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CN116994633A - Easy-maintenance and regeneration design system, method and equipment for memory bank - Google Patents

Easy-maintenance and regeneration design system, method and equipment for memory bank Download PDF

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Publication number
CN116994633A
CN116994633A CN202311096677.5A CN202311096677A CN116994633A CN 116994633 A CN116994633 A CN 116994633A CN 202311096677 A CN202311096677 A CN 202311096677A CN 116994633 A CN116994633 A CN 116994633A
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memory
control mechanism
chip
dimm
easy
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王择珑
吴伟波
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Shenzhen Juhor Precision Technology Co ltd
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Shenzhen Juhor Precision Technology Co ltd
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    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/44Indication or identification of errors, e.g. for repair
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50Marginal testing, e.g. race, voltage or current testing
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50Marginal testing, e.g. race, voltage or current testing
    • G11C2029/5004Voltage
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02DCLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
    • Y02D10/00Energy efficient computing, e.g. low power processors, power management or thermal management

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Abstract

本申请公开了一种内存条的易维修再生利用设计系统、方法及设备,其系统包括内存条、控制机构和多个存储芯片,内存条的基板对应多个存储芯片开设有用于供多个存储芯片的针脚可拆卸式插接的针脚孔,每个针脚孔的孔壁均设置有导电金属层,在存储芯片的针脚插接于针脚孔内时,存储芯片与导电金属层电连接;控制机构与内存条、多个存储芯片连接,控制机构在检测到内存条上的至少一个存储芯片出现故障时,自动屏蔽出现故障的相应存储芯片并使得内存条正常使用。本申请具有增加对存储芯片的智能屏蔽设计,使得系统在检测到内存条的某个存储芯片有故障时,自动将其屏蔽,不影响整个内存条的正常使用;从而本申请提供了一种便于维修的内存条的效果。

This application discloses a design system, method and equipment for easy maintenance and reuse of memory sticks. The system includes a memory stick, a control mechanism and multiple memory chips. The substrate of the memory stick is provided with multiple memory chips corresponding to the multiple memory chips. The pins of the chip are detachably plugged into pin holes, and the hole wall of each pin hole is provided with a conductive metal layer. When the pins of the memory chip are inserted into the pin holes, the memory chip is electrically connected to the conductive metal layer; the control mechanism and the memory strips and multiple memory chips are connected. When the control mechanism detects that at least one memory chip on the memory strip is faulty, it automatically blocks the corresponding faulty memory chip and allows the memory strip to be used normally. This application has an intelligent shielding design for the memory chip, so that when the system detects a fault in a certain memory chip of the memory stick, it will automatically shield it without affecting the normal use of the entire memory stick; thus this application provides a convenient The effect of repairing the memory module.

Description

一种内存条的易维修再生利用设计系统、方法及设备A design system, method and equipment for easy maintenance and recycling of memory sticks

技术领域Technical field

本申请涉及内存条技术领域,尤其是涉及一种内存条的易维修再生利用设计系统、方法及设备。The present application relates to the technical field of memory sticks, and in particular to a design system, method and equipment for easy maintenance and recycling of memory sticks.

背景技术Background technique

内存条是电脑中CPU可通过总线寻址,并进行读写操作的电脑部件。随着电脑软、硬件技术不断更新的要求,内存条已成为读写内存的整体。The memory stick is a computer component in the computer that the CPU can address through the bus and perform read and write operations. With the continuous updating requirements of computer software and hardware technology, memory modules have become a whole unit of read and write memory.

相关技术中,内存条上焊接有多个可存储芯片,容量越大的内存条,存储芯片数量越多;如果内存条上的某个存储芯片发生故障,整个内存条就会损坏、不能继续使用,对用户来说损失较大。In related technology, multiple storable chips are welded to the memory stick. The larger the capacity of the memory stick, the greater the number of storage chips. If a memory chip on the memory stick fails, the entire memory stick will be damaged and cannot be used anymore. , causing greater losses to users.

焊接固定的内存条损坏是可以维修的,但是修复内存条要将内存条寄修,由专业的维修师傅使用专业的工具进行维修更换,维护周期较长,且维护成本偏高;因而存在有不便于对内存条进行维修的缺陷,存在改进空间。Damaged memory modules that are welded and fixed can be repaired, but to repair the memory modules, you need to send the memory modules for repair, and professional repairmen use professional tools to repair and replace them. The maintenance cycle is long, and the maintenance cost is high; therefore, there are disadvantages There is room for improvement to facilitate the repair of memory modules.

发明内容Contents of the invention

为了提供一种便于维修的内存条,本申请提供一种内存条的易维修再生利用设计系统、方法及设备。In order to provide a memory module that is easy to maintain, this application provides a design system, method and equipment for easy maintenance and recycling of the memory module.

本申请的发明目的一采用如下技术方案实现:The first invention object of this application is achieved by adopting the following technical solutions:

一种内存条的易维修再生利用设计系统,包括内存条、控制机构和多个存储芯片,所述内存条的基板对应多个所述存储芯片开设有用于供所述多个存储芯片的针脚可拆卸式插接的针脚孔,每个所述针脚孔的孔壁均设置有导电金属层,在所述存储芯片的针脚插接于所述针脚孔内时,所述存储芯片与所述导电金属层电连接;A design system for easy maintenance and recycling of memory sticks, including a memory stick, a control mechanism and a plurality of memory chips. The substrate of the memory stick is provided with pins for supplying the plurality of memory chips corresponding to the plurality of memory chips. In the detachable plug-in pin holes, the hole wall of each pin hole is provided with a conductive metal layer. When the pins of the memory chip are inserted into the pin holes, the memory chip is electrically connected to the conductive metal layer. connect;

所述控制机构与所述内存条、多个所述存储芯片连接,所述控制机构在检测到所述内存条上的至少一个所述存储芯片出现故障时,自动屏蔽出现故障的相应所述存储芯片并使得所述内存条正常使用。The control mechanism is connected to the memory stick and a plurality of the memory chips. When the control mechanism detects that at least one of the memory chips on the memory stick has failed, it automatically blocks the corresponding failed memory chip. chip and allow the memory stick to be used normally.

通过采用上述技术方案,将存储芯片在内存条上的固定方式从焊接方式改为有引脚的接插方式,用户可以自行更换存储芯片;废弃的内存条上得到最大限度的再生利用,回收机构或用户可自行将损坏的存储芯片更换,整个内存条也可以继续使用;在内存条的内部驱动程序设计中,增加对存储芯片的智能屏蔽设计,使得易维修再生利用设计系统在检测到内存条的某个存储芯片有故障时,自动将其屏蔽起来,不影响整个内存条的正常使用;从而本申请提供了一种便于维修的内存条。By adopting the above technical solution, the fixing method of the memory chip on the memory stick is changed from the welding method to the pinned plug-in method, and the user can replace the memory chip by himself; the discarded memory stick can be reused to the maximum extent, and the recycling mechanism Or the user can replace the damaged memory chip by himself, and the entire memory stick can continue to be used; in the internal driver design of the memory stick, an intelligent shielding design for the memory chip is added, making the easy maintenance and recycling design system detect the memory stick. When one of the memory chips fails, it will be automatically shielded without affecting the normal use of the entire memory stick; thus, the present application provides a memory stick that is easy to repair.

