Papers by Debayan Bhaduri
Majority gates play an important role in defect-and fault-tolerant circuit implementations for na... more Majority gates play an important role in defect-and fault-tolerant circuit implementations for nanotechnologies due to their use in redundancy mechanisms such as TMR, CTMR etc. Therefore, providing reliable implementation of majority logic using some redundancy mechanism is extremely important. This problem was addressed by von Neumann in 1956, in the form of��� majority multiplexing��� and since then several analytical probabilistic models have been proposed to analyze majority multiplexing circuits. ...
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Nanotechnology, 2004. 4th IEEE …, Aug 16, 2004
The nanometer scale of device manufacturing in the semiconductor industry is characterized by two... more The nanometer scale of device manufacturing in the semiconductor industry is characterized by two features (i) high defect rate at the substrate, and (ii) availability of large number of devices on chip. The high defect rate is due to manufacturing defects, ageing, transient faults and quantum physical effects, which need to be circumvented by designing reliable architectures for the nanoscale devices. The availability of higher device count, however, allows designers to implement redundancy based defect-tolerance. However, ...
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Nanotechnology, 2004. 4th IEEE …, Aug 16, 2004
The nanometer scale of device manufacturing in the semiconductor industry is characterized by two... more The nanometer scale of device manufacturing in the semiconductor industry is characterized by two features (i) high defect rate at the substrate, and (ii) availability of large number of devices on chip. The high defect rate is due to manufacturing defects, ageing, transient faults and quantum physical effects, which need to be circumvented by designing reliable architectures for the nanoscale devices. The availability of higher device count, however, allows designers to implement redundancy based defect-tolerance. However, ...
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Proceedings of the Design Automation & Test in Europe Conference, 2006
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The ever increasing requirements on minia- turization and efficiency of electronic components res... more The ever increasing requirements on minia- turization and efficiency of electronic components result in efforts to incorporate new materials into silicon-based microelectronics. These new materials have to be employed from the outset within very small spatial dimensions. These dimensions are in the order of nanometers to tens of nanometers. In many cases these materials tend to lose their functionality as
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With the advent of nanocomputing, researchers have proposed Quantum Dot Cellular Automata (QCA) a... more With the advent of nanocomputing, researchers have proposed Quantum Dot Cellular Automata (QCA) as one of the implementation technologies. The majority gate is one of the fundamental gates implementable with QCAs. Moreover, majority gates play an important role in defect-tolerant circuit implementations for nanotechnologies due to their use in redundancy mechanisms such as TMR, CTMR etc. Therefore, providing reliable implementation
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20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07), 2007
Abstract With the rapid advancement of CMOS and non-CMOS nanotechnologies, circuit reliability is... more Abstract With the rapid advancement of CMOS and non-CMOS nanotechnologies, circuit reliability is becoming an important design parameter. In recent years, a number of reliability evaluation methodologies based on probabilistic model checking, probabilistic transition matrices, etc., have been proposed. Scalability has been a concern in the wide applicability of these methodologies to the reliability analysis of large circuits. In this paper, the similarities between these reliability evaluation methodologies were discussed and focus ...
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Proceedins of the 14th ACM Great Lakes symposium on VLSI - GLSVLSI '04, 2004
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Bio-Inspired and Nanoscale Integrated Computing, 2009
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Studies in Multidisciplinarity, 2008
ABSTRACT
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Nano, Quantum and Molecular Computing, 2004
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2006 14th Annual IEEE Symposium on Field-Programmable Custom Computing Machines, 2006
Abstract In this abstract, the authors present an overview of a reliability analysis toolset, cal... more Abstract In this abstract, the authors present an overview of a reliability analysis toolset, called the scalable tool for the analysis of reliable systems (STAR systems), with modules for determining the reliability of FPGA designs (STAR-circuits) and reconfigurable ...
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Manufacturing and transient faults may be abundant in high density reconfigurable design fabrics ... more Manufacturing and transient faults may be abundant in high density reconfigurable design fabrics as we move from deep submicron to nano-scale technologies. Design of reliable digital logic and architectures on such unreliable fabrics will require defect mapping fol- lowed by defect avoidance to circumvent hard faults, and the introduction of adequate structural redundancy a priori for tackling soft errors. An
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IEEE Transactions On Nanotechnology, 2000
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IEEE Transactions On Nanotechnology, 2005
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IEEE Transactions on Circuits and Systems I: Regular Papers, 2000
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Studies in Multidisciplinarity, Dec 31, 2008
Several papers appeared recently on mapping computation onto nanofabrics with defect mapping foll... more Several papers appeared recently on mapping computation onto nanofabrics with defect mapping followed by defect avoidance. However, such techniques are for permanent or manufacturing faults. Hence even after defect avoidance based configuration, the nanofabrics remain susceptible to natural operational faults. In this paper, we develop a probabilistic broadcast based defect map generation scheme suitable for self-assembled molecular nanofabrics. We also develop a hierarchical probabilistic design methodology ...
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Tech. Rep., Virginia …, 2004
Several papers appeared recently on mapping computation onto nanofabrics with defect-mapping foll... more Several papers appeared recently on mapping computation onto nanofabrics with defect-mapping followed by defectavoidance. However, such techniques are for permanent or manufacturing faults. Hence even after defect-avoidance based configuration, the nanofabrics remain susceptible to transient faults. In this paper we extend a hierarchical mapping scheme from recent work of Jacome et al. We add redundancy of various forms
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Papers by Debayan Bhaduri