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IS 4163 (2004): Steel - Determination of Content of Nonmetallic Inclusions - Micrographic Method Using Standard Diagrams [MTD 22: Metallography and Heat Treatment]

Invent a New India Using Knowledge

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Bhart+hariN,ti-atakam

IS 4163:2004 ISO 4967:1998

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Ww-fa-% %lmld *~dmlm *3Tqwil@l!Nrkt3 Wiif

mull @w7)
Indian Standard

STEEL DETERMINATION OF CONTENT OF NONMETALLIC INCLUSIONS MICROGRAPHIC METHOD USING STANDARD DIAGRAMS ( Third Revision)
Ics 77.040.99

0 61S 2004

BUREAU
MANAK

OF

IN DIAN

ST ANDA
ZAFAR

RDS
MARG

BHAVAN,

9 BAHADUR SHAH NEW DELHI 110002

March 2004

Price Group 12

Metallography and Heat Treatment Sectional Committee, MTD 22

NATIONAL FOREWORD This Indian Standard (Third Revision) which is identical with ISO 4967:1998 Steel Determination of content of nonmetallic inclusions Micrographic method using standard diagrams issued by the International Organization for Standardization (ISO) was adopted by the Bureau of Indian Standards on the recommendations of the Metallography and Heat Treatment Sectional Committee and approval of the Metalh!rgical Engineering Division Council. This Indian Standard was first published in 1967. It was revised in 1982 harmonizing with International Standard ISO 4967:1979 Steel Determination of content of nonmetallic inclusions Micrographic method using standard diagrams. In the adopted standard, some terminology and conventions are, however not identical to those used in Indian Standards. Attention is especially drawn to the following: a) Wherever the words International Standard appear, referring to this standard, they should be read as Indian Standard b) Comma (,) has been used as a decimal marker, while in Indian Standards, the current practice is to use a point (.) as the decimal marker. In reporting the results of a test or analysis made in accordance with this standard, If the final value, observed or calculated is to be rounded off, it shall be done in accordance with 1S 2:1960 Rules for rounding off numerical values (revised).

IS 4163:2004 ISO 4967:1998

/ndian Standard

STEEL DETERMINATION OF CONTENT OF NONMETALLIC INCLUSIONS MICROGRAPHIC METHOD USING STANDARD DIAGRAMS ( Third Revision)

Scope

This International Standard specifies a micrographic method of determining the nonmetallic inclusions in rolled or forged steel products having a reduction ratio of at least 3 using standard diagrams. This method is widely used to assess the suitability of a steel for a given use. However, since it is difficult to achieve reproducible results owing to the influence of the test operator, even with a large number of specimens, precautions should be taken when using the method.
NOTE For certain types of steel (e.g., free cutting steels), the standardized diagrams described in this International Standard may not be applicable.

This International Standard technologies (see annex D).

also

provides

for the determination

of nonmetallic

inclusions

by image

analysis

Principle

The method consists of comparing the observed field to the chart diagrams defined in this International Standard and taking in consideration separately each type of inclusion. In the case of image analysis, fields will be rated according to the relationships given in annex D. The chart pictures correspond to square fields of view, each with an area of 0,50 mm2, as obtained longitudinal plane-of-polish and as observed at 100 x. According to the shape and distribution of the inclusions, -bearing the reference A, B, C, D and DS. These five groups represent the most commonly observed the standard diagrams with a

are divided into five main groups,

inclusion types and morphologies:

Group A (sulfide type): highly malleable, individual grey particles with a wide range of aspect ratios (length/width)and generally rounded ends; Group B (aluminate type): numerous non deformable, angular, low aspect ratio (generally< 3), black or bluish
particles (at least three) aligned in the deformation direction; black or dark grey particles with a wide range of aspect

Group C (silicate type): highly malleable,

ratios (generally

individual = 3) and generally sharp ends;

Group D (globular oxide type): non deformable, bluish, randomly distributed particles;

angular or circular, low aspect ratio (generally

< 3), black or

Group DS (single globular type): circular, or nearly circular, single particle with a diameter = 13 ~m.

