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2020 – today
- 2022
[j3]Zhenkun Yang, Chuanhui Yang, Fusheng Han, Mingqiang Zhuang, Bing Yang, Zhifeng Yang, Xiaojun Cheng, Yuzhong Zhao, Wenhui Shi, Huafeng Xi, Huang Yu, Bin Liu, Yi Pan, Boxue Yin, Junquan Chen, Quanqing Xu:
OceanBase: A 707 Million tpmC Distributed Relational Database System. Proc. VLDB Endow. 15(12): 3385-3397 (2022)
2010 – 2019
- 2016
- [c8]Jie Shao, Boxue Yin, Bujiao Chen, Guangshu Wang, Lin Yang, Jianliang Yan, Jianying Wang, Weidong Liu:
Read Consistency in Distributed Database Based on DMVCC. HiPC 2016: 142-151 - [c7]Jingwei Ma, Boxue Yin, Zhi Kong, Yuxiang Ma, Chang Chen, Long Wang, Gang Wang, Xiaoguang Liu:
Leveraging Page-Level Compression in MySQL - A Practice at Baidu. Trustcom/BigDataSE/ISPA 2016: 1085-1092 - 2014
- [j2]Dong Xiang, Wenjie Sui, Boxue Yin, Kwang-Ting Cheng
:
Compact Test Generation With an Influence Input Measure for Launch-On-Capture Transition Fault Testing. IEEE Trans. Very Large Scale Integr. Syst. 22(9): 1968-1979 (2014) - 2010
- [j1]Zhen Chen, J. Feng, Dong Xiang, Boxue Yin:
Scan chain configuration based X-filling for low power and high quality testing. IET Comput. Digit. Tech. 4(1): 1-13 (2010)
2000 – 2009
- 2009
- [c6]Zhen Chen, Boxue Yin, Dong Xiang:
Conflict driven scan chain configuration for high transition fault coverage and low test power. ASP-DAC 2009: 666-671 - [c5]Dong Xiang, Boxue Yin, Krishnendu Chakrabarty:
Compact Test Generation for Small-Delay Defects Using Testable-Path Information. Asian Test Symposium 2009: 424-429 - [c4]Zhen Chen, Dong Xiang, Boxue Yin:
A power-effective scan architecture using scan flip-flops clustering and post-generation filling. ACM Great Lakes Symposium on VLSI 2009: 517-522 - [c3]Boxue Yin, Dong Xiang, Zhen Chen:
New Techniques for Accelerating Small Delay ATPG and Generating Compact Test Sets. VLSI Design 2009: 221-226 - [c2]Zhen Chen, Dong Xiang, Boxue Yin:
The ATPG Conflict-Driven Scheme for High Transition Fault Coverage and Low Test Cost. VTS 2009: 146-151 - [c1]Dong Xiang, Boxue Yin, Kwang-Ting Cheng:
Dynamic Test Compaction for Transition Faults in Broadside Scan Testing Based on an Influence Cone Measure. VTS 2009: 251-256
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