JPH03240979A - Device for producing semiconductor - Google Patents
Device for producing semiconductorInfo
- Publication number
- JPH03240979A JPH03240979A JP3235390A JP3235390A JPH03240979A JP H03240979 A JPH03240979 A JP H03240979A JP 3235390 A JP3235390 A JP 3235390A JP 3235390 A JP3235390 A JP 3235390A JP H03240979 A JPH03240979 A JP H03240979A
- Authority
- JP
- Japan
- Prior art keywords
- ring
- sealing resin
- plasma
- plasma chamber
- resin ring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 14
- 238000007789 sealing Methods 0.000 claims abstract description 26
- 229920005989 resin Polymers 0.000 claims abstract description 22
- 239000011347 resin Substances 0.000 claims abstract description 22
- 230000006866 deterioration Effects 0.000 claims abstract description 4
- 238000004519 manufacturing process Methods 0.000 claims description 9
- 230000004888 barrier function Effects 0.000 claims description 4
- 239000000428 dust Substances 0.000 abstract description 7
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract description 6
- 230000000630 rising effect Effects 0.000 abstract 1
- 238000004380 ashing Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 230000002542 deteriorative effect Effects 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 230000003749 cleanliness Effects 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 229920002050 silicone resin Polymers 0.000 description 1
Landscapes
- ing And Chemical Polishing (AREA)
Abstract
Description
【発明の詳細な説明】
〔概 要〕
プラズマ発生装置に関し、
プラズマによる封止樹脂リングの劣化を防止することを
目的として、
プラズマ室と封止樹脂リングとの間に物理的障害を設け
るように構成する。[Detailed Description of the Invention] [Summary] Regarding a plasma generator, a physical barrier is provided between the plasma chamber and the sealing resin ring in order to prevent the sealing resin ring from deteriorating due to plasma. Configure.
本発明は半導体製造装置(:係り、とりわけ酸素プラズ
マなどのプラズマ室を有する半導体製造装〔従来の技術
〕
従来のプラズマ発生装置の1例を第2図に示す。The present invention relates to a semiconductor manufacturing apparatus (particularly, a semiconductor manufacturing apparatus having a plasma chamber for oxygen plasma, etc. [Prior Art]) An example of a conventional plasma generating apparatus is shown in FIG.
このプラズマ発生装置はレジストのアッシング装置であ
るが、プラズマ室1は基台2と石英ガラス3により画成
され、基台2と石英ガラス3の間はパイトン(商品名)
又はシリコーンなどの樹脂製の封止樹脂リング4を用い
て気密封止されている。This plasma generator is a resist ashing device, and the plasma chamber 1 is defined by a base 2 and quartz glass 3.
Alternatively, it is hermetically sealed using a sealing resin ring 4 made of resin such as silicone.
5は電極、6は高周波電源、7は試料台、8は被処理ウ
ェーハである。5 is an electrode, 6 is a high frequency power source, 7 is a sample stage, and 8 is a wafer to be processed.
近年の半導体製造工程においては微細パターンの懲戒が
要求され、その為クリーン度を向上させる必要がある。In recent semiconductor manufacturing processes, fine patterning is required, and therefore it is necessary to improve the cleanliness.
ところが、プラズマノンにさらされる封止樹脂リングの
パイトンやシリコーン樹脂が劣化し、発塵の原因となっ
ている。従来のプラズマ雰囲気ガスはハロゲン系であり
、これに対しては対策が構じられていたが、第1図の如
きアッソング装置ては酸素プラズマが用いられ、従来の
プラズマ発生装置はこれに対する対策が十分でないため
発塵が避けられtヨいようである。However, the pyton and silicone resin of the sealing resin ring exposed to plasma non-container deteriorates, causing dust generation. Conventional plasma atmosphere gases are halogen-based, and countermeasures have been taken to prevent this, but oxygen plasma is used in the assong device shown in Figure 1, and conventional plasma generators have no countermeasures against this. It seems that dust generation cannot be avoided because the amount is not sufficient.
本発明は、上記目的を達成するために、プラズマ室を封
止樹脂リングで気密封止した半導体製造装置において、
プラズマ室と封止樹脂リングの間にプラズマによる封止
樹脂リングの劣化を防止するための物理的障害を設けた
ことを特徴とする半導体製造装置を提供する。In order to achieve the above object, the present invention provides a semiconductor manufacturing apparatus in which a plasma chamber is hermetically sealed with a sealing resin ring.
Provided is a semiconductor manufacturing apparatus characterized in that a physical barrier is provided between a plasma chamber and a sealing resin ring to prevent deterioration of the sealing resin ring due to plasma.
プラズマ室と封止樹脂リングの間に物理的障害を設ける
ことにより、プラズマノンに封止樹脂リングがさらされ
にくくなり、発塵が減少する。By providing a physical barrier between the plasma chamber and the sealing resin ring, the sealing resin ring is less likely to be exposed to plasma particles, and dust generation is reduced.
