Irfz 24 NSPBF
Irfz 24 NSPBF
Irfz 24 NSPBF
IRFZ24NS/LPbF
HEXFET® Power MOSFET
l Advanced Process Technology
l Surface Mount (IRFZ24NS) D
l Low-profile through-hole (IRFZ24NL) VDSS = 55V
l 175°C Operating Temperature
l Fast Switching RDS(on) = 0.07Ω
l Fully Avalanche Rated G
l Lead-Free ID = 17A
S
Description
Fifth Generation HEXFETs from International Rectifier
utilize advanced processing techniques to achieve
extremely low on-resistance per silicon area. This
benefit, combined with the fast switching speed and
ruggedized device design that HEXFET Power MOSFETs
are well known for, provides the designer with an extremely
efficient and reliable device for use in a wide variety of
applications.
The D2Pak is a surface mount power package capable of
accommodating die sizes up to HEX-4. It provides the
highest power capability and the lowest possible on- D 2 P ak T O -26 2
resistance in any existing surface mount package. The
D2Pak is suitable for high current applications because of
its low internal connection resistance and can dissipate
up to 2.0W in a typical surface mount application.
The through-hole version (IRFZ24NL) is available for low-
profile applications.
Absolute Maximum Ratings
Parameter Max. Units
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V
17
ID @ TC = 100°C Continuous Drain Current, VGS @ 10V
12 A
IDM Pulsed Drain Current
68
PD @TA = 25°C Power Dissipation 3.8 W
PD @TC = 25°C Power Dissipation 45 W
Linear Derating Factor 0.30 W/°C
VGS Gate-to-Source Voltage ± 20 V
EAS Single Pulse Avalanche Energy
71 mJ
IAR Avalanche Current 10 A
EAR Repetitive Avalanche Energy 4.5 mJ
dv/dt Peak Diode Recovery dv/dt
6.8 V/ns
TJ Operating Junction and -55 to + 175
TSTG Storage Temperature Range °C
Soldering Temperature, for 10 seconds 300 (1.6mm from case )
Thermal Resistance
Parameter Typ. Max. Units
RθJC Junction-to-Case ––– 3.3
°C/W
RθJA Junction-to-Ambient ( PCB Mounted,steady-state)** ––– 40
04/19/04
IRFZ24NS/LPbF
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ.Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage 55 –––––– V VGS = 0V, ID = 250µA
∆V(BR)DSS/∆TJ Breakdown Voltage Temp. Coefficient ––– 0.052
––– V/°C Reference to 25°C, ID =1mA
RDS(on) Static Drain-to-Source On-Resistance ––– –––0.07 Ω VGS =10V, ID = 10A
VGS(th) Gate Threshold Voltage 2.0 ––– 4.0 V VDS = VGS, ID = 250µA
gfs Forward Transconductance 4.5 –––––– S VDS = 25V, ID = 10A
––– ––– 25 VDS = 55V, VGS = 0V
IDSS Drain-to-Source Leakage Current µA
––– ––– 250 VDS = 44V, VGS = 0V, TJ = 150°C
Gate-to-Source Forward Leakage ––– –––100 VGS = 20V
IGSS nA
Gate-to-Source Reverse Leakage ––– –––-100 VGS = -20V
Qg Total Gate Charge ––– ––– 20 ID = 10A
Qgs Gate-to-Source Charge ––– ––– 5.3 nC VDS = 44V
Qgd Gate-to-Drain ("Miller") Charge ––– ––– 7.6 VGS = 10V, See Fig. 6 and 13
td(on) Turn-On Delay Time ––– 4.9––– VDD = 28V
tr Rise Time ––– 34 ––– ID = 10A
ns
td(off) Turn-Off Delay Time ––– 19 ––– RG = 24Ω
tf Fall Time ––– 27 ––– RD = 2.6Ω, See Fig. 10
Between lead,
LS Internal Source Inductance ––– 7.5 ––– nH
and center of die contact
Ciss Input Capacitance ––– 370 ––– VGS = 0V
Coss Output Capacitance ––– 140 ––– pF VDS = 25V
Crss Reverse Transfer Capacitance ––– 65 ––– ƒ = 1.0MHz, See Fig. 5
––– ––– 17
(Body Diode) showing the
A
ISM Pulsed Source Current integral reverse G
––– ––– 68
(Body Diode) p-n junction diode. S
Notes:
Repetitive rating; pulse width limited by Pulse width ≤ 280µs; duty cycle ≤ 2%.
