"Latch-up testing in CMOS IC's."

Roberto Menozzi et al. (1990)

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DOI: 10.1109/4.58295

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type: Journal Article

metadata version: 2025-01-23

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Roberto Menozzi, Massimo Lanzoni, Claudio Fiegna, Enrico Sangiorgi, Bruno Riccò:
Latch-up testing in CMOS IC's. IEEE J. Solid State Circuits 25(4): 1010-1014 (1990)

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