EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany, 2008
ABSTRACT The possibility of using electron energy loss spectroscopy (EELS) to measure a magnetic ... more ABSTRACT The possibility of using electron energy loss spectroscopy (EELS) to measure a magnetic chiral dichroic spectrum analogous to the x-ray magnetic circular dichroism (XMCD) signal has been suggested a few years ago [1]. This effect has been demonstrated recently for metallic samples [2]. The energy loss magnetic chiral dicroism (EMCD) signal is obtained by subtracting the EELS signal recorded at two symmetrical positions in the diffraction pattern, see figure 1. These two positions can be reached by moving the spectrometer aperture in the diffraction pattern [2], or by using the energy spectrum imaging (ESI) technique which consists in recording the whole diffraction pattern for successive energy windows [3].
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany, 2008
ABSTRACT Research of granular thin films composed by magnetic single-domain nanoparticles dispers... more ABSTRACT Research of granular thin films composed by magnetic single-domain nanoparticles dispersed in a non-magnetic matrix is currently very active because their magnetic and magnetotransport properties suggest various technological applications. Discontinuous metal insulator multilayers (DMIMs) belong to this class of materials. DMIMs consist of metallic layers with different degrees of discontinuity intercalated between insulating spacer layers. When the metallic layer consists of closely spaced ferromagnetic grains, different types of collective behaviour may appear due to magnetic dipolar or exchange interactions [1, 2]. In fact, the magnetic behaviour can be controlled by modifying the nominal thickness of the deposited ferromagnetic metal [3]. Therefore, microscopic characterization is essential in tailoring the magnetic properties of these systems.
2009 IEEE International Electron Devices Meeting (IEDM), 2009
ABSTRACT The authors present the latest results from the new technique of dark-field electron hol... more ABSTRACT The authors present the latest results from the new technique of dark-field electron holography (HoloDark) which combines the advantages of the conventional transmission electron microscopy (TEM) with the precision of electron holography and is applicable to standard focused-ion beam (FIB) prepared samples. The authors will present measurements of strain in the active regions of a strained-silicon n-MOSFET device and a test structure for CESL induced strain.
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany, 2008
Trends in electronics propose the use of spin instead of charge as an information unit. These new... more Trends in electronics propose the use of spin instead of charge as an information unit. These new spintronic devices are based on magnetic and non-magnetic thin layers through which electrons travel and are scattered or filtered at interfaces depending on their spin. The spin mean free path depends on the material but can be estimated to be in the 100 nm range. The interesting devices for spintronics have therefore dimensions close to few hundred of nanometer and therefore physical measurements have to be performed at this scale. One of the important properties is the local magnetic moment and its evolution close to surfaces or interfaces.
Monodispersed nanoparticles of cobalt have been prepared by an original method using the decompos... more Monodispersed nanoparticles of cobalt have been prepared by an original method using the decomposition under hydrogen of an organometallic precursor in the presence of a stabilizing polymer. Two colloids (Coll-I and Coll-II) have been obtained by changing the ...
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany, 2008
Metallic nanoparticles exhibit exceptional optoelectronic properties that are strongly size and s... more Metallic nanoparticles exhibit exceptional optoelectronic properties that are strongly size and shape dependant and locally variable. Recently, novel synthesis techniques have enabled precise control over the growth of metallic nanoparticles, occasionally resulting in morphologies that cannot be characterized using standard techniques [1]. One example is five-fold-twinned decahedral Au nanoparticles. Owing to the decahedral geometry, these nanoparticles must be strained or
Claverie/Transmission Electron Microscopy in Micro-Nanoelectronics, 2012
ABSTRACT This chapter describes the dark-field electron holography (DFEH) technique, which is use... more ABSTRACT This chapter describes the dark-field electron holography (DFEH) technique, which is used to measure strain to high precision, with nanometer spatial resolution and for micrometer fields of view. The technique has been applied successfully to a number of systems, from the MOSFET and FinFET devices and similar strained silicon devices, to strained layers, misfit dislocations therein and quantum dots. The technique can be powerfully combined with conventional holography to provide a complete study of strain and dopants in devices. The chapter addresses an important issue inherent to any TEM investigation of strain: the thin-film effect. the study of hydrogen-implanted silicon is also illustrated in the chapter.