IS 4163:2004 ISO 4967:1998

Non-traditional inclusion types may also be rated based on their morphology compared to the above five types and a statement about their chemical nature. As an example, globular sulfides would be rated as a D type and a descriptive subscript (e.g., D,ulf ) defined in the test report. DC,. would indicate globular calcium sulfides; D~~s would indicate globular rare earth sulfides; DDUPwould indicate globular duplex inclusions, such as calcium sulfide surrounding an aluminate. Types of precipitate such as borides, carbides, carbonitrides morphology compared to the above five types and a statement previous subclause.
NOTE Examination

or nitrides may also be rated based on their about their chemical nature as described in the

at a magnification greater than 100 x may be used to identify the nature Of the non-traditional

inclusions

before performing the test. Each main group on the chart consists of two subgroups, each made up of six diagrams representing increasing inclusion content. This division into subgroups is merely intended to give examples of different thicknesses of nonmetallic particles. The diagrams on the chart are given, by inclusion group, in annex A.

These chart diagrams carry an index number, i, from 0,5 to 3, the numbers increasing with the inclusion or stringer lengths (Groups A, B, C) or by the number (Group D) or by the diameter (Group DS), as defined in table 1, and by thickness, as defined in table 2. For example, the diagram A 2 indicates that the shape of the inclusions observed under the microscope is in accordance with group A and that their distribution and quantity are in accordance with number 2.

Table 1 Rating limits (minimum values)

Inclusion Chart diagram index
i

graup D count number 1 4 9 16 25 36 (< 49) DS diameter pm 13 19 27 38 53 76 (< 107)

A total length pm 37 127 261 436 649 898 (<1 181)

B total length pm 17 77 184 342 555 822 (<1 147)

c total length pm 18 76 176 320 510 746 (<1 029)

0,5 1 1,5 2 2,5 3

NOTE The above length values for the A, B and C groups have been computed from the equations given in annex D and then rounded of to the nearest whole number.

Table 2 Inclusion thickness parameters

I
Group type

Fine Minimum width pm 2 2 2 3

I
I

I
Maximum width
urn 4 9 5 8 I

Thick Minimum width

I
I

Maximum width
pm 12 15 12 13

urn
4 9 5 8

A
B c D NOTE

For type D the maximum dimension is defined as the diameter.

IS 4163:2004 ISO 4967:1998 3 Sampling

The shape of the inclusion depends to a large extent onthe degree of reduction of the steel; therefore, comparative measurements may only be carried out on prepared sections taken from samples with a similar amount of deformation. The polished surface of the specimen used to determine
(20 mm x 10 mm). It shall be parallel to the longitudinal outer surface and the centre. the content of inclusions shall be approximately 200 mmz axis of the product and shall be located halfway between the

The method of sampling shall be defined in the product standard or subject to agreement test surface, in the case of plates, shall be approximately at a quarter of the width. In the absence of such specifications, the sampling procedure shall be as follows:

between the parties. The

bar or billet with diameters greater than 40 mm: the surface to be examined consists section located halfway between the outer surface and the centre (see figure 1);

of a part of diametral

bar with a diameter greater than 25 mm and less than or equal to 40 mm: the surface to be examined of half the diametral section (from the centre to the edge of the sample) (see figure 2); bar with a diameter less than or equal to 25 mm: the surface to be examined section of length sufficient to obtain a surface of about 200 mmz (see figure 3); plates with a thickness less than or equal to 25 mm: the surface thickness, and located at the quarter of the width (see figure 4), consists

consists

of the full diametral

to be examined

consists

of the whole

plates with a thickness greater than 25 mm and less than or equal to 50 mm: the surface to be examined consists of half the thickness from the surface to the centre and is located at the quarter of the width (see figure 5); t)lates with a thickness areater than 50 mm: the surface to be examined consists of auarter the thickness and is iocated halfway betwe& the outer surface and the middle of the thickness and at the quarter of the width (see figure 6).

