"Investigation on stress induced hump phenomenon in IGZO thin film ..."

Dae Hyun Kim, Jong Tae Park (2015)

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DOI: 10.1016/J.MICROREL.2015.06.024

access: closed

type: Journal Article

metadata version: 2022-04-20

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Dae Hyun Kim, Jong Tae Park:
Investigation on stress induced hump phenomenon in IGZO thin film transistors under negative bias stress and illumination. Microelectron. Reliab. 55(9-10): 1811-1814 (2015)

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