"Dynamic supply noise measurement circuit composed of standard cells ..."

Yasuhiro Ogasahara, Masanori Hashimoto, Takao Onoye (2008)

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DOI: 10.1109/ASPDAC.2008.4483917

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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Yasuhiro Ogasahara, Masanori Hashimoto, Takao Onoye:
Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification. ASP-DAC 2008: 107-108

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