The number of samples to be taken is defined in the product standard or by special agreement. For any other product, the sampling procedures shall be subject to agreement between the parties. Dimensions in millimetres

I :/ -.

/ii
/

,/,

/1

/
II
~
,!

-+
Figure 1 Sample

from bar or billet with a diameter or length of side> 40 mm

IS 4163:2004 tSO 4967:1998

Figure 2 Sample from bar or billet with a diameter or length of side >25 mm and <40 mm

Figure 3 Sample from bar with a diameter <25 mm

w
Figure 4 Sample from plate with thickness <25 mm

IS 4163:2004, ISO 4967:1998

r =

width

Figure 5 Sample from plate with thickness >25 mm and <50 mm

/77

/ / / / / / . / I ., Rolling direction

Figure 6 Sample from plate with thickness >50 mm

Preparation

of specimens

The specimen shall be cut so as to obtain a surface for examination. In order to achieve a flat surface and to avoid rounding the edges of the specimen when polishing, the specimen may be held mechanically or may be mounted. When polishing specimens, it is important to avoid any tearing out or deformation of the inclusions, or contamination of the polished surface, so that the surface is as clean as possible and the shape of the inclusions is not affected. These precautions are of particular importance when the inclusions are small. It is advisable to use diamond paste for polishing. In certain cases it may be necessaty for the specimen to be heat treated before polishing in order to give it the maximum possible hardness.

IS

ISO 5 5.1

4163:2004 4967:1998 Determination of the content of inclusions

Method of observation
with the microscope may be by one of two methods:

Examination

by projection by observation

on to ground glass, by means of an eyepiece. chosen shall be maintained throughout the test.

The method of observation

If the image is projected onto a ground glass or similar device, the magnification must be 100 x & 2 x on the ground glass. Place a clear plastic overlay (figure 7) of a 71 mm square (0,50 mm2 true area) over or behind the ground glass projection screen. The image within the test square is compared to the standard pictures on the chart (annex A). If the inclusions are examined through the microscope eyepieces, insert a reticle with the test pattern shown in figure 7 in the microscope at the appropriate location so that the test grid area is 0,50 mm2 at the image plane. NOTE In special cases, a magnification greater than 100 may be used, provided that the same magnification the standard diagrams, and shall be recorded in the test report.
is applied for

Dimensions in millimetres

,,

1,3

AB-

O,k
1.2 0,9 1,5 0,5 1,2 0,8

1,9

G
0s

2.7

38
5,3

cDo
G

7,6

1.3

0
0
50

10,7

100

Figure 7 Test pattern for grid overlaysor reticlea

IS 4163:2004 ISO 4967:1998 5.2 Actual examination

methods are defined

The two following

5.2.1

Method A

The entire polished surface is examined and, for each type of inclusion, a note is made of the reference number which lies to the side of the standard diagram which corresponds to the worst field examined, in the fine and thick series.

5.2.2

Method

The entire polished surface is examined and each field of the specimen is compared with the standard diagrams. The reference number of the field (indicated to the side of the standard diagrams) -which best corresponds to the field examined for each type of inclusion is noted, in the fine and thick series. In order to minimize the cost of examination, it may be agreed upon to make a partial examination of the specimen by studying a reduced number of fields, distributed in accordance with a fixed scheme. Both the number of fields examined and their distribution shall be arranged by prior agreement.

5.2.3

General

rules for methods A and B

diagrams. If a field of inclusions falls between two standard

Each field observed is compared with the standard diagrams, it is rated following the lower diagram.

