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JPH05343298A - Exposure apparatus - Google Patents

Exposure apparatus

Info

Publication number
JPH05343298A
JPH05343298A JP4150241A JP15024192A JPH05343298A JP H05343298 A JPH05343298 A JP H05343298A JP 4150241 A JP4150241 A JP 4150241A JP 15024192 A JP15024192 A JP 15024192A JP H05343298 A JPH05343298 A JP H05343298A
Authority
JP
Japan
Prior art keywords
illuminance
light source
time
lamp
optical system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4150241A
Other languages
Japanese (ja)
Inventor
Takeshi Naraki
剛 楢木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp filed Critical Nikon Corp
Priority to JP4150241A priority Critical patent/JPH05343298A/en
Publication of JPH05343298A publication Critical patent/JPH05343298A/en
Pending legal-status Critical Current

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  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

PURPOSE:To decide a malfunction of an initial illuminance of a light source of an exposure apparatus and a decrease in illuminance while using the light source. CONSTITUTION:Relationship between an illuminance P of a luminous flux from a light source 1 to be detected by an illuminance monitor and a using time T1 of the source 1 measured by a timer 13, and relationship between the illuminance when the source 1 is replaced and a using time T1 of an illumination optical system are obtained, and stored in an arithmetic memory 14a. A deciding unit 14b compares the illuminance P to be detected during using of the source with the relation stored in the memory 14a, and judges the source 1 to be faulty if it decreases from the relationships.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体素子製造用の露
光装置に関するものであり、特に光源の照度をモニター
する機構を備えた露光装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an exposure apparatus for manufacturing semiconductor devices, and more particularly to an exposure apparatus equipped with a mechanism for monitoring the illuminance of a light source.

【0002】[0002]

【従来の技術】従来のこの種の露光装置は、図4に示す
ような構造であった。即ち、超高圧水銀灯等の光源1か
ら出射した光束は、楕円鏡2、反射鏡3a,3b、ハー
フミラー5、コンデンサーレンズ8等の照明光学系を介
してレチクル9上に均一に照射される。レチクル9を透
過した光束は、投影光学系10を介して被露光基板11
上に投影され、レチクル9上の像を結像する。一方、被
露光基板に対する露光量は、シャッター4を光路中に進
退させて露光時間(シャッター開時間)を制御すること
によって行っている。そのため光源1からの光束のうち
の一部を、ハーフミラー5で反射して照度センサ6に入
射し、光源1の照度を検出する。検出された照度に基づ
いて制御部12でシャッター4の開時間を求めて、シャ
ッター4を駆動する。
2. Description of the Related Art A conventional exposure apparatus of this type has a structure as shown in FIG. That is, the light flux emitted from the light source 1 such as an ultra-high pressure mercury lamp is uniformly irradiated onto the reticle 9 through the illumination optical system such as the elliptic mirror 2, the reflecting mirrors 3a and 3b, the half mirror 5, the condenser lens 8 and the like. The light flux that has passed through the reticle 9 passes through the projection optical system 10 and the substrate 11 to be exposed.
The image is projected onto the reticle 9 to form an image. On the other hand, the exposure amount for the substrate to be exposed is controlled by moving the shutter 4 back and forth in the optical path to control the exposure time (shutter open time). Therefore, a part of the light flux from the light source 1 is reflected by the half mirror 5 and enters the illuminance sensor 6 to detect the illuminance of the light source 1. Based on the detected illuminance, the controller 12 determines the opening time of the shutter 4 and drives the shutter 4.

【0003】ところで、露光時間は、光源の使用時間に
応じた光束の照度変化や照明光学系の光学部材の汚れ等
の状態により調整する必要がある。そこで照度モニタ6
により照度を逐次検出し、制御部12で光源からの光束
の照度に応じて露光時間を自動的に増減させる制御を行
っている。
By the way, the exposure time needs to be adjusted according to the change of the illuminance of the light flux according to the usage time of the light source and the condition such as the contamination of the optical members of the illumination optical system. Therefore, illuminance monitor 6
The illuminance is sequentially detected by the control unit 12, and the control unit 12 automatically controls the exposure time according to the illuminance of the light flux from the light source.