第2図は第1図のプラズマ発生装置の封止樹脂リングに
よる封止部分(図中のA部)を拡大したもので、基本的
に平坦な基台2上にこれまで基本的に平坦な底面を有す
る石英ガラス3が封止樹脂リング4を介して締め付けら
れている。リング4の直径は一般に5〜10mmφであ
るが、封止樹脂リング4の体積(厚み)分の隙間が石英
ガラス3と基台2の間が生じ、この隙間を介してプラズ
マノンが封止樹脂リング4に触れ、これを劣化させる原
因になっている。Figure 2 is an enlarged view of the sealed part (section A in the figure) with the sealing resin ring of the plasma generator shown in Figure 1. A quartz glass 3 having a bottom surface is fastened with a sealing resin ring 4 interposed therebetween. The diameter of the ring 4 is generally 5 to 10 mmφ, but a gap corresponding to the volume (thickness) of the sealing resin ring 4 is created between the quartz glass 3 and the base 2, and the plasma non-contains the sealing resin through this gap. It touches ring 4 and causes it to deteriorate.
第3図は第2図と同様の部分を、本発明に従い改良した
装置を示す。基台2′と石英ガラス3′のプラズマ室(
図の左側)から封止樹脂リング4までの間に、凹凸部を
設けてプラズマノンが封止樹脂リング4に到達するのを
困難にされている。FIG. 3 shows a device similar to that in FIG. 2 but improved in accordance with the present invention. Base 2' and quartz glass 3' plasma chamber (
An uneven portion is provided between the left side of the figure and the sealing resin ring 4 to make it difficult for plasma particles to reach the sealing resin ring 4.
プラズマノンに対する物理的障害の形式や数は、第3図
の例に限られないことは明らかである。It is clear that the type and number of physical obstacles to plasmanon are not limited to the example shown in FIG.
本発明によれば、従来のプラズマアッシング装置の場合
と比べて発塵が減少し、半導体の汚染が防止される。According to the present invention, dust generation is reduced compared to conventional plasma ashing equipment, and semiconductor contamination is prevented.
なお、本発明は各種のプラズマ発生装置に適用できるこ
とは明らかである。Note that it is clear that the present invention can be applied to various plasma generation devices.
本発明の半導体製造装置では、プラズマ室の気密封止用
リングがプラズマノンにさらされて劣化し、発塵するこ
とが防止され、半導体の品質向上に寄与する。In the semiconductor manufacturing apparatus of the present invention, the hermetic sealing ring of the plasma chamber is prevented from deteriorating and generating dust due to exposure to plasma, contributing to improving the quality of semiconductors.
第1図はプラズマ発生装置の模式図、第2図は従来の気
密封止構造を示す図、第3図は本発明による気密封止構
造を示す図である。
1・・・プラズマ室、 2・・・基台、3・・・石英
ガラス、 4・・・封止樹脂リング、5・・・電極、
6・・・高周波電源、7・・・試料台、
8・・・ウェーハ。
アッシング装置
第 1川
封止部
第20
封止部
畠 3田FIG. 1 is a schematic diagram of a plasma generator, FIG. 2 is a diagram showing a conventional hermetic sealing structure, and FIG. 3 is a diagram showing an hermetic sealing structure according to the present invention. DESCRIPTION OF SYMBOLS 1... Plasma chamber, 2... Base, 3... Quartz glass, 4... Sealing resin ring, 5... Electrode,
6... High frequency power supply, 7... Sample stage,
8...Wafer. Ashing equipment No. 1 River sealing section No. 20 Sealing section Hatake Mita
Claims (1)
製造装置において、プラズマ室と封止樹脂リングの間に
プラズマによる封止樹脂リングの劣化を防止するための
物理的障害を設けたことを特徴とする半導体製造装置。1. In semiconductor manufacturing equipment in which a plasma chamber is hermetically sealed with a sealing resin ring, a physical barrier is provided between the plasma chamber and the sealing resin ring to prevent deterioration of the sealing resin ring due to plasma. semiconductor manufacturing equipment.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3235390A JPH03240979A (en) | 1990-02-15 | 1990-02-15 | Device for producing semiconductor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3235390A JPH03240979A (en) | 1990-02-15 | 1990-02-15 | Device for producing semiconductor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH03240979A true JPH03240979A (en) | 1991-10-28 |
Family
ID=12356598
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3235390A Pending JPH03240979A (en) | 1990-02-15 | 1990-02-15 | Device for producing semiconductor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH03240979A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006194303A (en) * | 2005-01-12 | 2006-07-27 | Nok Corp | Plasma resisting seal |
EP1531288A3 (en) * | 2003-11-12 | 2008-02-13 | Nissan Motor Co., Ltd. | Power transmission device having a torque converter with a lockup clutch and lockup control method for torque converter |
US9020718B2 (en) | 2005-06-29 | 2015-04-28 | Nissan Motor Co., Ltd. | Engaging force control of lockup clutch |
-
1990
- 1990-02-15 JP JP3235390A patent/JPH03240979A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1531288A3 (en) * | 2003-11-12 | 2008-02-13 | Nissan Motor Co., Ltd. | Power transmission device having a torque converter with a lockup clutch and lockup control method for torque converter |
JP2006194303A (en) * | 2005-01-12 | 2006-07-27 | Nok Corp | Plasma resisting seal |
US9020718B2 (en) | 2005-06-29 | 2015-04-28 | Nissan Motor Co., Ltd. | Engaging force control of lockup clutch |
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