Individual inclusions or stringers that have a length greater than the field width (0,71 O mm) or a width or diameter greater than the thick series maximum (see table 2) will be rated as oversized by length, width or diameter. The oversized dimensions of the inclusion or stringer shall be noted separately. However, these inclusions shall still be parl of the overall rating of that field. Reproducibility of measurements is improved if actual measurements (stringer lengths of A, B or C types, diameter of DS type) and counts (D types) are made. Use a grid overlay or reticle, as shown in figure 7, the measurement limits in tables 1 and 2, and the morphological descriptions in section 2, as illustrated in the chart. Non-traditional inclusion types are rated according to the chart group (A, B, C, D, DS) that best corresponds to their morphology. Compare the length, number, thickness or diameter of the inclusions to each group shown in annex A or determine their total length, number, thickness or diameter, and use tables 1 and 2 to assign the appropriate inclusion content number and thickness class (fine, thick or oversize). Then indicate the nature of the non-traditional inclusion with a subscript to the group type, Define the subscript in the test report. For type A, B and C inclusions, two individual inclusions or stringers of lengths f, and 12and which are, or are not, in line are considered as one inclusion or stringer if the distanced is lower than or equal to 40 pm and if the distances, (the distance between centres of inclusions/stringers) is lower than or equal to 10 pm (see figures 8 and 9). In the case of a stringer inclusion. with inclusions of different width, the width to be considered is the width of the biggest

IS 4163:2004 ISO 4967:1998

I

-L

Figure 8 Type A and C inclusions

T!

Figure 9 Type B inclusions

6 6.1

Expression General

of results

LJnless otherwise

stated in the product standard, the results maybe expressed in the following ways.

The results are expressed with the index numbers relating to each specimen and on their basis the arithmetic mean is assessed per cast for each type of inclusion and for each thickness series. This method is used in combination with the method described in 5.2.1.

6.2

Method

A
number corresponding to the worst field for each type of inclusion and for each thickness

Indication of the reference series (see annex B).

The reference symbol for the group of inclusions is followed by the reference number of the worst field, the presence of thick inclusions being indicated by the letter e, the presence of inclusion oversized (see 5.2.3) being indicated by the letters. Examples: A 2, B Ie, C 3, D 1., B 2s, DS 0,5. used to identify non-traditional inclusion types, shall be defined.

Any subscripts

IS 4163:2004 ISO 4967:1998 6.3 Method B

and per thickness series for a given

Indication of the total number of fields for a given index, per type of inclusion number of fields observed (N).

The full set of total numbers of fields for a given index relative to the various types of inclusions may be used in special methods for expressing results, such as total index, itot, or mean index, jmoy, subject to agreement between the parties. EXAMPLE :

For type A inclusions taking T+ as the number of fields of index 0,5 r12as the number of fields of index 1 % as the number of fields of index 1,5 no as the number of fields of index 2 % as the number of fields of index 2,5 n~ as the number of fields of index 3 then

tot = bl

x015)

+ (12 x 1, + (n3x

175) + (n4x

2, + (n5 x215)

+ (n6x

3,

lmoy

itot =

where N is the total number of fields observed. A typical result is given in annex C.

Test report
information: i.e. ISO 4967;

The test report shall contain the following a) b) c) d) e) f) g) h) i) j) k) reference to this International

Standard,

the steel grade and the cast number; the nature of the product and its dimensions; the type of sampling and position of the area examined; method of examination, method of expressing results);

the method selected (method of observation, the magnification if greater than 100x;

the number of observed fields or the total area examined; the results of the examination statement of subscripts (including the number, size and type of oversize inclusions incluskm type; or stringers);

used to define any non-traditional

report number and date; name of operator.