本申请在一较佳示例中:所述控制机构包括信息输出模块和至少一个微控制器;所述控制机构连接有内存条电气连接测试模块,所述内存条电气连接测试模块包括至少一个恒压源、多个分压电阻、多个模拟多路复用器和至少一个模数转换器;In a preferred example of this application: the control mechanism includes an information output module and at least one microcontroller; the control mechanism is connected to a memory module electrical connection test module, and the memory module electrical connection test module includes at least one constant voltage a source, a plurality of voltage dividing resistors, a plurality of analog multiplexers, and at least one analog-to-digital converter;

多个所述分压电阻和多个模拟多路复用器一一对应设置,所述分压电阻的一端与一所述恒压源电连接,所述分压电阻的另一端与内存条中的一金手指的引脚电连接;所述分压电阻的输出端还与一所述模拟多路复用器电连接;A plurality of the voltage dividing resistors and a plurality of analog multiplexers are arranged in one-to-one correspondence. One end of the voltage dividing resistor is electrically connected to one of the constant voltage sources, and the other end of the voltage dividing resistor is connected to the memory module. The pin of a gold finger is electrically connected; the output end of the voltage dividing resistor is also electrically connected to one of the analog multiplexers;

所述模数转换器的输入端与所述模拟多路复用器的输出端电连接;所述模数转换器的输出端与所述微控制器的输入端电连接;The input terminal of the analog-to-digital converter is electrically connected to the output terminal of the analog multiplexer; the output terminal of the analog-to-digital converter is electrically connected to the input terminal of the microcontroller;

所述微控制器的输出端与所述信息输出模块电连接。The output end of the microcontroller is electrically connected to the information output module.

通过采用上述技术方案,内存条电气连接测试模块为一种自动诊断内存条电路电气连接的装置,恒压源通过分压电阻对待测内存条电路的各个引脚施加电压,待测电路的电气如出现开路、短路、虚焊等的电气异常时,由于阻抗的不同会反应在模拟多路复用器的每个通道内的分压电压有差异;微控制器通过信息输出模块将测量的各个通道内的电压值展示给测试者;测试者通过比对实际的电压值和正常电压值以旁边内存条中的一金手指的引脚是否出现电压异常,测量较准确快速。By adopting the above technical solution, the memory module electrical connection test module is a device that automatically diagnoses the electrical connection of the memory module circuit. The constant voltage source applies voltage to each pin of the memory module circuit to be tested through the voltage dividing resistor. The electrical connection of the circuit to be tested is as follows: When electrical abnormalities such as open circuit, short circuit, and virtual soldering occur, the difference in the divided voltage in each channel of the analog multiplexer will be reflected due to the difference in impedance; the microcontroller will measure each channel through the information output module. The voltage value in the memory module is displayed to the tester; the tester compares the actual voltage value with the normal voltage value to determine whether there is a voltage abnormality on the pin of a golden finger in the memory stick next to it, so that the measurement is more accurate and faster.

本申请在一较佳示例中:所述控制机构包括用于读取多个所述模拟多路复用器的每个通道的电压值的电压值读取模块;In a preferred example of this application: the control mechanism includes a voltage value reading module for reading the voltage value of each channel of a plurality of the analog multiplexers;

所述微控制器基于多个所述模拟多路复用器的每个通道均对应匹配有电压正常阈值;Each channel of the microcontroller is matched with a voltage normal threshold based on a plurality of the analog multiplexers;

所述微控制器将多个所述模拟多路复用器的各个通道的电压值与对应的所述电压正常阈值进行比较,并通过所述信息输出模块输出比较结果。The microcontroller compares the voltage value of each channel of the multiple analog multiplexers with the corresponding normal voltage threshold, and outputs the comparison result through the information output module.

通过采用上述技术方案,微控制器控制模拟多路复用器切换各个通道,并通过模数转换器采集各个通道的电压信号并发送给微控制器;微控制器将模拟多路复用器的各个通道内的电压与对应的正常阈值进行比较,并将比较结果通过信息输出模块展示给使用者,实现自动诊断内存条电路上的金手指引脚的电气异常情况,测量快速准确,有利于节省人力物力,方便维修内存条。By adopting the above technical solution, the microcontroller controls the analog multiplexer to switch each channel, and collects the voltage signal of each channel through the analog-to-digital converter and sends it to the microcontroller; the microcontroller switches the voltage signal of the analog multiplexer The voltage in each channel is compared with the corresponding normal threshold, and the comparison results are displayed to the user through the information output module, enabling automatic diagnosis of electrical abnormalities on the golden fingers of the memory circuit. The measurement is fast and accurate, which is beneficial to saving money. Manpower and material resources are needed to facilitate the repair of memory modules.

本申请在一较佳示例中:所述导电金属层包括软性金属层,所述软性金属层沿所述针脚孔的孔壁间隔涂覆设置。In a preferred example of this application: the conductive metal layer includes a soft metal layer, and the soft metal layer is coated and arranged at intervals along the hole walls of the pin holes.

通过采用上述技术方案,软性金属层具有弹性,有利于提高内存条的针脚、存储芯片的针脚与导电金属层的接触面积,提高内存条与存储芯片的电连接性能。By adopting the above technical solution, the soft metal layer is elastic, which is beneficial to increasing the contact area between the pins of the memory stick, the pins of the memory chip and the conductive metal layer, and improving the electrical connection performance between the memory stick and the memory chip.

本申请在一较佳示例中:所述导电金属层包括弹性金属圈,所述弹性金属圈对应每个所述针脚孔均设置有若干对,若干对弹性金属层沿针脚孔的孔壁竖向间隔设置,同一对的所述弹性金属圈位于所述针脚孔的相对两侧的孔壁。In a preferred example of this application: the conductive metal layer includes an elastic metal ring, and several pairs of elastic metal rings are provided corresponding to each of the pin holes. Several pairs of elastic metal layers are arranged vertically along the hole walls of the pin holes. The elastic metal rings of the same pair are arranged at intervals, and are located on the hole walls on opposite sides of the pin hole.

通过采用上述技术方案,弹性金属层具有弹性,若干对弹性金属圈提高了内存条的针脚、存储芯片的针脚与导电金属层的接触面积,从而增强了内存条与存储芯片的电连接性能。By adopting the above technical solution, the elastic metal layer is elastic, and several pairs of elastic metal rings increase the contact area between the pins of the memory stick, the pins of the memory chip and the conductive metal layer, thereby enhancing the electrical connection performance of the memory stick and the memory chip.