【0004】[0004]

【発明が解決しようとする課題】一般的に露光装置に使
用される超高圧水銀灯(ランプ)には、初期照度保証と
照度保証時間の2つの照度に関する保証が付けられてい
る。初期照度保証は、新品ランプを点灯させて安定した
後の照度(初期照度)としての最低値を保証したもので
あり、照度保証時間は、初期照度に対してある一定割合
以上の照度を得られる時間を保証したものである。しか
し中には不良品もあり、初期照度の低いランプや、照度
保証時間内であっても急激に照度低下するランプが出る
こともある。このような不良ランプを装置に付けた場
合、従来の技術における露光装置はこれを判断する構成
を備えておらず、また照度モニタで検出された照度に基
づいて適正な露光量に応じた露光時間を決定する構成で
あるため、照度低下が生じると露光時間が長くなり、ス
ループットの低下を招いていた。作業者は、多少のスル
ープット低下ではランプ不良を発見することは困難であ
る。従って、従来の装置ではスループットが大幅に低下
した時でないとランプ不良を発見することは難しく、単
位時間当たりの処理枚数が減少することは避けにくかっ
た。
Generally, an ultra-high pressure mercury lamp (lamp) used in an exposure apparatus is provided with two illuminance guarantees, an initial illuminance guarantee and an illuminance guarantee time. The initial illuminance guarantee guarantees the minimum value as the illuminance (initial illuminance) after the new lamp is lit and stabilized, and the illuminance guarantee time can obtain an illuminance at a certain ratio or more with respect to the initial illuminance. It guarantees time. However, some of them are defective, and there are cases where a lamp with low initial illuminance or a lamp whose illuminance drops sharply even within the illuminance guarantee time. When such a defective lamp is attached to the apparatus, the exposure apparatus in the related art does not have a configuration for judging this, and the exposure time corresponding to the appropriate exposure amount based on the illuminance detected by the illuminance monitor. Therefore, if the illuminance is decreased, the exposure time becomes longer, and the throughput is decreased. It is difficult for an operator to detect a lamp failure with a slight decrease in throughput. Therefore, in the conventional apparatus, it is difficult to detect the lamp failure only when the throughput is significantly reduced, and it is difficult to avoid a decrease in the number of processed sheets per unit time.

【0005】ところで、一般的にランプの照度は、例え
ば図2の曲線20で示すように時間の経過とともに低下
する。ランプの照度がある値まで低下した時や、照度保
証時間を経過した時点でランプを新品に交換すると、照
度は上がる。しかしながら、装置を長期間使用するうち
に照明光学系に汚れ、曇り、経年変化等が生じ、装置の
使用開始当初と同一の初期照度のランプを使用しても、
照度モニタで検出される照度は装置の使用開始時と同一
レベルまでは上がらなくなる(図2において、P1 >P
2 )。つまり、装置の使用時間の経過とともにランプの
初期照度は曲線21で示すように低下していく。
By the way, generally, the illuminance of the lamp decreases with the passage of time as shown by a curve 20 in FIG. 2, for example. When the illuminance of the lamp drops to a certain value or the lamp is replaced with a new one when the illuminance guarantee time has elapsed, the illuminance increases. However, when the device is used for a long period of time, the illumination optical system becomes dirty, cloudy, changes over time, etc., and even if a lamp with the same initial illuminance as when the device was first used was used,
The illuminance detected by the illuminance monitor does not rise to the same level as when the device was started (P 1 > P in FIG. 2).
2 ). That is, the initial illuminance of the lamp decreases as the usage time of the device elapses, as shown by the curve 21.

【0006】今、仮に照明光学系の変化を考慮に入れず
に、照度モニタの値が一定値(図2のPL )で照度不良
と判断してランプを交換するようにした場合、装置使用
時間が長くなるにしたがって、図2に示すようにランプ
交換の間隔が短くなってしまい、実用に適さない。反対
に、照明光学系の変化を考慮するとしても、光学系の変
化は装置の使用環境により一定でないため、初期照度低
下パターン(曲線21)を予めデータとして持っておく
ことはできず、従って時間の関数で照度リミットPL
設定することはできない。
If it is decided that the illuminance monitor value is a constant value (P L in FIG. 2) and the illuminance is defective and the lamp is replaced without considering the change of the illumination optical system, the apparatus is used. As the time becomes longer, the lamp replacement interval becomes shorter as shown in FIG. 2, which is not suitable for practical use. On the contrary, even if the change of the illumination optical system is taken into consideration, the change of the optical system is not constant depending on the usage environment of the device, and therefore the initial illuminance decrease pattern (curve 21) cannot be stored in advance as data, and therefore the time The illuminance limit P L cannot be set with the function of.

