"Electrical characterization and reliability study of integrated GaN power ..."

Rui Liu et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.06.034

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type: Journal Article

metadata version: 2024-04-11

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Rui Liu, Dominique M. M.-P. Schreurs, Walter De Raedt, Frederik Vanaverbeke, J. Das, Robert Mertens, Ingrid De Wolf:
Electrical characterization and reliability study of integrated GaN power amplifier in multi-layer thin-film technology. Microelectron. Reliab. 51(9-11): 1721-1724 (2011)

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