"基于机器视觉的液晶&#..."

Jide Qian et al. (2018)

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DOI: 10.11896/J.ISSN.1002-137X.2018.06.052

access: open

type: Journal Article

metadata version: 2020-03-12

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Jide Qian, Bin Chen, Jiye Qian, Hengjun Zhao, Gang Chen:
基于机器视觉的液晶屏Mura缺陷检测方法 (Machine Vision Based Inspection Method of Mura Defect for LCD). 计算机科学 45(6): 296-300 (2018)

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