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JPH03240979A - Device for producing semiconductor - Google Patents

Device for producing semiconductor

Info

Publication number
JPH03240979A
JPH03240979A JP3235390A JP3235390A JPH03240979A JP H03240979 A JPH03240979 A JP H03240979A JP 3235390 A JP3235390 A JP 3235390A JP 3235390 A JP3235390 A JP 3235390A JP H03240979 A JPH03240979 A JP H03240979A
Authority
JP
Japan
Prior art keywords
ring
sealing resin
plasma
plasma chamber
resin ring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3235390A
Other languages
Japanese (ja)
Inventor
Akitaka Karasawa
章孝 柄沢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP3235390A priority Critical patent/JPH03240979A/en
Publication of JPH03240979A publication Critical patent/JPH03240979A/en
Pending legal-status Critical Current

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  • ing And Chemical Polishing (AREA)

Abstract

PURPOSE:To prevent the deterioration of a sealing resin ring, to eliminate the rising of dust and to improve the quality of a semiconductor product in the device with its plasma chamber airtightly sealed by the ring by providing a physical obstruction between the plasma chamber and ring. CONSTITUTION:The plasma chamber 1 of this semiconductor producing device is airtightly sealed by a sealing resin ring 4. A rugged part is provided between the ring 4 and the plasma chamber 1 consisting of a base 2' and a quartz glass 3'. As a result, the arrival of the plasmanon at the ring 4 is prevented, the deterioration is reduced, the rise of dust is eliminated, and hence the semiconductor product 8 is not contaminated.

Description

【発明の詳細な説明】 〔概 要〕 プラズマ発生装置に関し、 プラズマによる封止樹脂リングの劣化を防止することを
目的として、 プラズマ室と封止樹脂リングとの間に物理的障害を設け
るように構成する。
[Detailed Description of the Invention] [Summary] Regarding a plasma generator, a physical barrier is provided between the plasma chamber and the sealing resin ring in order to prevent the sealing resin ring from deteriorating due to plasma. Configure.

〔産業上の利用分野〕[Industrial application field]

本発明は半導体製造装置(:係り、とりわけ酸素プラズ
マなどのプラズマ室を有する半導体製造装〔従来の技術
〕 従来のプラズマ発生装置の1例を第2図に示す。
The present invention relates to a semiconductor manufacturing apparatus (particularly, a semiconductor manufacturing apparatus having a plasma chamber for oxygen plasma, etc. [Prior Art]) An example of a conventional plasma generating apparatus is shown in FIG.

このプラズマ発生装置はレジストのアッシング装置であ
るが、プラズマ室1は基台2と石英ガラス3により画成
され、基台2と石英ガラス3の間はパイトン(商品名)
又はシリコーンなどの樹脂製の封止樹脂リング4を用い
て気密封止されている。
This plasma generator is a resist ashing device, and the plasma chamber 1 is defined by a base 2 and quartz glass 3.
Alternatively, it is hermetically sealed using a sealing resin ring 4 made of resin such as silicone.

5は電極、6は高周波電源、7は試料台、8は被処理ウ
ェーハである。
5 is an electrode, 6 is a high frequency power source, 7 is a sample stage, and 8 is a wafer to be processed.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

近年の半導体製造工程においては微細パターンの懲戒が
要求され、その為クリーン度を向上させる必要がある。
In recent semiconductor manufacturing processes, fine patterning is required, and therefore it is necessary to improve the cleanliness.

ところが、プラズマノンにさらされる封止樹脂リングの
パイトンやシリコーン樹脂が劣化し、発塵の原因となっ
ている。従来のプラズマ雰囲気ガスはハロゲン系であり
、これに対しては対策が構じられていたが、第1図の如
きアッソング装置ては酸素プラズマが用いられ、従来の
プラズマ発生装置はこれに対する対策が十分でないため
発塵が避けられtヨいようである。
However, the pyton and silicone resin of the sealing resin ring exposed to plasma non-container deteriorates, causing dust generation. Conventional plasma atmosphere gases are halogen-based, and countermeasures have been taken to prevent this, but oxygen plasma is used in the assong device shown in Figure 1, and conventional plasma generators have no countermeasures against this. It seems that dust generation cannot be avoided because the amount is not sufficient.

〔課題を解決するための手段〕[Means to solve the problem]

本発明は、上記目的を達成するために、プラズマ室を封
止樹脂リングで気密封止した半導体製造装置において、
プラズマ室と封止樹脂リングの間にプラズマによる封止
樹脂リングの劣化を防止するための物理的障害を設けた
ことを特徴とする半導体製造装置を提供する。
In order to achieve the above object, the present invention provides a semiconductor manufacturing apparatus in which a plasma chamber is hermetically sealed with a sealing resin ring.
Provided is a semiconductor manufacturing apparatus characterized in that a physical barrier is provided between a plasma chamber and a sealing resin ring to prevent deterioration of the sealing resin ring due to plasma.

〔作 用〕[For production]

プラズマ室と封止樹脂リングの間に物理的障害を設ける
ことにより、プラズマノンに封止樹脂リングがさらされ
にくくなり、発塵が減少する。
By providing a physical barrier between the plasma chamber and the sealing resin ring, the sealing resin ring is less likely to be exposed to plasma particles, and dust generation is reduced.

