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Yasuo Tokunaga

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1980 – 1989

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1989
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Yasuo Tokunaga, Jürgen Frosien:
High Performance Electron Beam Tester for Voltage Measurement on Unpassivated and Passivated Devices. ITC 1989: 917-922
1988
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Hironobu Niijima, Yasuo Tokunaga, Shouichi Koshizuka, Kazuo Yakuwa, Péter Fazekas, Mathias Sturm, Hans-Peter Feuerbaum:
Electron Beam Tester Integrated into a VLSI Tester. ITC 1988: 908-913

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