JPS58154264A - Hall effect semiconductor integrated circuit - Google Patents
Hall effect semiconductor integrated circuitInfo
- Publication number
- JPS58154264A JPS58154264A JP57037467A JP3746782A JPS58154264A JP S58154264 A JPS58154264 A JP S58154264A JP 57037467 A JP57037467 A JP 57037467A JP 3746782 A JP3746782 A JP 3746782A JP S58154264 A JPS58154264 A JP S58154264A
- Authority
- JP
- Japan
- Prior art keywords
- elements
- output
- hall
- circuit
- semiconductor integrated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N59/00—Integrated devices, or assemblies of multiple devices, comprising at least one galvanomagnetic or Hall-effect element covered by groups H10N50/00 - H10N52/00
Landscapes
- Hall/Mr Elements (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は、ホール素子及びホール出力を増幅する回路等
を単一のシリコン基板内に集積化した、ホール効果半導
体集積回路(以下単にホールICという)に関するもの
である。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a Hall effect semiconductor integrated circuit (hereinafter simply referred to as a Hall IC) in which a Hall element, a circuit for amplifying Hall output, and the like are integrated in a single silicon substrate.
シリコン基板によるスイッチタイプのホールICは、従
来、第1図に示す構成のものが一般的である、1はシリ
コンホール素子、2は増幅回路、3はシュミットトリガ
−回路、4は出力回路、5は定電圧回路で、これらは単
一のシリコン基板6内に集積化される。7は電源(電圧
Vcc)端子、8及び9は出力端子、10けGND(グ
ランド)端子である。Conventionally, a switch type Hall IC using a silicon substrate generally has the configuration shown in FIG. 1. 1 is a silicon Hall element, 2 is an amplifier circuit, 3 is a Schmitt trigger circuit, 4 is an output circuit, 5 are constant voltage circuits, which are integrated within a single silicon substrate 6. 7 is a power supply (voltage Vcc) terminal, 8 and 9 are output terminals, and 10 is a GND (ground) terminal.
このように従来のホールICでも出力端子は2端子であ
るか、ホール素子1、増幅回路2、シュミットトリガ−
回路3I/″iそれぞれ直結され、最終の出力回路4よ
り2つの出力端子8,9を取出すようにしている。従っ
て、2つの出力端子8,9でありながら、磁場に対して
単一のホール素子1の信号を回路処理して分割している
ため、出力端子8,9は同一出力であるか、若]−くは
出力回路4に内蔵されたインバータ回路により能力に反
転した信号を取出すようにしたに過ぎない。第2図(a
)(d前者の出力例で、出力端子8,9共同−の出力特
性を有し、第2図(b)は後者の出力例で、出力端子8
(例えば実線)と出力端子9(例えば破線)は単に反転
した出力特性であることを示している1゜本発明はかか
る問題点に鑑み、複数の出力端子か異った11作磁束密
度によりスイッチングする特性であることを特徴とする
ホールICを提供するものである、
以下第3図〜第7図により本発明の実施例を説明する。In this way, even conventional Hall ICs have two output terminals, or a Hall element 1, an amplifier circuit 2, and a Schmitt trigger.
The circuits 3I/''i are directly connected to each other, and the two output terminals 8 and 9 are taken out from the final output circuit 4.Therefore, although there are two output terminals 8 and 9, a single hole is connected to the magnetic field. Since the signal of element 1 is processed and divided by the circuit, output terminals 8 and 9 either have the same output, or an inverter circuit built in the output circuit 4 outputs an inverted signal. Figure 2 (a)
) (d The former output example has the output characteristics of output terminals 8 and 9 jointly. FIG. 2(b) is the latter output example, with the output characteristics of output terminal
(for example, a solid line) and the output terminal 9 (for example, a broken line) indicate that the output characteristics are simply inverted. Embodiments of the present invention will be described with reference to FIGS. 3 to 7 below.
第3図の実施例は、磁束密度に対するホール出力電圧の
異なる2種類のホール素子1,1′を同一シリコン基板
6上に近接して作成し、それぞれのホール素子1,1′
に直結した増幅回路2,2′シュミットトリガ−回路3
.3’、出力回路4゜4′を同じシリコン基板6に並列
にIC技術により作成したものである。なお、5は共通
の定電圧回路である。In the embodiment shown in FIG. 3, two types of Hall elements 1 and 1' having different Hall output voltages with respect to magnetic flux densities are fabricated adjacently on the same silicon substrate 6, and each Hall element 1 and 1'
Amplifier circuit 2, 2' Schmitt trigger circuit 3 directly connected to
.. 3' and output circuit 4°4' are fabricated in parallel on the same silicon substrate 6 using IC technology. Note that 5 is a common constant voltage circuit.
