"Testing for Floating Gates Defects in CMOS Circuits."

Sumbal Rafiq et al. (1998)

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DOI: 10.1109/ATS.1998.741618

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Sumbal Rafiq, André Ivanov, Sassan Tabatabaei, Michel Renovell:
Testing for Floating Gates Defects in CMOS Circuits. Asian Test Symposium 1998: 228-236

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