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany, 2008
ABSTRACT The possibility of using electron energy loss spectroscopy (EELS) to measure a magnetic ... more ABSTRACT The possibility of using electron energy loss spectroscopy (EELS) to measure a magnetic chiral dichroic spectrum analogous to the x-ray magnetic circular dichroism (XMCD) signal has been suggested a few years ago [1]. This effect has been demonstrated recently for metallic samples [2]. The energy loss magnetic chiral dicroism (EMCD) signal is obtained by subtracting the EELS signal recorded at two symmetrical positions in the diffraction pattern, see figure 1. These two positions can be reached by moving the spectrometer aperture in the diffraction pattern [2], or by using the energy spectrum imaging (ESI) technique which consists in recording the whole diffraction pattern for successive energy windows [3].
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany, 2008
ABSTRACT Research of granular thin films composed by magnetic single-domain nanoparticles dispers... more ABSTRACT Research of granular thin films composed by magnetic single-domain nanoparticles dispersed in a non-magnetic matrix is currently very active because their magnetic and magnetotransport properties suggest various technological applications. Discontinuous metal insulator multilayers (DMIMs) belong to this class of materials. DMIMs consist of metallic layers with different degrees of discontinuity intercalated between insulating spacer layers. When the metallic layer consists of closely spaced ferromagnetic grains, different types of collective behaviour may appear due to magnetic dipolar or exchange interactions [1, 2]. In fact, the magnetic behaviour can be controlled by modifying the nominal thickness of the deposited ferromagnetic metal [3]. Therefore, microscopic characterization is essential in tailoring the magnetic properties of these systems.
2009 IEEE International Electron Devices Meeting (IEDM), 2009
ABSTRACT The authors present the latest results from the new technique of dark-field electron hol... more ABSTRACT The authors present the latest results from the new technique of dark-field electron holography (HoloDark) which combines the advantages of the conventional transmission electron microscopy (TEM) with the precision of electron holography and is applicable to standard focused-ion beam (FIB) prepared samples. The authors will present measurements of strain in the active regions of a strained-silicon n-MOSFET device and a test structure for CESL induced strain.
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany, 2008
Trends in electronics propose the use of spin instead of charge as an information unit. These new... more Trends in electronics propose the use of spin instead of charge as an information unit. These new spintronic devices are based on magnetic and non-magnetic thin layers through which electrons travel and are scattered or filtered at interfaces depending on their spin. The spin mean free path depends on the material but can be estimated to be in the 100 nm range. The interesting devices for spintronics have therefore dimensions close to few hundred of nanometer and therefore physical measurements have to be performed at this scale. One of the important properties is the local magnetic moment and its evolution close to surfaces or interfaces.
Monodispersed nanoparticles of cobalt have been prepared by an original method using the decompos... more Monodispersed nanoparticles of cobalt have been prepared by an original method using the decomposition under hydrogen of an organometallic precursor in the presence of a stabilizing polymer. Two colloids (Coll-I and Coll-II) have been obtained by changing the ...
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany, 2008
Metallic nanoparticles exhibit exceptional optoelectronic properties that are strongly size and s... more Metallic nanoparticles exhibit exceptional optoelectronic properties that are strongly size and shape dependant and locally variable. Recently, novel synthesis techniques have enabled precise control over the growth of metallic nanoparticles, occasionally resulting in morphologies that cannot be characterized using standard techniques [1]. One example is five-fold-twinned decahedral Au nanoparticles. Owing to the decahedral geometry, these nanoparticles must be strained or
Claverie/Transmission Electron Microscopy in Micro-Nanoelectronics, 2012
ABSTRACT This chapter describes the dark-field electron holography (DFEH) technique, which is use... more ABSTRACT This chapter describes the dark-field electron holography (DFEH) technique, which is used to measure strain to high precision, with nanometer spatial resolution and for micrometer fields of view. The technique has been applied successfully to a number of systems, from the MOSFET and FinFET devices and similar strained silicon devices, to strained layers, misfit dislocations therein and quantum dots. The technique can be powerfully combined with conventional holography to provide a complete study of strain and dopants in devices. The chapter addresses an important issue inherent to any TEM investigation of strain: the thin-film effect. the study of hydrogen-implanted silicon is also illustrated in the chapter.
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