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Kim et al., 2001 - Google Patents

DPDAT: data path direct access testing

Kim et al., 2001

Document ID
15951498214527029752
Author
Kim K
Jayabharathi R
Carstens C
Vishakantaiah P
Feltham D
Carbine A
Publication year
Publication venue
Proceedings International Test Conference 2001 (Cat. No. 01CH37260)

External Links

Snippet

Data Path Direct Access Test, DPDAT, supports efficient structural test of targeted datapath blocks using existing non-datapath DFT features in conjunction with architectural transparency already present in surrounding datapath blocks. This new DFT technique …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

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    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318583—Design for test
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    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318572—Input/Output interfaces
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    • G01R31/318594—Timing aspects
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    • G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
    • G—PHYSICS
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    • G01R31/318558—Addressing or selecting of subparts of the device under test
    • G—PHYSICS
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    • G06F11/273—Tester hardware, i.e. output processing circuits
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    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
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    • G06F2217/00—Indexing scheme relating to computer aided design [CAD]
    • G06F2217/70—Fault tolerant, i.e. transient fault suppression

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