本申请在一较佳示例中:还包括多个设置有状态指示灯的DIMM插槽;所述控制机构包括可编程逻辑器件和寄存器;所述状态指示灯与所述可编程逻辑控制器连接;所述可编程逻辑控制器通过所述寄存器连接系统南桥PCH;In a preferred example of this application: it also includes a plurality of DIMM slots equipped with status indicator lights; the control mechanism includes programmable logic devices and registers; the status indicator lights are connected to the programmable logic controller; The programmable logic controller is connected to the system south bridge PCH through the register;

所述可编程逻辑器件将所述寄存器的信号解码到相应的DIMM插槽状态,并控制对应DIMM插槽的状态指示灯的显示状态。The programmable logic device decodes the signal of the register to the corresponding DIMM slot status, and controls the display status of the status indicator light of the corresponding DIMM slot.

通过采用上述技术方案,By adopting the above technical solutions,

本申请在一较佳示例中:所述控制机构还包括内存控制器;所述控制机构按照如下的步骤自动处理故障内存条:In a preferred example of this application: the control mechanism also includes a memory controller; the control mechanism automatically handles the faulty memory module according to the following steps:

所述控制机构启动BIOS,对所述寄存器进行初始化;所述控制机构初始化SMI和内存控制器;The control mechanism starts the BIOS and initializes the registers; the control mechanism initializes the SMI and memory controller;

将当前的寄存器的状态保存至存储区,注意侦测各个DIMM插槽内的内存条是否在位;如该DIMM插槽的内存条在位,则点亮该DIMM插槽对应的状态指示灯;并注册周期性SIM程序,初始化该DIMM插槽的内存条;如果该DIMM插槽的内存条不在位,则不点亮该DIMM插槽对应的状态指示灯;Save the current register status to the storage area, and pay attention to detect whether the memory module in each DIMM slot is in place; if the memory module in the DIMM slot is in place, light up the status indicator light corresponding to the DIMM slot; And register a periodic SIM program to initialize the memory module of the DIMM slot; if the memory module of the DIMM slot is not in place, the status indicator light corresponding to the DIMM slot will not light up;

如果DIMM插槽内的内存初始化正常,可编程逻辑器件控制该DIMM插槽对应的状态指示灯为点亮状态,清除保存在存储区的寄存器状态数据,卸载周期性内存处理的SMI程序;If the memory in the DIMM slot is initialized normally, the programmable logic device controls the status indicator light corresponding to the DIMM slot to be on, clears the register status data saved in the storage area, and unloads the SMI program for periodic memory processing;

如果内存初始化在SMI程序的周期时间间隔到来时未完成,则认为内存条初始化出现故障,周期性SMI中断触发,执行周期性内存处理的SMI程序,将该故障DIMM插槽的内存禁止,指向下一个DIMM插槽,并读取存储区中的寄存器状态的数据,退出SMI程序,将所有寄存器值恢复成存储区读取出来的寄存器的值;If the memory initialization is not completed when the periodic time interval of the SMI program arrives, it is considered that there is a fault in the memory module initialization, the periodic SMI interrupt is triggered, the SMI program of periodic memory processing is executed, and the memory of the faulty DIMM slot is disabled, pointing down A DIMM slot, and read the register status data in the storage area, exit the SMI program, and restore all register values to the register values read from the storage area;

进行下一个DIMM插槽的内存的检查。Perform a check of the memory in the next DIMM slot.

通过采用上述技术方案,针对DIMM内存条无法初始化完成,导致电脑系统宕机的情况,控制初始化内存条,发现有内存条故障、内存条类型不被支持等问题,软件程序将对故障的内存条进行禁止,同时设置状态指示灯来表明对应DIMM内存条出现故障,控制机构将进行对下一根内存条进行初始化,直到所有内存条初始化完成,启动电脑系统;从而使得电脑系统不会因为存在故障内存条而宕机,不影响电脑系统的正常使用,同时将故障内存条通过状态指示灯进行标识,方便用户排查故障内存条并进行替换,大大降低排查主板错误的技术难度,简单便捷。By adopting the above technical solution, when the DIMM memory module cannot be initialized, causing the computer system to crash, the initialization of the memory module is controlled. If problems such as memory module failure or unsupported memory module are found, the software program will detect the faulty memory module. Prohibit it, and set the status indicator light to indicate that the corresponding DIMM memory module is faulty. The control mechanism will initialize the next memory module until all memory modules are initialized and start the computer system; thus the computer system will not be affected by the fault. If the memory module fails, it will not affect the normal use of the computer system. At the same time, the faulty memory module will be identified through the status indicator light, which facilitates users to troubleshoot the faulty memory module and replace it, greatly reducing the technical difficulty of troubleshooting motherboard errors, making it simple and convenient.

本申请的发明目的二采用如下技术方案实现:The second invention object of this application is achieved by adopting the following technical solutions:

一种内存条的易维修再生利用设计方法,应用于如上任一项所述的一种内存条的易维修再生利用设计系统,包括:用于测试并获取所述内存条上的每个所述储存芯片的使用状态,所述使用状态包括正常使用状态和故障状态;A design method for easy maintenance and recycling of memory sticks, applied to a design system for easy maintenance and recycling of memory sticks as described in any one of the above, including: testing and obtaining each of the described memory sticks Store the usage status of the chip, which usage status includes normal usage status and fault status;

在检测到所述内存条上的至少一个所述存储芯片出现故障时,自动屏蔽出现故障的相应所述存储芯片并使得所述内存条正常使用。When it is detected that at least one of the memory chips on the memory stick is faulty, the corresponding faulty memory chip is automatically shielded and the memory stick is used normally.

通过采用上述技术方案,By adopting the above technical solutions,

本申请的发明目的三采用如下技术方案实现:The third object of the invention of this application is achieved by adopting the following technical solutions:

一种计算机设备,包括存储器、处理器以及存储在所述存储器中并可在所述处理器上运行的计算机程序,所述处理器执行所述计算机程序时实现上述一种内存条的易维修再生利用设计方法的步骤。A computer device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, it realizes easy maintenance and regeneration of the above-mentioned memory stick. Utilize the steps of a design methodology.

本申请的发明目的四采用如下技术方案实现:The fourth purpose of the invention of this application is achieved by adopting the following technical solutions:

一种计算机可读存储介质,所述计算机可读存储介质存储有计算机程序,所述计算机程序被处理器执行时实现上述一种内存条的易维修再生利用设计方法的步骤。A computer-readable storage medium stores a computer program. When the computer program is executed by a processor, the steps of the above-mentioned design method for easy maintenance and reuse of a memory stick are implemented.

