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CN118841490A - Mip packaging method - Google Patents

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Publication number
CN118841490A
CN118841490A CN202410800014.5A CN202410800014A CN118841490A CN 118841490 A CN118841490 A CN 118841490A CN 202410800014 A CN202410800014 A CN 202410800014A CN 118841490 A CN118841490 A CN 118841490A
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tape
packaging
bonding
discrete
blue film
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龚文
梅雄
李卫
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Suzhou Kinglight Optoelectronics Co ltd
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Suzhou Kinglight Optoelectronics Co ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/20Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

本发明公开了一种Mip封装方法,分立器件进行检测包装工序包括如下步骤:将上述分立器件粘接在UV胶带上后进行热压;将上述分立器件与上述第一高温胶带分离;对上述UV胶带进行解胶;将上述分立器件粘接在第一蓝膜上后进行热压;将上述分立器件与上述UV胶带分离;对上述分立器件的引脚面进行点测,检测出合格器件和不合格器件;将不合格器件从上述分立器件移除;将合格器件粘接在第二蓝膜上后进行热压;将合格器件与上述第一蓝膜分离;在合格器件背离上述第二蓝膜的一侧贴上离型纸。本发明工艺流程简化、可靠性更有保障、重资产投入少且辅料成本低,简化了Mip封装工艺,降低了Mip封装成本,提高了Mip封装可靠性。

The present invention discloses a Mip packaging method, and the discrete device detection and packaging process includes the following steps: hot pressing after bonding the discrete device to UV tape; separating the discrete device from the first high-temperature tape; debonding the UV tape; hot pressing after bonding the discrete device to the first blue film; separating the discrete device from the UV tape; spot testing the pin surface of the discrete device to detect qualified devices and unqualified devices; removing unqualified devices from the discrete device; hot pressing after bonding the qualified device to the second blue film; separating the qualified device from the first blue film; and pasting release paper on the side of the qualified device away from the second blue film. The present invention has a simplified process flow, more guaranteed reliability, less heavy asset investment and low auxiliary material cost, simplifies the Mip packaging process, reduces the Mip packaging cost, and improves the Mip packaging reliability.

Description

一种Mip封装方法A Mip encapsulation method

技术领域Technical Field

本发明涉及半导体技术领域,尤其是涉及一种Mip封装方法。The present invention relates to the field of semiconductor technology, and in particular to a Mip packaging method.

背景技术Background Art

在MLED显示应用中,COB和Mip两个技术的诞生时间相差10年左右。不过,2023年以来Mip已经形成与COB鼎足之势。从技术底层框架看,COB是一种芯片级封装技术,LED晶体被封装成数百个乃至更多像素点的cel l结构。Mip技术则更倾向于独立RGB像素封装,或仅有个位数RGB像素的独立封装结构。In MLED display applications, the birth time of COB and Mip technologies differs by about 10 years. However, since 2023, Mip has formed a three-way competition with COB. From the perspective of the underlying technical framework, COB is a chip-level packaging technology, in which LED crystals are packaged into a cell structure with hundreds or even more pixels. Mip technology is more inclined to independent RGB pixel packaging, or an independent packaging structure with only single-digit RGB pixels.

目前Mip产品在显示效果上表现突出,但成本和工艺流程方面与COB对比没有明显优势,现有技术中的Mip封装方法主要包括如下步骤:刷锡(在PCB基板的焊盘位置刷锡膏)→SPI检(锡膏印刷检测)→固晶(发光芯片装贴于PCB基板上)→过回流焊(发光芯片与PCB基板焊接)→AOI检(自动光学检测)→剔晶(剔除不合格芯片)→清洗(去除助焊剂)→除湿→PLSMA清洗(等离子清洗)→模造(在发光芯片的出光侧封装透明层形成封装模块)→过塑裁剪(在封装模块的出光面贴附第一高温胶带并进行热压,再用美工刀片将过好的材料分割成片)→贴板(制作珐琅盘,将第一高温胶带的非粘接面贴附在珐琅盘的第二高温胶带上,将珐琅盘翻转过来,用橡胶软板在防静电工作台上进行刮板)→切割(将封装模块分割为多个分立器件)→第一高温胶带与第二高温胶带分离→除湿→外观检→剥料(将分立器件从第一高温胶带)→清洗(酒精和防静电液混合对分立器件进行清洗)→风干(离子机对分立器件进行风干)→除湿→分光(对分立器件的光电参数进行快速测试,分光分色)→拌料→除湿→编带(将分立器件封装在带状载体上)→除湿→包装(将封装有分立器件的卷盘装载体放入铝箔袋,两盘一袋抽真空封口)。其中,从刷锡步骤至模造步骤属于封装工序,从过塑步骤至外观检步骤属于切割工序,从剥料步骤至包装步骤属于检测包装工序。At present, Mip products have outstanding performance in display effect, but have no obvious advantages over COB in terms of cost and process flow. The Mip packaging method in the existing technology mainly includes the following steps: tin brushing (brushing solder paste on the pad position of the PCB substrate) → SPI inspection (solder paste printing inspection) → solid crystal (light-emitting chip is mounted on the PCB substrate) → reflow soldering (light-emitting chip is welded to the PCB substrate) → AOI inspection (automatic optical inspection) → crystal removal (removing unqualified chips) → cleaning (removing flux) → dehumidification → PLSMA cleaning (plasma cleaning) → molding (encapsulating the transparent layer on the light-emitting side of the light-emitting chip to form a packaging module) → laminating and cutting (attaching the first high-temperature tape to the light-emitting surface of the packaging module and hot pressing, and then using a utility knife to cut the good material into pieces )→board pasting (making enamel disc, attach the non-adhesive surface of the first high-temperature tape to the second high-temperature tape of the enamel disc, turn the enamel disc over, and use a rubber soft board to scrape it on the anti-static workbench)→cutting (divide the package module into multiple discrete devices)→separate the first high-temperature tape from the second high-temperature tape→dehumidification→appearance inspection→stripping (separate the discrete devices from the first high-temperature tape)→cleaning (mix the discrete devices with alcohol and anti-static liquid)→air drying (use an ion machine to air dry the discrete devices)→dehumidification→spectroscopy (rapidly test the optoelectronic parameters of the discrete devices, spectroscopic separation)→mixing→dehumidification→taping (encapsulate the discrete devices on a strip carrier)→dehumidification→packaging (put the reel carrier encapsulated with discrete devices into an aluminum foil bag, and vacuum seal two reels in one bag). Among them, the steps from tinning to molding belong to the packaging process, the steps from laminating to appearance inspection belong to the cutting process, and the steps from stripping to packaging belong to the inspection and packaging process.

