CN114965395A - Long afterglow material fluorescence spectrum test tool and method - Google Patents
Long afterglow material fluorescence spectrum test tool and method Download PDFInfo
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Abstract
Description
技术领域technical field
本发明涉及荧光光谱测试技术领域,具体涉及一种长余辉材料荧光光谱测试工装及方法。The invention relates to the technical field of fluorescence spectrum testing, in particular to a long afterglow material fluorescence spectrum testing tool and method.
背景技术Background technique
长余辉发光材料是发光材料的一种,相比于常规的发光材料,其特点是可以在特定波长的激光光源的照射下受到激发而发光,同时能够把激发能量存储起来,在撤掉激发光源后依然保持发光。这一特点使得长余辉发光材料在应急安全指示、防伪标识、信息存储、医学检查、景观亮化等领域都有应用。Long afterglow luminescent material is a kind of luminescent material. Compared with conventional luminescent materials, it is characterized in that it can be excited to emit light under the irradiation of a laser light source of a specific wavelength, and can store the excitation energy at the same time. Still glowing afterward. This feature makes long afterglow luminescent materials used in emergency safety instructions, anti-counterfeiting signs, information storage, medical inspection, landscape lighting and other fields.
作为一种发光材料,激发光谱和发射光谱的测试是其研究过程中非常重要的表征手段,这一测试不仅仅能够确定发光材料的最佳激励光源和发光颜色,也对其发光过程的研究具有重要意义。因此,对其精确测试是很关键的。As a luminescent material, the test of excitation spectrum and emission spectrum is a very important characterization method in its research process. This test can not only determine the best excitation light source and luminescent color of luminescent material, but also has a great influence on the research of its luminescent process. important meaning. Therefore, its accurate testing is critical.
激发光谱的测试方法通常是在荧光探测器的监控下,逐渐改变激发光的波长,记录不同激发波长下的荧光强度形成光谱;发射光谱的测试方法是在把发光材料置于某一激光光源下,通过单色器和探测器扫描荧光的光谱成分,获得荧光发射光谱。目前,荧光光谱测试是一种比较成熟的技术,但是在长余辉材料的测试上却存在着一些问题,原因是长余辉效应会影响测试结果,以激发光谱测试为例,当激发光源的波长从一个方向向另一个方向扫描时,前一个激发波长点导致的长余辉效应(发光延迟)会叠加到后一个激发波长点引起的荧光效应上,导致激发光谱峰位的变动以及激发光谱的展宽。而且,由于长余辉发光和荧光发光的波长通常是一致的,因此难以通过常规的滤波片等手段使二者分开。The test method of excitation spectrum is usually to gradually change the wavelength of the excitation light under the monitoring of the fluorescence detector, and record the fluorescence intensity under different excitation wavelengths to form a spectrum; the test method of emission spectrum is to place the luminescent material under a certain laser light source. , the fluorescence emission spectrum is obtained by scanning the spectral components of the fluorescence through a monochromator and a detector. At present, fluorescence spectrum test is a relatively mature technology, but there are some problems in the test of long afterglow materials, because the long afterglow effect will affect the test results. Taking excitation spectrum test as an example, when the wavelength of the excitation light source varies from When scanning from one direction to the other, the long afterglow effect (luminescence delay) caused by the previous excitation wavelength point will be superimposed on the fluorescence effect caused by the latter excitation wavelength point, resulting in a change in the peak position of the excitation spectrum and a broadening of the excitation spectrum. Moreover, since the wavelengths of long afterglow emission and fluorescence emission are usually the same, it is difficult to separate the two through conventional filters and other means.
