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Jan Malburg
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2010 – 2019
- 2019
- [c13]Jan Malburg, Karl Janson, Jaan Raik, Frank Dannemann:
Fault-Aware Performance Assessment Approach for Embedded Networks. DDECS 2019: 1-4 - [c12]Tara Ghasempouri, Jan Malburg, Alessandro Danese, Graziano Pravadelli, Görschwin Fey, Jaan Raik:
Engineering of an Effective Automatic Dynamic Assertion Mining Platform. VLSI-SoC 2019: 111-116 - 2018
- [c11]Jan Malburg, Heinz Riener, Görschwin Fey:
Mining Latency Guarantees for RTL Designs. ISMVL 2018: 68-73 - 2017
- [c10]Jan Malburg, Tino Flenker, Görschwin Fey:
Property mining using dynamic dependency graphs. ASP-DAC 2017: 244-250 - [c9]Tino Flenker, Jan Malburg, Görschwin Fey, Serhiy Avramenko, Massimo Violante, Matteo Sonza Reorda:
Towards Making Fault Injection on Abstract Models a More Accurate Tool for Predicting RT-Level Effects. ISVLSI 2017: 533-538 - 2016
- [b1]Jan Malburg:
Feature Localization and Design Understanding for Hardware Designs. University of Bremen, Germany, Shaker 2016, ISBN 978-3-8440-4219-1, pp. 1-123 - [j3]Jan Malburg, Alexander Finder, Görschwin Fey:
Debugging hardware designs using dynamic dependency graphs. Microprocess. Microsystems 47: 347-359 (2016) - [c8]Gadi Aleksandrowicz, Eli Arbel, Roderick Bloem, Timon D. ter Braak, Sergei Devadze, Görschwin Fey, Maksim Jenihhin, Artur Jutman, Hans G. Kerkhoff, Robert Könighofer, Jan Malburg, Shiri Moran, Jaan Raik, Gerard K. Rauwerda, Heinz Riener, Franz Röck, Konstantin Shibin, Kim Sunesen, Jinbo Wan, Yong Zhao:
Designing reliable cyber-physical systems overview associated to the special session at FDL'16. FDL 2016: 1-8 - 2014
- [j2]Jan Malburg, Gordon Fraser:
Search-based testing using constraint-based mutation. Softw. Test. Verification Reliab. 24(6): 472-495 (2014) - [j1]Jan Malburg, Alexander Finder, Görschwin Fey:
A Simulation-Based Approach for Automated Feature Localization. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(12): 1886-1899 (2014) - [c7]Jan Malburg, Niklas Krafczyk, Görschwin Fey:
Automatically connecting hardware blocks via light-weight matching techniques. DDECS 2014: 21-26 - [c6]Jan Malburg, Emmanuelle Encrenaz-Tiphène, Görschwin Fey:
Mutation Based Feature Localization. MTV 2014: 49-54 - 2013
- [c5]Jan Malburg, Alexander Finder, Görschwin Fey:
Tuning dynamic data flow analysis to support design understanding. DATE 2013: 1179-1184 - 2012
- [c4]Jan Malburg, Alexander Finder, Görschwin Fey:
Automated feature localization for hardware designs using coverage metrics. DAC 2012: 941-946 - [c3]Jan Malburg, Alexander Finder, Görschwin Fey:
Automated Feature Localization for Hardware Designs using Coverage Metrics. MBMV 2012: 85-96 - 2011
- [c2]Jan Malburg, Gordon Fraser:
Combining search-based and constraint-based testing. ASE 2011: 436-439
2000 – 2009
- 2009
- [c1]Matthias Deller, Sebastian Thelen, Daniel Steffen, Peter-Scott Olech, Achim Ebert, Jan Malburg, Jörg Meyer:
A Highly Scalable Rendering Framework for Arbitrary Display and Display-in-Display Configurations. CGVR 2009: 164-170
Coauthor Index
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