上述检测包装工序存在如下缺陷:①工艺流程复杂:工序过多、流转时间长及实施自动化难度大;②气密性风险大:过程多次浸泡液体中,除湿不彻底或制程管控不足,容易造成材料吸湿,导致气密性问题;另外除湿次数过多,影响材料可靠性和亮度;③分编效率低和重资产投入大:分光、编带一组设备约20W左右,分光UPH约20K/H,编带UPH约30K/H,基本3台分光机配套2台编带机,月产能1000KK需匹配分光机约77台、编带机约50台,投入后段设备成本约1200W。④辅料成本高:盖膜、载带、转盘、铝箔袋等,均摊到材料上成本约0.5元/K。The above-mentioned inspection and packaging process has the following defects: ① Complex process flow: too many processes, long circulation time and difficulty in implementing automation; ② High risk of airtightness: The process is immersed in liquid many times, dehumidification is not thorough or process control is insufficient, which easily causes the material to absorb moisture and lead to airtightness problems; in addition, too many dehumidification times affect the reliability and brightness of the material; ③ Low efficiency of sorting and weaving and heavy asset investment: a set of equipment for spectrometry and taping is about 20W, the spectrometry UPH is about 20K/H, and the taping UPH is about 30K/H. Basically, 3 spectrometers are equipped with 2 taping machines. A monthly production capacity of 1000KK requires about 77 spectrometers and about 50 taping machines, and the cost of investing in the back-end equipment is about 1200W. ④ High cost of auxiliary materials: cover film, carrier tape, turntable, aluminum foil bag, etc., the average cost of materials is about 0.5 yuan/K.

如何简化Mip封装工艺、降低Mip封装成本以及提高Mip封装可靠性是本领域技术人员亟需解决的问题。How to simplify the Mip packaging process, reduce the Mip packaging cost and improve the Mip packaging reliability are problems that technical personnel in this field need to solve urgently.

发明内容Summary of the invention

为此,本发明所要解决的技术问题在于提供一种Mip封装方法,简化Mip封装工艺、降低Mip封装成本以及提高Mip封装可靠性。Therefore, the technical problem to be solved by the present invention is to provide a Mip packaging method, simplify the Mip packaging process, reduce the Mip packaging cost and improve the Mip packaging reliability.

为了解决上述技术问题,本发明提供一种Mip封装方法,包括依次进行的如下工序:In order to solve the above technical problems, the present invention provides a Mip packaging method, comprising the following steps performed in sequence:

第一工序,制作封装模块,所述封装模块包括PCB基板、多组发光芯片以及封装层,所述发光芯片安装在所述PCB基板的正面,所述封装层设于所述发光芯片背离所述PCB基板的一侧,所述PCB基板的背面为引脚面,所述封装层背离所述发光芯片的一面为出光面;The first step is to manufacture a packaging module, wherein the packaging module comprises a PCB substrate, a plurality of light-emitting chips and a packaging layer, wherein the light-emitting chips are mounted on the front side of the PCB substrate, the packaging layer is arranged on a side of the light-emitting chips away from the PCB substrate, the back side of the PCB substrate is a pin surface, and a side of the packaging layer away from the light-emitting chips is a light-emitting surface;

第二工序,将所述封装模块切割为多个分立器件,同一所述封装模块形成的所述分立器件的出光面与第一高温胶带的粘接面贴合连接;The second step is to cut the packaging module into a plurality of discrete devices, and to bond the light-emitting surfaces of the discrete devices formed by the same packaging module to the bonding surface of the first high-temperature adhesive tape;

第三工序,对所述分立器件进行检测和包装,所述第三工序包括如下步骤:The third process is to test and package the discrete devices, and the third process includes the following steps:

(303)将所述分立器件粘接在UV胶带上后进行热压,所述分立器件的引脚面与所述UV胶带的粘接面贴合;(303) bonding the discrete device to the UV tape and then performing heat pressing, so that the pin surface of the discrete device is in contact with the bonding surface of the UV tape;

(304)将所述分立器件与所述第一高温胶带分离;(304) separating the discrete device from the first high temperature tape;

(303)对所述UV胶带进行解胶;(303) debonding the UV tape;

(304)将所述分立器件粘接在第一蓝膜上后进行热压,所述分立器件的出光面与所述第一蓝膜的粘接面贴合;(304) bonding the discrete device to the first blue film and then performing heat pressing, so that the light emitting surface of the discrete device is in contact with the bonding surface of the first blue film;

(305)将所述分立器件与所述UV胶带分离;(305) separating the discrete device from the UV tape;

(306)对所述分立器件的引脚面进行点测,检测出合格器件和不合格器件;(306) performing spot testing on the pin surface of the discrete device to detect qualified devices and unqualified devices;

(307)将不合格器件从所述分立器件移除;(307) removing defective devices from the discrete device;

(308)将合格器件粘接在第二蓝膜上后进行热压,所述合格器件的引脚面与所述第二蓝膜的粘接面贴合;(308) bonding the qualified device to the second blue film and then performing heat pressing, so that the pin surface of the qualified device is in contact with the bonding surface of the second blue film;

(309)将合格器件与所述第一蓝膜分离;(309) separating qualified devices from the first blue film;

(310)在合格器件背离所述第二蓝膜的一侧贴上离型纸,所述第二蓝膜的粘接面与所述离型纸边缘贴合。(310) A release paper is pasted on the side of the qualified device facing away from the second blue film, and the adhesive surface of the second blue film is in contact with the edge of the release paper.

进一步地,步骤(301)中,先将UV胶带的粘接面朝上地放置于载台上,再将分立器件的引脚面朝下地贴在UV胶带的粘接面上,之后通过过塑机将分立器件和UV胶带热压在一起。Furthermore, in step (301), the UV tape is first placed on the carrier with the adhesive surface facing upward, and then the pin surface of the discrete device is attached to the adhesive surface of the UV tape with the pin surface facing downward, and then the discrete device and the UV tape are heat-pressed together by a laminator.

进一步地,步骤(303)中,通过UV解胶机对所述UV胶带进行解胶,在解胶时,将一透光压板压在所述UV胶带的非粘接面上。Furthermore, in step (303), the UV tape is debonded by a UV debonding machine, and during the debonding process, a light-transmitting pressing plate is pressed on the non-adhesive surface of the UV tape.