IS 4163:2004 ISO 4967:1998

Annex A
(normative)

ISO Chart diagrams for inclusion groups A, B, C, D and DS A

(Sulfide type) Fine series Thickness = 2 ~m to 4 ~m Minimum total length Thick series Thickness > 4pm to 12pm

t
i = 0,5
I

37 pnl

I
i=l

127 pm

Magnification

= 100x

10

IS 4163:2004 ISO 4967:1998

I
)
i=l.5

1;
261 q

I
i=2

I
436 PITI

---

Magnification

= 100x

11

IS 4163:2004 ISO 4967:1998

1,1
I

111

I
I

I
1
1{

II
a

I
I

I
9

I
i

649 w

i=3

I i

I
I
898 PITI

Magnification

= 100x

12

IS 4163:2004 ISO 4967:1998

B
(Aluminate Fine series Thickness >2 ~m to 9 ~m Minimum total length type) Thick series Thickness >9 ~m to 15 ~m

i = 0,5

b
G

: ?

17 ,unl

i=l

77

pm

Magnification

= 100x

13

IS 4163:2004 ISO 4967:1998

i=

1,5

184 w

i=2

Magnification

= 100x

14

-,
Is

-.
II
-N

--------

A.

-.

. . . . . ,.~

... ..-.

.-*V

-..-.~-m.-

W ----------

G GB .ww

IS 4163:2004 1S0 4967:1998

c
(Silicate type) Fine series Thickness >2 ~m to 5 ~m Minimum total length Thick series Thickness > 5.Am to 12pm

i = 0,5

18

PM

/=1

76

Magnification

= 100x

16

IS 4163:2004 ISO 4967:1998

i=

1,5

176

;=2

320 MM

Magnification

= 100x

17

IS 4163:2004 ISO 4967:1998

510

pm

i=3

746

pm

Magnification

= 100x

18

IS 4163:2004 ISO 4967:1998

D
(Globular type oxides) Fine series Minimum number
Thickness z 3 ~m to 8 ~m of inclusions Thickness >8 ~m to 13pm

Thick series

i = 0,5

i=l

Magnification

= 100x

19

IS 4163:2004 ISO 4967: 1998 .

.
G

i = 1,5

. .

. .

/=2

.
G 

&

16

Magnification

= 100x

20

IS 4163:2004 ISO 4967:1998

. . . .
G G   G G

9
G

. .
G

G G

w
9
G

.
G
9

.
G G

. . .
*

v
G
D

G G G

. .

25

G 

G G 

G G G

  G
S .

;=3
.

. ..

b
G
6

G
. .

G
.

G
.

36

Magnification

= 100 x

21

IS 4163:2004 ISO 4967:1998

0S
(Globular type oxides)

Diameter >13 ~m to 76 pm Minimum diameter

;=O,

13 prn

l.=

19 pnl

Magnification

= 100 x

22

IS 4163:2004 ISO 4967:1998

i=

1,5

27

PM

t-

i=2

38

Magnification

= 100x

23

IS 4163:2004 ISO 4967:1998

i = 2,5

53

pm

i=

76

yrn

Magnification

= 100x

24

IS 4163:2004 ISO 4967:1998

Annex B
(informative)

Assessment
B.1

of a

field

and

of oversized inclusions or stringers

Example of assessment

of a field

25

IS 4163:2004 ISO 4967:1998

A2

B2

9
)S 2,5 9

The upper, left diagram shows a field observed using a magnification of 100 x, where four twes of nonmetallic incl&ions may be distinguished. Depending on their shape and distribution, these are classified according to the four inclusion types: type A, sulfide, type B, aluminate (fragmented inclusions), type C, silicate, type DS, single globular inclusion. is assessed by comparing it, for each with the nearest standard diagram, cl

The field observed type of inclusion,

i9n0rin9 other types of inclusions. This gives the indices: A 2, B 2, C 1 and DS 2,5.

tollowirlg

Figure B.1 Field assessment

26

IS 4163:2004 ISO 4967:1998 B.2

Example

of assessment

of oversized

inclusions

or stringers

If the inclusion or stringer is oversized by length only, the portion of the inclusion or stringer within the field for method B, or 0,.710 mm for method A, will be added to the length of any other inclusions of the same type and thickness in the same field (see Figure B.2 a). If the inclusion or stringer is oversized by width or diameter thick series rating for that field (see Figure B.2 b). For the type D inclusion, given in annex D. (type D inclusions), the inclusion should be part of the

if the number of particles is greater than 49, the index can be calculated

from the equation

For a DS type inclusion with a diameter in annex D.

