materials test system
the
difference
the
difference
Market leading impedance analysis
Widest voltage and current range available
Time domain and impedance analysis in a single
system
ModuLab XM MTS is an Xtreme Measurement Materials Test
System able to measure the extremes of ultra-high impedance/
low capacitance dielectric and insulator materials as well as
high conductivity materials in the sub-milliohm range. The
ModuLab XM MTS is an all around player capable of time
domain and AC measurement, high and low impedance, high
and low voltage and current as well as temperature control all in
one convenient system.
The ModuLab XM MTS system is able to autosequence all of the above time domain and AC
techniques without switching cables, removing the
need to configure complicated systems using discrete
measurement units. The ModuLab XM MTS PC
software also controls a wide range of temperature
accessories in convenient, easy to configure
experiment sequences.
Time Domain / AC Auto-sequence
Capability
Power Curve
The ModuLab XM MTS system is able to test materials
using a wide range of time domain and AC measurement
techniques including:
I-V (current / voltage - used to characterize
electronic and dielectric materials)
P-E (polarization / electric field - used to
characterize ferroelectric materials)
High-speed pulse (used for electronic and dielectric
materials)
Staircase and analog smooth ramp waveforms
Impedance, admittance, permittivity / capacitance,
electrical modulus
C-V (capacitance vs. DC voltage), Mott-Schottky
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state of the art
Xtreme Measurement
Control and Slave Modules
The ModuLab XM system has two intelligent Control
Modules:
XM MAT 1MHz for time domain measurements
XM MFRA 1MHz for AC measurements
In addition there are several Slave Modules that
amplify the signals produced by the Control Modules
to provide high voltage/current polarization waveforms
to the sample, and provide amplified/attenuated high
resolution signals back to the control modules:
XM MHV100 High voltage option (100 V)
XM MFA Low current measurement option
XM MREF Sample/reference module for
increased AC analysis accuracy
XM MBST 2A High current option (2 amps)
Part of the XM difference, is the way that modules are
designed to integrate together without limitations. For
example the XM MHV100 module allows impedance
tests to be run over the full range of the module (using
up to 100 V peak AC waveform or any combination of
AC + DC up to 100 V). The XM MFA is able to resolve
current levels in the sub-fA range. Used together, this
combination can provide extreme dielectric/insulator
measurements in the region of >100 Tohms.
System and Software
ModuLab XM may be configured as a single or
multichannel system depending on which options are
needed. In multichannel configurations each channel
can be independently controlled from separate PCs,
allowing tests on multiple samples to be run in parallel
by separate researchers. It is also possible to configure
groups of modules in the same chassis from ModuLab
XM MTS and from the XM ECS Electrochemical
System (refer to the separate brochure).
An example application is XM MTS modules
characterizing high impedance SOFC ionic
membrane materials, while XM ECS modules test the
complete fuel cells.
All modules are plug and play allowing the user
to easily add modules in the field. Once additional
modules or channels have been installed, the
software recognizes the modules and enables them
for use in future experiments.
The software provides powerful automatic
sequencing of time domain and AC techniques and
provides a wide range of data analysis facilities
including Fill Factor, and equivalent circuit fitting
functions. This powerful combination of hardware and
software functionality adds to the XM difference
Materials Core
Module
XM MAT 1MHz makes use of latest generation
high-technology hardware for accurate
waveform generation and data acquisition.
Fast auto-sequencing of I-V, ramp, P-E
and high-speed pulse techniques without
switching cables
Frequency Response
Analyzer
XM MFRA 1MHz is the most versatile
Frequency Response Analyzer available
today. It is fully compatible with all XM slave
modules for high voltage, high/low current and
sample/reference AC measurements, and is
able to auto-sequence time domain and AC
measurements without switching cables.
