Test as a key enabler for faster yield ramp-up. Published in: Proceedings 20th IEEE VLSI Test Symposium (VTS 2002). Article #:.
The successful introduction of a new IC manufacturing process requires a rapid yield ramp. In-line inspection, parameter evaluation using special tests ...
This technique is found to be accurate and effective for devices with differing channel lengths and also for devices after nonuniform hot-carrier degradation.
Mutation testing is a well-known but costly approach for determining test adequacy. The central idea behind the approach is to generate mutants, ...
Julie Segal, Rene Segers, Rob Aitken, S. Eichenberge, A. Gattike, M. Millegen, R. Seger, S. Venkataraman: Test as a Key Enabler for Faster Yield Ramp-Up.
Julie Segal, Rene Segers, Rob Aitken, S. Eichenberge, A. Gattike, M. Millegen, R. Seger, S. Venkataraman: Test as a Key Enabler for Faster Yield Ramp-Up.
It helps engineers improve yield learning and accelerate yield ramp. The complementary product, SmartFactory Defect Management, reduces the need for unreliable ...
This study proposes a fast ramp-up framework for wafer yield improvement in semiconductor manufacturing systems.
Missing: Enabler | Show results with:Enabler
It is possible to launch multi-site testing into production with high yield from day one and this can be achieved with less effort than ever before.
Missing: Enabler | Show results with:Enabler
Yield diagnostics are based on a new class of diagnostics tool specifically designed to accelerate yield ramp and yield learning in manufacturing environments.