"Investigation on Positive Bias-Induced Threshold Voltage Instability in ..."

Shivendra K. Rathaur, Abhisek Dixit, Edward Yi Chang (2024)

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DOI: 10.1109/DRC61706.2024.10605412

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type: Conference or Workshop Paper

metadata version: 2024-10-06

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Shivendra K. Rathaur, Abhisek Dixit, Edward Yi Chang:
Investigation on Positive Bias-Induced Threshold Voltage Instability in GaN-on-Si D-mode Power MIS-HEMTs. DRC 2024: 1-2

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