Single Sine Analysis
AC tests include impedance, capacitance,
and C-V/Mott-Schottky (with stepped or
smoothly ramped DC)
Ultra-high frequency resolution for
resonant materials characterization
Multi-sine / Fast Fourier Transform (FFT)
Analysis
AC tests include impedance, capacitance,
and C-V/Mott-Schottky (with stepped or
smoothly ramped DC)
Faster measurements across the whole
frequency range saves test time and
minimizes errors for time-variant materials
Harmonic / Intermodulation Analysis
To investigate sample linearity and
breakdown
XM control modules
Measurements from highest conductivity to highest
impedance materials by appropriate choice of plug and
play slave option modules
No matter which modules are in operation, ModuLab
XM provides smooth analog voltage ramp waveforms
essential for many research applications
Selectable high-speed data acquisition up to 1 MS/s
available for all measurement techniques including
pulse and fast I-V
Xtreme Measurement
XM slave modules
Low Current
Option
Extends current measurement resolution
to 0.15 fA
Available for time domain and AC (with
FRA) tests
Combined with XM MHV100 option
provides ultra-high impedance
measurement
100 V High Voltage
Option
High voltage time domain analysis
for IV, ramp, P-E, and pulse sample
characterization
AC characterization with small AC / high
DC bias, or with high AC over the full 100
V range
Combined with XM MFA option provides
ultra-high impedance measurement
Sample/Reference
Option
XM MREF provides increased accuracy
impedance measurements by comparing the
material under test with known pre-calibrated
reference components.
Compensates for cable impedance
in temperature control accessories
cryostats, furnaces, etc.
Compensates for any residual
measurement system errors
2 A High Current
Option
XM MBST 2A extends XMs high current
to 2 Amps for accurate time-domain and
impedance tests of low impedance materials:
XM MBST 2A has low output impedance
useful for testing electronic materials in
their ON state
Combined with XM MHV100 provides
high power tests
Accessories
A wide range of accessories are available for use with the ModuLab XM MTS, including sample holders,
cryostats, furnaces and amplifiers.
Temperature Control
The 129610A cryostat provides fully integrated temperature related measurements of solid, liquid or powder materials samples over a wide range
of temperature (5 K to > 600 K) using liquid nitrogen or liquid helium cryogen. This system ensures that the sample is not exposed to the cryogen
vapor which could cause it to crack or swell, by positioning the sample in a separate chamber that heats or cools the sample via an exchange gas
(usually dry inert helium gas)
The ModuLab XM MTS is compatible with various furnace systems for very high temperature tests up to 1200 C. Other temperature systems may
be configured for special requirements.
Semiconductor Probe Stations
The ModuLab XM can be used with third party probe stations for testing semiconductor wafers. Probe stations provide accurate positioning of
sample probes on the surface of semiconductor to allow precision measurements of the wafers electrical properties. Cryostatic probe stations are
also compatible with ModuLab XM MTS to provide combined temperature and electrical characterization.
Room Temperature Sample Holders
In addition to the purpose-built sample holders that are provided as part of the cryostat and furnace systems, Solartron Analytical also provides
additional room temperature holders for testing solids, liquids and powders. One example is the 12962A sample holder that can be used to perform
2 and 4 terminal testing on a range of materials.
Xtreme Measurement
Specifications
Control Module
Slave Modules
100 V High Voltage
Femto Ammeter
2 A Booster
XM MBST 2A
XM MAT 1MHz
XM MHV100
XM MFA
Chassis slots taken
Single
Single
Single
Double
Measurement mode
2 or 4 terminal
2 or 4 terminal
2 or 4 terminal
2 or 4 terminal
Sample connections from module