进一步地,步骤(304)中,先将所述第一蓝膜的粘接面朝上的放在承载盘上,再将所述分立器件贴合在所述第一蓝膜的粘接面上,之后通过翻膜机将所述分立器件和所述第一蓝膜热压在一起。Furthermore, in step (304), the first blue film is first placed on a carrier plate with the adhesive surface facing upward, and then the discrete device is attached to the adhesive surface of the first blue film, and then the discrete device and the first blue film are heat-pressed together by a film turning machine.

进一步地,步骤(306)中,通过点测设备对所述分立器件的引脚面进行自动定位扫描,然后测试光电参数标记出合格器件和不合格器件,并输出合格器件和不合格器件的坐标。Furthermore, in step (306), the pin surface of the discrete device is automatically positioned and scanned by a point measuring device, and then the photoelectric parameters are tested to mark qualified devices and unqualified devices, and the coordinates of the qualified devices and unqualified devices are output.

进一步地,步骤(307)中,先通过涂胶设备对所述分立器件进行自动定位扫描,根据不合格器件坐标在不合格器件上点UV胶水,再将所述承载盘放置在透光载具上,之后将透光上载具压在分立器件的引脚面上,接着通过UV解胶机对所述UV胶水进行紫外光照射固化,接着移开所述透光上载具并带走与所述透光上载具粘接的不合格器件,最后将所述透光上载具上的不合格器件移除。Furthermore, in step (307), the discrete device is first automatically positioned and scanned by a glue coating device, UV glue is applied to the unqualified device according to the coordinates of the unqualified device, and then the carrier plate is placed on a light-transmitting carrier. After that, the light-transmitting upper carrier is pressed onto the pin surface of the discrete device, and then the UV glue is cured by ultraviolet light by a UV glue dissolving machine. Then, the light-transmitting upper carrier is removed and the unqualified device bonded to the light-transmitting upper carrier is taken away, and finally, the unqualified device on the light-transmitting upper carrier is removed.

进一步地,步骤(308)中,先将第二蓝膜的粘接面朝上的放置于承载盘上,再将合格器件的引脚面朝下的贴在第二蓝膜的粘接面上,之后通过翻膜机将所述分立器件、所述第二蓝膜热压在一起。Furthermore, in step (308), the second blue film is first placed on the carrier plate with the adhesive surface facing upward, and then the qualified device is attached to the adhesive surface of the second blue film with the pin surface facing downward, and then the discrete device and the second blue film are heat-pressed together by a film turning machine.

进一步地,所述第一工序包括如下步骤:Furthermore, the first process comprises the following steps:

(101)在PCB基板正面的焊盘位置印刷锡膏;(101) printing solder paste at the pad position on the front side of the PCB substrate;

(102)对所述PCB基板上的锡膏进行检测;(102) Detecting the solder paste on the PCB substrate;

(103)将发光芯片转移到对应的焊盘上形成基板芯片组件;(103) transferring the light emitting chip to the corresponding pad to form a substrate chip assembly;

(104)对所述基板芯片组件进行焊接;(104) welding the substrate chip assembly;

(105)对所述基板芯片组件的焊接质量进行检测,检测出合格芯片和不合格芯片;(105) Testing the welding quality of the substrate chip assembly to detect qualified chips and unqualified chips;

(106)将不合格芯片从所述基板芯片组件剔除;(106) removing unqualified chips from the substrate chip assembly;

(107)通过助焊剂清洗剂对所述基板芯片组件进行清洗,去除助焊剂,再用去离子水漂洗清洗剂;(107) cleaning the substrate chip assembly with a flux cleaning agent to remove the flux, and then rinsing the cleaning agent with deionized water;

(108)对所述基板芯片组件进行烘干;(108) drying the substrate chip assembly;

(109)对所述基板芯片组件进行除湿;(109) dehumidifying the substrate chip assembly;

(110)对所述基板芯片组件进行等离子清洗;(110) performing plasma cleaning on the substrate chip assembly;

(111)对所述基板芯片组件进行模造形成封装层,制得所述封装模块。(111) The substrate chip assembly is molded to form a packaging layer to obtain the packaging module.

进一步地,所述第二工序包括如下步骤:Furthermore, the second process comprises the following steps:

(201)将多个所述封装模块粘接在同一第一高温胶带上,所述封装模块的出光面与第一高温胶带的粘接面贴合;(201) bonding a plurality of the packaging modules to the same first high-temperature adhesive tape, wherein the light-emitting surface of the packaging module is bonded to the adhesive surface of the first high-temperature adhesive tape;

(202)将不同所述封装模块之间的第一高温胶带切断形成多个粘接组件;(202) cutting the first high temperature adhesive tape between different packaging modules to form a plurality of adhesive components;

(203)将所述多个粘接组件粘接在珐琅盘的第二高温胶带上,其中,所述第一高温胶带的非粘接面与珐琅盘上第二高温胶带的粘接面贴合;(203) bonding the plurality of adhesive components to the second high temperature tape on the enamel disk, wherein the non-adhesive surface of the first high temperature tape is in contact with the adhesive surface of the second high temperature tape on the enamel disk;

(204)将各个所述封装模块分割为多个分立器件,同时第一高温胶带不被切断;(204) dividing each of the packaging modules into a plurality of discrete devices, while the first high temperature tape is not cut;

(205)将所述第一高温胶带与所述第二高温胶带分离;(205) separating the first high temperature tape from the second high temperature tape;

(206)对所述分立器件进行除湿;(206) dehumidifying the discrete device;

(207)对所述分立器件进行外观检测。(207) Performing appearance inspection on the discrete device.

进一步地,步骤(201)中,先将所述封装模块沿所述第一高温胶带的长度方向依次粘接在所述第一高温胶带上,再通过过塑机将所述封装模块与所述第一高温胶带的边缘热压在一起;步骤(203)中,先制作珐琅盘,再将多个粘接组件阵列粘接在珐琅盘的第二高温胶带粘性面上,再通过将珐琅盘翻转后用橡胶软板在防静电工作台上进行刮板使得粘接在所述第二高温胶带上。Furthermore, in step (201), the packaging module is first adhered to the first high-temperature tape in sequence along the length direction of the first high-temperature tape, and then the packaging module and the edge of the first high-temperature tape are hot-pressed together by a laminator; in step (203), an enamel disk is first made, and then a plurality of adhesive component arrays are adhered to the adhesive surface of the second high-temperature tape of the enamel disk, and then the enamel disk is turned over and scraped with a rubber soft board on an anti-static workbench to make it adhere to the second high-temperature tape.