长余辉效应对激发光谱测试的影响还表现在测试一致性较差上,实践中一般是在测试前对材料进行避光处理或者热处理,尽量降低长余辉效应的影响,但是总的来说无法完全避免这种影响。中国发明专利CN108007906B公开了一种长余辉材料磷光激发光谱测量系统及方法,也注意到长余辉发光材料荧光和磷光(长余辉发光)的不同,并尝试进行区分荧光激发光谱和磷光激发光谱,但是其只是通过延迟某一激发波长下的发光采集时间来筛选磷光光谱,也未避免前一个激发点产生的磷光对后一个激发点产生的影响。The influence of the long afterglow effect on the excitation spectrum test is also reflected in the poor test consistency. In practice, the material is generally protected from light or heat treated before the test to minimize the influence of the long afterglow effect, but in general it cannot be completely avoid this effect. Chinese invention patent CN108007906B discloses a long afterglow material phosphorescence excitation spectrum measurement system and method, also noticed the difference between fluorescence and phosphorescence (long afterglow luminescence) of long afterglow luminescent materials, and tried to distinguish the fluorescence excitation spectrum and the phosphorescence excitation spectrum, but It only filters the phosphorescence spectrum by delaying the emission collection time under a certain excitation wavelength, and does not avoid the influence of the phosphorescence generated at the previous excitation point on the latter excitation point.
目前,长余辉发光材料的长余辉效应对荧光光谱尤其是激发光谱测试的影响,对研究材料的发光过程、能级结构等都有不利影响。无法精确测量激发光谱的峰位也给长余辉材料的应用带来不便,使人们不能有效确定最高效的激发波长。因此,设计一种能够精确测量长余辉材料荧光光谱的方法是必要的。At present, the long afterglow effect of long afterglow luminescent materials has an adverse effect on the fluorescence spectrum, especially the excitation spectrum test, and has adverse effects on the luminescence process and energy level structure of the studied materials. The inability to accurately measure the peak position of the excitation spectrum also brings inconvenience to the application of long afterglow materials, making it impossible to effectively determine the most efficient excitation wavelength. Therefore, it is necessary to design a method that can accurately measure the fluorescence spectra of long-persistence materials.
发明内容SUMMARY OF THE INVENTION
有鉴于此,本发明公开了一种长余辉材料荧光光谱测试工装及方法,能够有效避免长余辉效应对荧光光谱测试的影响,使得测试结果准确可靠。In view of this, the present invention discloses a long afterglow material fluorescence spectrum test tool and method, which can effectively avoid the influence of the long afterglow effect on the fluorescence spectrum test, so that the test results are accurate and reliable.
根据本发明的目的提出的一种长余辉材料荧光光谱测试工装,包括激光光源、荧光光谱仪以及待测材料安装结构;所述待测材料安装结构包括转动料盘、不透明固定料盘盖、不透明荧光狭缝盖以及运动控制器;所述转动料盘内部装填待测材料,安装于不透明固定料盘盖的一侧,可在运动控制器的控制下相对于不透明固定料盘盖转动;所述转动料盘至少朝向不透明固定料盘盖的一侧为透明的;所述不透明固定料盘盖上设置有狭缝,激光可透过狭缝照射于转动料盘内的待测材料上;所述不透明荧光狭缝盖安装于不透明固定料盘盖上,以遮挡狭缝,并可在运动控制器的控制下打开或关闭。According to the purpose of the present invention, a long afterglow material fluorescence spectrum testing tool is proposed, which includes a laser light source, a fluorescence spectrometer, and an installation structure for the material to be measured; the installation structure for the material to be measured includes a rotating tray, an opaque fixed tray cover, and an opaque fluorescent A slit cover and a motion controller; the rotating material tray is filled with the material to be tested, installed on one side of the opaque fixed tray cover, and can be rotated relative to the opaque fixed tray cover under the control of the motion controller; the rotation At least the side facing the opaque fixed tray cover is transparent; the opaque fixed tray cover is provided with a slit, and the laser can be irradiated on the material to be tested in the rotating tray through the slit; the opaque fixed tray cover The fluorescent slit cover is installed on the opaque fixed tray cover to cover the slit and can be opened or closed under the control of the motion controller.