Gen, VHi, VLo, I
Gen, VHi, VLo
MAT- I
I
MAT- Gen, VHi, VLo
Gen- I
MAT- VHi, VLo
Sample connection cables (1 M length)
4 x BNC to BNC
MAT cables
Triax to BNC
MAT cables
Yes
Yes
Yes
Yes
XM MAT 1MHz
XM MHV100
XM MFA
XM MBST 2A
64 MS/s
interpolated/filtered
Uses MAT
N/A
Uses MAT
8 V
100 V
N/A
8 V with MAT
20 V with MHV
150 V (< 3 V)
400 V ( 3 V)
2 mV (< 37 V)
5 mV ( 37 V)
N/A
1.5 mV
100 mA
100 mA
N/A
2 A
General
Floating
Generator Output - (Gen)
Maximum waveform generator sample rate
Maximum voltage (open-circuit load)
DC + peak AC (subject to slew rate limit)
Maximum voltage resolution
Maximum output current
Output impedance (nominal)
Applied voltage error (open-circuit load)
Voltage sweep rate
Recommended maximum sweep rate
(using 1 MS/s acquisition rate)
Minimum pulse duration
Maximum slew rate
Voltage Measurement - (VHi / VLo)
Maximum voltage
50
50
N/A
<1
0.2% setting
800V (< 3 V)
/ 2 mV ( 3 V)
0.2% setting
12.5 mV (< 37 V)
/ 35 mV ( 37 V)
N/A
0.2% setting +
10 mV (< 3 V)
/ 25 mV ( 3 V)
1.6 MV/s to 1 V/s
10 MV/s to 1 V/s
N/A
1.6 MV/s to 1 V/s
25 kVs
150 kV/s
N/A
25 kV/s
Uses MAT
1 s
Uses MAT
N/A
>10 V/s
>15 V/s
N/A
>10 V/s
XM MAT 1MHz
XM MHV100
XM MFA
XM MBST 2A
8 V
100 V
N/A
N/A
Voltage ranges
8, 3 (V)
300, 30, 3 mV
100, 37.5, 3.75 (V)
375, 37.5 (mV)
N/A
N/A
Voltage measurement error
0.1% reading +
0.05% range +
0.1% reading +
0.05% range
N/A
N/A
100V
+ 100V
1 MS/s
N/A
N/A
N/A
Maximum time domain measurement rate
Maximum time record
Current Measurement (I)
Maximum current
Current ranges
Maximum resolution
Unlimited
N/A
N/A
N/A
XM MAT 1MHz
XM MHV100
XM MFA
XM MBST 2A
100mA
N/A
100mA
2 A
100 mA, 30 mA to
30 nA in decades
N/A
100 mA, 30 mA to
3 pA in decades
2 A plus MAT
ranges
1.5 pA
N/A
0.15 fA
1.5 pA (MAT)
Current measurement error
0.1% reading +
+0.05% range +
100 pA
N/A
0.1%** reading +
+0.05% range +
30 fA
0.1% reading +
+0.05% range +
0.1 mA
Auxiliary Voltage Inputs
XM MAT 1MHz
XM MHV100
XM MFA
XM MBST 2A
Number of auxiliary DC channels
Four
N/A
N/A
N/A
8 V, 3 V to 3 mV
N/A
N/A
N/A
Maximum resolution
1 V
N/A
N/A
N/A
Synchronized to VHi, VLo measurement
Yes
N/A
N/A
N/A
Voltage ranges
** MFA Femto Ammeter current measurement reading % error term is 0.2% for 300 pA range, 2% for 30 pA range and 5% for 3 pA range
System Impedance Accuracy
Specifications XM MFRA
Frequency Response Analyzer
Impedance accuracy specification for MAT, Femto Ammeter, 2A booster and MREF
XM MFRA 1MHz
Chassis slots taken
single
Maximum sample rate
40 MS/s
Frequency range
10 Hz to 1 MHz
Frequency resolution
1 in 65,000,000
Frequency error
100 ppm
Minimum measurement integration time
10 ms
Analysis modes (10 Hz to MHz)
Fixed frequency
Single Sine
Multi-sine / harmonic frequencies
Linear / logarithmic
All or selected
Accuracy (ratio)
0.1%, 0.1
Anti-alias, digital filters, DC bias reject
Automatic
Specifications XM MREF
Sample / Reference Option
XM MREF
Chassis slots taken
Single
Reference modes
Internal / External
Connections to MAT, MHV, or MFA
Calibrated reference capacitors
Gen, I
*High Voltage option module provides up to 10X higher impedance than shown
*Femto ammeter and MREF is used for dielectrics (1 pF to 10 nF) and for high impedance
*2A booster is used for very low impedance measurements (sub 100 mohm)
*Faraday cage is recommended for dielectric and high impedance measurements
MAT Impedance Accuracy
Impedance accuracy for MAT operating stand alone
10 nF to 1 pF
(3 per decade)
MFRA Accuracy
*High Voltage option module provides up to 10X higher impedance than shown
*MREF is used for dielectrics (1 pF to 10 nF) and high impedance measurements
*Faraday cage is recommended for dielectric and high impedance measurements
USA
Europe
801 South Illinois Avenue
Oak Ridge
TN, 37831-0895 USA
Unit 1 Armstrong Mall
Southwood Business Park
Farnborough
Hampshire GU14 ONR UK
Tel: (865) 425-1289
Fax: (865) 481-2410
Tel: +44 (0) 1252 556800
Fax: +44 (0) 1252 556899
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