Disclosure of Invention
In view of the disadvantages in the prior art, the present invention provides an organic electroluminescent device, comprising:
a thin film transistor array substrate;
an organic light emitting diode comprising:
an anode comprising a silver film, the anode disposed on the thin film transistor array and electrically connected to the thin film transistor;
an organic functional layer, which at least comprises an organic light-emitting layer and is positioned on the anode;
a cathode, said cathode being located over the organic functional layer; and
a pixel defining layer for defining a pixel region;
a protective layer between the anode and the pixel defining layer; and
and the packaging cover plate is positioned on the light-emitting side of the organic light-emitting diode so as to package the organic light-emitting diode in a sealing space between the packaging cover plate and the thin film transistor array substrate.
Further, the protective layer covers at least the anode portion in contact with the pixel defining layer.
Further, the protective layer covers only the anode portion in contact with the pixel defining layer.
Further, the protective layer is made of an inorganic material.
Further, the protective layer material is nitride or oxynitride.
Further, the thickness of the protective layer is larger than
Further, the protective layer covers at least a side surface and an upper surface of the anode.
Further, the protective layer is made of a conductive semiconductor material.
Further, the protective layer material is indium tin oxide.
Further, the thickness of the protective layer is
Further, the anode further comprises a first conductive layer and a second conductive layer, and the silver film is positioned between the first conductive layer and the second conductive layer.
Compared with the prior art, the invention has at least the following effects:
1. the protective layer can effectively prevent the silver film in the anode from rising, so that the phenomenon that the cathode and the anode are short-circuited to influence the luminous effect due to the migration of silver ions in the discharging process is prevented.
2. The organic material used by the pixel defining layer contains sulfide and oxide, and the metal silver is active and unstable in property and is easy to be vulcanized and oxidized.
Detailed Description
Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of example embodiments to those skilled in the art. The same reference numerals in the drawings denote the same or similar structures, and thus their repetitive description will be omitted.
The description of the directions and positions of the upper, lower, middle, upper and the like in the present invention is provided by the accompanying drawings as an example, but may be changed as required, and all the changes are included in the scope of the present invention. The terms first and second are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implying any number of technical features indicated.
The present inventors have investigated the cause of the problem in relation to the phenomenon of the silver thin film 12 bulging in the anode 1. In the prior art, an ITO/Ag/ITO combination is adopted for the anode 1, and the stress values of an ITO layer and a silver film in the combination are detected. The test instrument is a membrane stress tester generally known or used on the market. The detection method comprises the following steps: placing the silicon wafer attached to the substrate into a film stress tester, and detecting the film stress of the silicon wafer before film coating to obtain a previous value A; taking out the silicon wafer, and plating a film to be detected for the stress value on the silicon wafer; and (3) placing the silicon wafer plated with the film into a film stress tester for detection to obtain a back value B, and subtracting the front value A from the back value B to obtain the stress value of the film.
The detection is carried out by adopting the method, and in the reflecting anode electrode, the stress value of the silver thin film 12 is-34 mPa, and the stress type is compressive stress (compression). The first ITO layer 11 and the second ITO layer 13 have a stress value of-167 mPa and a stress type of compressive stress (compression). And the pixel defining layer 2 has a stress value of 3400mPa and the stress type is Tensile stress (Tensile). Therefore, as shown in fig. 3 (a) and (b), a tensile film stress is generated when the silver film 12 is in contact with the pixel defining layer 2. As shown in fig. 3, when both stresses are Isotropic stresses (Isotropic Stress), a Mud crack (Mud Flat Cracks) phenomenon shown in fig. 3 (c) occurs on the contact surface of the silver thin film 12 and the pixel defining layer 2; when both the stresses are Anisotropic stresses (Anisotropic stresses), Straight Cracks (Straight Cracks) as shown in fig. 3 (d) are generated on the contact surface of the silver thin film 12 and the pixel defining layer 2.
Through the above analysis, when the silver thin film 12 is in contact with the pixel defining layer 2 after the anode 1 process is completed, the silver thin film 12 may be pulled by the tensile stress of the pixel defining layer 2 to cause the above-mentioned doming phenomenon due to the difference in film stress and stress type between the silver thin film 12 and the pixel defining layer 2.
