the error condition remains, bit and is performed at the completion of the GLOB_CMD[1:0]
the error flag returns to 1 at the conclusion of the next sample functions (see Table 19).
cycle. The SPI communication error flag in DIAG_STAT[3]
Table 26. FLASH_CNT (Base Address = 0x00), Read Only
indicates that the number of SCLKs in a SPI sequence did not
Bits Description
equal a multiple of 16 SCLKs.
[15:0] Binary counter
Table 25. DIAG_STAT (Base Address = 0x3C), Read Only
Bits Description (Default = 0x0000) Checksum Test
15 Z-axis accelerometer self-test failure Set MSC_CTRL[11] = 1 (DIN = 0xB508) to perform a check-
1 = fail, 0 = pass sum test of the internal program memory. This function takes
14 Y-axis accelerometer self-test failure a summation of the internal program memory and compares
1 = fail, 0 = pass it with the original summation value for the same locations
13 X-axis accelerometer self-test failure (from factory configuration). If the sum matches the correct val-
1 = fail, 0 = pass ue, DIAG_STAT[6] is equal to 0. If it does not match, DI-
12 Z-axis gyroscope self-test failure AG_STAT[6] is equal to 1. Make sure that the power supply is
0 = pass within specification for the entire 20 ms that this function takes
11 Y-axis gyroscope self-test failure to complete.
1 = fail, 0 = pass
10 X-axis gyroscope self-test failure
1 = fail, 0 = pass
9 Alarm 2 status
1 = active, 0 = inactive
8 Alarm 1 status
1 = active, 0 = inactive
7 Not used
6 Flash test, checksum flag
1 = fail, 0 = pass
5 Self-test diagnostic error flag
1 = fail, 0 = pass
4 Sensor overrange
1 = overrange, 0 = normal
3 SPI communication failure
1 = fail, 0 = pass
2 Flash update failure
1 = fail, 0 = pass
[1:0] Not used
Rev. F | Page 15 of 22
ADIS16445 Data Sheet
INPUT/OUTPUT CONFIGURATION
DATA READY INDICATOR Table 27. GPIO_CTRL (Base Address = 0x32), Read/Write
The data ready indicator provides a signal that indicates Bits Description (Default = 0x0000)
when the registers are updating, so that system processors can [15:12] Not used
avoid data collision, a condition when internal register updates 11 General-Purpose I/O Line 4 (DIO4) data level
happen at the same time that an external processor requests it. 10 General-Purpose I/O Line 3 (DIO3) data level
The data ready signal has valid and invalid states. Using the 9 General-Purpose I/O Line 2 (DIO2) data level
transition from invalid to valid to trigger an interrupt service 8 General-Purpose I/O Line 1 (DIO1) data level
routine provides the most time for data acquisition (before [7:4] Not used
the next register update). See Figure 4 and Table 2 for specific 3 General-Purpose I/O Line 4 (DIO4) direction control
timing information. 1 = output, 0 = input
MSC_CTRL[2:0] (see Table 24) provide control bits for ena- 2 General-Purpose I/O Line 3 (DIO3) direction control
bling this function, selecting the polarity of the valid state and 1 = output, 0 = input
I/O line assignment (DIO1, DIO2). The factory default setting 1 General-Purpose I/O Line 2 (DIO2) direction control
of MSC_CTRL[2:0] = 110 establishes DIO1 as a data ready out- 1 = output, 0 = input
put line and assigns the valid state with a logic high (1). Set 0 General-Purpose I/O Line 1 (DIO1) direction control
MSC_CTRL[2:0] = 100 (DIN = 0xB404) to change the polarity of 1 = output, 0 = input
the data ready signal on DIO1 for interrupt inputs that require
negative logic inputs for activation. Example Input/Output Configuration
For example, set GPIO_CTRL[3:0] = 0100 (DIN = 0xB204)
GENERAL-PURPOSE INPUT/OUTPUT
to set DIO3 as an output signal pin and DIO1, DIO2, and
DIO1, DIO2, DIO3, and DIO4 are configurable, general-purpose DIO4 as input signal pins. Set the output on DIO3 to 1 by set-
input/output lines that serve multiple purposes. The data ting GPIO_CTRL[10] = 1 (DIN = 0xB304). Then, read
ready controls in MSC_CTRL[2:0] have the highest priority GPIO_CTRL[7:0] (DIN = 0x3200) and mask off GPIO_CTRL[9:8]
for configuring DIO1 and DIO2. The alarm indicator controls in and GPIO_CTRL[11] to monitor the digital signal levels on
ALM_CTRL[2:0] have the second highest priority for configuring DIO4, DIO2, and DIO1.
