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In this paper we propose a new diagonal test algorithm for flash memory that effectively reduces the test time without sacrificing the fault coverage. Both ...
In this paper we propose a new diagonal test algorithm for flash memory that effectively reduces the test time without sacrificing the fault coverage. Both ...
A new diagonal test algorithm for flash memory is proposed that effectively reduces the test time without sacrificing the fault coverage and a built-in ...
In this paper we propose a new diagonal test algorithm for flash memory that effectively reduces the test time without sacrificing the fault coverage. Both ...
In this paper we propose a new diagonal test algorithm for flash memory that effectively reduces the test time without sacrificing the fault coverage. Both ...
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Diagonal Test and Diagnostic Schemes for Flash Memories. Sau-Kwo Chiu, Jen-Chich Yeh, Chih-Tsun Huang, and Cheng-Wen Wu. Laboratory for Reliable Computing ...
Diagonal test and diagnostic schemes for flash memories ; 001 Exact sciences and technology ; 001D Applied sciences ; 001D03 Electronics ; 001D03F Semiconductor ...
Co-authors ; Diagonal test and diagnostic schemes for flash memories. SK Chiu, JC Yeh, CT Huang, CW Wu. Proceedings. International Test Conference, 37-46, 2002.
A new diagonal test algorithm for flash memory is proposed that effectively reduces the test time without sacrificing the fault coverage and a built-in self- ...
In addition, we present a configurable flash memory tester using FPGA for low-cost testing and diagnostics. Experimental results on industrial flash chips ...