Irfb 4229 PBF
Irfb 4229 PBF
Irfb 4229 PBF
IRFB4229PbF
Features
l Advanced Process Technology
l Key Parameters Optimized for PDP Sustain,
Energy Recovery and Pass Switch Applications
l Low EPULSE Rating to Reduce Power
Dissipation in PDP Sustain, Energy Recovery
and Pass Switch Applications
l Low QG for Fast Response
l High Repetitive Peak Current Capability for
Reliable Operation
l Short Fall & Rise Times for Fast Switching
l175C Operating Junction Temperature for
Improved Ruggedness
l Repetitive Avalanche Capability for Robustness
and Reliability
l Class-D Audio Amplifier 300W-500W
(Half-bridge)
Key Parameters
VDS min
VDS (Avalanche) typ.
RDS(ON) typ. @ 10V
IRP max @ TC= 100C
TJ max
250
300
38
91
175
V
V
m:
A
C
G
G
TO-220AB
Gate
Drain
Source
Description
This HEXFET Power MOSFET is specifically designed for Sustain; Energy Recovery & Pass switch
applications in Plasma Display Panels. This MOSFET utilizes the latest processing techniques to achieve
low on-resistance per silicon area and low EPULSE rating. Additional features of this MOSFET are 175C
operating junction temperature and high repetitive peak current capability. These features combine to
make this MOSFET a highly efficient, robust and reliable device for PDP driving applications.
Parameter
Units
VGS
Gate-to-Source Voltage
30
ID @ TC = 25C
46
ID @ TC = 100C
33
IDM
180
IRP @ TC = 100C
PD @TC = 25C
Power Dissipation
330
PD @TC = 100C
Power Dissipation
190
2.2
W/C
TJ
-40 to + 175
TSTG
91
300
10lb in (1.1N m)
Thermal Resistance
Parameter
RJC
RCS
RJA
Junction-to-Case
Typ.
0.50
Max.
0.45
62
Units
C/W
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1
09/10/07
IRFB4229PbF
Electrical Characteristics @ TJ = 25C (unless otherwise specified)
Parameter
Min.
250
210
VGS(th)
3.0
38
46
5.0
VGS(th)/TJ
IDSS
-14
20
IGSS
1.0
100
83
-100
72
26
110
18
31
tf
tst
100
30
21
EPULSE
790
1390
Input Capacitance
4560
Output Capacitance
Reverse Transfer Capacitance
390
100
290
4.5
BVDSS
VDSS/TJ
RDS(on)
gfs
Qg
Qgd
td(on)
tr
td(off)
Ciss
Coss
Crss
Coss eff.
LD
7.5
mV/C
A VDS = 250V, VGS = 0V
mA VDS = 250V, VGS = 0V, TJ = 125C
nA
VGS = 20V
VGS = -20V
nC
e
ID = 26A
ns
See Fig. 22
VDD = 200V, VGS = 15V, RG= 4.7
L = 220nH, C= 0.3F, VGS = 15V
RG = 2.4
pF
nH
LS
Conditions
6mm (0.25in.)
from package
and center of die contact
G
S
Avalanche Characteristics
Parameter
EAS
EAR
VDS(Avalanche)
IAS
d
Repetitive Avalanche Energy c
Repetitive Avalanche Voltagec
Avalanche Currentd
Single Pulse Avalanche Energy
Typ.
Max.
Units
130
mJ
300
33
mJ
26
Diode Characteristics
Parameter
IS @ TC = 25C Continuous Source Current
ISM
VSD
trr
Qrr
(Body Diode)
Pulsed Source Current
c
Min.
46
Conditions
MOSFET symbol
180
(Body Diode)
Diode Forward Voltage
1.3
190
840
290
1260
ns
nC
showing the
integral reverse
p-n junction diode.
