"A delay metric for RC circuits based on the Weibull distribution."

Frank Liu, Chandramouli V. Kashyap, Charles J. Alpert (2004)

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DOI: 10.1109/TCAD.2004.823343

access: closed

type: Journal Article

metadata version: 2023-06-23

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Frank Liu, Chandramouli V. Kashyap, Charles J. Alpert:
A delay metric for RC circuits based on the Weibull distribution. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(3): 443-447 (2004)

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