本发明的上述技术方案相比现有技术具有以下优点:本发明中的分立器件的检测和包装工序具有如下优点:(1)工艺流程简化:工序减少,且流转时间快,同时利于自动化实施;(2)可靠性更有保障:材料浸泡和除湿次数减少,减弱对材料特性的影响,降低材料失效和使用寿命的风险;(3)重资产投入少:点测设备效率约80K/H,单头点胶设备约40K/H(不良品约1%-3%),月产能1000KK需匹配点测机20台、点胶2台,投入后段设备成本约370W;(4)辅料成本低:UV膜、蓝膜、离型纸等,均摊到材料上成本约0.2元/K。The above technical solution of the present invention has the following advantages over the prior art: The detection and packaging process of discrete devices in the present invention has the following advantages: (1) Simplified process flow: The number of processes is reduced, and the turnover time is fast, which is also conducive to automated implementation; (2) Reliability is more guaranteed: The number of times of material immersion and dehumidification is reduced, which reduces the impact on material properties and reduces the risk of material failure and service life; (3) Less heavy asset investment: The efficiency of point measuring equipment is about 80K/H, and the efficiency of single-head dispensing equipment is about 40K/H (defective products are about 1%-3%). A monthly production capacity of 1000KK requires 20 point measuring machines and 2 dispensing machines, and the cost of investing in the back-end equipment is about 370W; (4) The cost of auxiliary materials is low: UV film, blue film, release paper, etc., the average cost of materials is about 0.2 yuan/K.

附图说明BRIEF DESCRIPTION OF THE DRAWINGS

为了使本发明的内容更容易被清楚的理解,下面根据本发明的具体实施例并结合附图,对本发明作进一步详细的说明。In order to make the contents of the present invention more clearly understood, the present invention is further described in detail below based on specific embodiments of the present invention in conjunction with the accompanying drawings.

图1为本发明步骤(11)中封装模块的示意图;FIG1 is a schematic diagram of a packaging module in step (11) of the present invention;

图2为本发明步骤(12)中多个封装模块与第一高温胶带的连接示意图;FIG2 is a schematic diagram of the connection between a plurality of packaging modules and a first high temperature tape in step (12) of the present invention;

图3为本发明步骤(14)中多个粘接组件与第二高温胶带的连接示意图;FIG3 is a schematic diagram of the connection between multiple adhesive components and the second high-temperature tape in step (14) of the present invention;

图4为本发明步骤(15)中封装模块切割后的示意图;FIG4 is a schematic diagram of the packaging module after cutting in step (15) of the present invention;

图5为本发明步骤(19)中多个分立器件与UV胶带的连接示意图;FIG5 is a schematic diagram of the connection between multiple discrete devices and UV tape in step (19) of the present invention;

图6为本发明步骤(22)中多个分立器件与第一蓝膜的连接示意图;FIG6 is a schematic diagram of the connection between a plurality of discrete devices and the first blue film in step (22) of the present invention;

图7为本发明步骤(26)中多个分立器件与第二蓝膜的连接示意图;FIG7 is a schematic diagram of the connection between a plurality of discrete devices and a second blue film in step (26) of the present invention;

图8为本发明步骤(28)中多个分立器件、第二蓝膜以及离型纸的连接示意图。FIG8 is a schematic diagram of the connection between multiple discrete components, the second blue film and the release paper in step (28) of the present invention.

说明书附图标记说明:A、封装模块;B、分立器件;1、PCB基板;2、发光芯片;3、封装层;4、第一高温胶带;5、第二高温胶带;6、UV胶带;7、第一蓝膜;8、第二蓝膜;9、离型纸。Explanation of the reference numerals in the specification: A. packaging module; B. discrete device; 1. PCB substrate; 2. light-emitting chip; 3. packaging layer; 4. first high-temperature tape; 5. second high-temperature tape; 6. UV tape; 7. first blue film; 8. second blue film; 9. release paper.

具体实施方式DETAILED DESCRIPTION

下面结合附图和具体实施例对本发明作进一步说明,以使本领域的技术人员可以更好地理解本发明并能予以实施,但所举实施例不作为对本发明的限定。The present invention is further described below in conjunction with the accompanying drawings and specific embodiments so that those skilled in the art can better understand the present invention and implement it, but the embodiments are not intended to limit the present invention.

实施例一Embodiment 1

参见图1至图8所示,本发明中Mip封装方法的一个实施例。Referring to FIG. 1 to FIG. 8 , an embodiment of the Mip packaging method of the present invention is shown.

上述Mip封装方法包括依次进行的如下步骤:The above Mip encapsulation method includes the following steps performed in sequence:

(1)在PCB基板1正面的焊盘位置印刷锡膏;具体的,将焊锡膏均匀地印刷在PCB基板1上,为后续的组装工序提供焊接的依据。锡膏印刷的质量直接影响到后续组件的焊接质量。不良的锡膏印刷可能导致焊点不良、短路等严重问题;(1) Print solder paste on the pad position on the front of the PCB substrate 1; specifically, print the solder paste evenly on the PCB substrate 1 to provide a basis for soldering for subsequent assembly processes. The quality of solder paste printing directly affects the soldering quality of subsequent components. Poor solder paste printing may lead to serious problems such as poor solder joints and short circuits;

(2)对上述PCB基板1上的锡膏进行检测;具体的,通过SPI系统的检测,可以精确测量和分析印刷在PCB基板1(印刷电路板)上的锡膏量、形状、位置等关键参数;(2) Detecting the solder paste on the PCB substrate 1; specifically, through the detection of the SPI system, key parameters such as the amount, shape, and position of the solder paste printed on the PCB substrate 1 (printed circuit board) can be accurately measured and analyzed;

(3)将发光芯片2转移到对应的焊盘上得到基板芯片组件;具体的,将RGB芯片按极性分别固定在对应焊盘上;(3) Transferring the light-emitting chip 2 to the corresponding pad to obtain a substrate chip assembly; specifically, fixing the RGB chips on the corresponding pads according to polarity;

(4)对所述基板芯片组件进行过流焊;具体的,将基板芯片组件放入回流焊设备进行焊接,回流焊设备的内部有一个加热电路,将空气或氮气加热到足够高的温度后吹向已经固晶好的芯片组件上,让芯片对应极性的两侧焊料融化后与主板粘结;(4) performing overflow soldering on the substrate chip assembly; specifically, placing the substrate chip assembly into a reflow soldering device for soldering. The reflow soldering device has a heating circuit inside, which heats air or nitrogen to a sufficiently high temperature and blows it onto the chip assembly that has been crystal-bonded, so that the solder on both sides of the chip corresponding to the polarity melts and then bonds with the mainboard;

