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R. Jain

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2022
[c1]
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Luca Pirro, P. Liebscher, C. Brantz, M. Kessler, H. Herzog, Olaf Zimmerhackl, R. Jain, E. Ebrand, K. Gebauer, Michael Otto, Alban Zaka, Jan Hoentschel:
Impact of Electrical Defects located at Transistor Periphery on Analog and RTN Device Performance. IRPS 2022: 59-1

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