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Claudia Wiemer

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2000 – 2009

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2009
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Xavier Garros, Mikaël Cassé, M. Rafik, Claire Fenouillet-Béranger, Gilles Reimbold, François Martin, Claudia Wiemer, F. Boulanger:
Process dependence of BTI reliability in advanced HK MG stacks. Microelectron. Reliab. 49(9-11): 982-988 (2009)

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