[go: up one dir, main page]

Chaikeeree et al., 2021 - Google Patents

Characterization broadband omnidirectional antireflection ITO nanorod films coating

Chaikeeree et al., 2021

Document ID
14710602923503216253
Author
Chaikeeree T
Mungkung N
Kasayapanand N
Lertvanithphol T
Nakajima H
Horprathum M
Publication year
Publication venue
Optical Materials

External Links

Snippet

Abstract Three-dimensional (3D) nanostructure electrode based on the transparent conductive oxide (TCO) is an alternative and effective approach for increasing the performance of next-generation photovoltaic and optoelectronic devices. In this work, we …
Continue reading at www.sciencedirect.com (other versions)

Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GASES [GHG] EMISSION, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/54Material technologies
    • Y02E10/549Material technologies organic PV cells
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/08Oxides
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/14Metallic material, boron or silicon
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/0021Reactive sputtering or evaporation
    • C23C14/0036Reactive sputtering
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L31/00Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0224Electrodes
    • H01L31/022466Electrodes made of transparent conductive layers, e.g. TCO, ITO layers
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L31/00Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies

Similar Documents

Publication Publication Date Title
Sarma et al. AZO (Al: ZnO) thin films with high figure of merit as stable indium free transparent conducting oxide
Prepelita et al. Transparent thin films of indium tin oxide: Morphology–optical investigations, inter dependence analyzes
Beena et al. Effect of substrate temperature on structural, optical and electrical properties of pulsed laser ablated nanostructured indium oxide films
Ansari et al. Structural, optical and photoluminescence investigations of nanocrystalline CuO thin films at different microwave powers
Chaikeeree et al. Characterization broadband omnidirectional antireflection ITO nanorod films coating
Nuchuay et al. Engineered omnidirectional antireflection ITO nanorod films with super hydrophobic surface via glancing-angle ion-assisted electron-beam evaporation deposition
Singh et al. Growth angle-dependent tunable work function and optoelectronic properties of MoOx thin films
Nomoto et al. High-Hall-mobility Al-doped ZnO films having textured polycrystalline structure with a well-defined (0001) orientation
Lee et al. Dependence of the electrical and optical properties on the bias voltage for ZnO: Al films deposited by rf magnetron sputtering
Sobri et al. Effect of annealing on structural, optical, and electrical properties of nickel (Ni)/indium tin oxide (ITO) nanostructures prepared by RF magnetron sputtering
Kumar et al. The enhanced light trapping nature of NiOx thin films deposited by magnetron sputtering onto silicon solar cells at room temperature
Yang et al. Influence of base pressure on property of sputtering deposited ITO film
Hymavathi et al. Investigations on physical properties of nanostructured Cr doped CdO thin films for optoelectronic applications
Das et al. Band gap widening of nanocrystalline nickel oxide thin films via phosphorus doping
Wen et al. Room temperature deposition of very thin and flexible crystalline ITO thin film using 3-D facing-magnetron sputtering plasma source
Khalaf et al. Influence of discharge voltage on the sensitivity of the resultant sputtered NiO thin films toward hydrogen gas
Zhu et al. Oxygen influence on sputtered high rate ZnO: Al films from dual rotatable ceramic targets
Gökçeli et al. Investigation of hydrogen post-treatment effect on surface and optoelectronic properties of indium tin oxide thin films
Nomoto et al. Correlation between carrier transport and orientation evolution of polycrystalline transparent conductive Al-doped ZnO films
Promjantuk et al. Spectroscopic study on alternative plasmonic TiN-NRs film prepared by R-HiPIMS with GLAD technique
Prepelita et al. Relevance of annealing on the stoichiometry and morphology of transparent thin films
Hsu et al. Facile preparation of hazy Ga-doped ZnO electrodes by atmospheric pressure plasma jet
Doghmane et al. Microstructural and optoelectronic properties of sputtered Al: ZnO films and Al: ZnO/Cu bilayer structures: Effects of substrate and Cu thickness
Sun et al. Effects of annealing time on the structural and optoelectronic properties of p-type conductive transparent Cu–Cr–O films
Chaikeeree et al. Investigation of omnidirectional transmittance related to ITO nanorods orientation for optical applications