优选的,所述转动料盘朝向不透明固定料盘盖的一侧可拆卸固定安装有透明料盘盖。Preferably, a transparent tray cover is detachably and fixedly installed on the side of the rotating tray facing the opaque fixed tray cover.
优选的,所述转动料盘、透明料盘盖以及不透明固定料盘盖均为形状、大小适配的环形,所述狭缝径向设置于不透明固定料盘盖上。Preferably, the rotating tray, the transparent tray cover and the opaque fixed tray cover are all annular shapes and sizes adapted to each other, and the slits are radially arranged on the opaque fixed tray cover.
优选的,所述不透明固定料盘盖中轴上固定安装有转动电机,所述转动料盘中心通过连杆固定安装有与转动电机配合安装的连接头,所述转动料盘在转动电机的驱动下相对于不透明固定料盘盖转动;所述不透明固定料盘盖固定安装于运动控制器外壳上。Preferably, a rotating motor is fixedly installed on the central shaft of the opaque fixed tray cover, and a connecting head that cooperates with the rotating motor is fixedly installed in the center of the rotating tray through a connecting rod, and the rotating tray is driven by the rotating motor. The lower part rotates relative to the opaque fixed tray cover; the opaque fixed tray cover is fixedly mounted on the motion controller casing.
优选的,所述不透明荧光狭缝盖外表面涂有荧光材料。Preferably, the outer surface of the opaque fluorescent slit cover is coated with fluorescent material.
本发明另外公开的一种基于上述测试工装进行长余辉材料荧光光谱测试的方法,包括以下步骤:The present invention also discloses a method for testing the fluorescence spectrum of long afterglow materials based on the above-mentioned test tool, comprising the following steps:
步骤一:装填待测材料,将带透明料盘盖的转动料盘安装到不透明固定料盘盖上,关闭不透明荧光狭缝盖使其遮盖不透明固定料盘盖上的狭缝。Step 1: Fill the material to be tested, install the rotating tray with the transparent tray cover on the opaque fixed tray cover, and close the opaque fluorescent slit cover to cover the slit on the opaque fixed tray cover.
步骤二:将装配好的待测材料安装结构整体安装在荧光光谱仪内。Step 2: Install the assembled installation structure of the material to be tested in the fluorescence spectrometer as a whole.
步骤三:调整光路使激发光可以照射到不透明荧光狭缝盖,并以不透明荧光狭缝盖外表面的荧光材料为参考调整仪器参数,使荧光光谱仪处于手动扫描模式。Step 3: Adjust the optical path so that the excitation light can irradiate the opaque fluorescent slit cover, and adjust the instrument parameters with the fluorescent material on the outer surface of the opaque fluorescent slit cover as a reference, so that the fluorescence spectrometer is in the manual scanning mode.
步骤四:按照荧光光谱扫描速度,设置转动料盘的转动速度,使转动料盘的转动周期小于荧光光谱仪扫描周期,并取最大值。Step 4: According to the scanning speed of the fluorescence spectrum, set the rotation speed of the rotating material tray, so that the rotation period of the rotating material tray is smaller than the scanning period of the fluorescence spectrometer, and take the maximum value.
步骤五:设置完毕后,打开不透明荧光狭缝盖,同时开始荧光光谱扫描,扫描完毕后保存数据。Step 5: After the setting is completed, open the opaque fluorescent slit cover, and start the fluorescence spectrum scanning at the same time, and save the data after scanning.