In addition, the pixel defining layer 2 can be formed by some photosensitive materials, polymer materials, silicon oxides, and silicon nitrides, the used materials contain a small amount of sulfides and/or oxides, and the metal silver is active and unstable, and the silver film 12 is thin, and the silver film 12 can be damaged by the small amount of sulfides and oxides, so that the silver film 12 can be easily vulcanized and oxidized.
In order to avoid the above phenomenon, the present invention provides an organic electroluminescent device comprising: the light emitting diode package comprises a Thin Film Transistor (TFT) array substrate, an Organic Light Emitting Diode (OLED) positioned on the TFT array substrate, a protective layer and a package cover plate.
The TFT array of the present invention includes: the structure of the active layer, the gate electrode, the gate insulating layer, the source electrode, the drain electrode, the passivation layer, the planarization layer and the like can be formed in sequence according to the film structure process technology (deposition, photoetching and other processes) in the prior art.
The organic light emitting diode is disposed above the TFT array and electrically connected to the thin film transistor, and includes: an anode 1, an organic functional layer (not shown) formed over the anode 1, a cathode (not shown) positioned over the organic functional layer, and a pixel defining layer 2. Fig. 4F and 5E show only the anode 1 and pixel defining layer 2 structures.
The anode 1 in the present invention includes a silver thin film 12 serving as a reflective layer. The silver thin film 12 may be a pure silver thin film or a silver alloy thin film containing at least one element selected from Pd, Cu, Ti, Nb, Al, Pb, Au, Nd, Ca, and Mg. The anode 1 may further include a first conductive layer and a second conductive layer with the silver thin film 12 therebetween.
The anode 1 may be formed by laminating the silver thin film 12 with a first conductive layer and a second conductive layer made of other conductive semiconductor materials, which may be any conductive glass that may be used as an anode of an organic light emitting diode, including, but not limited to, Indium Tin Oxide (ITO), aluminum-doped zinc oxide (AZO), indium-doped zinc oxide (IZO), antimony-doped tin dioxide (ATO), or fluorine-doped tin oxide (FTO). In one embodiment, the first conductive layer and the second conductive layer are ITO layers, and the anode 1 is formed by sequentially laminating a first ITO layer 11, a silver thin film 12, and a second ITO layer 13, and the anode laminated structure is described as an example in the drawings and the embodiments. The anode 1 may be formed using process techniques known in the art.
The organic functional layer at least comprises an organic light-emitting layer, and can further comprise one or more layers of a hole injection layer, a hole transport layer, an electron blocking layer, a hole blocking layer, an electron transport layer and an electron injection layer. The organic functional layer can be formed sequentially by using materials and process technology in the prior art.
For the cathode, an alkali metal, an alkaline earth metal, a transition metal, a group 13 metal of the periodic table, an alloy of the above metals, or the like can be used, and a transparent conductive electrode made of a conductive metal oxide, a conductive organic substance, a conductive semiconductor material, or the like can also be used. Examples include: metals such as lithium, sodium, potassium, rubidium, cesium, beryllium, magnesium, calcium, strontium, barium, aluminum, scandium, vanadium, zinc, yttrium, indium, cerium, samarium, europium, terbium, ytterbium, magnesium-silver alloys, magnesium-indium alloys, magnesium-aluminum alloys, indium-silver alloys, lithium-aluminum alloys, lithium-magnesium alloys, lithium-indium alloys, calcium-aluminum alloys, and the like, conductive metal oxides such as indium oxide, zinc oxide, tin oxide, Indium Tin Oxide (ITO), and indium-doped zinc oxide (IZO), and conductive semiconductor materials. The cathode may be formed using prior art process techniques.
Referring to fig. 4F and 5E, a pixel defining layer 2 of the organic light emitting diode covers a side surface and a portion of a first surface (an upper surface in the illustration of the embodiment) of an anode 1 to define a pixel region, and a protective layer 3 is disposed between the anode 1 and the pixel defining layer 2, wherein the protective layer 3 separates the anode 1 from the pixel defining layer 2 to protect the anode 1.
The protective layer 3 can effectively prevent the silver film 12 in the anode 1 from swelling, thereby preventing silver ions from migrating in the discharging process, avoiding the phenomenon of short circuit between the cathode and the anode, and improving the luminous effect. Since the anode 1 and the pixel defining layer 2 are separated by the protective layer 3, the protective layer 3 can function to prevent the silver thin film 12 in the anode 1 from being vulcanized or oxidized.