【0007】本発明は上記のような従来の問題点に鑑
み、照明光学系の経時変化を考慮した上で、露光装置に
装着したランプの初期照度や照度低下の異常を自動的に
判定し、スループットの低下を最小限に抑えることので
きる露光装置を提供することを目的とする。
In view of the conventional problems as described above, the present invention automatically determines the initial illuminance or the abnormality of the illuminance decrease of the lamp mounted on the exposure apparatus, taking into consideration the change with time of the illumination optical system, It is an object of the present invention to provide an exposure apparatus that can minimize a decrease in throughput.

【0008】[0008]

【課題を解決するための手段】上記問題点の解決のため
本発明では、光源(1)からの光束を光学系(2,3
a,3b,5,8,10)を介して対象物(11)に照
射する際に、光学系(2,3a,3b,5,8,10)
の少なくとも一部を介した光束の少なくとも一部を検出
して光束の照度に関する情報(P)を検出する照度検出
手段(6)を備えた露光装置において、光源(1)の使
用時間に関する情報(T2 )と、光学系の使用時間に関
する情報(T1 )とを求める計時手段(13)と;予め
基本データとして光源の使用時間(T2 )と照度検出手
段(6)によって検出した照度(P)についての第1の
関係(22)を求めるとともに、光源を交換した際の光
学系の使用時間(T1 )と照度検出手段(6)によって
検出した照度(P)についての第2の関係(21)を求
めて、第1及び第2の関係(22,21)を記憶する演
算記憶手段(14a)と;光源(1)を交換した際に得
られる照度(P)と第2の関係(21)とに基づいて、
交換した光源の初期照度の良否を判断するとともに、光
源(1)の使用中に得られる照度(P)と第1の関係
(22)とに基づいて使用中の光源の照度低下の異常を
判断する判定手段(14b)とを含むこととした。
In order to solve the above problems, in the present invention, a light beam from a light source (1) is converted into an optical system (2, 3).
When illuminating the object (11) via a, 3b, 5, 8, 10), the optical system (2, 3a, 3b, 5, 8, 10)
In an exposure apparatus provided with an illuminance detection means (6) for detecting at least a part of a light flux passing through at least a part of the light flux and detecting information (P) relating to the illuminance of the light flux, information on a usage time of the light source (1) ( T 2 ) and a time measuring means (13) for obtaining information (T 1 ) relating to the use time of the optical system; the use time of the light source (T 2 ) and the illuminance detected by the illuminance detecting means (6) in advance as basic data ( P) the first relationship (22), and the second relationship between the operating time (T 1 ) of the optical system when the light source is replaced and the illuminance (P) detected by the illuminance detecting means (6). Calculation storage means (14a) for obtaining (21) and storing the first and second relationships (22, 21); Illuminance (P) and second relationship obtained when the light source (1) is replaced. Based on (21) and
The initial illuminance of the replaced light source is determined to be good or bad, and the illuminance reduction of the light source in use is abnormal based on the illuminance (P) obtained during use of the light source (1) and the first relationship (22). And a determination means (14b) for doing so.

【0009】[0009]

【作用】本発明によれば、装置の使用中に、装置の使用
時間に対する光源の照度を検出し、この使用時間と照度
との関係に基づいて光源の初期照度不良を判断すること
としたため、装置の照明光学系の変化の影響を考慮した
照度不良の判断が可能となる。
According to the present invention, the illuminance of the light source with respect to the use time of the device is detected during use of the device, and the initial illuminance defect of the light source is determined based on the relationship between the use time and the illuminance. It is possible to judge the illuminance defect in consideration of the influence of the change of the illumination optical system of the device.

【0010】また、予め光源の使用時間に対する照度の
関係を基本データとして求めておき、実際の光源の使用
時間に対する光源の照度を検出して基本データと比較す
るため、光源の照度低下の異常を判断することが可能と
なる。
Further, since the relation of the illuminance with respect to the usage time of the light source is obtained in advance as the basic data, and the illuminance of the light source with respect to the actual usage time of the light source is detected and compared with the basic data, an abnormality in the decrease in the illuminance of the light source is detected. It becomes possible to judge.

