DK521988D0 - Fremgangsmaade til udvaelgelse af en kodelaengde og en intensitet af et testsignal - Google Patents

Fremgangsmaade til udvaelgelse af en kodelaengde og en intensitet af et testsignal

Info

Publication number: DK521988D0
Authority: DK; Denmark
Prior art keywords: intensity; selecting; procedure; test signal; code length
Prior art date: 1987-01-21

Application number

DK521988A

Other languages

Danish (da)

English (en)

Other versions

DK521988A (da

Inventor

Moshe Nazarathy

Steven A Newton

Scott Haines Foster

Original Assignee

Hewlett Packard Co

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1987-01-21

Filing date

1988-09-20

Publication date

1988-09-20

1988-09-20 Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co

1988-09-20 Publication of DK521988D0 publication Critical patent/DK521988D0/da

1988-09-20 Publication of DK521988A publication Critical patent/DK521988A/da

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
- G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
- G01M11/3109—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR
- G01M11/3118—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR using coded light-pulse sequences

Landscapes

Physics & Mathematics (AREA)
Optics & Photonics (AREA)
Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
General Physics & Mathematics (AREA)
Testing Of Optical Devices Or Fibers (AREA)

DK521988A 1987-01-21 1988-09-20 Fremgangsmaade til udvaelgelse af en kodelaengde og en intensitet af et testsignal DK521988A (da)

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
US07/005,993 US4812038A (en)	1987-01-21	1987-01-21	Adaptive selection of OTDR test parameters and the fusion of data taken from successively shrinking measurement spans
PCT/US1988/000169 WO1988005531A1 (en)	1987-01-21	1988-01-21	Otdr testing of optical fiber

Publications (2)

Publication Number	Publication Date
DK521988D0 true DK521988D0 (da)	1988-09-20
DK521988A DK521988A (da)	1988-09-20

Family

ID=21718747

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
DK521988A DK521988A (da)	1987-01-21	1988-09-20	Fremgangsmaade til udvaelgelse af en kodelaengde og en intensitet af et testsignal

Country Status (6)

Country	Link
US (1)	US4812038A (zh)
EP (1)	EP0298118B1 (zh)
JP (1)	JP2674817B2 (zh)
DE (1)	DE3871257D1 (zh)
DK (1)	DK521988A (zh)
WO (1)	WO1988005531A1 (zh)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPH01169408A (ja) *	1987-12-21	1989-07-04	Fujikura Ltd	シングルモード光ファイバ接続部の判定法
US4958926A (en) *	1988-10-31	1990-09-25	Reliance Comm/Tec Corporation	Closed loop control system for laser
US4928232A (en) *	1988-12-16	1990-05-22	Laser Precision Corporation	Signal averaging for optical time domain relectometers
EP0379609B1 (en) *	1989-01-24	1993-07-28	Hewlett-Packard GmbH	Method and apparatus for performing optical time domain reflectometry
US5155439A (en) *	1989-12-12	1992-10-13	Tektronix, Inc.	Method of detecting and characterizing anomalies in a propagative medium
US5069544A (en) *	1990-04-12	1991-12-03	Minnesota Mining And Manufacturing Company	Adaptive pulse width optical fault finder
JP2977091B2 (ja) *	1990-09-28	1999-11-10	安藤電気株式会社	ヘテロダイン受光を用いた光パルス試験器
US5353110A (en) *	1991-07-12	1994-10-04	Tektronix, Inc.	Method and apparatus for carrying out optical time domain reflectometry using weighing techniques
US5485264A (en) *	1993-12-14	1996-01-16	Antel Optronics, Inc.	High dynamic range OTDR data acquisition circuit
US5465143A (en) *	1994-01-27	1995-11-07	Antel Optronics Inc.	ADP switch and adjustable data acquisition window
US5552881A (en) *	1994-03-17	1996-09-03	Teradyne, Inc.	Method and apparatus for scanning a fiber optic network
US5491548A (en) *	1994-03-18	1996-02-13	Tektronix, Inc.	Optical signal measurement instrument and wide dynamic range optical receiver for use therein
US5528356A (en) *	1995-03-20	1996-06-18	Tektronix, Inc.	Apparatus and method for displaying multiple sample spacing waveform segments
DE19631423B4 (de) *	1996-08-06	2005-11-03	Forschungszentrum Karlsruhe Gmbh	Verfahren zum ortsaufgelösten Substanznachweis
JPH10111212A (ja) *	1996-10-09	1998-04-28	Ando Electric Co Ltd	光パルス試験器
JP4179537B2 (ja) *	2000-11-17	2008-11-12	レクロイコーポレイション	デジタルオシロスコープまたは同様の機器におけるデータ処理のための処理ウエッブエディタ
US8237921B2 (en) *	2006-07-03	2012-08-07	Anritsu Corporation	Optical time domain reflectometer and method for testing optical fiber using optical pulse
US8077314B2 (en)	2007-10-15	2011-12-13	Schlumberger Technology Corporation	Measuring a characteristic of a multimode optical fiber
US8654320B2 (en) *	2008-06-02	2014-02-18	Sumitomo Electric Industries, Ltd.	Beam Path Monitoring Device and Beam Path Monitoring System
DE102008044317B4 (de) *	2008-12-03	2011-02-10	Universität Potsdam	Vorrichtung und Verfahren zur Konzentrationsbestimmung von Sauerstoff
CN101917226B (zh) *	2010-08-23	2016-03-02	中兴通讯股份有限公司	一种在无源光网络中进行光纤故障诊断的方法及光线路终端
US9752955B2 (en) *	2014-07-31	2017-09-05	Ii-Vi Incorporated	Edge propagating optical time domain reflectometer and method of using the same
US9341543B2 (en)	2014-10-16	2016-05-17	Texas Instruments Incorporated	Method and OTDR apparatus for optical cable defect location with reduced memory requirement
KR20160112079A (ko) *	2015-03-17	2016-09-28	한국전자통신연구원	광분배망에서의 광선로 검사 방법 및 그에 따른 검사 장치
US10101240B1 (en)	2017-04-27	2018-10-16	Viavi Solutions France SAS	Optical time-domain reflectometer device including combined trace display

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4158505A (en) *	1976-12-27	1979-06-19	International Business Machines Corporation	Spectrum analyzing system with photodiode array
DK538681A (da) *	1981-12-07	1983-07-29	Re Instr As	Apparat til maaling af lyslederes transmissionsegenskaber

1987
- 1987-01-21 US US07/005,993 patent/US4812038A/en not_active Expired - Lifetime
1988
- 1988-01-21 DE DE8888901977T patent/DE3871257D1/de not_active Expired - Lifetime
- 1988-01-21 EP EP88901977A patent/EP0298118B1/en not_active Expired - Lifetime
- 1988-01-21 JP JP63501882A patent/JP2674817B2/ja not_active Expired - Lifetime
- 1988-01-21 WO PCT/US1988/000169 patent/WO1988005531A1/en active IP Right Grant
- 1988-09-20 DK DK521988A patent/DK521988A/da not_active Application Discontinuation

Also Published As

Publication number	Publication date
JP2674817B2 (ja)	1997-11-12
DE3871257T (zh)	1992-06-25
US4812038A (en)	1989-03-14
EP0298118A1 (en)	1989-01-11
JPH01501970A (ja)	1989-07-06
DK521988A (da)	1988-09-20
DE3871257D1 (de)	1992-06-25
EP0298118B1 (en)	1992-05-20
WO1988005531A1 (en)	1988-07-28

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Legal Events

Date	Code	Title	Description
1999-04-26	AHS	Application shelved for other reasons than non-payment