max. junction temperature. ( See fig. 11 )
Starting TJ = 25°C, L =1.0mH
Uses IRFZ24N data and test conditions
RG = 25Ω, IAS = 10A. (See Figure 12)
ISD ≤ 10A, di/dt ≤ 280A/µs, VDD ≤ V(BR)DSS,
TJ ≤ 175°C
6.0V
5.5V 5.5V
5.0V 5.0V
BOTTOM 4.5V BOTTOM 4.5V
10 10
4 .5V
4.5V
D
D
20 µ s P U LS E W ID TH 2 0µ s P U L S E W ID T H
T
TCJ == 25°C
2 5°C TTCJ == 175°C
17 5°C
1 A 1 A
0.1 1 10 100 0.1 1 10 100
V D S , D rain-to-S ourc e V oltage (V ) V DS , D rain-to-S ource V oltage (V )
100 3.0
I D = 17 A
R D S (on ) , D rain -to-S ou rc e O n R es is tan c e
I D , D rain-to-So urce C urren t (A )
2.5
TJ = 2 5 °C
T J = 1 7 5 °C 2.0
(N orm a liz ed)
10 1.5
1.0
0.5
V DS = 2 5V
2 0µ s P U L S E W ID TH V G S = 1 0V
1 0.0
A A
4 5 6 7 8 9 10 -60 -40 -20 0 20 40 60 80 100 120 140 160 180
V G S , G ate-to -So urce Voltag e (V) T J , J unc tion T em perature (°C )
700 20
V GS = 0V , f = 1M H z I D = 10 A
C is s = C g s + C g d , Cd s S H O R T E D V D S = 44 V
C rs s = C gd
500 C iss
C , Capacitance (pF)
12
400 C oss
300
8
200 C rss
4
100
FO R TE S T C IRC UIT
S E E FIG U R E 1 3
0 A 0 A
1 10 100 0 4 8 12 16 20
V D S , D rain-to-S ourc e V oltage (V ) Q G , T otal G ate C harge (nC )
100 1000
O P E R A T IO N IN T H IS A R E A L IM ITE D
B Y R D S (o n)
I S D , R everse Drain C urrent (A )
I D , D rain Current (A )
T J = 1 75 °C 100
TJ = 25 °C
10µ s
10
10 100µ s
T C = 25 °C 1m s
T J = 17 5°C
V G S = 0V S ing le P u lse 10m s
1 A 1 A
0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 1 10 100
10V
I D , Drain Current (A)
Pulse Width ≤ 1 µs
12 Duty Factor ≤ 0.1 %
0
25 50 75 100 125 150 175 10%
TC , Case Temperature ( ° C) VGS
td(on) tr t d(off) tf
Fig 9. Maximum Drain Current Vs. Fig 10b. Switching Time Waveforms
Case Temperature
10
Thermal Response (Z thJC )
D = 0.50
1
0.20
0.10
0.05
0.1
0.02
0.01 SINGLE PULSE
(THERMAL RESPONSE)
PDM
t1
t2
0.01
Notes:
1. Duty factor D = t 1 / t 2
2. Peak T J = P DM x Z thJC + TC
V(BR)DSS 20
tp V D D = 25 V
0 A
VDD 25 50 75 100 125 150 175
S tarting T J , J unc tion T em perature (°C )
VDS
50KΩ
12V .2µF
QG .3µF
10 V +
V
QGS QGD D.U.T. - DS
VGS
VG
3mA
IG ID
Charge Current Sampling Resistors
Fig 13a. Basic Gate Charge Waveform Fig 13b. Gate Charge Test Circuit
IRFZ24NS/LPbF
Peak Diode Recovery dv/dt Test Circuit
+
- +
-
RG • dv/dt controlled by RG +
• Driver same type as D.U.T. V DD
-
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
VGS=10V *
Reverse
Recovery Body Diode Forward
Current Current
di/dt
D.U.T. VDS Waveform
Diode Recovery
dv/dt
VDD
Re-Applied
Voltage Body Diode Forward Drop
Inductor Curent
Ripple ≤ 5% ISD
OR
P AR T NU MB E R
INT E R NAT IONAL
R E CT IF IE R F 530S
L OGO
DAT E CODE
P = DE S IGNAT E S L E AD-F R E E
AS S E MB L Y P R ODU CT (OP T IONAL )
L OT CODE YE AR 0 = 2000
WE E K 02
A = AS S E MB L Y S IT E CODE
IRFZ24NS/LPbF
TO-262 Package Outline
OR
P AR T N U MB E R
IN T E R N AT ION AL
R E CT IF IE R
L OGO
D AT E COD E
P = D E S IGN AT E S L E AD -F R E E
AS S E MB L Y P R OD U CT (OP T ION AL )
L OT COD E YE AR 7 = 19 97
WE E K 19
A = AS S E MB L Y S IT E COD E
IRFZ24NS/LPbF
TR R
1 .6 0 (.0 6 3 )
1 .5 0 (.0 5 9 )
1 .6 0 (.0 6 3 )
4 .1 0 (.1 6 1 ) 1 .5 0 (.0 5 9 )
3 .9 0 (.1 5 3 ) 0 .3 6 8 (.0 1 4 5 )
0 .3 4 2 (.0 1 3 5 )
F E E D D IRE CTIO N
30 .40 (1.19 7)
NO TES : MAX.
1. C O M F O R M S T O E IA-4 18. 26 .40 (1 .03 9) 4
2. C O N TR O LL IN G D IM E N S IO N : M IL LIM E T E R . 24 .40 (.9 61 )
3. D IM E N S IO N M E A SU R E D @ H U B .
3
4. IN C LU D E S F L AN G E D IS T O R T IO N @ O U TE R E D G E.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information. 04/04
Note: For the most current drawings please refer to the IR website at:
http://www.irf.com/package/