与现有技术相比,本发明公开的一种长余辉材料荧光光谱测试工装及方法的优点是:Compared with the prior art, the advantages of a long afterglow material fluorescence spectrum testing tool and method disclosed in the present invention are:
(1)本发明中转动料盘与带狭缝的不透明固定料盘盖配合设置,随着激发波长的变化,转动料盘相对于不透明固定料盘盖持续转动,被测材料依次连续通过狭缝而被照射产生荧光,已经被照射产生长余辉效应的被测材料会被遮住从而避免对后面的测试产生影响,从而有效避免了长余辉效应对荧光光谱测试的影响,测试方法科学、有效,测试结果更加准确,有利于推动长余辉材料科研工作的进步。(1) In the present invention, the rotating feed tray and the opaque fixed feed tray cover with slits are arranged in coordination. With the change of the excitation wavelength, the rotating feed tray continues to rotate relative to the opaque fixed feed tray cover, and the material to be tested successively passes through the slits. The material to be tested that is irradiated to produce fluorescence and has been irradiated to produce a long afterglow effect will be covered to avoid affecting subsequent tests, thereby effectively avoiding the long afterglow effect on the fluorescence spectrum test. The test method is scientific and effective. The test results are more accurate, which is conducive to promoting the progress of scientific research on long afterglow materials.
(2)本发明所公开的工装本身是密封避光结构,整个测试过程不需要在黑暗环境下进行,操作难度降低。(2) The tooling disclosed in the present invention itself is a sealed light-proof structure, and the whole testing process does not need to be carried out in a dark environment, and the operation difficulty is reduced.
(3)本发明所公开的工装成本较低,使用方法简单,有利于标准化生产,对于长余辉发光材料的生产也具有推动作用。(3) The tooling disclosed in the present invention has low cost, simple use method, is conducive to standardized production, and also has a driving effect on the production of long afterglow luminescent materials.
附图说明Description of drawings
为了更清楚的说明本发明实施例或现有技术的技术方案,下面将对实施例或现有技术描述中所需要使用的附图做简单的介绍,显而易见的,下面描述中的附图仅仅是本发明的一些实施例,对于本领域中的普通技术人员来说,在不付出创造性劳动的前提下,还可根据这些附图获得其他附图。In order to illustrate the technical solutions of the embodiments of the present invention or the prior art more clearly, the following briefly introduces the accompanying drawings used in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only For some embodiments of the present invention, for those of ordinary skill in the art, other drawings can also be obtained from these drawings without creative effort.
图1为待测材料安装结构拆解图。Figure 1 is a disassembled diagram of the installation structure of the material to be tested.
图2为待测材料安装结构整体结构图。FIG. 2 is an overall structural diagram of the installation structure of the material to be tested.
图中:1-转动料盘;2-透明料盘盖;3-狭缝;4-不透明固定料盘盖;5-不透明荧光狭缝盖;6-转动电机;7-运动控制器;8-连接头;9-连杆。In the figure: 1- Rotating tray; 2- Transparent tray cover; 3- Slit; 4- Opaque fixed tray cover; 5- Opaque fluorescent slit cover; 6- Rotating motor; 7- Motion controller; 8- Connector; 9-Link.
具体实施方式Detailed ways
下面结合附图对本发明的具体实施方式做简要说明。显然,所描述的实施例仅仅是本发明的一部分实施例,而不是全部实施例,基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动的前提下所获得的所有其他实施例,均属于本发明保护的范围。The specific embodiments of the present invention will be briefly described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, those of ordinary skill in the art can obtain all other implementations without creative work. For example, all belong to the protection scope of the present invention.
图1-图2示出了本发明较佳的实施例,对其进行了详细的剖析。Fig. 1-Fig. 2 show a preferred embodiment of the present invention, which is analyzed in detail.