(5)对上述基板芯片组件的焊接质量进行检测,检测出合格芯片和不合格芯片;具体的,通过自动光学检测对基板芯片组件进行检测,自动光学检测是基于光学原理来对焊接生产中遇到的常见缺陷进行检测的设备。当自动检测时,机器通过摄像头自动扫描,采集图像,测试的焊点与数据库中的合格的参数进行比较,经过图像处理,检查出PCB上缺陷,并通过显示器或自动标志把缺陷显示/标示出来,供剔晶机剔除或激光光斑烧损;(5) Inspect the welding quality of the above-mentioned substrate chip assembly to detect qualified chips and unqualified chips; specifically, the substrate chip assembly is inspected by automatic optical inspection, which is a device that detects common defects encountered in welding production based on optical principles. During automatic inspection, the machine automatically scans and collects images through a camera, compares the tested solder joints with qualified parameters in the database, and checks the defects on the PCB through image processing, and displays/marks the defects through a display or automatic marking, so that the crystal removal machine can remove them or the laser spot can burn them;

(6)将不合格芯片从上述基板芯片组件剔除;(6) removing unqualified chips from the substrate chip assembly;

(7)通过助焊剂清洗剂对所述基板芯片组件进行清洗,去除助焊剂,再用去离子水漂洗清洗剂;(7) cleaning the substrate chip assembly with a flux cleaning agent to remove the flux, and then rinsing the cleaning agent with deionized water;

(8)对上述基板芯片组件进行烘干,通过烘干机对上述基板芯片组件进行烘干,使基板芯片组件表面的水分被烘干;(8) drying the substrate chip assembly by using a drying machine to dry the substrate chip assembly so that moisture on the surface of the substrate chip assembly is dried;

(9)对上述基板芯片组件进行烤干,通过烤箱对上述基板芯片组件进行除湿,使得基板芯片组件的湿气彻底去除;(9) drying the substrate chip assembly and dehumidifying the substrate chip assembly in an oven so that moisture in the substrate chip assembly is completely removed;

(10)对上述基板芯片组件进行等离子清洗;具体的通过等离子清洗机对上述基板芯片组件进行等离子清洗;等离子清洗机的原理是在真空或特定气体环境下,通过高频电磁场使气体分子电离,形成等离子体。这些等离子体与材料表面发生反应,可以去除表面的污染物,同时也可以在表面引入活性基团,提高材料的粘合性和涂层的附着力;(10) Plasma cleaning the substrate chip assembly; specifically, plasma cleaning the substrate chip assembly by a plasma cleaning machine; the principle of a plasma cleaning machine is to ionize gas molecules through a high-frequency electromagnetic field in a vacuum or specific gas environment to form plasma. These plasmas react with the surface of the material to remove surface pollutants and introduce active groups on the surface to improve the adhesion of the material and the adhesion of the coating;

(11)对上述基板芯片组件进行模造,将上述发光芯片2封装在上述PCB基板1与封装层3之间,制得封装模块A,其中上述PCB基板的背面为引脚面11,上述封装层3的外表面为出光面31;具体的,在发光芯片2背向PCB基板的一面模造一层环氧树脂,该环氧树脂固化后即为封装层3;(11) Molding the substrate chip assembly, encapsulating the light-emitting chip 2 between the PCB substrate 1 and the encapsulation layer 3, and obtaining an encapsulation module A, wherein the back surface of the PCB substrate is the pin surface 11, and the outer surface of the encapsulation layer 3 is the light-emitting surface 31; specifically, a layer of epoxy resin is molded on the side of the light-emitting chip 2 facing away from the PCB substrate, and the epoxy resin becomes the encapsulation layer 3 after curing;

(12)将多个上述封装模块A粘接于同一第一高温胶带4后进行热压,上述封装模块A的出光面与第一高温胶带4的粘接面贴合;将多个封装模块A沿着第一高温胶带4的长度方向依次排列,之后将封装模块A放在过塑机(温度110℃)滚动边缘,自动过塑,使材料与高温胶紧贴,第一高温胶带粘度较大,韧性较大,使得多个封装模块被连接为一体,便于后续进行热压,且可以保证后续切割时对封装模块进行定位和保证第一高温胶带不易被切断;(12) The plurality of packaging modules A are bonded to the same first high-temperature adhesive tape 4 and then hot-pressed, so that the light-emitting surface of the packaging module A is in contact with the adhesive surface of the first high-temperature adhesive tape 4; the plurality of packaging modules A are arranged in sequence along the length direction of the first high-temperature adhesive tape 4, and then the packaging module A is placed on a laminator (temperature 110° C.) and rolled to automatically laminat e the material so that the material is in close contact with the high-temperature adhesive. The first high-temperature adhesive tape has a relatively high viscosity and toughness, so that the plurality of packaging modules are connected as a whole, which is convenient for subsequent hot pressing, and can ensure that the packaging module is positioned during subsequent cutting and that the first high-temperature adhesive tape is not easily cut;

(13)将不同上述封装模块A之间的第一高温胶带4切断形成多个粘接组件;具体的,通过切割刀具将相邻两个封装模块A之间的第一高温胶带4切断;(13) Cutting the first high temperature tapes 4 between different packaging modules A to form a plurality of bonding components; specifically, cutting the first high temperature tapes 4 between two adjacent packaging modules A by a cutting tool;