综上所述,本申请包括以下至少一种有益技术效果:To sum up, this application includes at least one of the following beneficial technical effects:

1. 将存储芯片在内存条上的固定方式从焊接方式改为有引脚的接插方式,用户可以自行更换存储芯片;废弃的内存条上得到最大限度的再生利用,回收机构或用户可自行将损坏的存储芯片更换,整个内存条也可以继续使用;在内存条的内部驱动程序设计中,增加对存储芯片的智能屏蔽设计,使得易维修再生利用设计系统在检测到内存条的某个存储芯片有故障时,自动将其屏蔽起来,不影响整个内存条的正常使用;从而本申请提供了一种便于维修的内存条;1. Change the fixing method of the memory chip on the memory stick from the welding method to the pinned connection method. The user can replace the memory chip by himself; the discarded memory stick can be reused to the maximum extent, and the recycling agency or the user can By replacing the damaged memory chip, the entire memory stick can continue to be used; in the internal driver design of the memory stick, an intelligent shielding design for the memory chip is added, making the easy-repair and recycling design system detect a certain memory in the memory stick. When the chip fails, it will be automatically shielded without affecting the normal use of the entire memory stick; thus, this application provides a memory stick that is easy to repair;

2. 微控制器控制模拟多路复用器切换各个通道,并通过模数转换器采集各个通道的电压信号并发送给微控制器;微控制器将模拟多路复用器的各个通道内的电压与对应的正常阈值进行比较,并将比较结果通过信息输出模块展示给使用者,实现自动诊断内存条电路上的金手指引脚的电气异常情况,测量快速准确,有利于节省人力物力,方便维修内存条;2. The microcontroller controls the analog multiplexer to switch each channel, and collects the voltage signal of each channel through the analog-to-digital converter and sends it to the microcontroller; the microcontroller switches the voltage signal in each channel of the analog multiplexer. The voltage is compared with the corresponding normal threshold, and the comparison result is displayed to the user through the information output module, enabling automatic diagnosis of electrical abnormalities on the golden finger pins on the memory circuit. The measurement is fast and accurate, which is conducive to saving manpower and material resources, and is convenient Repair memory modules;

3. 针对DIMM内存条无法初始化完成,导致电脑系统宕机的情况,控制初始化内存条,发现有内存条故障、内存条类型不被支持等问题,软件程序将对故障的内存条进行禁止,同时设置状态指示灯来表明对应DIMM内存条出现故障,控制机构将进行对下一根内存条进行初始化,直到所有内存条初始化完成,启动电脑系统;从而使得电脑系统不会因为存在故障内存条而宕机,不影响电脑系统的正常使用,同时将故障内存条通过状态指示灯进行标识,方便用户排查故障内存条并进行替换,大大降低排查主板错误的技术难度,简单便捷。3. For the situation where the DIMM memory module cannot be initialized, causing the computer system to crash, control the initialization of the memory module. If problems such as memory module failure or unsupported memory module are found, the software program will disable the faulty memory module and at the same time Set the status indicator light to indicate that the corresponding DIMM memory module is faulty. The control mechanism will initialize the next memory module until all memory modules are initialized and the computer system is started; thus the computer system will not be down due to the presence of faulty memory modules. It does not affect the normal use of the computer system. At the same time, the faulty memory module is identified through the status indicator light, which facilitates the user to troubleshoot the faulty memory module and replace it, greatly reducing the technical difficulty of troubleshooting motherboard errors, making it simple and convenient.

附图说明Description of the drawings

图1是本申请一实施例中一种内存条的易维修再生利用设计系统中的内存条和存储芯片的安装结构示意图;Figure 1 is a schematic diagram of the installation structure of a memory stick and a memory chip in a design system for easy maintenance and recycling of memory sticks in an embodiment of the present application;

图2是本申请一实施例中一种内存条的易维修再生利用设计系统中的内存条和内存条电气连接测试模块的连接示意图;Figure 2 is a schematic connection diagram of a memory module and a memory module electrical connection test module in a design system for easy maintenance and recycling of memory modules in an embodiment of the present application;

图3是本申请一实施例中一种内存条的易维修再生利用设计系统中的内存条和控制机构的连接示意图;Figure 3 is a schematic diagram of the connection between the memory stick and the control mechanism in a design system for easy maintenance and reuse of the memory stick according to an embodiment of the present application;

图4是本申请一实施例中一种内存条的易维修再生利用设计系统中的控制机构和DIMM插槽的连接示意图;Figure 4 is a schematic diagram of the connection between the control mechanism and the DIMM slot in a design system for easy maintenance and recycling of memory sticks in an embodiment of the present application;

图5是本申请一实施例中的设备示意图。Figure 5 is a schematic diagram of equipment in an embodiment of the present application.

附图标记说明:Explanation of reference symbols:

1、内存条;11、针脚孔;12、导电金属层;2、存储芯片。1. Memory stick; 11. Pin holes; 12. Conductive metal layer; 2. Memory chip.

具体实施方式Detailed ways

以下结合附图对本申请作进一步详细说明。The present application will be further described in detail below in conjunction with the accompanying drawings.

在一实施例中,如图1所示,本申请公开了一种内存条1的易维修再生利用设计系统,内存条1的易维修再生利用设计系统包括内存条1、控制机构和多个存储芯片2,内存条1的基板对应多个存储芯片2开设有用于供多个存储芯片2的针脚可拆卸式插接的针脚孔11,每个针脚孔11的孔壁均设置有导电金属层12,在储存芯片的针脚插接于针脚孔11内时,存储芯片2与导电金属层12电连接;控制机构与内存条1、多个存储芯片2连接,控制机构在检测到内存条1上的至少一个存储芯片2出现故障时,自动屏蔽出现故障的相应存储芯片2并使得内存条1正常使用;本申请将存储芯片2在内存条1上的固定方式从焊接方式改为有引脚的接插方式,存储芯片2损坏时用户可以自行更换存储芯片2;废弃的内存条1上得到最大限度的再生利用,整个内存条1也可以继续使用;且在流通销售环节中,可以根据用户的需求调节内存条1容量。In one embodiment, as shown in Figure 1, the present application discloses an easy maintenance and recycling design system for the memory stick 1. The easy maintenance and recycling design system for the memory stick 1 includes the memory stick 1, a control mechanism and multiple storage devices. Chip 2, the substrate of the memory stick 1 is provided with pin holes 11 for detachable insertion of pins of multiple memory chips 2 corresponding to the plurality of memory chips 2, and the hole wall of each pin hole 11 is provided with a conductive metal layer 12. When the pins of the memory chip are inserted into the pin holes 11, the memory chip 2 is electrically connected to the conductive metal layer 12; the control mechanism is connected to the memory bar 1 and multiple memory chips 2, and the control mechanism detects at least one of the memory chips 2 on the memory bar 1. When the memory chip 2 fails, the corresponding failed memory chip 2 is automatically shielded and the memory bar 1 can be used normally; this application changes the fixing method of the memory chip 2 on the memory bar 1 from the welding method to the pinned plugging method. , when the memory chip 2 is damaged, the user can replace the memory chip 2 by himself; the discarded memory stick 1 is reused to the maximum extent, and the entire memory stick 1 can continue to be used; and in the circulation and sales process, the memory can be adjusted according to the needs of the user Bar 1 capacity.