The protective layer 3 may cover a part of the anode 1, as shown in fig. 4F, wherein the protective layer 3 covers at least a part of the anode in contact with the pixel defining layer 2, including the side surfaces and a part of the upper surface of the anode 1. In some embodiments, the protective layer 3 may further extend from the side of the anode 1 to the non-light emitting region, for example, to a region between the pixel defining layer 2 and the planarizing layer. The protective layer 3 preferably covers only the anode portion in contact with the pixel defining layer 2, whereby the protective layer 3 does not block upward emission of light reflected by the silver thin film 12, thereby contributing to an increase in aperture ratio. When the protective layer 3 covers part of the anode 1, the protective layer 3 may be made of an inorganic material, and the stress value and the stress type of the protective layer 3 made of the inorganic material are similar to those of the anode 1. The thickness of the protective layer 3 formed of an inorganic material may be greater than
Useful inorganic materials include, but are not limited to, one of the following and combinations thereof: the oxide, nitride, oxynitride, and fluoride are preferable, and the oxide, nitride, and oxynitride are more preferable. Oxides include, but are not limited to, alumina, zirconia, zinc oxide, titania, magnesia, silica. Nitrides include, but are not limited to, silicon nitride, aluminum nitride, titanium nitride. Oxynitrides include, but are not limited to, silicon oxynitride, aluminum oxynitride, titanium oxynitride. Fluorides include, but are not limited to, magnesium fluoride, sodium fluoride.
Methods for preparing the protective layer 3 from inorganic materials include, but are not limited to, evaporation, sputtering, spin coating, spray coating, screen printing, ink jet printing, Chemical Vapor Deposition (CVD).
The
protective layer 3 may also be a transparent protective layer covering the side surfaces and the entire upper surface of the
anode 1, and as shown in fig. 5E, the
protective layer 3 covers the portion of the anode in contact with the
pixel defining layer 2, including the anode side surfaces and the entire upper surface. In some embodiments, the
protective layer 3 may further extend from the side of the
anode 1 to the non-light emitting region, for example, to a region between the
pixel defining layer 2 and the planarizing layer. When the
protective layer 3 covers the side surfaces and the entire upper surface of the
anode 1, the
protective layer 3 may be made of a conductive semiconductor material, preferably a semiconductor material having high transparency, so as to increase the transmittance of light reflected by the silver
thin film 12. The thickness of the
protective layer 3 may be formed
Preference is given to
Useful conductive semiconductor materials include, but are not limited to, one of Indium Tin Oxide (ITO), aluminum-doped zinc oxide (AZO), indium-doped zinc oxide (IZO), antimony-doped tin oxide (ATO), fluorine-doped tin oxide (FTO), or combinations thereof, preferably Indium Tin Oxide (ITO).
Methods of preparing the protective layer 3 from the transparent conductive semiconductor material include, but are not limited to, evaporation, sputtering, spin coating, spray coating, screen printing, ink jet printing, Chemical Vapor Deposition (CVD).
The embodiment of the invention also provides a preparation method of the organic electroluminescent element, which comprises the following steps:
the method comprises the following steps: providing a substrate which can be a rigid substrate or a flexible substrate, including but not limited to a glass substrate, a quartz substrate, a metal substrate, an organic polymer substrate, a metal oxide substrate, and cleaning the substrate by using a prior art method including ultrasonic cleaning;
step two: manufacturing a TFT array on the cleaned glass substrate, wherein the related process flow comprises the following steps of 1: preparing a polysilicon layer, and step 2: preparing a grid, and step 3: preparing an insulating layer, and step 4: forming a data line layer, and a step 5: preparing a buffer layer, and 6: preparing a planarization layer;
step three: the organic light emitting diode is prepared on the TFT array, and the related process flow comprises the following steps of 1: preparing an anode 1, and a step 2: preparing a protective layer 3, and step 3: preparing a pixel definition layer 2, and a 4 th step: preparing an organic functional layer, wherein the organic functional layer at least comprises an organic light-emitting layer, and the step 5: and preparing a cathode.
Step four: and providing a packaging cover plate, wherein the material of the cover plate can be the same as or different from that of the substrate, performing a packaging process, and packaging the organic light-emitting diode in a sealed space between the packaging cover plate and the thin film transistor array substrate to form the organic electroluminescent element.
The process for producing the protective layer 3 of the present invention is described in detail below by way of examples.