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2020 – today
- 2023
[c7]Mridha Md Mashahedur Rahman, M. Sazadur Rahman
, Rasheed Kibria, Mike Borza, Bandy Reddy, Adam Cron, Fahim Rahman, Mark M. Tehranipoor, Farimah Farahmandi:
CAPEC: A Cellular Automata Guided FSM-based IP Authentication Scheme. VTS 2023: 1-8- 2022
- [j4]Adam Cron, Hailong Jiao, Erik Jan Marinissen:
Guest Editors' Introduction: Special Issue on Design and Test of Multidie Packages. IEEE Des. Test 39(5): 5-6 (2022) - [j3]Teresa McLaurin, Adam Cron:
Applying IEEE Test Standards to Multidie Designs. IEEE Des. Test 39(5): 7-16 (2022) - [i2]Bulbul Ahmed, Md Kawser Bepary, Nitin Pundir, Mike Borza, Oleg Raikhman, Amit Garg, Dale R. Donchin, Adam Cron, Mohamed Abdel-Moneum, Farimah Farahmandi, Fahim Rahman, Mark M. Tehranipoor:
Quantifiable Assurance: From IPs to Platforms. CoRR abs/2204.07909 (2022) - 2021
- [j2]Adam Cron, Erik Jan Marinissen:
IEEE Standard 1838 Is on the Move. Computer 54(11): 88-94 (2021) - [c6]Md Sami Ul Islam Sami, Fahim Rahman, Farimah Farahmandi, Adam Cron, Mike Borza, Mark M. Tehranipoor:
Invited: End-to-End Secure SoC Lifecycle Management. DAC 2021: 1295-1298 - [c5]Md Sami Ul Islam Sami, Fahim Rahman, Adam Cron, Dale R. Donchin, Mike Borza, Farimah Farahmandi, Mark M. Tehranipoor:
POCA: First Power-on Chip Authentication in Untrusted Foundry and Assembly. HOST 2021: 124-135 - [i1]Bulbul Ahmed, Md Kawser Bepary, Nitin Pundir, Mike Borza, Oleg Raikhman, Amit Garg, Dale R. Donchin, Adam Cron, Mohamed A. Abdelmoneum, Farimah Farahmandi, Fahim Rahman, Mark M. Tehranipoor:
Quantifiable Assurance: From IPs to Platforms. IACR Cryptol. ePrint Arch. 2021: 1654 (2021)
2010 – 2019
- 2018
- [c4]Yu Li, Ming Shao, Hailong Jiao, Adam Cron, Sandeep Bhatia, Erik Jan Marinissen:
IEEE Std P1838's flexible parallel port and its specification with Google's protocol buffers. ETS 2018: 1-6
2000 – 2009
- 2006
- [c3]Bambang Suparjo, Adam W. Ley, Adam Cron, Heiko Ehrenberg:
Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test. ITC 2006: 1-9 - 2004
- [c2]Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil G. Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts:
Status of IEEE Testability Standards 1149.4, 1532 and 1149.6. DATE 2004: 1184-1191
1990 – 1999
- 1997
- [c1]Adam Cron:
IEEE P1149.4-Almost a Standard. ITC 1997: 174-182 - 1996
- [j1]Adam Cron:
A D&T Special Report: P1149.4 Mixed-Signal Test Bus. IEEE Des. Test Comput. 13(3): 98-101 (1996)
Coauthor Index
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