如图1所示,为存储芯片2的针脚插接在内存条1电路板上的结构示意图;在实际使用时,导电金属层12为软性金属层,软性金属层沿针脚孔11的孔壁间隔涂覆设置;或将导电金属层12设置成弹性金属圈,弹性金属圈对应每个针脚孔11均设置有若干对,若干对弹性金属层沿针脚孔11的孔壁竖向间隔设置,同一对的弹性金属圈位于针脚孔11的相对两侧的孔壁;软性金属层和弹性金属圈均具有弹性,有利于提高内存条1的针脚、存储芯片2的针脚与导电金属层12的接触面积,提高内存条1与存储芯片2的电连接性能。As shown in Figure 1, it is a schematic structural diagram of the pins of the memory chip 2 being plugged into the circuit board of the memory stick 1; in actual use, the conductive metal layer 12 is a soft metal layer, and the soft metal layer is along the holes of the pin holes 11 The walls are spaced by coating; or the conductive metal layer 12 is arranged as an elastic metal ring. Several pairs of elastic metal rings are provided corresponding to each pin hole 11, and several pairs of elastic metal layers are arranged at vertical intervals along the hole wall of the pin hole 11. The same pair of elastic metal rings are located on the hole walls on opposite sides of the pin hole 11; both the soft metal layer and the elastic metal ring are elastic, which is beneficial to improving the connection between the pins of the memory bar 1, the pins of the memory chip 2 and the conductive metal layer 12. The contact area improves the electrical connection performance between the memory bar 1 and the memory chip 2.

如图2所示,控制机构包括信息输出模块和至少一个微控制器(MCU);微控制器的型号为STM32F103C8T6,信息输出模块为手机端、IPAD、电脑端等显示屏;控制机构连接有内存条电气连接测试模块,内存条电气连接测试模块包括至少一个恒压源、多个分压电阻、多个模拟多路复用器和至少一个模数转换器(ADC);多个分压电阻和多个模拟多路复用器一一对应设置,分压电阻的一端与一个恒压源电连接,分压电阻的另一端与内存条1中的一个金手指的引脚电连接;分压电阻的输出端还与一个模拟多路复用器电连接;模数转换器的输入端与模拟多路复用器的输出端电连接;模数转换器的输出端与微控制器的输入端电连接;微控制器的输出端与信息输出模块电连接。As shown in Figure 2, the control mechanism includes an information output module and at least one microcontroller (MCU); the model of the microcontroller is STM32F103C8T6, and the information output module is a display screen such as a mobile phone, IPAD, or computer; the control mechanism is connected to a memory The memory module electrical connection test module includes at least one constant voltage source, multiple voltage dividing resistors, multiple analog multiplexers and at least one analog-to-digital converter (ADC); multiple voltage dividing resistors and Multiple analog multiplexers are set in one-to-one correspondence. One end of the voltage-dividing resistor is electrically connected to a constant voltage source, and the other end of the voltage-dividing resistor is electrically connected to a gold finger pin in memory module 1; the voltage-dividing resistor The output terminal is also electrically connected to an analog multiplexer; the input terminal of the analog-to-digital converter is electrically connected to the output terminal of the analog multiplexer; the output terminal of the analog-to-digital converter is electrically connected to the input terminal of the microcontroller. Connection; the output end of the microcontroller is electrically connected to the information output module.

以DDR类型的内存条1为例,基于恒压源的电压较低,通过分压电阻阵列对待测内存条1电路的各个引脚施加电压时不会损伤内存条1上的半导体器件;且待测的电路的电气异常如开路、短路、虚焊等会由于阻抗的不同会反应在对应通道的分压电压有差异。Taking the DDR type memory stick 1 as an example, the voltage of the constant voltage source is low. When applying voltage to each pin of the circuit of the memory stick 1 to be tested through the voltage dividing resistor array, the semiconductor device on the memory stick 1 will not be damaged; and the semiconductor device on the memory stick 1 will not be damaged. Electrical abnormalities in the measured circuit, such as open circuits, short circuits, and weak soldering, will be reflected in differences in the divided voltages of the corresponding channels due to different impedances.

在一实施例中,如图3所示,针对DDR类型的内存条,恒压源可使用LDO电源芯片,LDO电源芯片的型号为LT3080EMS8E#PBF;具有低纹波、输出电压可低至0V的特点,符合电压低至不损坏电脑主板和内存条上的半导体器件的要求。In one embodiment, as shown in Figure 3, for DDR type memory modules, the constant voltage source can use an LDO power chip. The model of the LDO power chip is LT3080EMS8E#PBF; it has low ripple and the output voltage can be as low as 0V. Features, meet the requirements of low voltage that will not damage the semiconductor devices on the computer motherboard and memory stick.

模拟多路复用器可选用SN74LV4051APWR芯片,此芯片为8切1模拟多路复用器,由3个通道选择脚和1个使能脚控制通道切换,即每片SN74LV4051APWR需要4根数字信号来控制选通。The analog multiplexer can choose the SN74LV4051APWR chip. This chip is an 8-cut 1 analog multiplexer. It has 3 channel selection pins and 1 enable pin to control channel switching. That is, each SN74LV4051APWR requires 4 digital signals. Control gating.

如图3所示,DDR内存条共有288根金手指引脚,在所有引脚全部测量的情况下,288个通道共需36个SN74LV4051APWR,因此需要36*4=144个数字信号来控制切换,由于这些数字信号数量超出MCU控制器最大IO数,因此需要通过串并转换器进行IO扩展来控制。串并转换器的型号为SN74HC595PWR,串并转换器也称为移位寄存器,多个移位寄存器可串联使用,以达到少量引脚扩展大量引脚的目的。As shown in Figure 3, the DDR memory module has a total of 288 golden finger pins. When all pins are measured, a total of 36 SN74LV4051APWR are needed for the 288 channels. Therefore, 36*4=144 digital signals are needed to control switching. Since the number of these digital signals exceeds the maximum IO number of the MCU controller, IO expansion needs to be controlled through a serial-to-parallel converter. The model of the serial-to-parallel converter is SN74HC595PWR. The serial-to-parallel converter is also called a shift register. Multiple shift registers can be used in series to achieve the purpose of extending a small number of pins to a large number of pins.

控制机构包括用于读取多个模拟多路复用器的每个通道的电压值的电压值读取模块(图中未示出);电压值读取模块为测量电压值的测量仪器;微控制器基于多个模拟多路复用器的每个通道均对应匹配有电压正常阈值;微控制器将多个模拟多路复用器的各个通道的电压值与对应的电压正常阈值进行比较,并通过信息输出模块输出比较结果。The control mechanism includes a voltage value reading module (not shown in the figure) for reading the voltage value of each channel of a plurality of analog multiplexers; the voltage value reading module is a measuring instrument for measuring voltage values; a micro The controller is based on each channel of multiple analog multiplexers and is matched with a voltage normal threshold; the microcontroller compares the voltage value of each channel of multiple analog multiplexers with the corresponding voltage normal threshold, And output the comparison results through the information output module.