greater than 0,107 mm, the index can be calculated

from the equation

given

El

EI
-

I
The field rating is based of the total length L.
L=0,71+[1+12+[3

The field rating is based of the total length L

L=ll+l.z +13+14

with separate indication of oversized length 14

with separate indication of oversized width (14)

a) For inclusions

or stringers Figure

oversized B.2

by length only

b) For inclusions

or stringers

oversized

by width or diameter

Field assessment with oversized inclusions on stringers

27

IS 4163:2004 ISO 4967:1998

Annex C
(informative)

Typical

example

of results (the total number of fields showing the index, by type of inclusion, for a given number of fields observed)
to field and type of inclusion

C.1

Indices according

Table C. 1 aives an examrie of the results of an assessment of this Wpe, for a total of 20 observed fields, in order to simplify th~ lay-out of theexamples. In general, a minimum of 100 fields are examined.

Table C.1 Indices

Type of inclusion Field fine 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 0,5 0,5 1 1,.5 0,5 1 0,5 2 0,5 0,5 A thick 0,5 1s 1 0,5 2 fine 1 0,5 1,5 0,5 1 0,5 1 0,5 0,5 B thick 0,5 1,5 1 0,5 1 1,5 3 fine 0,5 0,5 1,5 1 0,5 0,5 0,5 1 0,5 c thick 0,5 1 0,5 0,5 1,5 1 0,5 fine 0,5 1 0,5 D thick 0;5 1 0,5 0,5 1 1 1,5 DS

C.2

Total number of fields per index according

to type of inclusion
indices and

On the basis of these results it is possible to determine the total number of fields for the various inclusion types. Table C.2 below gives the values for the total number of fields.

Table C.2 Total number of fields

I
Field fine 0,5 1 1,5 2 2,5 3 6 2 1 1 0 0 A thick 2 1 0 1 0 0 fine 5 3 1 0 0 0 B

Type of inclusion c thick 2 2 2 0 0 1 fine 6 2 1 0 0 0 thick 4 2 1 0 0 0 fine 2 1 0 0 0 0 D thick 2 1 0 0 0 0 1 2 1 0 0 0 DS

28

IS 4163:2004 ISO 4967:1998

NOTE Inclusions having a length greater than-the dimension of the field, ora width ora diameter greater than indicated in table 2 shall be rated using the standard diagrams and reported separately in the test report.

C.3

Calculation

of total index, i,O~, and mean index, i~QY

of fields given in table C.2 it is possible to calculate the corresponding total and mean

Using the total numbers

indices for each inclusiontype and each series. C.3.1

a)

For type A inclusions

Fine series

itot=(6x

0,5) +(2x

l)+(lxl

,5) + (1x2)=8,5

where N is the total number of fields observed b) Thick series

(see 6.2)

itot=(2x

0,5)+ (lxl)+(l

x2) =4
of 1 s

4 imY = = 0,20 with indication 20

C.3.2

For type B inclusions

a)

Fine series i:o:-=(5xo,5) ; +(3x = 0,35 l)+(lxl,5)=7

lmoy

b)

Thick series itot=(2x 0,5) +(2x l)+(2xl ,5) +(1 x3)=9

9 lmoy = = 0,45 20

C.3.3 a)

For type C inclusions

Fine series itOt=(6x 0,5) +(2x l)+(l x1,5) =6,5

~,=
lmoy =

0325

20

b)

Thick series itot=(4x

imy = ~

0,5) +(2x
=

l)+(lxl

,5)=5,5

0,275

29

IS 4163:2004 ISO C.3.4

a)

