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Harris et al., 1994 - Google Patents

SYNCBIST: synthesis for concurrent built-in self-testability

Harris et al., 1994

Document ID
11048547246196214330
Author
Harris I
Orailoglu A
Publication year
Publication venue
Proceedings 1994 IEEE International Conference on Computer Design: VLSI in Computers and Processors

External Links

Snippet

We present a system which synthesizes, from a behavioral description, an RTL circuit which is testable with a high degree of test concurrency. The system produces a datapath containing test registers, and a BIST test plan for the testing of the chip. All design decisions …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

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    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
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    • G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
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