(14)将上述多个粘接组件粘接在珐琅盘的第二高温胶带上5,上述第一高温胶带4的非粘接面与珐琅盘上第二高温胶带5的粘接面贴合;具体的,先制作珐琅盘,将珐琅盘架子固定在贴膜机上,拉动第二高温胶带将第二高温胶带拉过珐琅盘边缘贴紧,按下划刀将第二高温胶带切断后拖动滚轮2-3次使第二高温胶带与珐琅盘粘紧)将上述所得粘接组件阵列在珐琅盘的第二高温胶带5上;珐琅盘第二高温胶带粘度较大,韧性较大,使得多个粘接组件被连接为一体,然后将珐琅盘翻转过来,用橡胶软板在防静电工作台上进行刮板,使得粘接组件平整固定在珐琅盘上,且可以保证后续切割时对焊接组件进行定位和保证第二高温胶带不易被切断,避免切割时材料切飞或切偏、蹦刀;(14) Adhere the above-mentioned multiple adhesive components to the second high-temperature tape 5 of the enamel disk, and the non-adhesive surface of the above-mentioned first high-temperature tape 4 is in contact with the adhesive surface of the second high-temperature tape 5 on the enamel disk; specifically, first make an enamel disk, fix the enamel disk rack on the film laminating machine, pull the second high-temperature tape to pull the second high-temperature tape over the edge of the enamel disk and stick it tightly, press the cutter to cut the second high-temperature tape, and then drag the roller 2-3 times to make the second high-temperature tape and the enamel disk stick tightly) array the above-mentioned adhesive components on the second high-temperature tape 5 of the enamel disk; the second high-temperature tape of the enamel disk has a large viscosity and a large toughness, so that multiple adhesive components are connected as a whole, and then turn the enamel disk over, and use a rubber soft board to scrape it on an anti-static workbench, so that the adhesive component is flat and fixed on the enamel disk, and it can ensure that the welding component is positioned during subsequent cutting and that the second high-temperature tape is not easily cut, so as to avoid material flying or cutting off or jumping the knife during cutting;

(15)将各个上述封装模块A分割为多个分立器件B,同时第一高温胶带4不被切断;具体的,对封装模块A进行切割,每个分立器件包括分割PCB基板形成的基板部、分割封装层形成的封装部以及被封装在基板部和封装部之间并包括至少一组发光芯片的发光部;(15) Each of the above-mentioned packaging modules A is divided into a plurality of discrete devices B, and the first high-temperature tape 4 is not cut; specifically, the packaging module A is cut, and each discrete device includes a substrate portion formed by dividing the PCB substrate, a packaging portion formed by dividing the packaging layer, and a light-emitting portion that is encapsulated between the substrate portion and the packaging portion and includes at least one group of light-emitting chips;

(16)将上述第一高温胶带4与上述珐琅盘上第二高温胶带5分离;(16) Separating the first high temperature tape 4 from the second high temperature tape 5 on the enamel plate;

(17)对上述分立器件进行除湿;具体的,将上述分立器件放入烤箱中进行除湿,温度为110℃,时间为0.5H,去除材料表面水汽;(17) Dehumidifying the discrete device; specifically, placing the discrete device in an oven for dehumidification at a temperature of 110° C. for 0.5 hours to remove moisture on the surface of the material;

(18)对上述分立器件进行外观检测;具体的,查看切割是否位置形状符合要求;(18) Performing appearance inspection on the above discrete devices; specifically, checking whether the position and shape of the cutting meet the requirements;

(19)将上述分立器件粘接在UV胶带6上后进行热压,上述分立器件B的引脚面与上述UV胶带6的粘接面贴合;具体的,先将UV胶带6的粘接面朝上地放置于载台上,再将分立器件B的引脚面朝下地贴在UV胶带6的粘接面上,之后通过过塑机将分立器件和UV胶带6热压在一起;UV胶带6进行热压后,其粘度增加,保证后续分立器件能够与第一高温胶带分离,热压温度为80℃-100℃;(19) After the discrete device is bonded to the UV tape 6, hot pressing is performed, so that the pin surface of the discrete device B is bonded to the bonding surface of the UV tape 6; specifically, the UV tape 6 is first placed on the carrier with the bonding surface facing upward, and then the pin surface of the discrete device B is bonded to the bonding surface of the UV tape 6 with the pin surface facing downward, and then the discrete device and the UV tape 6 are hot pressed together by a laminator; after the UV tape 6 is hot pressed, its viscosity increases, ensuring that the subsequent discrete device can be separated from the first high-temperature tape, and the hot pressing temperature is 80°C-100°C;

(20)将上述分立器件与上述第一高温胶带4分离;(20) separating the discrete device from the first high-temperature tape 4;

(21)对上述UV胶带6进行解胶;具体的,通过UV解胶机对上述UV胶带6进行解胶,UV胶带解胶后粘度降低,便于后续UV胶带与分立器件的分离,在解胶时,将一透明玻璃压板压在上述UV胶带6的非粘接面上,防止UV胶带收缩变形,UV光照1-2min/1A(根据UV膜特性调整时间和电流);(21) Debonding the UV tape 6; specifically, debonding the UV tape 6 by a UV debonding machine. The viscosity of the UV tape is reduced after debonding, which is convenient for the subsequent separation of the UV tape from the discrete device. During debonding, a transparent glass pressing plate is pressed on the non-adhesive surface of the UV tape 6 to prevent the UV tape from shrinking and deforming. The UV light is irradiated for 1-2 min/1 A (the time and current are adjusted according to the characteristics of the UV film);

(22)将上述分立器件粘接在第一蓝膜7后进行热压,上述分立器件B的出光面与上述第一蓝膜7的粘接面贴合;具体的,先将上述第一蓝膜7的粘接面朝上的放在承载盘上,再将上述分立器件B贴合在上述第一蓝膜7的粘接面上,之后通过翻膜机将上述分立器件和上述第一蓝膜7热压在一起。(22) After the discrete device is bonded to the first blue film 7, hot pressing is performed so that the light emitting surface of the discrete device B is in contact with the bonding surface of the first blue film 7; specifically, the first blue film 7 is first placed on a carrier plate with the bonding surface facing upward, and then the discrete device B is bonded to the bonding surface of the first blue film 7, and then the discrete device and the first blue film 7 are hot pressed together by a film turning machine.

上述承载盘中心区域镂空,便于对分立器件和第一蓝膜进行热压,已解胶材料共极朝向缺口方向贴合在中心位置,镂空孔设有缺口作为防呆标记,上述第一蓝膜的粘度较低,便于后续分立器件与第一蓝膜分离;热压温度为50℃-65℃,热压时间为30s,热压压力为300Kg;The central area of the carrier plate is hollowed out to facilitate hot pressing of the discrete device and the first blue film. The common pole of the debonded material is attached to the center position in the direction of the notch. The hollow hole is provided with a notch as an anti-fool mark. The viscosity of the first blue film is relatively low, which is convenient for subsequent separation of the discrete device from the first blue film. The hot pressing temperature is 50°C-65°C, the hot pressing time is 30s, and the hot pressing pressure is 300Kg.

