Characterization of the Individual Short-Term Frequency Stability of Cryogenic Sapphire Oscillators at the Level
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency …, 2016•ieeexplore.ieee.org
We present the characterization of three cryogenic sapphire oscillators (CSOs) using the
three-cornered-hat method. Easily implemented with commercial components and
instruments, this method reveals itself very useful to analyze the fractional frequency stability
limitations of these state-of-the-art ultrastable oscillators. The best unit presents a fractional
frequency stability better than 5× 10-16 at 1 s and below 2× 10-16 for τ<; 5000 s.
three-cornered-hat method. Easily implemented with commercial components and
instruments, this method reveals itself very useful to analyze the fractional frequency stability
limitations of these state-of-the-art ultrastable oscillators. The best unit presents a fractional
frequency stability better than 5× 10-16 at 1 s and below 2× 10-16 for τ<; 5000 s.
We present the characterization of three cryogenic sapphire oscillators (CSOs) using the three-cornered-hat method. Easily implemented with commercial components and instruments, this method reveals itself very useful to analyze the fractional frequency stability limitations of these state-of-the-art ultrastable oscillators. The best unit presents a fractional frequency stability better than 5 × 10 -16 at 1 s and below 2 × 10 -16 for τ <; 5000 s.
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