[go: up one dir, main page]

Chang et al., 1997 - Google Patents

Postlayout logic restructuring using alternative wires

Chang et al., 1997

View PDF
Document ID
14396198940216858282
Author
Chang S
Cheng K
Woo N
Marek-Sadowska M
Publication year
Publication venue
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

External Links

Snippet

In this paper, we propose a layout-driven synthesis approach for field programmable gate arrays (FPGA's). The approach attempts to identify alternative wires and alternative functions for wires that cannot be routed due to the limited routing resources in FPGA. The alternative …
Continue reading at www.researchgate.net (PDF) (other versions)

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50Computer-aided design
    • G06F17/5068Physical circuit design, e.g. layout for integrated circuits or printed circuit boards
    • G06F17/5077Routing
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50Computer-aided design
    • G06F17/5068Physical circuit design, e.g. layout for integrated circuits or printed circuit boards
    • G06F17/5081Layout analysis, e.g. layout verification, design rule check
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50Computer-aided design
    • G06F17/5045Circuit design
    • G06F17/5054Circuit design for user-programmable logic devices, e.g. field programmable gate arrays [FPGA]
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50Computer-aided design
    • G06F17/5045Circuit design
    • G06F17/505Logic synthesis, e.g. technology mapping, optimisation
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50Computer-aided design
    • G06F17/5068Physical circuit design, e.g. layout for integrated circuits or printed circuit boards
    • G06F17/5072Floorplanning, e.g. partitioning, placement
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50Computer-aided design
    • G06F17/5009Computer-aided design using simulation
    • G06F17/5022Logic simulation, e.g. for logic circuit operation
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50Computer-aided design
    • G06F17/5009Computer-aided design using simulation
    • G06F17/5036Computer-aided design using simulation for analog modelling, e.g. for circuits, spice programme, direct methods, relaxation methods
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F2217/00Indexing scheme relating to computer aided design [CAD]
    • G06F2217/70Fault tolerant, i.e. transient fault suppression
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/30Information retrieval; Database structures therefor; File system structures therefor
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F2217/00Indexing scheme relating to computer aided design [CAD]
    • G06F2217/12Design for manufacturability
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F2217/00Indexing scheme relating to computer aided design [CAD]
    • G06F2217/08Multi-objective optimization
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Error detection; Error correction; Monitoring responding to the occurence of a fault, e.g. fault tolerance
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F2217/00Indexing scheme relating to computer aided design [CAD]
    • G06F2217/02Component-based CAD
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F7/00Methods or arrangements for processing data by operating upon the order or content of the data handled
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRICAL DIGITAL DATA PROCESSING
    • G06F15/00Digital computers in general; Data processing equipment in general
    • G06F15/16Combinations of two or more digital computers each having at least an arithmetic unit, a programme unit and a register, e.g. for a simultaneous processing of several programmes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3183Generation of test inputs, e.g. test vectors, patterns or sequence

Similar Documents

Publication Publication Date Title
Chang et al. Postlayout logic restructuring using alternative wires
Chang et al. Perturb and simplify: Multilevel boolean network optimizer
US6260177B1 (en) Automatic configuration of gate array cells using a standard cell function library
Chang et al. Layout driven logic synthesis for FPGAs
JP3891599B2 (en) Device for automatic insertion of standard cells into an integrated circuit layout.
US5764954A (en) Method and system for optimizing a critical path in a field programmable gate array configuration
JP2614986B2 (en) Method and apparatus for converting a field programmable gate array implementation to a mask programmable logic cell implementation
US5521836A (en) Method for determining instance placements in circuit layouts
US9147023B1 (en) Method and apparatus for performing fast incremental resynthesis
US6415430B1 (en) Method and apparatus for SAT solver architecture with very low synthesis and layout overhead
Chang et al. Circuit optimization by rewiring
JPH0766718A (en) Wafer scale structure for programmable logic
US20090293023A1 (en) Generation of standard cell library components with increased signal routing resources
Cong et al. Boolean matching for LUT-based logic blocks with applications to architecture evaluation and technology mapping
US6938236B1 (en) Method of creating a mask-programmed logic device from a pre-existing circuit design
US8578306B2 (en) Method and apparatus for performing asynchronous and synchronous reset removal during synthesis
Cong et al. A new enhanced SPFD rewiring algorithm
Bolchini et al. Designing self-checking FPGAs through error detection codes
Ghosh et al. Heuristic minimization of boolean relations using testing techniques
Cong et al. SPFD-based global rewiring
US8904318B1 (en) Method and apparatus for performing optimization using don't care states
US20040003363A1 (en) Integrated circuit design and manufacture utilizing layers having a predetermined layout
US5825659A (en) Method for local rip-up and reroute of signal paths in an IC design
Yamashita et al. Increasing yield using partially-programmable circuits
US6877040B1 (en) Method and apparatus for testing routability