"Identification of Defective TSVs in Pre-Bond Testing of 3D ICs."

Brandon Noia, Krishnendu Chakrabarty (2011)

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DOI: 10.1109/ATS.2011.57

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Brandon Noia, Krishnendu Chakrabarty:
Identification of Defective TSVs in Pre-Bond Testing of 3D ICs. Asian Test Symposium 2011: 187-194

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