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HK1019930A1 - Assembly and method for testing integrated circuit devices - Google Patents

Assembly and method for testing integrated circuit devices Download PDF

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Publication number
HK1019930A1
HK1019930A1 HK99105055A HK99105055A HK1019930A1 HK 1019930 A1 HK1019930 A1 HK 1019930A1 HK 99105055 A HK99105055 A HK 99105055A HK 99105055 A HK99105055 A HK 99105055A HK 1019930 A1 HK1019930 A1 HK 1019930A1
Authority
HK
Hong Kong
Prior art keywords
signal
test
terminals
integrated circuit
pulse
Prior art date
Application number
HK99105055A
Other languages
English (en)
Chinese (zh)
Other versions
HK1019930B (en
Inventor
T‧L‧豪林
Original Assignee
艾利森电话股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 艾利森电话股份有限公司 filed Critical 艾利森电话股份有限公司
Publication of HK1019930A1 publication Critical patent/HK1019930A1/xx
Publication of HK1019930B publication Critical patent/HK1019930B/xx

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/24—Accessing extra cells, e.g. dummy cells or redundant cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
HK99105055.3A 1996-02-06 1997-01-17 Assembly and method for testing integrated circuit devices HK1019930B (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US59597996A 1996-02-06 1996-02-06
US08/595,979 1996-02-06
PCT/SE1997/000068 WO1997029384A1 (en) 1996-02-06 1997-01-17 Assembly and method for testing integrated circuit devices

Publications (2)

Publication Number Publication Date
HK1019930A1 true HK1019930A1 (en) 2000-03-03
HK1019930B HK1019930B (en) 2003-01-17

Family

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Also Published As

Publication number Publication date
ATE433121T1 (de) 2009-06-15
CN1084878C (zh) 2002-05-15
AU1678697A (en) 1997-08-28
DE69739438D1 (de) 2009-07-16
CN1217062A (zh) 1999-05-19
CA2245549A1 (en) 1997-08-14
CA2245549C (en) 2003-04-08
US5996102A (en) 1999-11-30
JP2000504830A (ja) 2000-04-18
KR19990082339A (ko) 1999-11-25
EP0882239A1 (en) 1998-12-09
WO1997029384A1 (en) 1997-08-14
EP0882239B1 (en) 2009-06-03

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Legal Events

Date Code Title Description
PF Patent in force
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20070117