(23)将上述分立器件与上述UV胶带6分离;(23) Separating the discrete device from the UV tape 6;

(24)对上述分立器件B的引脚面进行点测,检测出合格器件和不合格器件;通过点测设备对上述分立器件B的引脚面进行自动定位扫描,然后测试光电参数标记出合格器件和不合格器件,并输出合格器件和不合格器件的坐标(24) performing point measurement on the pin surface of the discrete device B to detect qualified devices and unqualified devices; automatically positioning and scanning the pin surface of the discrete device B by using a point measurement device, then testing the photoelectric parameters to mark qualified devices and unqualified devices, and outputting the coordinates of the qualified devices and unqualified devices

(25)将不合格器件从上述分立器件移除;先通过涂胶设备对上述分立器件B进行自动定位扫描,根据不合格器件坐标在不合格器件点UV胶水,再将上述承载盘放置在透光载具上,之后将透光压板压在分立器件的引脚面上,接着通过UV解胶机对上述UV胶水紫外光照射固化,光照30S-1min/100-500mA,接着移开上述透光上载具并带走与上述透光上载具粘接的不合格器件,最后将上述透光上载具上的不合格器件移除;可以直接擦除,也可以通过酒精擦除;(25) Remove the unqualified device from the discrete device; first, automatically position and scan the discrete device B through the glue coating equipment, apply UV glue on the unqualified device according to the coordinates of the unqualified device, then place the carrier plate on the light-transmitting carrier, and then press the light-transmitting pressing plate on the pin surface of the discrete device, and then use the UV glue dissolving machine to cure the UV glue with ultraviolet light, the light exposure time is 30S-1min/100-500mA, then remove the light-transmitting upper carrier and take away the unqualified device bonded to the light-transmitting upper carrier, and finally remove the unqualified device on the light-transmitting upper carrier; it can be wiped directly or wiped with alcohol;

(26)将合格器件粘接在第二蓝膜8后进行热压,上述合格器件的引脚面与上述第二蓝膜8的粘接面贴合;先将第二蓝膜8的粘接面朝上的放置于承载盘中,再将合格器件的引脚面朝下的贴在第二蓝膜8的粘接面上,之后通过翻膜机将上述分立器件、上述第二蓝膜8热压在一起,最后撕除上述第一蓝膜7(26) After the qualified device is bonded to the second blue film 8, hot pressing is performed, and the pin surface of the qualified device is bonded to the bonding surface of the second blue film 8; first, the bonding surface of the second blue film 8 is placed on the carrier plate, and then the pin surface of the qualified device is bonded to the bonding surface of the second blue film 8 with the pin surface facing downward. Then, the discrete device and the second blue film 8 are hot pressed together by a film turning machine, and finally the first blue film 7 is torn off.

(27)将合格器件与上述第一蓝膜7分离;(27) Separating the qualified devices from the first blue film 7;

(28)在合格器件背离上述第二蓝膜8的一侧贴上离型纸9,上述第二蓝膜8的粘接面与上述离型纸9边缘贴合。(28) A release paper 9 is pasted on the side of the qualified device that is away from the second blue film 8, and the adhesive surface of the second blue film 8 is in contact with the edge of the release paper 9.

其中,PCB基板1长宽设计为40-100mm*40-100mm(可根据终端客户试用固晶设备的晶圆工作台行程进行设计,一般晶圆使用6寸环,行程最大120mm)如上例设计尺寸为50mm*92mm,排布为75*79*2=11850pcs。UV胶带的宽度为52mm。第一蓝膜为直径185mm,厚度0.08mm的SPV-224膜(0.8N/20mm)。承载盘为直径200mm,厚度10mm,中心镂空(直径100mm圆形并有缺口)边的不锈钢载具。下透光玻璃载具为直径100mmm,高度100mm的圆柱体,上透光载具为T形主体(包括上圆柱和下圆柱,上圆柱直径为150mm,高度为30mm,下圆柱直径为100mm,高度为70mm)。第二蓝膜为直径185mm,厚度0.08mm的SPV-225膜(0.95N/20mm),离型纸的直径为200mm。Among them, the length and width of the PCB substrate 1 are designed to be 40-100mm*40-100mm (it can be designed according to the wafer worktable stroke of the terminal customer's trial crystal bonding equipment. Generally, the wafer uses a 6-inch ring with a maximum stroke of 120mm). As in the above example, the design size is 50mm*92mm, and the arrangement is 75*79*2=11850pcs. The width of the UV tape is 52mm. The first blue film is an SPV-224 film (0.8N/20mm) with a diameter of 185mm and a thickness of 0.08mm. The carrier plate is a stainless steel carrier with a diameter of 200mm, a thickness of 10mm, and a hollow center (100mm diameter round and notched) edge. The lower light-transmitting glass carrier is a cylinder with a diameter of 100mmm and a height of 100mm, and the upper light-transmitting carrier is a T-shaped body (including an upper cylinder and a lower cylinder, the upper cylinder has a diameter of 150mm and a height of 30mm, and the lower cylinder has a diameter of 100mm and a height of 70mm). The second blue film is an SPV-225 film (0.95N/20mm) with a diameter of 185mm and a thickness of 0.08mm, and the diameter of the release paper is 200mm.

实施例二Embodiment 2

其余与实施例一相同,不同之处在于,还包括分选设备(其必须能识别点测设备输出的坐标数据),直接将点测后的材料使用分选机按一定间距和图形转移并排版在另一张蓝膜上,良品再进行二次倒膜,使得胶体面朝上,最后与离型纸贴合,制成成品。点测效率约80K/H,分选效率约35K/H,即按照月产能1000KK,需购置点测设备约20台、分选约44台,整体设备成本约600W,但方案不是最优。The rest is the same as Example 1, except that it also includes a sorting device (which must be able to recognize the coordinate data output by the point measurement device). The material after point measurement is directly transferred and laid out on another blue film according to a certain spacing and pattern using a sorting machine. The good product is then reversed for a second time so that the colloid side faces up, and finally bonded with the release paper to form a finished product. The point measurement efficiency is about 80K/H, and the sorting efficiency is about 35K/H. That is, according to a monthly production capacity of 1000KK, about 20 point measurement devices and about 44 sorting devices need to be purchased, and the overall equipment cost is about 600W, but the solution is not optimal.

显然,上述实施例仅仅是为清楚地说明所作的举例,并非对实施方式的限定。对于所属领域的普通技术人员来说,在上述说明的基础上还可以做出其它不同形式变化或变动。这里无需也无法对所有的实施方式予以穷举。而由此所引申出的显而易见的变化或变动仍处于本发明创造的保护范围之中。Obviously, the above embodiments are merely examples for clear explanation and are not intended to limit the implementation methods. For those skilled in the art, other different forms of changes or modifications can be made based on the above description. It is not necessary and impossible to list all the implementation methods here. The obvious changes or modifications derived from them are still within the protection scope of the invention.