本发明公开的一种长余辉材料荧光光谱测试工装,包括激光光源、荧光光谱仪以及待测材料安装结构。如图1、2所示的待测材料安装结构包括转动料盘1、透明料盘盖2、不透明固定料盘盖4、不透明荧光狭缝盖5以及运动控制器7。The invention discloses a long afterglow material fluorescence spectrum testing tool, which includes a laser light source, a fluorescence spectrometer and an installation structure for a material to be tested. The installation structure of the material to be tested as shown in FIGS. 1 and 2 includes a rotating tray 1 , a
转动料盘1、透明料盘盖2以及不透明固定料盘盖4均为形状、大小适配的环形。转动料盘1内部装填待测材料,透明料盘盖2采用亚克力材料制作而成,用螺丝固定在转动料盘1上随之一起转动。不透明固定料盘盖4中轴上固定安装有转动电机6,转动料盘1中心通过三个连杆9固定安装有与转动电机6配合安装的连接头8,转动料盘1通过连接头8与转动电机6的连接实现与不透明固定料盘盖4的转动连接,安装透明料盘盖2的一侧朝向不透明固定料盘盖4设置,转动料盘1可在转动电机6的驱动下相对于不透明固定料盘盖4转动,使得转动料盘1内不同位置的待测材料依次暴露于不透明固定料盘盖4的狭缝3下。The rotating tray 1 , the
不透明固定料盘盖4固定安装于运动控制器7外壳上,采用铝材制作,表面氧化发黑处理,其上沿其径向设置有狭缝3,狭缝3的宽度为2mm,激光可透过狭缝3照射于待测材料上。不透明荧光狭缝盖5安装于狭缝3上,以遮挡狭缝3,使得未测试时激发光源无法通过不透明固定料盘盖4的狭缝3照射被测物料。不透明荧光狭缝盖5可在运动控制器7的控制下相对于不透明固定料盘盖4自动打开或关闭。不透明荧光狭缝盖5外表面涂有YAG:Ce荧光陶瓷材料,当激发光照射到其外表面的YAG:Ce荧光陶瓷材料上产生荧光,可供设备调试所用。The opaque fixed
本发明另外公开的一种基于上述测试工装进行长余辉材料荧光光谱测试的方法,包括以下步骤:The present invention also discloses a method for testing the fluorescence spectrum of long afterglow materials based on the above-mentioned test tool, comprising the following steps:
步骤一:装填待测材料,安装透明料盘盖2,并将带透明料盘盖2的转动料盘1安装到不透明固定料盘盖4上,关闭不透明荧光狭缝盖5使其遮盖不透明固定料盘盖4上的狭缝3。Step 1: Fill the material to be tested, install the
步骤二:将装配好的待测材料安装结构整体安装在荧光光谱仪内。Step 2: Install the assembled installation structure of the material to be tested in the fluorescence spectrometer as a whole.
步骤三:调整光路使激发光可以照射到不透明荧光狭缝盖5,并以不透明荧光狭缝盖5外表面的荧光材料为参考调整仪器参数,使荧光光谱仪处于手动扫描模式。Step 3: Adjust the optical path so that the excitation light can irradiate the opaque fluorescent slit
步骤四:按照荧光光谱扫描速度,设置转动料盘1的转动速度,使转动料盘1的转动周期小于荧光光谱仪扫描周期,并取最大值。Step 4: According to the scanning speed of the fluorescence spectrum, set the rotation speed of the rotating tray 1 so that the rotation period of the rotating tray 1 is smaller than the scanning period of the fluorescence spectrometer, and take the maximum value.
步骤五:设置完毕后,通过遥控打开不透明荧光狭缝盖5,同时开始荧光光谱扫描。随着激发波长的变化,转动料盘1持续转动,如此一来被测材料依次连续通过狭缝3而被照射产生荧光,已经被照射产生长余辉效应的被测材料会被遮住从而避免对后面的测试产生影响。扫描完毕后保存数据,测试完毕。Step 5: After the setting is completed, open the opaque fluorescent slit
对所公开的实施例的上述说明,使本领域专业技术人员能够实现和使用本发明。对这些实施例的多种修改方式对本领域的专业技术人员来说将是显而易见的,本文中所定义的一般原理可以在不脱离本发明的精神和范围的情况下,在其他实施例中实现。因此,本发明将不会被限制于本文所示的这些实施例,而是要符合本文所公开的原理和新颖特点相一致的最宽的范围。The foregoing description of the disclosed embodiments enables those skilled in the art to make and use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be implemented in other embodiments without departing from the spirit and scope of the present invention. Thus, the present invention is not intended to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
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