DIO1 and DIO2. The external clock control associated with
SMPL_PRD[0] has the highest priority for DIO4 configuration
(see Table 28). GPIO_CTRL in Table 27 has the lowest priority
for configuring DIO1, DIO2, and DIO4, and has absolute con-
trol over DIO3.
Rev. F | Page 16 of 22
Data Sheet ADIS16445
MAGNITUDE (dB)
SMPL_PRD register in Table 28 provides two functional controls –60
11051-018
0.001 0.01 0.1 1
~25 Hz. The SMPL_PRD[12:8] setting affects the update rate FREQUENCY (f/fS)
for the TEMP_OUT register (see Table 17) as well. Figure 18. Bartlett Window, FIR Filter Frequency Response
(Phase Delay = N Samples)
Table 28. SMPL_PRD (Base Address = 0x36), Read/Write
Bits Description (Default = 0x0001) Dynamic Range
[15:13] Not used The SENS_AVG[10:8] bits provide three dynamic range
[12:8] D, decimation rate setting, binomial, see Figure 19 settings for the gyroscopes. The lower dynamic range settings
[7:1] Not used (±62.5°/sec and ±125°/sec) limit the minimum filter tap sizes
0 Clock to maintain resolution. For example, set SENS_AVG[10:8] =
1 = internal sampling clock, 819.2 SPS 010 (DIN = 0xB902) for a measurement range of ±125°/sec.
0 = external sampling clock Because this setting can influence the filter settings, program
SENS_AVG[10:8] before programming SENS_AVG[2:0] if more
INPUT CLOCK CONFIGURATION filtering is required.
SMPL_PRD[0] (see Table 28) provides a control for synchroniz-
Table 29. SENS_AVG (Base Address = 0x38), Read/Write
ing the internal sampling to an external clock source. Set
Bits Description (Default = 0x0402)
SMPL_PRD[0] = 0 (DIN = 0xB600) and GPIO_CTRL[3] = 0
[15:11] Not used
(DIN = 0xB200) to enable the external clock. See Table 2 and
[10:8] Measurement range (sensitivity) selection
Figure 4 for timing information.
100 = ±250°/sec (default condition)
Digital Filtering 010 = ±125°/sec, filter taps ≥ 4 (Bits[2:0] ≥ 0x02)
The SENS_AVG register in Table 29 provides user controls for 001 = ±62.5°/sec, filter taps ≥ 16 (Bits[2:0] ≥ 0x04)
the low-pass filter. This filter contains two cascaded averaging [7:3] Not used
filters that provide a Bartlett window, FIR filter response (see [2:0] Filter Size Variable B
Figure 19). For example, set SENS_AVG[2:0] = 100 (DIN = 0xB804) Number of taps in each stage; NB = 2B
to set each stage to 16 taps. When used with the default sample See Figure 18 for filter response
rate of 819.2 SPS and zero decimation (SMPL_PRD[15:8] = 0x00),
this value reduces the sensor bandwidth to approximately 16 Hz.