【0011】[0011]

【実施例】図1は本発明の実施例による露光装置の概略
的な構成を示す図である。基本的な構成は図4に示す従
来の技術による露光装置と同様であるため、異なる構成
について以下に説明する。本来、露光時間の制御の目的
で検出される照度モニタ6からのデータPを、タイマー
13で計測される装置使用開始からの時間T1 、及びラ
ンプ1を交換してからの時間T2 とともにコンピュータ
14の記憶演算部14aに記憶する。記憶するデータ
は、ランプ交換後、一定時間経過してランプが安定した
時の照度(初期照度)と、ランプを使用開始してから所
定の時間毎の照度である。コンピュータ14は、記憶し
た各データP,T1 ,T2 に基づいて光学系の経時変化
のパターン(図2に曲線21で示すランプの初期照度低
下の原因となるもの)と基本となるランプの照度低下パ
ターン(図3の実線22)とを記憶演算部14aで求め
る。そしてこれらのパターンとモニタ6で検出される照
度Pとに基づいてランプの初期照度及び照度低下の異常
(照度不良)を判定部14bで判断する。コンピュータ
14でランプが照度不良と判断されるとアラーム15等
に信号を出力して作業者にランプの交換を促す。
1 is a diagram showing a schematic structure of an exposure apparatus according to an embodiment of the present invention. Since the basic structure is the same as that of the conventional exposure apparatus shown in FIG. 4, a different structure will be described below. Originally, the data P from the illuminance monitor 6 detected for the purpose of controlling the exposure time, together with the time T 1 from the start of using the apparatus measured by the timer 13 and the time T 2 after the replacement of the lamp 1 are calculated by the computer. It is stored in the storage operation unit 14a of 14. The data to be stored are the illuminance when the lamp has stabilized for a certain period of time after the lamp replacement (initial illuminance) and the illuminance at every predetermined time after the use of the lamp is started. Based on the stored data P, T 1 , and T 2 , the computer 14 determines the pattern of the temporal change of the optical system (which causes the decrease in the initial illuminance of the lamp shown by the curve 21 in FIG. 2) and the basic lamp. The illuminance reduction pattern (solid line 22 in FIG. 3) is obtained by the storage / calculation unit 14a. Then, based on these patterns and the illuminance P detected by the monitor 6, the determining unit 14b determines the initial illuminance of the lamp and an abnormality in the illuminance decrease (illuminance defect). When the computer 14 determines that the lamp has poor illuminance, a signal is output to the alarm 15 or the like to prompt the operator to replace the lamp.

【0012】次にコンピュータ14で求める各パターン
について図1,図2,図3に基づいて説明する。上記の
構成において、先ず、初期照度が明らかになっているラ
ンプを装置に取り付け、照度モニタ6で検出される値を
コンピュータ14に記憶する。この値より初期照度保証
値の最低初期照度のランプを取り付けた場合に照度モニ
タで検出される照度(図3のPs )を求める。これは、
照度モニタ6で検出される照度が照明光学系を介した光
束の照度であり、ランプそのものの照度より若干低い値
を示すことを考慮したものである。今、照度が明らかに
なっているランプの照度をSa 、そのランプを取り付け
た時の照度モニタの値をPa 、保証値の最低初期照度を
min.とすると、PS =Pa ・Smin./Sa となる。つ
まり実際に使用するランプを取り付けたときに、照度モ
ニタの値PがPS より大きければ良品、もし小さければ
不良と判断する。
Next, each pattern obtained by the computer 14 will be described with reference to FIGS. 1, 2 and 3. In the above configuration, first, a lamp whose initial illuminance is known is attached to the device, and the value detected by the illuminance monitor 6 is stored in the computer 14. From this value, the illuminance detected by the illuminance monitor (P s in FIG. 3) when the lamp with the lowest initial illuminance of the guaranteed initial illuminance value is attached is obtained. this is,
This is because it is considered that the illuminance detected by the illuminance monitor 6 is the illuminance of the light flux passing through the illumination optical system and is slightly lower than the illuminance of the lamp itself. Now, let S a be the illuminance of the lamp whose illuminance is known, P a be the value of the illuminance monitor when the lamp is attached, and S min be the minimum initial illuminance of the guaranteed value, P S = P a S min. / S a . That is, when the lamp to be actually used is attached, it is determined that the value P on the illuminance monitor is greater than P S and that the value is good, and if the value P is small, the product is defective.

