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Effect of noise fluctuation of a quantum tunneling device coupled to a substrate

Nikhilesh A. Vaidya and D. H. Santamore
Phys. Rev. B 95, 155439 – Published 24 April 2017

Abstract

The recent experiment of Stettenheim et al. showed that, contrary to conventional belief, the coupling of a quantum electronic device to its substrate can have important effects on the noise power spectrum, since the substrate functions as a mechanical oscillator. We carry out a theoretical analysis of this coupling in the case of a quantum point contact (QPC). First we derive the noise power spectrum from the Hamiltonian without making the Markovian approximation, and obtain numerical results that reproduce the experimental data. Next we investigate the nature of the coupling. In most previous analyses, the coupling of an electronic device to a mechanical oscillator has been modeled as a position coupling. We model it both as a position coupling and as a momentum coupling and compare the results. We find that, as long as one includes backaction between position and momentum, the assumed mode of coupling makes little difference, since the backaction transmits momentum fluctuations to position fluctuations and vice versa. Finally, we ask whether the salient features of the model persist in the Markovian approximation. We find that a Markovian analysis confirms the QPC-substrate coupling, but underestimates the noise floor and leads to excessively sharp and narrow noise peaks around the resonant frequencies.

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  • Received 21 February 2017
  • Revised 10 April 2017

DOI:https://doi.org/10.1103/PhysRevB.95.155439

©2017 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied PhysicsStatistical Physics & ThermodynamicsQuantum Information, Science & Technology

Authors & Affiliations

Nikhilesh A. Vaidya

  • Department of Physics, Temple University, Philadelphia, Pennsylvania 19122, USA

D. H. Santamore

  • Department of Physics and Engineering Physics, Delaware State University, Dover, Delaware 19901, USA

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Issue

Vol. 95, Iss. 15 — 15 April 2017

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