AVERAGE/
BARTLETT WINDOW DECIMATION
FIR FILTER FILTER
NB NB ND ÷ND
MEMS LOW-PASS 1 1 1
FILTER ADC x(n) x(n) x(n)
SENSOR NB NB ND
330Hz n=1 n=1 n=1
B = SENS_AVG[2:0] D = SMPL_PRD[12:8]
GYROSCOPES NB = 2B ND = 2D
CLOCK NB = NUMBER OF TAPS ND = NUMBER OF TAPS
LOW-PASS, TWO-POLE (404Hz, 757Hz)
819.2SPS (PER STAGE)
ACCELEROMETERS
LOW-PASS, SINGLE-POLE (330Hz)
11051-019
Rev. F | Page 17 of 22
ADIS16445 Data Sheet
CALIBRATION
The mechanical structure and assembly process of the ADIS16445 Single Command Bias Correction
provide excellent position and alignment stability for each sensor, GLOB_CMD[0] (see Table 19) loads the xGYRO_OFF registers
even after subjected to temperature cycles, shock, vibration, and with the values that are the opposite of the values that are in
other environmental conditions. The factory calibration includes a xGYRO_OUT, at the time of initiation. Use this command, to-
dynamic characterization of each gyroscope and accelerometer over gether with the decimation filter (SMPL_PRD[12:8], see Table 28),
temperature and generates sensor specific correction formulas. to automatically average the gyroscope data and improve the
GYROSCOPES accuracy of this function, as follows:
The XGYRO_OFF (see Table 30), YGYRO_OFF (see Table 31), 1. Set SENS_AVG[10:8] = 001 (DIN = 0xB901) to optimize
and ZGYRO_OFF (see Table 32) registers provide user- the xGYRO_OUT sensitivity to 0.0025°/sec/LSB.
programmable bias adjustment function for the x-, y-, and 2. Set SMPL_PRD[12:8] = 0x10 (DIN = 0xB710) to set the
z-axis gyroscopes, respectively. Figure 20 illustrates that they con- decimation rate to 65,536 (216), which provides an averaging
tain bias correction factors that adjust to the sensor data imme- time of 80 seconds (65,536 ÷ 819.2 SPS).
diately before it loads into the output register. 3. Wait for 80 seconds while keeping the device motionless.
4. Set GLOB_CMD[0] = 1 (DIN = 0xBE01) and wait for the
FACTORY time it takes to perform the flash memory backup.
MEMS CALIBRATION xGYRO_OUT
ADC
xACCL_OUT
SENSOR AND
FILTERING ACCELEROMETERS
The XACCL_OFF (see Table 33), YACCL_OFF (see Table 34),
11051-020
xGYRO_OFF and ZACCL_OFF (see Table 35) registers provide user pro-
xACCL_OFF
grammable bias adjustment function for the x-, y-, and
Figure 20. User Calibration, Gyroscopes, and Accelerometers z-axis accelerometers, respectively. These registers adjust the
Gyroscope Bias Error Estimation accelerometer data in the same manner as XGYRO_OFF in
Figure 20.
Any system level calibration function must start with an estimate
of the bias errors, which typically comes from a sample of gyro- Table 33. XACCL_OFF (Base Address = 0x20), Read/Write
scope output data, when the device is not in motion. The sample Bits Description (Default = 0x0000)
size of data depends on the accuracy goals. Figure 7 provides a [15:0] X-axis, accelerometer offset correction factor,
trade-off relationship between averaging time and the expected twos complement, 0.25 mg/LSB, 0 g = 0x0000
accuracy of a bias measurement. Vibration, thermal gradients,
and power supply instability can influence the accuracy of this Table 34. YACCL_OFF (Base Address = 0x22), Read/Write
process. Bits Description (Default = 0x0000)
[15:14] Not used
Table 30. XGYRO_OFF (Base Address = 0x1A), Read/Write [13:0] Y-axis, accelerometer offset correction factor,
Bits Description (Default = 0x0000) twos complement, 0.25 mg/LSB, 0 g = 0x0000
[15:0] X-axis, gyroscope offset correction factor,
twos complement, 0.0025°/sec/LSB, 0°/sec = 0x0000 Table 35. ZACCL_OFF (Base Address = 0x24), Read/Write
Bits Description (Default = 0x0000)
Table 31. YGYRO_OFF (Base Address = 0x1C), Read/Write [15:14] Not used
Bits Description (Default = 0x0000) [13:0] Z-axis, accelerometer offset correction factor,
[15:0] Y-axis, gyroscope offset correction factor, twos complement, 0.25 mg/LSB, 0 g = 0x0000
twos complement, 0.0025°/sec/LSB, 0°/sec = 0x0000
Accelerometer Bias Error Estimation
Table 32. ZGYRO_OFF (Base Address = 0x1E), Read/Write Under static conditions, orient each accelerometer in positions
Bits Description (Default = 0x0000) where the response to gravity is predictable. A common approach
[15:0] Z-axis, gyroscope offset correction factor, is to measure the response of each accelerometer when they are
twos complement, 0.0025°/sec/LSB, 0°/sec = 0x0000 oriented in peak response positions, that is, where ±1 g is the
Gyroscope Bias Correction Factors ideal measurement position. Next, average the +1 g and −1 g
accelerometer measurements together to estimate the residual
When the bias estimate is complete, multiply the estimate by
bias error. Using more points in the rotation can improve the
−1 to change its polarity, convert it into digital format for the
accuracy of the response.