微控制器通过信息输出模块将测量的各个通道内的电压值展示给测试者;测试者通过比对实际的电压值和正常电压值以旁边内存条中的一金手指的引脚是否出现电压异常,测量较准确快速;微控制器将模拟多路复用器的各个通道内的电压与对应的正常阈值进行比较,微控制器通过信息输出模块将电压值的比较结果展示给使用者,实现自动诊断内存条电路上的金手指引脚的电气异常情况。The microcontroller displays the measured voltage values in each channel to the tester through the information output module; the tester compares the actual voltage value with the normal voltage value to determine whether there is a voltage abnormality on the pin of a gold finger in the memory stick next to it. , the measurement is more accurate and fast; the microcontroller compares the voltage in each channel of the analog multiplexer with the corresponding normal threshold, and the microcontroller displays the comparison result of the voltage value to the user through the information output module, realizing automatic Diagnose electrical abnormalities on the gold finger pins on the memory module circuit.

在一实施例中,如图4所示,本实施例以设置有DIMM插槽的主机电路板为例,一个电脑主板上设置有多个DIMM插槽,一个DIMM插槽用于插接一个内存条;DIMM插槽通常使用DDR SDRAM内存条,包括DDR1、DDR2、DDR3和DDR4等类型的内存条;不同的DIMM插槽类型和主板支持的内存条类型是有区别的,需要根据具体的硬件配置来选择相应的内存条。In one embodiment, as shown in Figure 4, this embodiment takes a host circuit board provided with DIMM slots as an example. A computer motherboard is provided with multiple DIMM slots, and one DIMM slot is used to plug in a memory. strips; DIMM slots usually use DDR SDRAM memory strips, including DDR1, DDR2, DDR3 and DDR4 memory strips; different DIMM slot types and the types of memory strips supported by the motherboard are different and need to be configured according to the specific hardware to select the corresponding memory module.

一种内存条的易维修再生利用设计系统中的控制机构包括:包括多个设置有状态指示灯的DIMM插槽;状态指示灯为LED灯;控制机构包括可编程逻辑器件(CPLD)和寄存器(GPIO);状态指示灯与可编程逻辑控制器连接;可编程逻辑控制器通过寄存器连接系统南桥PCH;可编程逻辑器件将寄存器的信号解码到相应的DIMM插槽状态,并控制对应DIMM插槽的状态指示灯的显示状态;即系统南桥PCH通过可编程逻辑器件和寄存器连接;电脑系统在开机过程中,可编程逻辑器件将寄存器的GPIO信号解码到对应的DIMM插槽状态,控制对应DIMM插槽的指示灯状态,从而在发现有内存条故障、内存条类型不被支持等问题时,控制机构将对故障内存条进行禁止,通过设置的指示灯来指示对应出现故障的DIMM内存条。The control mechanism in a design system for easy maintenance and recycling of memory modules includes: multiple DIMM slots equipped with status indicator lights; the status indicator lights are LED lights; the control mechanism includes a programmable logic device (CPLD) and a register ( GPIO); the status indicator light is connected to the programmable logic controller; the programmable logic controller is connected to the system south bridge PCH through the register; the programmable logic device decodes the register signal to the corresponding DIMM slot status and controls the corresponding DIMM slot The display status of the status indicator light; that is, the system south bridge PCH is connected through a programmable logic device and a register; during the boot process of the computer system, the programmable logic device decodes the GPIO signal of the register to the corresponding DIMM slot status and controls the corresponding DIMM The indicator light status of the slot, so that when a problem such as a memory module failure or an unsupported memory module type is found, the control mechanism will disable the faulty memory module and indicate the corresponding failed DIMM memory module through the set indicator lights.

具体地,控制机构连接有运维管理系统,运维管理系统中设置有SMI(简单网络管理协议)程序。控制机构还包括内存控制器;控制机构按照如下的步骤自动处理故障内存条:Specifically, the control mechanism is connected to an operation and maintenance management system, and the operation and maintenance management system is equipped with an SMI (Simple Network Management Protocol) program. The control mechanism also includes a memory controller; the control mechanism automatically handles faulty memory modules according to the following steps:

S1:控制机构启动BIOS,对寄存器进行初始化;控制机构初始化SMI和内存控制器;S1: The control mechanism starts the BIOS and initializes the registers; the control mechanism initializes the SMI and memory controller;

S2:将当前的寄存器的状态保存至存储区,注意侦测各个DIMM插槽内的内存条是否在位;如该DIMM插槽的内存条在位,则点亮该DIMM插槽对应的状态指示灯;并注册周期性SIM程序,初始化该DIMM插槽的内存条;如果该DIMM插槽的内存条不在位,则不点亮该DIMM插槽对应的状态指示灯;S2: Save the current register status to the storage area, and pay attention to detect whether the memory module in each DIMM slot is in place; if the memory module in the DIMM slot is in place, light up the status indicator corresponding to the DIMM slot. light; and register a periodic SIM program to initialize the memory module of the DIMM slot; if the memory module of the DIMM slot is not in place, the status indicator light corresponding to the DIMM slot will not light up;

S3:如果DIMM插槽内的内存初始化正常,可编程逻辑器件控制该DIMM插槽对应的状态指示灯为点亮状态,清除保存在存储区的寄存器状态数据,卸载周期性内存处理的SMI程序;S3: If the memory in the DIMM slot is initialized normally, the programmable logic device controls the status indicator light corresponding to the DIMM slot to be on, clears the register status data saved in the storage area, and unloads the SMI program for periodic memory processing;

S4:如果内存初始化在SMI程序的周期时间间隔到来时未完成,则认为内存条初始化出现故障,周期性SMI中断触发,进入运维管理系统,执行周期性内存处理的SMI程序,将该故障DIMM插槽的内存禁止;将多个DIMM插槽的用号码n区分,n大于1;将DIMM插槽的号码n增加1,指向下一个DIMM插槽,并读取存储区中的寄存器状态的数据,退出SMI程序,将所有寄存器值恢复成存储区读取出来的寄存器的值。S4: If the memory initialization is not completed when the periodic time interval of the SMI program arrives, it is considered that there is a fault in the initialization of the memory module, and the periodic SMI interrupt is triggered. Enter the operation and maintenance management system, execute the SMI program of periodic memory processing, and remove the faulty DIMM. The memory of the slot is disabled; multiple DIMM slots are distinguished by number n, n is greater than 1; increase the number n of the DIMM slot by 1, point to the next DIMM slot, and read the register status data in the storage area , exit the SMI program and restore all register values to the register values read from the storage area.

针对DIMM内存条无法初始化完成,导致电脑系统宕机的情况,控制初始化内存条,发现有内存条故障、内存条类型不被支持等问题,软件程序将对故障的内存条进行禁止,同时设置状态指示灯来表明对应DIMM内存条出现故障,控制机构将进行对下一根内存条进行初始化,直到所有内存条初始化完成,启动电脑系统;从而使得电脑系统不会因为存在故障内存条而宕机,不影响电脑系统的正常使用,同时将故障内存条通过状态指示灯进行标识,方便用户排查故障内存条并进行替换,大大降低排查主板错误的技术难度,简单便捷。For the situation where the DIMM memory module cannot be initialized, causing the computer system to crash, control the initialization of the memory module and find problems such as memory module failure or unsupported memory module type. The software program will disable the faulty memory module and set the status at the same time. The indicator light indicates that the corresponding DIMM memory module is faulty, and the control mechanism will initialize the next memory module until all memory modules are initialized and the computer system is started; thus the computer system will not shut down due to the presence of faulty memory modules. It does not affect the normal use of the computer system, and at the same time, the faulty memory module is identified through the status indicator light, which facilitates users to troubleshoot the faulty memory module and replace it, greatly reducing the technical difficulty of troubleshooting motherboard errors, making it simple and convenient.