〔実施例〕〔Example〕

第2図は第1図のプラズマ発生装置の封止樹脂リングに
よる封止部分(図中のA部)を拡大したもので、基本的
に平坦な基台2上にこれまで基本的に平坦な底面を有す
る石英ガラス3が封止樹脂リング4を介して締め付けら
れている。リング4の直径は一般に5〜10mmφであ
るが、封止樹脂リング4の体積(厚み)分の隙間が石英
ガラス3と基台2の間が生じ、この隙間を介してプラズ
マノンが封止樹脂リング4に触れ、これを劣化させる原
因になっている。
Figure 2 is an enlarged view of the sealed part (section A in the figure) with the sealing resin ring of the plasma generator shown in Figure 1. A quartz glass 3 having a bottom surface is fastened with a sealing resin ring 4 interposed therebetween. The diameter of the ring 4 is generally 5 to 10 mmφ, but a gap corresponding to the volume (thickness) of the sealing resin ring 4 is created between the quartz glass 3 and the base 2, and the plasma non-contains the sealing resin through this gap. It touches ring 4 and causes it to deteriorate.

第3図は第2図と同様の部分を、本発明に従い改良した
装置を示す。基台2′と石英ガラス3′のプラズマ室(
図の左側)から封止樹脂リング4までの間に、凹凸部を
設けてプラズマノンが封止樹脂リング4に到達するのを
困難にされている。
FIG. 3 shows a device similar to that in FIG. 2 but improved in accordance with the present invention. Base 2' and quartz glass 3' plasma chamber (
An uneven portion is provided between the left side of the figure and the sealing resin ring 4 to make it difficult for plasma particles to reach the sealing resin ring 4.

プラズマノンに対する物理的障害の形式や数は、第3図
の例に限られないことは明らかである。
It is clear that the type and number of physical obstacles to plasmanon are not limited to the example shown in FIG.

本発明によれば、従来のプラズマアッシング装置の場合
と比べて発塵が減少し、半導体の汚染が防止される。
According to the present invention, dust generation is reduced compared to conventional plasma ashing equipment, and semiconductor contamination is prevented.

なお、本発明は各種のプラズマ発生装置に適用できるこ
とは明らかである。
Note that it is clear that the present invention can be applied to various plasma generation devices.

〔発明の効果〕〔Effect of the invention〕

本発明の半導体製造装置では、プラズマ室の気密封止用
リングがプラズマノンにさらされて劣化し、発塵するこ
とが防止され、半導体の品質向上に寄与する。
In the semiconductor manufacturing apparatus of the present invention, the hermetic sealing ring of the plasma chamber is prevented from deteriorating and generating dust due to exposure to plasma, contributing to improving the quality of semiconductors.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はプラズマ発生装置の模式図、第2図は従来の気
密封止構造を示す図、第3図は本発明による気密封止構
造を示す図である。 1・・・プラズマ室、  2・・・基台、3・・・石英
ガラス、  4・・・封止樹脂リング、5・・・電極、
     6・・・高周波電源、7・・・試料台、  
   8・・・ウェーハ。 アッシング装置 第 1川 封止部 第20 封止部 畠 3田
FIG. 1 is a schematic diagram of a plasma generator, FIG. 2 is a diagram showing a conventional hermetic sealing structure, and FIG. 3 is a diagram showing an hermetic sealing structure according to the present invention. DESCRIPTION OF SYMBOLS 1... Plasma chamber, 2... Base, 3... Quartz glass, 4... Sealing resin ring, 5... Electrode,
6... High frequency power supply, 7... Sample stage,
8...Wafer. Ashing equipment No. 1 River sealing section No. 20 Sealing section Hatake Mita

Claims (1)

【特許請求の範囲】[Claims] 1.プラズマ室を封止樹脂リングで気密封止した半導体
製造装置において、プラズマ室と封止樹脂リングの間に
プラズマによる封止樹脂リングの劣化を防止するための
物理的障害を設けたことを特徴とする半導体製造装置。
1. In semiconductor manufacturing equipment in which a plasma chamber is hermetically sealed with a sealing resin ring, a physical barrier is provided between the plasma chamber and the sealing resin ring to prevent deterioration of the sealing resin ring due to plasma. semiconductor manufacturing equipment.
JP3235390A 1990-02-15 1990-02-15 Device for producing semiconductor Pending JPH03240979A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3235390A JPH03240979A (en) 1990-02-15 1990-02-15 Device for producing semiconductor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3235390A JPH03240979A (en) 1990-02-15 1990-02-15 Device for producing semiconductor

Publications (1)

Publication Number Publication Date
JPH03240979A true JPH03240979A (en) 1991-10-28

Family

ID=12356598

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3235390A Pending JPH03240979A (en) 1990-02-15 1990-02-15 Device for producing semiconductor

Country Status (1)

Country Link
JP (1) JPH03240979A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006194303A (en) * 2005-01-12 2006-07-27 Nok Corp Plasma resisting seal
EP1531288A3 (en) * 2003-11-12 2008-02-13 Nissan Motor Co., Ltd. Power transmission device having a torque converter with a lockup clutch and lockup control method for torque converter
US9020718B2 (en) 2005-06-29 2015-04-28 Nissan Motor Co., Ltd. Engaging force control of lockup clutch

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1531288A3 (en) * 2003-11-12 2008-02-13 Nissan Motor Co., Ltd. Power transmission device having a torque converter with a lockup clutch and lockup control method for torque converter
JP2006194303A (en) * 2005-01-12 2006-07-27 Nok Corp Plasma resisting seal
US9020718B2 (en) 2005-06-29 2015-04-28 Nissan Motor Co., Ltd. Engaging force control of lockup clutch

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