offset correction registers (see Table 30, Table 31, and Table 32),
and write the correction factors to the correction registers. For
example, lower the x-axis bias by 10 LSB (0.025°/sec) by setting
XGYRO_OFF = 0x1FF6 (DIN = 0x9B1F, 0x9AF6).
Rev. F | Page 18 of 22
Data Sheet ADIS16445
Accelerometer Bias Correction Factors FLASH UPDATES
When the bias estimate is complete, multiply the estimate by When using the user calibration registers to optimize system
−1 to change its polarity, convert it to the digital format for the level accuracy, set GLOB_CMD[3] = 1 (DIN = 0xBE04) to save
offset correction registers (see Table 33, Table 34 or Table 35), these settings in nonvolatile flash memory. Be sure to consider
and write the correction factors to the correction registers. For the endurance rating of the flash memory when determining how
example, lower the x-axis bias by 12 LSB (3 mg) by setting often to update the user correction factors in the flash memory.
XACCL_OFF = 0xFFF4 (DIN = 0xA1FF, 0xA0F4).
RESTORING FACTORY CALIBRATION
Point of Percussion Alignment
Set GLOB_CMD[1] = 1 (DIN = 0xBE02) to execute the factory
Set MSC_CTRL[6] = 1 (DIN = 0xB446) to enable this feature calibration restore function, which resets the gyroscope and accel-
and maintain the factory default settings for DIO1. This feature erometer offset registers to 0x0000 and all sensor data to 0. Then, it
performs a point of percussion translation to the point identified automatically updates the flash memory and restarts sampling and
in Figure 21. See Table 24 for more information on MSC_CTRL. processing data. See Table 19 for information on GLOB_CMD.
ORIGIN ALIGNMENT
11051-021
REFERENCE POINT
SEE MSC_CTRL[6].
Rev. F | Page 19 of 22
ADIS16445 Data Sheet
ALARMS
Alarm 1 and Alarm 2 provide two independent alarms with Table 40. ALM_CTRL (Base Address = 0x48), Read/Write
programmable levels, polarity, and data sources. Bits Description (Default = 0x0000)
[15:12] Alarm 2 data source selection
STATIC ALARM USE
0000 = disable
The static alarms setting compares the data source selection 0001 = XGYRO_OUT
(ALM_CTRL[15:8]) with the values in the ALM_MAGx registers 0010 = YGYRO_OUT
listed in Table 36 and Table 37, using ALM_MAGx[15] to deter- 0011 = ZGYRO_OUT
mine the trigger polarity. The data format in these registers 0100 = XACCL_OUT
matches the format of the data selection in ALM_CTRL[15:8]. 0101 = YACCL_OUT
See Table 41, Alarm 1, for a static alarm configuration example. 0110 = ZACCL_OUT
Table 36. ALM_MAG1 (Base Address = 0x40), Read/Write [11:8] Alarm 1 data source selection (same as Alarm 2)
Bits Description (Default = 0x0000) 7 Alarm 2, dynamic/static (1 = dynamic, 0 = static)
[15:0] Threshold setting; matches for format of 6 Alarm 1, dynamic/static (1 = dynamic, 0 = static)
ALM_CTRL[11:8] output register selection 5 Alarm 2, polarity (1 = greater than ALM_MAG2)
4 Alarm 1, polarity (1 = greater than ALM_MAG1)
Table 37. ALM_MAG2 (Base Address = 0x42), Read/Write 3 Data source filtering (1 = filtered, 0 = unfiltered)
Bits Description (Default = 0x0000) 2 Alarm indicator (1 = enabled, 0 = disabled)
[15:0] Threshold setting; matches for format of 1 Alarm indicator active polarity (1 = high, 0 = low)