シリコンホール素子の感度V H/B は次式%式%
第5図にシリコン基板6上のホール素子1(又は1′
)部ノ構成を、第6図に感度VH/BとW/Lの関係(
Ta 、 V 、 B 、μは一定)を示す。上式及び
第6図に表わされるように、ホール素子の横幅W。The sensitivity V H/B of the silicon Hall element is expressed by the following formula (%).
) part configuration and the relationship between sensitivity VH/B and W/L (
Ta, V, B, μ are constant). As shown in the above formula and FIG. 6, the width W of the Hall element.
縦幅りの比を変えることにより、その感度を変えること
ができる。By changing the height-to-width ratio, the sensitivity can be changed.
なお、W/Lがα5の場合にはf H(W/ L )は
α9とほとんど1に近く、W/LがLL25以下の場合
にはfH(W/L)はlと見なし得る。このような条件
のもとでは、
L
で、(第6図点線)、VH/BとW/L とは比例関
係となり、感度の異なるホール素子の設計は比較的容易
である、もちろん他の範囲でも何ら差支えない。
′□′:″
このようにL/Wの異なった2種のホール素f1.1′
を組込むことにより、第4図(a)または(b)に示す
ような、異なったスイッチ動作磁束密度特性をもつ出力
が得られる。第4図において、実線は例えば出力端子8
、破線は出力端子9の出力である。Note that when W/L is α5, f H (W/L) is α9, which is almost close to 1, and when W/L is LL25 or less, f H (W/L) can be considered to be l. Under these conditions, VH/B and W/L are in a proportional relationship at L (dotted line in Figure 6), and it is relatively easy to design Hall elements with different sensitivities. But there is no problem.
′□′:″ In this way, two types of Hall elements f1.1′ with different L/W
By incorporating these, outputs with different switching magnetic flux density characteristics as shown in FIG. 4(a) or (b) can be obtained. In FIG. 4, the solid line is, for example, the output terminal 8.
, the broken line is the output of the output terminal 9.
第7図の実施例は、近接して作成されるホール素子1,
1′を全く同一のサイズとして、別途電圧調整回路11
を内蔵して、それぞれのホール素子1,1′に印加され
る電圧を異なったものとしたものである。その他の構成
は第3図のものと同様である。この構成によυホール素
子1,1′での感度が変化し、同様に出力端子8,9に
第4図のような特性の出力を得ることができる。In the embodiment shown in FIG. 7, the Hall elements 1,
1′ are exactly the same size, and a separate voltage adjustment circuit 11 is installed.
The hall elements 1 and 1' have different voltages applied thereto. The rest of the configuration is the same as that in FIG. 3. With this configuration, the sensitivity of the υ Hall elements 1, 1' changes, and similarly outputs having the characteristics shown in FIG. 4 can be obtained at the output terminals 8, 9.
上述の実施例では、出力端子として2端子の場合を述べ
たが、本方式を更に拡張して、必要に応じて複数のホー
ル素子及び付属回路を並列に設置すれば、動作磁束密度
の異なった多端子の出力を(Jj8えたホールICに発
展させることができる。In the above embodiment, the case where two output terminals are used is described, but if this method is further expanded and multiple Hall elements and attached circuits are installed in parallel as necessary, it is possible to achieve different operating magnetic flux densities. It is possible to develop a Hall IC with multi-terminal output (Jj8).
以上のように本発明のホール効果半導体集積回路は、精
密位置決め制御用として有効であり、2つのホールIC
を並べて使用する場合等と比較して、素子の選別1分類
か不要である点、及び配線。As described above, the Hall effect semiconductor integrated circuit of the present invention is effective for precision positioning control, and the Hall effect semiconductor integrated circuit of the present invention is effective for precision positioning control.
Compared to cases where devices are used side by side, there is no need to select one category of elements, and wiring.
セツティングが1素子だけで済む点から、実装上の効果
か大きいものを提供できる。Since only one element is required for setting, a large implementation effect can be provided.
