When Government drawings, specifications, or other data are used for any purpose other than in co... more When Government drawings, specifications, or other data are used for any purpose other than in connection with a definitely Government-related procurement, the United States Government incurs no responsibility or any obligation whatsoever. The fact that the Government may have formulated or in any way supplied the said drawings, specifications, or other data, is not to be regarded by implication, or otherwise as in any manner construed, as licensing the holder, or any other person or corporation; or as conveying any rights or permission to manufacture, use, or sell any patented invention that may in any way be related thereto. This technical report has been reviewed and is approved for publication.
: The Millimeter Wave Reflectivity Measurement System (MRMS) is used by researchers to investigat... more : The Millimeter Wave Reflectivity Measurement System (MRMS) is used by researchers to investigate the basic phenomenology, to verify theoretical models, and to assess the effectiveness of actual countermeasures of various materials for target scattering at millimeter wave (MMW) frequencies. The data acquisition portion of the MRMS was constructed using a Hewlett-Packard (HP) 310 computer as the system controller. The data acquisition controller was difficult to operate because its operating system and disk formats were quite different from personal computer (PC) operating system the engineer or scientist was accustomed to using. Off-the-shelf PC products are readily available. There is extensive in-house programming expertise for the PC which is not the case with the HP computer. The limitations with the HP computer-based controller hampered the ability of the MRMS to be an effective tool and meet the needs of the engineer and scientist. The decision was made to switch to a PC-base...
: The RF Technology Section of WL/MNGS is developing an in-house capability for modeling and meas... more : The RF Technology Section of WL/MNGS is developing an in-house capability for modeling and measurement of target scattering and material characteristics at millimeter wave (MMW) frequencies. The goal of the modeling effort is to understand the basic mechanisms that contribute to the target scattering (coated and uncoated) at MMW frequencies. The measurement effort is two-fold: verify theoretical models (target and materials) and assess the effectiveness of actual countermeasures. The MMW Reflectivity Measurement System (MRMS) is capable of bistatic swept frequency measurements for copolarized (COPOL) transmit and receive signals, and it gives a quick-look capability useful in evaluating countermeasures. The primary goal is the understanding of the various mechanisms that contribute to the scattering in order to develop the algorithms and technology necessary to exploit these effects and improve seeker guidance techniques. This paper discusses the current hardware configuration and...
: This report compares three solutions for scattering from a perfectly conducting risk. It compar... more : This report compares three solutions for scattering from a perfectly conducting risk. It compares a closed form Physical Optics (PO) solution, a solution found by applying the RADC/BSRCRCS scattering prediction code, and an exact eigenfunction solution. The results are compared for various ka values and incidence angles for both horizontal and vertical polarizations. In addition, this report determined the applicability of the disk as a calibration standard for bistatic radar cross section (RCS) measurements by examining the calibration curve. This curve is a plot of the specular return as a function of bistatic angle. This curve is computed for both horizontal and vertical polarizations at various ka values using the PO and eigenfunction solutions. Results show that PO agrees reasonably well with the PTD and eigenfunction solutions in certain cases. The agreement is particulary good for the calibration curve for a wide range of bistatic angles. (RH)
When Government drawings, specifications, or other data are used for any purpose other than in co... more When Government drawings, specifications, or other data are used for any purpose other than in connection with a definitely Government-related procurement, the United States Government incurs no responsibility or any obligation whatsoever. The fact that the Government may have formulated or in any way supplied the said drawings, specifications, or other data, is not to be regarded by implication, or otherwise as in any manner construed, as licensing the holder, or any other person or corporation; or as conveying any rights or permission to manufacture, use, or sell any patented invention that may in any way be related thereto. This technical report has been reviewed and is approved for publication.
: The Millimeter Wave Reflectivity Measurement System (MRMS) is used by researchers to investigat... more : The Millimeter Wave Reflectivity Measurement System (MRMS) is used by researchers to investigate the basic phenomenology, to verify theoretical models, and to assess the effectiveness of actual countermeasures of various materials for target scattering at millimeter wave (MMW) frequencies. The data acquisition portion of the MRMS was constructed using a Hewlett-Packard (HP) 310 computer as the system controller. The data acquisition controller was difficult to operate because its operating system and disk formats were quite different from personal computer (PC) operating system the engineer or scientist was accustomed to using. Off-the-shelf PC products are readily available. There is extensive in-house programming expertise for the PC which is not the case with the HP computer. The limitations with the HP computer-based controller hampered the ability of the MRMS to be an effective tool and meet the needs of the engineer and scientist. The decision was made to switch to a PC-base...
: The RF Technology Section of WL/MNGS is developing an in-house capability for modeling and meas... more : The RF Technology Section of WL/MNGS is developing an in-house capability for modeling and measurement of target scattering and material characteristics at millimeter wave (MMW) frequencies. The goal of the modeling effort is to understand the basic mechanisms that contribute to the target scattering (coated and uncoated) at MMW frequencies. The measurement effort is two-fold: verify theoretical models (target and materials) and assess the effectiveness of actual countermeasures. The MMW Reflectivity Measurement System (MRMS) is capable of bistatic swept frequency measurements for copolarized (COPOL) transmit and receive signals, and it gives a quick-look capability useful in evaluating countermeasures. The primary goal is the understanding of the various mechanisms that contribute to the scattering in order to develop the algorithms and technology necessary to exploit these effects and improve seeker guidance techniques. This paper discusses the current hardware configuration and...
: This report compares three solutions for scattering from a perfectly conducting risk. It compar... more : This report compares three solutions for scattering from a perfectly conducting risk. It compares a closed form Physical Optics (PO) solution, a solution found by applying the RADC/BSRCRCS scattering prediction code, and an exact eigenfunction solution. The results are compared for various ka values and incidence angles for both horizontal and vertical polarizations. In addition, this report determined the applicability of the disk as a calibration standard for bistatic radar cross section (RCS) measurements by examining the calibration curve. This curve is a plot of the specular return as a function of bistatic angle. This curve is computed for both horizontal and vertical polarizations at various ka values using the PO and eigenfunction solutions. Results show that PO agrees reasonably well with the PTD and eigenfunction solutions in certain cases. The agreement is particulary good for the calibration curve for a wide range of bistatic angles. (RH)
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