ALM_CTRL[15:12] output register selection
0 Alarm output line select (1 = DIO2, 0 = DIO1)
DYNAMIC ALARM USE
Alarm Example
The dynamic alarm setting monitors the data selection for a
Table 41 offers an example that configures Alarm 1 to trigger when
rate-of-change comparison. The rate-of-change comparison is
filtered ZACCL_OUT data drops below 0.7 g, and Alarm 2 to
represented by the magnitude in the ALM_MAGx registers over
trigger when filtered ZGYRO_OUT data changes by more than
the time represented by the number-of-samples setting in the
50°/sec over a 100 ms period, or 500°/sec2. The filter setting
ALM_SMPLx registers, located in Table 38 and Table 39. See
helps reduce false triggers from noise and refines the accuracy
Table 41, Alarm 2, for a dynamic alarm configuration example.
of the trigger points. The ALM_SMPL2 setting of 82 samples
Table 38. ALM_SMPL1 (Base Address = 0x44), Read/Write provides a comparison period that is approximately equal to
Bits Description (Default = 0x0000) 100 ms for an internal sample rate of 819.2 SPS.
[15:8] Not used Table 41. Alarm Configuration Example
[7:0] Binary, number of samples (both 0x00 and 0x01 = 1) DIN Description
0xC936, ALM_CTRL = 0x36AF
Table 39. ALM_SMPL2 (Base Address = 0x46), Read/Write
0xC8AF Alarm 2: dynamic, Δ-ZGYRO_OUT
Bits Description (Default = 0x0000) (Δ-time, ALM_SMPL2) > ALM_MAG2
[15:8] Not used Alarm 1: static, ZACCL_OUT < ALM_MAG1, filtered data
[7:0] Binary, number of samples (both 0x00 and 0x01 = 1) DIO2 output indicator, positive polarity
0xC313, ALM_MAG2 = 0x1388 = 5000 LSB = 50°/sec
ALARM REPORTING 0xC288
The DIAG_STAT[9:8] bits provide error flags that indicate an 0xC10A, ALM_MAG1 = 0x0AF0 = 2800 LSB = 0.7 g
alarm condition. The ALM_CTRL[2:0] bits provide controls 0xC0F0
for a hardware indicator using DIO1 or DIO2. 0xC652 ALM_SMPL2[7:0] = 0x52 = 82 samples
82 samples ÷ 819.2 SPS = ~100 ms
Rev. F | Page 20 of 22
Data Sheet ADIS16445
APPLICATIONS INFORMATION
MOUNTING TIPS Figure 23 provides the pin assignments for the interface board.
J1 J2
The mounting and installation process can influence gyroscope RST 1 2 SCLK DNC 1 2 GND
bias repeatability and other key parametric behaviors. To pre- CS 3 4 DOUT DNC 3 4 DIO3
serve the best performance, use the following guidelines when DNC 5 6 DIN GND 5 6 DIO4
developing an attachment approach for the ADIS16445: GND 7 8 GND DNC 7 8 DNC
11051-023
GND 9 10 VDD DNC 9 10 DNC
• Focus mounting force at the machine screw locations.
VDD 11 12 VDD DIO2 11 12 DIO1
• Avoid direct force application on the substrate.
Figure 23. J1/J2 Pin Assignments for Interface PCB
• Avoid placing mounting pressure on the package lid, except
for the edges that border the exposed side of the substrate. Installation
• Use a consistent mounting torque of 28 inch-ounces on The following steps provide an example installation process for
mounting hardware. using these three components:
• Avoid placing translational forces on the electrical connector. • Drill and tap M2 and M3 holes in the system frame, according
For more ideas on mounting ideas and tips, please refer to to the locations in Figure 22.
