"Wide-supply-range all-digital leakage variation sensor for on-chip process ..."

Islam A. K. M. Mahfuzul et al. (2014)

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DOI: 10.1109/ASSCC.2014.7008856

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-07

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Islam A. K. M. Mahfuzul, Jun Shiomi, Tohru Ishihara, Hidetoshi Onodera:
Wide-supply-range all-digital leakage variation sensor for on-chip process and temperature monitoring. A-SSCC 2014: 45-48

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