【0013】以後、装置の使用に伴い光学系に上述のよ
うな変化が生じるので、ランプ交換毎に初期照度
(P1 ,P2 ,P3 ,…)をモニタ6で検出し、光学系
の経時変化のパターンを例えば最小二乗法等を用いて求
める。そして、このパターンに基づいてランプ交換時の
装置使用時間を考慮に入れた照度PS を求めて初期照度
異常を判定する。尚、初期照度低下のパターンを求める
場合、不良ランプのデータは除いて計算を行うのは言う
までもない。
After that, since the above-mentioned change occurs in the optical system with the use of the apparatus, the initial illuminance (P 1 , P 2 , P 3 , ...) Is detected by the monitor 6 every time the lamp is replaced, and the optical system of the optical system is detected. The pattern of change over time is obtained by using, for example, the least square method. Then, based on this pattern, the illuminance P S in consideration of the device usage time at the time of lamp replacement is determined to determine the initial illuminance abnormality. Needless to say, when the pattern of the initial illuminance decrease is obtained, the data of the defective lamp is excluded.

【0014】一方、超高圧水銀灯等のランプは図3に示
すように特徴的な照度低下を示すので、予め使用時間に
対する照度のデータを取ることによって、ランプの使用
に伴う照度低下のモデルパターンを設定することができ
る。即ち、あるランプが照度保証時間TE を経過した時
の保証照度PnEは、ランプの規格として初期照度Pn
何%と決められているので、これに基づいて求められ
る。初期照度Pn のランプが時間TE 後に保証照度PnE
まで低下するとして、上述のモデルパターンに基づいて
使用時間に対する照度低下の基本データ(図3の実線2
2)を求める。そして、ランプ使用中の照度モニタ6の
値Pがモデルパターンで与えられる照度よりも下回った
時、即ち図3の破線23が、実線22を下回った時点で
照度不良と判断する。
On the other hand, since a lamp such as an ultra-high pressure mercury lamp shows a characteristic illuminance drop as shown in FIG. 3, data of illuminance with respect to usage time is obtained in advance to obtain a model pattern of illuminance drop with use of the lamp. Can be set. That is, the guaranteed illuminance P nE when a certain lamp has passed the illuminance guaranteed time T E is determined as a percentage of the initial illuminance P n as a standard of the lamp, and is obtained based on this. Guaranteed illuminance P nE of lamp with initial illuminance P n after time T E
Based on the model pattern described above, the basic data of the decrease in illuminance with respect to the use time (solid line 2 in FIG.
2) is asked. Then, when the value P of the illuminance monitor 6 in use of the lamp is lower than the illuminance given by the model pattern, that is, when the broken line 23 in FIG.

【0015】照度保証時間TE を経過してランプの破裂
保証時間TB までの間は照度PnEを基本データとする。
本発明では、光源として超高圧水銀灯を用いたが、レー
ザやハロゲンランプ等の光源であっても構わない。
The illuminance P nE is used as basic data until the lamp burst guarantee time T B after the illuminance guarantee time T E has elapsed.
Although an ultra-high pressure mercury lamp is used as a light source in the present invention, a light source such as a laser or a halogen lamp may be used.

【0016】[0016]

【発明の効果】以上のように本発明によれば、装置の使
用時間と照度との関係および光源の使用時間と照度との
関係と、照度モニタで検出する照度とを比較する構成と
したため、光源の照度不良を的確に判断することが可能
となる。このとき、警告装置等によって光源の不良を作
業者に促せば、露光装置のスループットの低下を最小限
に抑えることができる。
As described above, according to the present invention, the relationship between the usage time of the device and the illuminance and the relationship between the usage time of the light source and the illuminance is compared with the illuminance detected by the illuminance monitor. It is possible to accurately determine the illuminance defect of the light source. At this time, if the warning device or the like is used to prompt the operator for a defect in the light source, the decrease in throughput of the exposure apparatus can be suppressed to a minimum.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例による露光装置の概略的な構成
を示す図
FIG. 1 is a diagram showing a schematic configuration of an exposure apparatus according to an embodiment of the present invention.