Claims (10)

1. The Mic packaging method is characterized by comprising the following steps of:
The method comprises the steps of firstly, manufacturing a packaging module, wherein the packaging module comprises a PCB substrate, a plurality of groups of light-emitting chips and a packaging layer, the light-emitting chips are arranged on the front surface of the PCB substrate, the packaging layer is arranged on one side, away from the PCB substrate, of the light-emitting chips, the back surface of the PCB substrate is a pin surface, and one surface, away from the light-emitting chips, of the packaging layer is a light-emitting surface;
A second step of cutting the packaging module into a plurality of discrete devices, wherein the light emitting surface of the discrete devices formed by the same packaging module is in fit connection with the bonding surface of the first high-temperature adhesive tape;
and a third process for inspecting and packaging the discrete devices, the third process comprising the steps of:
(301) Bonding the discrete device on a UV adhesive tape, and then performing hot pressing, wherein the pin surface of the discrete device is bonded with the bonding surface of the UV adhesive tape;
(302) Separating the discrete device from the first high temperature tape;
(303) Debonding the UV adhesive tape;
(304) Bonding the discrete device on a first blue film, and then performing hot pressing, wherein the light emitting surface of the discrete device is bonded with the bonding surface of the first blue film;
(305) Separating the discrete device from the UV tape;
(306) Performing point measurement on the pin surface of the discrete device to detect out qualified devices and unqualified devices;
(307) Removing the rejected device from the discrete device;
(308) Bonding the qualified device on the second blue film, and then performing hot pressing, wherein the pin surface of the qualified device is bonded with the bonding surface of the second blue film;
(309) Separating the qualified device from the first blue film;
(310) And attaching release paper on one side of the qualified device, which is away from the second blue film, and attaching the bonding surface of the second blue film to the edge of the release paper.
2. The method of packaging as claimed in claim 1, wherein in step (301), the UV tape is placed with its bonding surface facing up on the carrier, and then the pins of the discrete device are attached with their bonding surface facing down, and then the discrete device and the UV tape are thermally pressed together by a laminator.
3. The method according to claim 1, wherein in step (303), the UV tape is unbuckled by a UV-unbuckling machine, and a light-transmitting pressing plate is pressed against the non-adhesive surface of the UV tape during unbuckling.
4. The method of claim 1, wherein in step (304), the adhesive surface of the first blue film is placed on a carrier tray, the discrete device is attached to the adhesive surface of the first blue film, and then the discrete device and the first blue film are thermally pressed together by a film turnover machine.
5. The method according to claim 4, wherein in step (306), the pin surface of the discrete device is automatically positioned and scanned by a spot measurement device, and then the qualified device and the unqualified device are marked by the test photoelectric parameter, and coordinates of the qualified device and the unqualified device are output.
6. The method according to claim 5, wherein in step (307), the discrete device is automatically positioned and scanned by a glue spreading device, UV glue is applied to the point of the discrete device according to the coordinates of the defective device, the carrier is placed on the light-transmitting carrier, the light-transmitting carrier is pressed on the lead surface of the discrete device, UV light is irradiated and cured by a UV glue remover, the light-transmitting carrier is removed, the defective device adhered to the light-transmitting carrier is carried away, and finally the defective device on the light-transmitting carrier is removed.
7. The method of claim 1, wherein in step (308), the bonding surface of the second blue film is placed on the carrier tray with the bonding surface of the second blue film facing upwards, then the pins of the qualified device are attached to the bonding surface of the second blue film with the bonding surface facing downwards, and then the discrete device and the second blue film are thermally pressed together by a film turnover machine.
8. The Mip encapsulation method according to claim 1, wherein said first process comprises the steps of:
(101) Printing solder paste on the bonding pad position on the front surface of the PCB substrate;
(102) Detecting the solder paste on the PCB substrate;
(103) Transferring the light emitting chip to a corresponding bonding pad to form a substrate chip assembly;
(104) Welding the substrate chip assembly;
(105) Detecting the welding quality of the substrate chip assembly, and detecting qualified chips and unqualified chips;
(106) Rejecting the failed chip from the substrate chip assembly;
(107) Cleaning the substrate chip assembly through a scaling powder cleaning agent, removing the scaling powder, and rinsing the cleaning agent with deionized water;
(108) Drying the substrate chip assembly;
(109) Dehumidifying the substrate chip assembly;
(110) Plasma cleaning is carried out on the substrate chip assembly;
(111) And molding the substrate chip assembly to form a packaging layer to obtain the packaging module.
9. The Mip packaging method according to claim 1, wherein said second process comprises the steps of:
(201) Bonding a plurality of packaging modules on the same first high-temperature adhesive tape, wherein the light emitting surface of each packaging module is bonded with the bonding surface of the first high-temperature adhesive tape;
(202) Cutting off the first high-temperature adhesive tapes among different packaging modules to form a plurality of bonding assemblies;
(203) Bonding the plurality of bonding assemblies on a second high-temperature adhesive tape of the enamel tray, wherein the non-bonding surface of the first high-temperature adhesive tape is bonded with the bonding surface of the second high-temperature adhesive tape on the enamel tray;
(204) Dividing each packaging module into a plurality of discrete devices, wherein the first high-temperature adhesive tape is not cut off;
(205) Separating the first high temperature tape from the second high temperature tape;
(206) Dehumidifying the discrete devices;
(207) And performing appearance detection on the discrete device.
10. The method according to claim 9, wherein in the step (201), the packaging module is sequentially adhered to the first high-temperature adhesive tape along the length direction of the first high-temperature adhesive tape, and then the packaging module and the edge of the first high-temperature adhesive tape are hot-pressed together by a laminator; in the step (203), firstly, an enamel plate is manufactured, then a plurality of bonding component arrays are bonded on the adhesive surface of a second high-temperature adhesive tape of the enamel plate, and then the enamel plate is overturned and then scraped on an antistatic workbench by a rubber soft plate so as to be bonded on the second high-temperature adhesive tape.
CN202410800014.5A 2024-06-20 2024-06-20 Mip packaging method Pending CN118841490A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202410800014.5A CN118841490A (en) 2024-06-20 2024-06-20 Mip packaging method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202410800014.5A CN118841490A (en) 2024-06-20 2024-06-20 Mip packaging method

Publications (1)

Publication Number Publication Date
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Family Applications (1)

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