TJ = 25C, IS = 26A, VGS = 0V
TJ = 25C, IF = 26A, VDD = 50V
di/dt = 100A/s
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IRFB4229PbF
1000
1000
VGS
15V
10V
8.0V
7.0V
6.5V
6.0V
5.5V
100
BOTTOM
10
5.5V
1
0.1
100
5.5V
10
10
BOTTOM
1
100
0.1
100
1000
10
100
TJ = 175C
10
TJ = 25C
0.1
VDS = 25V
60s PULSE WIDTH
0.01
4.0
5.0
6.0
7.0
ID = 26A
VGS = 10V
3.0
2.5
2.0
1.5
1.0
0.5
0.0
8.0
1600
1400
L = 220nH
C = 0.3F
100C
25C
1200
L = 220nH
C = Variable
100C
25C
1200
VGS
15V
10V
8.0V
7.0V
6.5V
6.0V
5.5V
TOP
TOP
800
400
1000
800
600
400
200
150
160
170
180
190
200
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100
110
120
130
140
150
160
170
IRFB4229PbF
2000
1000
L = 220nH
C= 0.3F
C= 0.2F
C= 0.1F
1600
1200
800
400
100
TJ = 175C
10
TJ = 25C
VGS = 0V
0
25
50
75
100
125
0.1
150
0.2
Temperature (C)
C, Capacitance (pF)
20
5000
Ciss
4000
3000
Coss
2000
1000
Crss
1
1.0
1.2
ID= 26A
VDS = 160V
VDS = 100V
16
VDS = 40V
12
10
100
1000
1000
30
20
10
40
60
80
100
120
50
40
20
0.8
100
100sec
10sec
10
1
Tc = 25C
Tj = 175C
Single Pulse
0.1
25
50
75
100
125
150
175
0.6
VGS = 0V,
f = 1 MHZ
Ciss = Cgs + Cgd, Cds SHORTED
Crss = Cgd
6000
0.4
10
100
1000
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0.40
()
RDS (on), Drain-to -Source On Resistance
IRFB4229PbF
ID = 26A
0.30
0.20
TJ = 125C
0.10
TJ = 25C
600
I D
7.4A
13A
BOTTOM 26A
TOP
500
400
300
200
100
0.00
0
5
10
25
100
125
150
175
5.0
140
4.5
120
75
4.0
50
ID = 250A
3.5
3.0
2.5
ton= 1s
Duty cycle = 0.25
Half Sine Wave
Square Pulse
100
2.0
80
60
40
20
1.5
25
50
75
25
50
75
100
125
150
175
TJ , Temperature ( C )
D = 0.50
0.1
0.20
0.10
0.05
0.01
0.02
0.01
R1
R1
J
1
R2
R2
R3
R3
Ri (C/W)
C
Ci= i/Ri
Ci= i/Ri
(sec)
0.080717 0.000052
0.209555 0.001021
0.159883 0.007276
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
SINGLE PULSE
( THERMAL RESPONSE )
0.001
1E-006
1E-005
0.0001
0.001
0.01
0.1
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IRFB4229PbF
Driver Gate Drive
D.U.T
RG
***
dv/dt controlled by RG
Driver same type as D.U.T.
I SD controlled by Duty Factor "D"
D.U.T. - Device Under Test
P.W.
Period
VGS=10V
D=
Period
P.W.
V DD
**
+
-
Re-Applied
Voltage
Body Diode
VDD
Forward Drop
Inductor Curent
ISD
Ripple 5%
Fig 18. Diode Reverse Recovery Test Circuit for HEXFET Power MOSFETs
V(BR)DSS
15V
D.U.T
RG
VGS
20V
DRIVER
VDS
tp
+
V
- DD
IAS
tp
0.01
I AS
Id
Vds
Vgs
L
DUT
VCC
1K
Vgs(th)
Qgs1 Qgs2
Qgd
Qgodr
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IRFB4229PbF
PULSE A
RG
DRIVER
L
PULSE B
VCC
B
Ipulse
RG
tST
DUT
V DS
V GS
RG
RD
VDS
90%
D.U.T.
+
-V DD
VGS
Pulse Width 1 s
Duty Factor 0.1 %
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10%
VGS
td(on)
tr
t d(off)
tf
IRFB4229PbF
TO-220AB Package Outline (Dimensions are shown in millimeters (inches))
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Note: For the most current drawing please refer to IR website at: http://www.irf.com/package/
Data and specifications subject to change without notice.
This product has been designed and qualified for the Industrial market.
Qualification Standards can be found on IRs Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information. 09/2007
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