【図2】露光装置の照明光学系の使用時間に対する光源
の照度の関係を示す図
FIG. 2 is a diagram showing the relationship between the illuminance of a light source and the usage time of an illumination optical system of an exposure apparatus.

【図3】光源の使用時間に対する照度の関係を示す図FIG. 3 is a diagram showing a relationship between illuminance and usage time of a light source.

【図4】従来の技術による露光装置の概略的な構成を示
す図
FIG. 4 is a diagram showing a schematic configuration of an exposure apparatus according to a conventional technique.

【符号の説明】[Explanation of symbols]

1 光源 6 照度センサ 13 タイマー 14a 記憶演算部 14b 判定部 15 アラーム 1 Light source 6 Illuminance sensor 13 Timer 14a Memory calculation unit 14b Judgment unit 15 Alarm

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 光源からの光束を光学系を介して対象物
に照射する際に、前記光学系の少なくとも一部を介した
前記光束の少なくとも一部を検出して該光束の照度に関
する情報を検出する照度検出手段を備えた露光装置にお
いて、 前記光源の使用時間に関する情報と、前記光学系の使用
時間に関する情報とを求める計時手段と;予め基本デー
タとして前記光源の使用時間と前記照度検出手段によっ
て検出した前記照度についての第1の関係を求めるとと
もに、前記光源を交換した際の前記光学系の使用時間と
前記照度検出手段によって検出した前記照度についての
第2の関係を求めて、前記第1及び第2の関係を記憶す
る演算記憶手段と;前記光源を交換した際に得られる前
記照度と前記第2の関係とに基づいて、前記交換した光
源の初期照度の良否を判断するとともに、前記光源の使
用中に得られる前記照度と前記第1の関係とに基づいて
前記使用中の光源の照度低下の異常を判断する判定手段
とを含むことを特徴とする露光装置。
1. When irradiating an object with a light beam from a light source through an optical system, at least a part of the light beam through at least a part of the optical system is detected to obtain information about the illuminance of the light beam. In an exposure apparatus provided with an illuminance detecting means for detecting, a time measuring means for obtaining information about a usage time of the light source and information about a usage time of the optical system; a usage time of the light source and the illuminance detection means as basic data in advance. The second relationship between the illuminance detected by the illuminance detected by the illuminance detecting means and the second relationship between the illuminance detected by the illuminance detecting means and the operating time of the optical system when the light source is replaced is obtained. An arithmetic storage unit for storing the first and second relationships; an initial illumination of the replaced light source based on the illuminance and the second relationship obtained when the light source is replaced. And a determination unit that determines whether the illuminance of the light source is in use is abnormal based on the illuminance and the first relationship obtained during use of the light source. Exposure equipment.
【請求項2】 前記第2の関係は、前記光源の交換毎に
更新することを特徴とする請求項1に記載の露光装置。
2. The exposure apparatus according to claim 1, wherein the second relationship is updated every time the light source is replaced.
【請求項3】 前記露光装置は、さらに前記判定手段の
判定に基づいて警告を発する警告手段を含むことを特徴
とする請求項1に記載の露光装置。
3. The exposure apparatus according to claim 1, wherein the exposure apparatus further includes warning means for issuing a warning based on the judgment of the judgment means.
JP4150241A 1992-06-10 1992-06-10 Exposure apparatus Pending JPH05343298A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4150241A JPH05343298A (en) 1992-06-10 1992-06-10 Exposure apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4150241A JPH05343298A (en) 1992-06-10 1992-06-10 Exposure apparatus

Publications (1)

Publication Number Publication Date
JPH05343298A true JPH05343298A (en) 1993-12-24

Family

ID=15492653

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4150241A Pending JPH05343298A (en) 1992-06-10 1992-06-10 Exposure apparatus

Country Status (1)

Country Link
JP (1) JPH05343298A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008242173A (en) * 2007-03-28 2008-10-09 Orc Mfg Co Ltd Exposure drawing device
JP2008268888A (en) * 2007-03-28 2008-11-06 Orc Mfg Co Ltd Exposure drawing device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008242173A (en) * 2007-03-28 2008-10-09 Orc Mfg Co Ltd Exposure drawing device
JP2008268888A (en) * 2007-03-28 2008-11-06 Orc Mfg Co Ltd Exposure drawing device

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