在一实施例中,提供一种内存条的易维修再生利用设计方法,应用于如上所述的一种内存条的易维修再生利用设计系统。In one embodiment, a design method for easy maintenance and recycling of a memory stick is provided, which is applied to a design system for easy maintenance and recycling of a memory stick as described above.

一种内存条的易维修再生利用设计方法包括:A design method for easy repair and recycling of memory sticks includes:

S100:用于测试并获取内存条上的每个存储芯片的使用状态,使用状态包括正常使用状态和故障状态;S100: used to test and obtain the usage status of each memory chip on the memory stick. The usage status includes normal usage status and fault status;

S200:在检测到内存条上的至少一个存储芯片出现故障时,自动屏蔽出现故障的相应存储芯片并使得内存条正常使用。S200: When it is detected that at least one memory chip on the memory stick is faulty, the corresponding faulty memory chip is automatically shielded and the memory stick is used normally.

具体地,将存储芯片在内存条上的固定方式从焊接方式改为有引脚的接插方式,用户可以自行更换存储芯片;废弃的内存条上得到最大限度的再生利用,回收机构或用户可自行将损坏的存储芯片更换,整个内存条也可以继续使用;在内存条的内部驱动程序设计中,增加对存储芯片的智能屏蔽设计,使得易维修再生利用设计系统在检测到内存条的某个存储芯片有故障时,自动将其屏蔽起来,不影响整个内存条的正常使用;从而本申请提供了一种便于维修的内存条。Specifically, the fixing method of the memory chip on the memory stick is changed from the welding method to the pinned connection method, so that the user can replace the memory chip by himself; the discarded memory stick can be reused to the maximum extent, and the recycling agency or the user can Replace the damaged memory chip by yourself, and the entire memory stick can continue to be used; in the internal driver design of the memory stick, an intelligent shielding design for the memory chip is added, making the easy-to-repair and reuse design system detect a certain part of the memory stick. When the memory chip is faulty, it will be automatically shielded without affecting the normal use of the entire memory stick; thus, the present application provides a memory stick that is easy to repair.

应理解,上述实施例中各步骤的序号大小并不意味着执行顺序的先后,各过程的执行顺序应以其功能和内在逻辑确定,而不应对本申请实施例的实施过程构成任何限定。It should be understood that the sequence number of each step in the above embodiment does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiment of the present application.

在一个实施例中,提供了一种计算机设备,该计算机设备可以是服务器,其内部结构图可以如图5所示。该计算机设备包括通过系统总线连接的处理器、存储器、网络接口和数据库。其中,该计算机设备的处理器用于提供计算和控制能力。该计算机设备的存储器包括非易失性存储介质、内存储器。该非易失性存储介质存储有操作系统、计算机程序和数据库。该内存储器为非易失性存储介质中的操作系统和计算机程序的运行提供环境。该计算机设备的数据库用于存储存储器、内存条的存储数据。该计算机设备的网络接口用于与外部的终端通过网络连接通信。该计算机程序被处理器执行时以实现一种内存条的易维修再生利用设计方法。In one embodiment, a computer device is provided. The computer device may be a server, and its internal structure diagram may be shown in Figure 5 . The computer device includes a processor, memory, network interface, and database connected through a system bus. Wherein, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes non-volatile storage media and internal memory. The non-volatile storage medium stores operating systems, computer programs and databases. This internal memory provides an environment for the execution of operating systems and computer programs in non-volatile storage media. The database of the computer equipment is used to store the storage data of the memory and the memory stick. The network interface of the computer device is used to communicate with external terminals through a network connection. When the computer program is executed by the processor, a design method for easy maintenance and recycling of the memory stick is implemented.

在一个实施例中,提供了一种计算机设备,包括存储器、处理器以及存储在所述存储器中并可在所述处理器上运行的计算机程序,处理器执行计算机程序时实现以下步骤:In one embodiment, a computer device is provided, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the following steps are implemented:

S100:用于测试并获取内存条上的每个存储芯片的使用状态,使用状态包括正常使用状态和故障状态;S100: used to test and obtain the usage status of each memory chip on the memory stick. The usage status includes normal usage status and fault status;

S200:在检测到内存条上的至少一个存储芯片出现故障时,自动屏蔽出现故障的相应存储芯片并使得内存条正常使用。S200: When it is detected that at least one memory chip on the memory stick is faulty, the corresponding faulty memory chip is automatically shielded and the memory stick is used normally.

在一个实施例中,提供了一种计算机可读存储介质,其上存储有计算机程序,计算机程序被处理器执行时实现以下步骤:In one embodiment, a computer-readable storage medium is provided with a computer program stored thereon. When the computer program is executed by a processor, the following steps are implemented:

S100:用于测试并获取内存条上的每个存储芯片的使用状态,使用状态包括正常使用状态和故障状态;S100: used to test and obtain the usage status of each memory chip on the memory stick. The usage status includes normal usage status and fault status;

S200:在检测到内存条上的至少一个存储芯片出现故障时,自动屏蔽出现故障的相应存储芯片并使得内存条正常使用。S200: When it is detected that at least one memory chip on the memory stick is faulty, the corresponding faulty memory chip is automatically shielded and the memory stick is used normally.

本领域普通技术人员可以理解实现上述实施例方法中的全部或部分流程,是可以通过计算机程序来指令相关的硬件来完成,所述的计算机程序可存储于一非易失性计算机可读取存储介质中,该计算机程序在执行时,可包括如上述各方法的实施例的流程。其中,本申请所提供的各实施例中所使用的对存储器、存储、数据库或其它介质的任何引用,均可包括非易失性和/或易失性存储器。非易失性存储器可包括只读存储器(ROM)、可编程ROM(PROM)、电可编程ROM(EPROM)、电可擦除可编程ROM(EEPROM)或闪存。易失性存储器可包括随机存取存储器(RAM)或者外部高速缓冲存储器。作为说明而非局限,RAM以多种形式可得,诸如静态RAM(SRAM)、动态RAM(DRAM)、同步DRAM(SDRAM)、双数据率SDRAM(DDRSDRAM)、增强型SDRAM(ESDRAM)、同步链路(Synchlink) DRAM(SLDRAM)、存储器总线(Rambus)直接RAM(RDRAM)、直接存储器总线动态RAM(DRDRAM)、以及存储器总线动态RAM(RDRAM)等。Those of ordinary skill in the art can understand that all or part of the processes in the methods of the above embodiments can be completed by instructing relevant hardware through a computer program. The computer program can be stored in a non-volatile computer-readable storage. In the media, when executed, the computer program may include the processes of the above method embodiments. Any reference to memory, storage, database or other media used in the embodiments provided in this application may include non-volatile and/or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in many forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous chain Synchlink DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), etc.