4967:1998 For type D inclusions

Fine series itOt =(2x0,5) +(1 x 1)=2

2 (~oy = =0,10 20 b) Thick series &t=(2x0,5)+(2xl ~ )=3

lmoy

= 0,15 with indication of 1 s

C.3.5

For type DS inclusions

x0,5) 4 = =0,2 +(2xl)+(lxl,5) =4

itOt=(l

imoy

20

C.4

Weighting

factor
factor for each index number in order to calculate global cleanness index based on

It is possible to use a weighting the amount of inclusions. The weighting

factors given in table C.3 may be used:

Table C.3 Weighting factors

Index number
i

Weighting

factor

fi
0,05 0,1 0,2

0,5 1 1,5 2

0,5 1 2

2,5 3 The cleanness

3,5

index Ci is calculated

following the formula

C, =

[1
~fix~j ,=(),5

1000

where

fj
ni

is the weighting factor;

is the number of fields of index is the total investigated
i;

area of the sample in square millimetres.

30

IS 4163:2004 1S0 4967:1998

Annex D
(informative)

Relationship

between chart diagram indices and inclusion measurements

The relationships between the chart diagram indices and the inclusion measurements (length or diameter in pm, or number per field) for inclusion groups A, B, C, D and DS are shown on the following graphs. The following equations can be used to calculate either the index from the measurement, or the inclusion measurement from the index, for example, if there is a need to work to chart picture numbers above 3.

D.1

Calculation

of chart

diagram

indices

from

measurements

For group A sulfides, Ig (i) = [0,5605

length in pm (L): lg(L)] -1,179

For group B aluminates, Ig

(i) =

length in pm (L):

[0,462 6 Ig(l,)] -0,871

For group C silicates, length in pm (L): Ig

(i)=

[0,4807

lg(L)] -0,904

For group D globular oxide type, number per field (n): Ig

(i) =

[0,5 Ig(n)] -0,301 in pm (d):

For group DS single globular oxide, diameter

i = [3,311

Ig(d)] -3,22 must be taken to obtain the i.

Except

for type DS, the anti-log

0.2

Calculation

of the inclusion

measurement

from the chart

picture

number

For group A sulfides, length in pm (L): lg(L) = [1 ,784 Ig

(i)]+

2,104 length in pm (L):

For group B aluminates,

lg(L) = [2,161 6 Ig (i)] + 1,884 For group C silicates, length in pm (L): lg(L.) = [2,08 Ig (i)]+

1,88
number per field (n):

For group D globular oxides,

Ig(n) = [2 Ig (i)] + 0,602

31

IS 4163:2004 1S0 4967:1998

For group DS single globular oxide, diameter Ig(d) = [0,302
i]+

in pm (d):

0,972

The anti-log must be taken to obtain the measurement

For

values.

the above linear regression-equations,

the IF values are all above 0,9999.

32

IS 4163:2004 ISO 4967:1998

Group A: sulfide type

E
3.

x
r4.

Iv i
Cn

1Ooc

10(

Chart diagram index

33

IS 4163:2004 ISO 4967:1998

Group B: aluminate type

1+

1000

0 ,P
1A /

100

J=

[<
10 0,5 I 1 I 1 2 I I 3 I I 4 I s

Chart diagramindex

IS 4163:2004 ISO 4967:1998

Group C: silicate type

E = ~.

z ~
3

L1

/d
1000

D
0

Pr

VI /

100 /

VI

[r
10 0,5 I 1 I I 2 I 1 3 I I 4 I 5

Chart diagram index

IS 4163:2004 ISO 4967:1998

Group D: globular oxide type

100

10

1
0,5

I 1

I 2

I 3

I 4

I 5

Chart diagram index

36

IS 4163:2004 ISO 4967:1998

Grwp

DS: single globular type

/ / /

I 2

I 3

I 4

I 4,5

0,5

1.5

2,5

3.5

Chart diagram index

Bureau of Indian Standards

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