第1図は従来例を示す構成図、第2図(al及び(bl
は従来の出力特性例を説明する図、第3図は本発明の一
実施例を示す構成図、第4図(at及び(bl Ifi
本発明の出力特性例を説明する図、第5図はホール素子
部の構成を示す図、第6図/″i感度と寸法比の関係を
示す図、第7図は本発明の他の実施例を示す構成図であ
る。
1・1′・・・ホール素子、 2・2′・・・増幅器、
3・3′・・・シュミットトリガ−回路、 4・4′・
・・出力回路、 5・・・定電圧回路、 6・・・シリ
コン基板、 7・・・電源端子、 8・9・・・出力端
子、10・・・GND端子、 W・・・横幅、 L・・
・縦幅、11・・・電圧調整回路。
代理人 弁理士 福 士 愛 彦(他2名)11
蔵
譬Figure 1 is a configuration diagram showing a conventional example, and Figure 2 (al and (bl)
3 is a diagram illustrating an example of conventional output characteristics, FIG. 3 is a configuration diagram illustrating an embodiment of the present invention, and FIG. 4 (at and (bl Ifi
Figure 5 is a diagram illustrating an example of the output characteristics of the present invention, Figure 5 is a diagram showing the configuration of the Hall element section, Figure 6 is a diagram showing the relationship between sensitivity and dimension ratio, and Figure 7 is another embodiment of the present invention. It is a configuration diagram showing an example. 1, 1'... Hall element, 2, 2'... amplifier,
3, 3'...Schmitt trigger circuit, 4, 4'...
... Output circuit, 5... Constant voltage circuit, 6... Silicon substrate, 7... Power supply terminal, 8, 9... Output terminal, 10... GND terminal, W... Width, L・・・
・Vertical width, 11... Voltage adjustment circuit. Agent Patent Attorney Aihiko Fukushi (and 2 others) 11.
Claims (1)
を導出する、複数の素子及び回路部を有してなることを
特徴とするホール効果半導体集積回路1、1. A Hall effect semiconductor integrated circuit 1 characterized by having a plurality of elements and circuit sections, each of which derives outputs with different operating magnetic flux density characteristics from its output terminals.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57037467A JPS58154264A (en) | 1982-03-09 | 1982-03-09 | Hall effect semiconductor integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57037467A JPS58154264A (en) | 1982-03-09 | 1982-03-09 | Hall effect semiconductor integrated circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS58154264A true JPS58154264A (en) | 1983-09-13 |
Family
ID=12498324
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57037467A Pending JPS58154264A (en) | 1982-03-09 | 1982-03-09 | Hall effect semiconductor integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58154264A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4939449A (en) * | 1986-12-12 | 1990-07-03 | Liaisons Electroniques-Mecaniques Lem Sa | Electric current sensing device of the magnetic field compensation type |
EP0387854A2 (en) * | 1989-03-17 | 1990-09-19 | Siemens Aktiengesellschaft | Circuit arrangement and device for the contactless setting of a target value for an integrated circuit enveloped by a non-magnetic material |
-
1982
- 1982-03-09 JP JP57037467A patent/JPS58154264A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4939449A (en) * | 1986-12-12 | 1990-07-03 | Liaisons Electroniques-Mecaniques Lem Sa | Electric current sensing device of the magnetic field compensation type |
EP0387854A2 (en) * | 1989-03-17 | 1990-09-19 | Siemens Aktiengesellschaft | Circuit arrangement and device for the contactless setting of a target value for an integrated circuit enveloped by a non-magnetic material |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP0364925A1 (en) | Semiconductor integrated circuit having i/o terminals allowing independent connection test | |
JPH08148537A (en) | Semiconductor integrated circuit | |
US20090189693A1 (en) | Operational amplifier | |
JPS58154264A (en) | Hall effect semiconductor integrated circuit | |
US6696840B2 (en) | Device for triggering ignition circuits | |
JP2681427B2 (en) | Semiconductor device | |
JP2006121377A (en) | Input circuit and semiconductor device | |
JP2868115B2 (en) | Power supply circuit for driving semiconductor integrated circuits | |
JP2832994B2 (en) | Semiconductor integrated circuit | |
JPH0521708A (en) | Semiconductor device | |
JPH0120538B2 (en) | ||
JP2962051B2 (en) | Semiconductor integrated circuit device | |
JPH0548009A (en) | Semiconductor device | |
JP2811740B2 (en) | Integrated circuit | |
US3643104A (en) | Magnetic control device | |
JPS60150662A (en) | Semiconductor integrated logic device | |
JPH0677404A (en) | Electrostatic breakdown preventive circuit for lsi chip | |
JPH08307222A (en) | Integrated circuit | |
JP2687442B2 (en) | Semiconductor device | |
JPS603726A (en) | Reference power source | |
JPH0317576A (en) | semiconductor equipment | |
JPS5946564A (en) | Magnetic detector | |
JPH05335414A (en) | Forming metod of integrated circuit | |
JPH04258151A (en) | Semiconductor integrated circuit | |
JPH0662531A (en) | Bandgap type constant current source circuit |