所属领域的技术人员可以清楚地了解到,为了描述的方便和简洁,仅以上述各功能单元、模块的划分进行举例说明,实际应用中,可以根据需要而将上述功能分配由不同的功能单元、模块完成,即将所述装置的内部结构划分成不同的功能单元或模块,以完成以上描述的全部或者部分功能。Those skilled in the art can clearly understand that for the convenience and simplicity of description, only the division of the above functional units and modules is used as an example. In actual applications, the above functions can be allocated to different functional units and modules according to needs. Module completion means dividing the internal structure of the device into different functional units or modules to complete all or part of the functions described above.

以上所述实施例仅用以说明本申请的技术方案,而非对其限制;尽管参照前述实施例对本申请进行了详细的说明,本领域普通技术人员应当理解;其依然可以对前述各实施例所记载的技术方案进行修改,或者对其中部分特征进行等同替换;而这些修改或者替换,并不使相应技术方案的本质脱离本申请各实施例技术方案的精神和范围,均应包含在本申请的保护范围之内。The above embodiments are only used to illustrate the technical solution of the present application, but not to limit it. Although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art will understand that they can still modify the foregoing embodiments. The recorded technical solutions are modified, or some of the features are equivalently replaced; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application, and shall be included in this application. within the scope of protection.

Claims (10)

1. The design system is characterized by comprising a memory bar (1), a control mechanism and a plurality of memory chips (2), wherein a substrate of the memory bar (1) is provided with pin holes (11) for detachably inserting pins of the memory chips (2) corresponding to the memory chips (2), the hole wall of each pin hole (11) is provided with a conductive metal layer (12), and when the pins of the memory chips (2) are inserted into the pin holes (11), the memory chips (2) are electrically connected with the conductive metal layers (12);
the control mechanism is connected with the memory strips (1) and the memory chips (2), and when detecting that at least one memory chip (2) on the memory strips (1) fails, the control mechanism automatically shields the corresponding memory chip (2) which fails and enables the memory strips (1) to be normally used.
2. The easy-repair recycling design system of memory bank according to claim 1, wherein said control mechanism comprises an information output module and at least one microcontroller; the control mechanism is connected with a memory strip electric connection test module, and the memory strip electric connection test module comprises at least one constant voltage source, a plurality of voltage dividing resistors, a plurality of analog multiplexers and at least one analog-to-digital converter;
the voltage dividing resistors and the analog multiplexers are arranged in a one-to-one correspondence manner, one end of each voltage dividing resistor is electrically connected with one constant voltage source, and the other end of each voltage dividing resistor is electrically connected with a pin of a golden finger in the memory strip (1); the output end of the voltage dividing resistor is also electrically connected with the analog multiplexer;
the input end of the analog-to-digital converter is electrically connected with the output end of the analog multiplexer; the output end of the analog-to-digital converter is electrically connected with the input end of the microcontroller;
and the output end of the microcontroller is electrically connected with the information output module.
3. The easy-repair recycling design system of memory bank according to claim 2, wherein said control mechanism comprises a voltage value reading module for reading a voltage value of each channel of the plurality of analog multiplexers;
the microcontroller correspondingly matches a voltage normal threshold value based on each channel of the plurality of analog multiplexers;
and the microcontroller compares the voltage values of the channels of the analog multiplexers with the corresponding normal voltage thresholds and outputs the comparison result through the information output module.
4. The system according to claim 1, wherein the conductive metal layer (12) comprises a soft metal layer, and the soft metal layer is coated and arranged along the hole wall of the pin hole (11) at intervals.
5. The easy-to-repair recycling design system of the memory bank according to claim 1, wherein the conductive metal layer (12) comprises an elastic metal ring, a plurality of pairs of elastic metal rings are arranged corresponding to each pin hole (11), the plurality of pairs of elastic metal layers are vertically arranged at intervals along the hole walls of the pin holes (11), and the elastic metal rings of the same pair are positioned on the hole walls of the two opposite sides of the pin holes (11).
6. The easy repair recycling design system for memory sticks of claim 1, further comprising a plurality of DIMM sockets provided with status indicators; the control mechanism comprises a programmable logic device and a register; the status indicator lamp is connected with the programmable logic controller; the programmable logic controller is connected with a system south bridge PCH through the register;
the programmable logic device decodes the signals of the registers to the corresponding DIMM slot states and controls the display states of the status indicators of the corresponding DIMM slots.
7. The easy repair recycling design system for memory sticks of claim 6, wherein said control mechanism further comprises a memory controller; the control mechanism automatically processes the fault memory bank according to the following steps:
the control mechanism starts a BIOS and initializes the register; the control mechanism initializes the SMI and the memory controller;
storing the current state of the register into a storage area, and paying attention to detecting whether the memory bank in each DIMM slot is in place or not; if the memory bar of the DIMM slot is in place, a state indicator lamp corresponding to the DIMM slot is lightened; registering a periodic SIM program, and initializing a memory bank of the DIMM slot; if the memory bar of the DIMM slot is not in place, the state indicator lamp corresponding to the DIMM slot is not lightened;
if the memory initialization in the DIMM slot is normal, the programmable logic device controls the state indicator lamp corresponding to the DIMM slot to be in a lighting state, clears the register state data stored in the storage area, and unloads the SMI program of periodic memory processing;
if the memory initialization is not completed when the periodic time interval of the SMI program arrives, the memory bank initialization is considered to have a fault, the periodic SMI interrupt is triggered, the SMI program of periodic memory processing is executed, the memory of the fault DIMM slot is forbidden, the next DIMM slot is pointed, the data of the register state in the memory area is read, the SMI program is exited, and all register values are restored to the values of the registers read by the memory area;
a check is made for memory in the next DIMM socket.
8. An easy-to-repair recycling design method for a memory bank, characterized by being applied to an easy-to-repair recycling design system for a memory bank according to any one of claims 1 to 7, comprising:
s1, testing and acquiring the use state of each memory chip on the memory bank, wherein the use state comprises a normal use state and a fault state;
s2, when detecting that at least one memory chip on the memory strip fails, automatically shielding the corresponding memory chip with the failure and enabling the memory strip to be used normally.
9. A computer device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, wherein the processor, when executing the computer program, implements the steps of the easy repair recycling design method for memory sticks as claimed in claim 8.
10. A computer-readable storage medium storing a computer program, wherein the computer program when executed by a processor implements the steps of the easy-repair recycling design method for memory banks according to claim 8.
CN202311096677.5A 2023-08-28 2023-08-28 Easy-maintenance and regeneration design system, method and equipment for memory bank Withdrawn CN116994633A (en)

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Cited By (1)

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Publication number Priority date Publication date Assignee Title
CN117976028A (en) * 2024-02-04 2024-05-03 皇虎测试科技(深圳)有限公司 Memory bar for memory test and memory test method thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117976028A (en) * 2024-02-04 2024-05-03 皇虎测试科技(深圳)有限公司 Memory bar for memory test and memory test method thereof

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