"A Fault Simulation Based Test Pattern Generator for Synchronous Sequential ..."

Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy (1999)

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DOI: 10.1109/VTEST.1999.766674

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-04

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Ruifeng Guo, Irith Pomeranz, Sudhakar M. Reddy:
A Fault Simulation Based Test Pattern Generator for Synchronous Sequential Circuits. VTS 1999: 260-267

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