Application Note AN-1305. • Install the ADIS16445 using M2 machine screws. Use a
mounting torque of 25 inch-ounces.
POWER SUPPLY CONSIDERATIONS
• Install the interface PCB using M3 machine screws.
The power supply must be within 3.15 V and 3.45 V for normal
• Connect J1 on the interface flex to the ADIS16445BMLZ
operation and optimal performance. During start up, the internal
connector.
power conversion system starts drawing current when VDD
• Connect J2 on the interface flex to J3 on the interface PCB.
reaches 1.6 V. The internal processor begins initializing when
Note that J2 (interface flex) has 20 pins and J3 (interface PCB)
VDD is equal to 2.35 V. After the processor starts, VDD must
has 24 pins. Make sure that Pin 1 on J2 (interface flex)
reach 2.7 V within 128 ms. Also, make sure that the power sup-
connects to Pin 20 on J3 (interface PCB). J3 has a Pin 1 in-
ply drops below 1.6 V to shut the device down. Figure 9 shows a
dicator to help guide this connection.
10 µF capacitor on the power supply. Using this capacitor sup-
• Use J1 and J2 on the interface PCB to make the electrical
ports optimal noise performance in the sensors.
connection with the system supply and embedded pro-
ADIS16445/PCBZ cessor, using 12-pin, 1 mm ribbon cables. The following
The ADIS16445/PCBZ includes one ADIS16445BMLZ, one parts may be useful in building this type of cable: 3M
interface PCB, and one flexible connector/cable. This particular Part Number 152212-0100-GB (ribbon crimp connector)
flexible cable mates the ADIS16445BMLZ 20-pin connector to and 3M Part Number 3625/12 (ribbon cable).
systems that presently support the 24-pin interface from other
The C1/C2 pads on the interface PCB do not have capacitors
products in this family, such as the ADIS16365, ADIS16375,
on them, but these pads can support the suggested power sup-
and ADIS16488A. This combination of components enables
ply capacitor of 10 µF (see Figure 9).
quicker installation for prototype evaluation and algorithm
development. Figure 22 provides a mechanical design example PC-BASED EVALUATION TOOLS
for using these three components in a system. The EVAL-ADIS supports PC-based evaluation of the ADIS16445.
15mm TO
23.75mm
Go to www.analog.com/EVAL-ADIS, to download the user guide
45mm
33.40mm (UG-287) and software (IMU evaluation).
12 11
2 1 15.05mm
20.15mm J1
12 11
10.07mm 30.10mm
2 1
ADIS16445BMLZ J2
FLEXIBLE CONNECTOR/CABLE
INTERFACE PCB
NOTES
11051-022
Rev. F | Page 21 of 22
ADIS16445 Data Sheet
OUTLINE DIMENSIONS
24.53
24.15
23.77 2.60
20.150 Ø 2.40
BSC
2.20
2.00 BSC (4 PLCS)
2.00
BSC 4.70
4.50
4.30
30.10
BSC
33.40
BSC
38.08
37.70
37.32
1.00 7.89
BSC
7.63
7.37
0.66
BSC TOP VIEW
2.30 BSC
(2 PLCS)
12.50 BSC
2.30 BSC
(2 PLCS)
19.55 BSC
2.96
2.70 7.57
BSC 1.00 BSC
2.44 PITCH
2.84 BSC
(Pin Height)
11.10
10.80
10.50
10.23
BSC 5.18 BSC
(PCB to Connector)
02-072-2013-B
END VIEW
ORDERING GUIDE
Model1 Temperature Range Package Description Package Option
ADIS16445BMLZ −40°C to +105°C 20-Lead Module with Connector Interface [MODULE] ML-20-3
ADIS16445/PCBZ Interface PCB
1
Z = RoHS Compliant Part.
Rev. F | Page 22 of 22
Mouser Electronics
Authorized Distributor